Patents
Sitemap › G01 - Measuring; Testing › G01R - Measuring electric variables; Measuring magnetic variables › G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
11/1999
11/23/1999US5991908 Boundary scan chain with dedicated programmable routing
11/23/1999US5991907 Method for testing field programmable gate arrays
11/23/1999US5991906 Semiconductor integrated circuit device and its test method
11/23/1999US5991905 Process and device for testing a memory element
11/23/1999US5991903 Parallel bit test circuit for testing a semiconductor device in parallel bits
11/23/1999US5991898 Arithmetic built-in self test of multiple scan-based integrated circuits
11/23/1999US5991897 Diagnostic module dispatcher
11/23/1999US5991890 Device and method for characterizing signal skew
11/23/1999US5991888 Test clock modes
11/23/1999US5991677 Battery-driven working machine
11/23/1999US5991523 Method and system for HDL global signal simulation and verification
11/23/1999US5991522 Method and apparatus for circuit conversion for simulation, simulator using the same, and computer-readable medium with a program therefor stored thereon
11/23/1999US5991436 Apparatus and method for inspecting wirebonds on leads
11/23/1999US5991232 Clock synchronous memory embedded semiconductor integrated circuit device
11/23/1999US5991213 Short disturb test algorithm for built-in self-test
11/23/1999US5991212 Semi-conductor integrated circuit device having an external memory and a test method therefor
11/23/1999US5991137 Partial discharge coupler
11/23/1999US5990724 Method and a device for detecting and handling short-circuit phenomena for power semiconductor devices of turn-off type connected in series
11/23/1999US5990699 Method for detecting opens through time variant current measurement
11/23/1999US5990698 Test method and apparatus for semiconductor element
11/23/1999US5990696 Test fixture with self contained shorting means for testing small scale test packs
11/23/1999US5990692 Testing apparatus for non-packaged semiconductor chip
11/23/1999US5990691 Non-intrusive state observation of VLSI circuits using thermal actuation
11/23/1999US5990689 Device for detecting and locating anomalies in the electromagnetic protection of a system
11/23/1999US5990688 Apparatus and method for evaluation a condition of a magnetic circuit of an electric machine
11/23/1999US5990687 Measuring shield breaks in coaxial cable by a sheath test current
11/23/1999US5990686 Method and apparatus for locating resistive faults in communication and power cables
11/23/1999US5990664 Process and apparatus for modulating terminal voltage of battery
11/23/1999US5990663 Charge/discharge control circuit and charging type power-supply unit
11/23/1999US5990562 Semiconductor devices having backside probing capability
11/23/1999US5989039 Socket apparatus for testing package
11/18/1999WO1999059089A1 Noise checking method and device
11/18/1999WO1999059079A1 System and method for identifying finite state machines and verifying circuit designs
11/18/1999WO1999059051A1 Device and apparatus for detecting clock failure
11/18/1999WO1999058993A2 Integrated circuit with scan register chain
11/18/1999WO1999058992A2 A power cable monitoring system
11/18/1999WO1999050102A3 Method for operating a restraint system connected by a bus line in case of a short circuit
11/18/1999WO1999047941A3 Connection testing device for testing the electric connection between chips or chip modules
11/18/1999DE19920251A1 Measuring electric charge of electrochemical cell such as accumulator or battery
11/18/1999DE19902348A1 Ball raster array device to facilitate of reading input and output signals of integrated circuit mounted on printed circuit board
11/18/1999DE19855182A1 Test mode circuit for a micro controller
11/17/1999EP0957429A1 Detecting communication errors across a chip boundary
11/17/1999EP0956690A2 Emergency telephone with automatic low-battery signaling
11/17/1999EP0956500A1 Infrared screening and inspection system
11/17/1999EP0705501B1 Method and apparatus for testing telecommunications equipment using a reduced redundancy test signal
11/17/1999CN2349582Y Loading tester for three-phase asynchronous motor
11/17/1999CN1235419A Semiconductor device for setting delay time
11/17/1999CN1235352A Synchronous semiconductor storage device
11/16/1999US5987636 Static test sequence compaction using two-phase restoration and segment manipulation
11/16/1999US5987635 Semiconductor integrated circuit device capable of simultaneously performing self-test on memory circuits and logic circuits
11/16/1999US5987632 Method of testing memory operations employing self-repair circuitry and permanently disabling memory locations
11/16/1999US5987237 Framework for rules checking
11/16/1999US5986953 Input/output circuits and methods for testing integrated circuit memory devices
11/16/1999US5986917 Wafer burn-in test circuit for a semiconductor memory device
11/16/1999US5986860 Zone arc fault detection
11/16/1999US5986462 Auxiliary power unit tester
11/16/1999US5986460 BGA package semiconductor device and inspection method therefor
11/16/1999US5986459 Semiconductor device testing carrier and method of fixing semiconductor device to testing carrier
11/16/1999US5986458 Test head for semiconductor tester
11/16/1999US5986447 Test head structure for integrated circuit tester
11/16/1999US5986435 Method of utilizing a battery powered system having two processors
11/16/1999US5986345 Semiconductor device having two ground pads connected to a ground connection lead and method for testing the same
11/16/1999US5986282 Method of measuring electrical characteristics of semiconductor circuit in wafer state and semiconductor device for the same
11/16/1999US5986281 Circuit and method for predicting failure rates in a semiconductor device
11/16/1999US5984524 Apparatus and method for testing product heat-resistance
11/16/1999US5984522 Apparatus for inspecting bump junction of flip chips and method of inspecting the same
11/16/1999US5984079 Method and apparatus for loading electronic components
11/16/1999US5983493 Method of temporarily, then permanently, connecting to a semiconductor device
11/16/1999CA2188305C Self-powered powerline sensor
11/16/1999CA2091087C Communications system to boundary-scan logic interface
11/11/1999WO1999057633A1 Apparatus and method for creating and documenting procedures
11/11/1999WO1999057569A1 Method for testing an integrated circuit and corresponding integrated circuit
11/11/1999WO1999057567A2 Method and apparatus for protecting sensitive data during automatic testing of hardware
11/11/1999WO1999030172B1 Wideband isolation system
11/11/1999WO1999008116A3 A memory test system with a means for test sequence optimisation and a method of its operation
11/11/1999DE19914775A1 Guide hole arrangement in testing device of semiconductor integrated circuits
11/11/1999DE19820848A1 Apparatus for testing and packing of SMD/LED type electronic components
11/11/1999DE19820313A1 Verfahren zum Erkennen von Fehlern in einem Gleichstromkommutatormotor A method of detecting faults in a DC commutator
11/11/1999DE19809890C1 Vorrichtung zur Messung der Kapazität von elektrischen Adern Apparatus for measuring the capacitance of electrical wires
11/10/1999EP0955553A2 Apparatus and method for continuous monitoring of batteries
11/10/1999EP0955552A1 Method for recognizing faults in a direct current commutator motor
11/10/1999EP0955551A2 Testing of semiconductor device and a manufacturing process of a semiconductor device including a testing process
11/10/1999EP0955550A1 Method of detecting electrical discharges
11/10/1999EP0955547A2 Electro-optic sampling oscilloscope
11/10/1999EP0954822A1 Method of checking the authenticity of an electric circuit arrangement
11/10/1999EP0760954A4 Phase noise detector
11/10/1999EP0637036B1 Redundancy element check in IC memory without programming substitution of redundant elements
11/10/1999CN2348403Y Leakage protection switch detector
11/10/1999CN1234654A Digital to analog convertor and semiconductor integrated circuit using same, and detection method therefor
11/10/1999CN1234640A Electronic device for stimulating temp. rise in electric motor
11/10/1999CN1046350C System and method for testing accelerated degradation of semiconductor devices
11/09/1999US5983381 Partitioning and reordering methods for static test sequence compaction of sequential circuits
11/09/1999US5983380 Weighted random pattern built-in self-test
11/09/1999US5983379 Test access port controller and a method of effecting communication using the same
11/09/1999US5983378 Method tester and circuit for applying a pulse trigger to a unit to be triggered
11/09/1999US5983377 System and circuit for ASIC pin fault testing
11/09/1999US5983376 Automated scan insertion flow for control block design
11/09/1999US5983372 Failure counting method and device
11/09/1999US5983363 In-sheet transceiver testing
11/09/1999US5983277 Work group computing for electronic design automation
1 ... 1296 1297 1298 1299 1300 1301 1302 1303 1304 1305 1306 1307 1308 1309 1310 1311 1312 1313 1314 1315 1316 ... 1523