Patents
Sitemap › G01 - Measuring; Testing › G01R - Measuring electric variables; Measuring magnetic variables › G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
08/1999
08/24/1999US5942911 Electric field test of integrated circuit component
08/24/1999US5942910 Method and circuit for providing accurate voltage sensing for a power transistor, or the like
08/24/1999US5942909 Method for analyzing Schottky junction, method for evaluating semiconductor wafer, method for evaluating insulating film, and Schottky junction analyzing apparatus
08/24/1999US5942908 Apparatus for testing a nonpackaged die
08/24/1999US5942907 Method and apparatus for testing dies
08/24/1999US5942905 For engaging terminals
08/24/1999US5942903 Apparatus for EMC testing of electrical devices
08/24/1999US5942902 Method of measuring delay time and random pulse train generating circuit used in such method
08/24/1999US5942901 For testing printed circuit boards
08/24/1999US5942889 Capacitive probe for in situ measurement of wafer DC bias voltage
08/24/1999US5942886 Power device with a short-circuit detector
08/24/1999US5942808 Semiconductor device with plural power supply circuits, plural internal circuits, and single external terminal
08/24/1999US5942000 Circuit and method for testing an integrated circuit
08/24/1999US5941997 Current-based contention detection and handling system
08/24/1999US5941987 Reference cell for integrated circuit security
08/24/1999US5941916 Driving apparatus with a function for detecting an electric current and method for detecting its electric current
08/24/1999US5940965 Method of making multiple lead voltage probe
08/24/1999CA2093420C Electric arc and radio frequency spectrum detection
08/19/1999DE19905499A1 Clock signal generator for processor systems
08/19/1999DE19836134A1 Data collection unit for solar cells with system for irradiating specimen
08/19/1999DE19821225A1 Method for testing printed circuit cards
08/19/1999DE19813964A1 Ring bus system with a central unit and a number or control modules, in particular for motor vehicle passenger protection systems
08/19/1999DE19805267A1 Method and arrangement for optimizing the energy management of autonomous power supply systems supplied from batteries
08/19/1999DE19756042A1 Method for adjusting and testing operating mode of electronically controlled device, e.g. remote controlled robot
08/19/1999DE19744009C1 Three=phase short-circuit indicating signal generation method e.g. for three=phase electrical power transmission line
08/19/1999DE19651713C2 Bauelement-Testgerät zum Testen elektronischer Bauelemente Device test apparatus for testing electronic components
08/18/1999EP0936851A2 Socket for integrated circuit chip
08/18/1999EP0936719A2 Battery pack and battery system
08/18/1999EP0936469A2 Loop resistance tester (LRT) for cable shield integrity monitoring
08/18/1999EP0935759A1 Device noise measurement system
08/18/1999EP0918714A4 Method and apparatus for loading electronic components
08/18/1999EP0913033A4 Coherent sampling digitizer system
08/18/1999EP0858605A4 Systems for determining fault location on power distribution lines
08/18/1999EP0479915B1 Compact portable computer
08/18/1999CN1226370A Sucked material detector, sucked material detecting method using the same detector, shift detecting method and cleaning method therefor
08/18/1999CN1226092A Battery pack and battery system
08/18/1999CN1044746C Output coupling to high frequency breakdown signals from middle-high frequency electric magnetic field of large motor
08/17/1999US5940875 Address pattern generator for burst address access of an SDRAM
08/17/1999US5940783 Test method for testing electrical connections
08/17/1999US5940680 Method for manufacturing known good die array having solder bumps
08/17/1999US5940679 Method of checking electric circuits of semiconductor device and conductive adhesive for checking usage
08/17/1999US5940678 Method of forming precisely cross-sectioned electron-transparent samples
08/17/1999US5940588 Method for testing an integrated circuit
08/17/1999US5940547 Optical fiber accidental arc detector for an electric power distribution switching device
08/17/1999US5940545 Noninvasive optical method for measuring internal switching and other dynamic parameters of CMOS circuits
08/17/1999US5940518 In a vehicle radio
08/17/1999US5940414 Method of checking connections between each of a plurality of circuit blocks and between each circuit block and a plurality of external terminals
08/17/1999US5940413 Method for detecting operational errors in a tester for semiconductor devices
08/17/1999US5940310 Device, method and storage medium for calculating electromagnetic field strength
08/17/1999US5940303 Semiconductor device test system
08/17/1999US5940299 System & method for controlling a process-performing apparatus in a semiconductor device-manufacturing process
08/17/1999US5939914 Synchronous test mode initialization
08/17/1999US5939897 Method and apparatus for testing quiescent current in integrated circuits
08/17/1999US5939894 CMOS integrated circuit testing method and apparatus using quiescent power supply currents database
08/17/1999US5939875 Universal probe interface
08/17/1999US5939873 Test fixture for a liquid recirculation unit
08/17/1999US5939863 Power circuit providing reverse battery protection and current and temperature sensing
08/17/1999US5939719 Scanning probe microscope with scan correction
08/17/1999US5938785 Computer implemented method
08/17/1999US5938784 Linear feedback shift register, multiple input signature register, and built-in self test circuit using such registers
08/17/1999US5938783 Dual mode memory for IC terminals
08/17/1999US5938782 Scan flip-flop and methods for controlling the entry of data therein
08/17/1999US5938781 Production interface for an integrated circuit test system
08/17/1999US5938780 Method for capturing digital data in an automatic test system
08/17/1999US5938779 Asic control and data retrieval method and apparatus having an internal collateral test interface function
08/17/1999US5938755 Method and apparatus for estimating power in electronic integrated circuits
08/17/1999CA2240697A1 Method of evaluating superconducting wire
08/12/1999WO1999040664A1 Electrical protection systems
08/12/1999WO1999040621A1 An integrated circuit
08/12/1999WO1999040451A1 Measuring and electrochromic display system for electrically measured variables
08/12/1999WO1999040450A1 Apparatus for testing semiconductor device
08/12/1999WO1999040449A1 Optically driven driver, optical output type voltage sensor, and ic testing equipment using these devices
08/12/1999WO1999040448A1 Connection test method
08/12/1999DE19904060A1 Arrangement with voltage monitoring circuit, esp. for monitoring the voltage of a rechargeable battery
08/12/1999DE19902159A1 Circuit board test system for development stage
08/12/1999DE19804832A1 Acoustic locating device for finding faults in power cable
08/12/1999DE19804332A1 Elektrochromes Meß- und Anzeigegerät für elektrische Meßgrößen Electrochromic measurement and display device for electrical measurement variables
08/12/1999DE19802551A1 Partial discharge measurement method for component of magnetic resonance arrangement
08/12/1999DE19757365C1 Trigger circuit arrangement for over-voltage protection unit
08/12/1999DE19754351C1 Method of measuring the temp. of a coil with an associated inductance and temp. dependent capacitance
08/11/1999EP0935339A1 Versatile signal generator
08/11/1999EP0935256A1 Test method for writable nonvolatile semiconductor memory device
08/11/1999EP0934615A1 Method and device for managing an electronic component with complementary mos transistors functioning under radiation
08/11/1999EP0934580A1 Battery capacity monitoring system
08/11/1999EP0934533A1 Switching arrangement for monitoring leakage current
08/11/1999CN1225724A Wafer-level burn-in and test
08/11/1999CN1044644C Method and device for testing integrated circuit soldered on a board
08/11/1999CN1044643C Testing apparatus
08/10/1999US5937368 User-definable electrical test query for vehicle quality assurance testing during manufacture
08/10/1999US5937367 Method for testing a memory chip, divided into cell arrays, during ongoing operation of a computer while maintaining real-time conditions
08/10/1999US5937180 Method and apparatus relating to a telecommunications system
08/10/1999US5937179 Integrated circuit design system with shared hardware accelerator and processes of designing integrated circuits
08/10/1999US5937154 Manufacturing functional testing of computing devices using microprogram based functional tests applied via the devices own emulation debug port
08/10/1999US5936977 Scan path circuitry including a programmable delay circuit
08/10/1999US5936975 Semiconductor memory device with switching circuit for controlling internal addresses in parallel test
08/10/1999US5936910 Semiconductor memory device having burn-in test function
08/10/1999US5936900 Integrated circuit memory device having built-in self test circuit with monitor and tester modes
08/10/1999US5936899 Wafer burn-in test circuit of a semiconductor memory device
08/10/1999US5936876 Semiconductor integrated circuit core probing for failure analysis
08/10/1999US5936867 Method for locating critical speed paths in integrated circuits
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