Patents
Sitemap › G01 - Measuring; Testing › G01R - Measuring electric variables; Measuring magnetic variables › G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
03/2000
03/21/2000US6041176 Emulation devices utilizing state machines
03/21/2000US6041168 High-speed delay verification apparatus and method therefor
03/21/2000US6041002 Semiconductor memory device and method of testing the same
03/21/2000US6040907 Microscope system for the detection of emission distribution and process for operation of the same
03/21/2000US6040778 Neon power supply with midpoint ground detection and diagnostic functions
03/21/2000US6040706 Contactor and semiconductor device inspecting method
03/21/2000US6040704 Probe unit and inspection head
03/21/2000US6040702 Carrier and system for testing bumped semiconductor components
03/21/2000US6040701 Thin profile vertically oriented probe adapter
03/21/2000US6040700 Semiconductor tester system including test head supported by wafer prober frame
03/21/2000US6040699 Mounting apparatus for vectorless testing
03/21/2000US6040691 Test head for integrated circuit tester arranging tester component circuit boards on three dimensions
03/21/2000US6040530 Versatile printed circuit board for testing processing reliability
03/21/2000US6040199 Semiconductor test structure for estimating defects at isolation edge and test method using the same
03/21/2000CA2034147C Device for detecting residual capacity of a battery both in load and no load conditions
03/16/2000WO2000014833A1 Socket for handler
03/16/2000WO2000014660A1 Method and arrangement for testing the stability of a working point of a circuit
03/16/2000WO2000014557A1 Locating underground power cable faults
03/16/2000WO2000014556A1 Terminator unit for wiring networks
03/16/2000WO2000014555A1 Diagnostic circuitry for measuring the resistance and leakage current of at least one electric consumer, especially a primer in a motor vehicle passenger protection system, and a passenger protection system fitted therewith
03/16/2000WO2000014554A1 Vehicle electrical circuit failure monitor
03/16/2000WO2000014476A1 Measurements using tunnelling current between elongate conductors
03/16/2000DE4143468C2 Rapid timing circuit providing test patterns for automatic testing appts.
03/16/2000DE19840944A1 Sicherheitsrelevantes System, insbesondere elektromechanisches Bremssystem Safety-relevant system, in particular electro-mechanical brake system
03/15/2000EP0986289A2 Layout and method of marking circuit substrates
03/15/2000EP0986217A2 Network transceiver for steering network data to selected paths based on determined link speeds
03/15/2000EP0986066A2 Ferroelectric memory and method of testing the same
03/15/2000EP0985933A2 Method and apparatus to measure far end crosstalk for the determination of equal level far end crosstalk
03/15/2000EP0985907A2 Fail-safe system, in particular an electromechanical braking system
03/15/2000EP0985175A1 Distributed logic analyzer for use in a hardware logic emulation system
03/15/2000EP0985155A1 Method and device for testing electronic equipment
03/15/2000EP0985154A1 Broadband impedance matching probe
03/15/2000EP0764352A4 Microelectronic contacts and assemblies
03/15/2000CN1247318A Assembly device for semiconductor components
03/15/2000CN1050475C Power generating equipment for vehicle
03/15/2000CN1050423C Visual inspection support appts. substrate inspection appts.
03/15/2000CN1050331C Assist device for electric vehicle
03/14/2000US6038691 Method of analyzing logic circuit test points, apparatus for analyzing logic circuit test points and semiconductor integrated circuit with test points
03/14/2000US6038521 Quality test system for electric appliances
03/14/2000US6038520 Method and apparatus for application's specific testing of assembled circuits
03/14/2000US6038515 Portable information terminal apparatus capable of correctly detecting power supply voltage
03/14/2000US6038336 PCB testing circuit for an automatic inserting apparatus and a testing method therefor
03/14/2000US6038183 Semiconductor memory device having burn-in mode operation stably accelerated
03/14/2000US6038182 Integrated circuit memory devices and testing methods including selectable input/output channels
03/14/2000US6038181 Efficient semiconductor burn-in circuit and method of operation
03/14/2000US6038180 Semiconductor memory capable of detecting memory cells with small margins as well as sense amplifier
03/14/2000US6038114 Motor controller having delta motor wiring error detection capability
03/14/2000US6038018 Substrate inspecting apparatus, substrate inspecting system having the same apparatus and substrate inspecting method
03/14/2000US6037818 High resolution delay circuit having coarse and fine delay circuits
03/14/2000US6037797 Measurement of the interface trap charge in an oxide semiconductor layer interface
03/14/2000US6037796 Current waveform analysis for testing semiconductor devices
03/14/2000US6037795 Multiple device test layout
03/14/2000US6037794 Semiconductor device testing apparatus and testing method thereof
03/14/2000US6037793 Inspecting method and apparatus for semiconductor integrated circuit
03/14/2000US6037792 Burn-in stress test mode
03/14/2000US6037791 Vision aided docking mechanism for semiconductor testers
03/14/2000US6037788 Docking station for automated test fixture
03/14/2000US6037782 Automatic adjustment of cables which aids in set-up of equipment under test for electromagnetic compatibility measurements
03/14/2000US6037781 Measurement of electrical characteristics of semiconductor wafer
03/14/2000US6037779 Bus isolation/diagnostic tool
03/14/2000US6037778 Electronic battery testing device and method for testing batteries
03/14/2000US6037777 Method and apparatus for determining battery properties from complex impedance/admittance
03/14/2000US6037764 Rotatable mechanical hold-down finger for holding a circuit board in a test fixture
03/14/2000US6037749 Battery monitor
03/14/2000US6037578 Integrated photosensor using test capacitor to test functioning of photosensor in the dark
03/14/2000US6036503 IC socket for a BGA package
03/14/2000US6036431 Parts handling method
03/14/2000US6036023 Heat-transfer enhancing features for semiconductor carriers and devices
03/14/2000CA2104725C Combination flashlight/lantern electrical continuity tester
03/09/2000WO2000013288A1 Battery charge measurement and discharge reserve time prediction technique and apparatus
03/09/2000WO2000013186A1 Method and system for timing control in the testing of rambus memory modules
03/09/2000WO2000013030A1 High resolution analytical probe station
03/09/2000WO2000005723A3 Integrated circuit comprising a self-test device for executing a self-test of the integrated circuit
03/09/2000DE19941129A1 Measuring attachment for structural element with integrated circuit; has several test points with top casing having cavity for structural element with integrated circuit and bottom casing having apertures for solid test pins
03/09/2000DE19940422A1 Sensor with capacitive element, e.g. for pressure or acceleration; has capacitive detection and reference elements and capacitance determination circuit to produce charge difference
03/09/2000DE19937820A1 Mixed IC tester used in testing mixed IC comprising of logic portion and memory portion
03/09/2000DE19840479A1 Strommessung in Pumpen Current measurement in pump
03/09/2000DE19838411A1 Method to identify faults of electric operating device; uses active power, distorting and displacement wattless powers, unsymmetrical actual and differential powers
03/09/2000DE19838407A1 Contact device, especially for testing electrical components, comprises dielectric-separated electrical connections for connecting contacts on both sides of translator and contact elements
03/09/2000DE19813503C1 Schaltungsanordnung zum Verhindern von bei Kontaktfehlern auftretenden falschen Ergebnissen beim Testen einer integrierten Schaltung A circuit arrangement for preventing contact failure occurring in incorrect results when testing an integrated circuit
03/08/2000EP0984479A1 Method and installation for fuse positioning inspection in a fuse box
03/08/2000EP0984292A2 Current measurements in pumps
03/08/2000EP0984291A1 Capture and conversion of mixed-signal test stimuli
03/08/2000EP0984290A1 Method of operating an integrated circuit
03/08/2000EP0984289A1 Partial discharge detector of gas-insulated apparatus
03/08/2000EP0984287A1 Oscilloscope probe having stored probe identification
03/08/2000EP0983562A1 Emulation system with time-multiplexed interconnect
03/08/2000EP0861442B1 Current measurement in turbogenerators
03/08/2000EP0823089B1 Automatic parallel electronic component testing method and equipment
03/08/2000EP0823088B1 Automatic parallel electronic component testing method and equipment
03/08/2000EP0820613B1 Automatic parallel electronic component testing method and equipment
03/08/2000EP0729585B1 A surface mount test point enabling hands free diagnostic testing of electronical circuits
03/08/2000EP0584087B1 Integrated test circuit for display devices such as liquid cristal displays
03/08/2000CN2368042Y Electric characteristics testing mechanism of printed circuit board
03/08/2000CN2368041Y Mixed wave-shape generator
03/08/2000CN1246737A Electronic device containing device for charging for batter device
03/08/2000CN1246618A Device for measuring battery charging capacity of battery truck and alarm device for capacity inadequate
03/08/2000CN1246617A Signal processing device with nonvolatile memory and programmed method of nonvolatile memory
03/08/2000CN1050238C Detector for monitoring integrity of ground connection of electrical appliance
03/07/2000US6035431 Semiconductor integrated circuit with test device
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