| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
|---|
| 04/04/2000 | US6046926 Ferroelectric memory and screening method therefor |
| 04/04/2000 | US6046803 Two and a half dimension inspection system |
| 04/04/2000 | US6046669 Fully testable CMOS comparator circuit with half-comparing stage |
| 04/04/2000 | US6046601 Method for measuring the kink effect of a semiconductor device |
| 04/04/2000 | US6046600 Process of testing integrated circuit dies on a wafer |
| 04/04/2000 | US6046599 Method and device for making connection |
| 04/04/2000 | US6046597 Test socket for an IC device |
| 04/04/2000 | US6046574 Battery dropout correction for battery monitoring in mobile unit |
| 04/04/2000 | US6046573 System for equalizing the level of charge in batteries |
| 04/04/2000 | US6046061 Method of inspecting wafer water mark |
| 04/04/2000 | US6046060 Method of making a high planarity, low CTE base for semiconductor reliability screening |
| 04/04/2000 | US6045382 Socket apparatus for IC packages |
| 04/04/2000 | US6045369 Device for mounting semiconductor package and method of fabricating same |
| 04/04/2000 | CA2137935C Trailer lamp function test device |
| 04/04/2000 | CA2059782C Generator rotor winding ground detection |
| 04/04/2000 | CA2049616C Contactless test method and system for testing printed circuit boards |
| 03/30/2000 | WO2000018204A1 Vertically actuated bga socket |
| 03/30/2000 | WO2000017853A2 Multi-pulse sampling of signals using force sampling |
| 03/30/2000 | WO2000017665A1 A method of and an apparatus for monitoring the condition of batteries used by a mobile radio telecommunications fleet |
| 03/30/2000 | WO2000017664A1 Method and device for testing capacitors integrated on a semiconductor chip |
| 03/30/2000 | WO2000017662A1 Testing device for modules |
| 03/30/2000 | WO2000017620A1 Vehicle diagnostics interface apparatus |
| 03/30/2000 | WO2000003259A3 Method and apparatus for distinguishing regions where a material is present on a surface |
| 03/30/2000 | WO2000003255A3 Device without set-up kit for the targeted moving of electronic components |
| 03/30/2000 | WO2000000839A9 Device for testing solar home systems |
| 03/30/2000 | DE19844069A1 Means for determining ageing or operation caused degradation in characteristics of high tension cable such as voltage loss and capacitance by recording measurements at various temperatures |
| 03/30/2000 | DE19843469A1 Verfahren und Vorrichtung zum Testen von auf einem Halbleiterchip integrierten Kondensatoren Method and device for testing integrated on a semiconductor chip capacitors |
| 03/30/2000 | DE19841715A1 Überwachungsverfahren und Überwachungsvorrichtung für ein Filter Monitoring method and apparatus for monitoring a filter |
| 03/30/2000 | DE19841002C1 Verfahren zur Diagnose eines Kurzschlusses an einem kapazitiven Stellglied A method for diagnosing a short-circuit of a capacitive actuator |
| 03/30/2000 | DE19840167A1 Electrical insulation testing of thin base material, for multilayer printed circuit board, applies voltage avoiding breakdown, then breakdown current measurement |
| 03/30/2000 | DE19836361C1 Integrated circuit contact point leakage current test method |
| 03/30/2000 | DE19836237C1 Method of measuring direction dependent saturated stray inductance in asynchronous motors using test pulses |
| 03/29/2000 | EP0989410A1 Method of and apparatus for designing a testable semiconductor integrated circuit |
| 03/29/2000 | EP0989409A1 Scan test machine for densely spaced test sites |
| 03/29/2000 | EP0988686A1 A device for supervising a high voltage converter station |
| 03/29/2000 | EP0988558A1 Low cost, easy to use automatic test system software |
| 03/29/2000 | EP0616335B1 Nonvolatile semiconductor memory device having a status register and test method for the same |
| 03/29/2000 | CN2371564Y Testing device set for electronic substrate |
| 03/29/2000 | CN2371563Y Baking tester for power supply device |
| 03/29/2000 | CN1248826A Method and apparatus for measuring far end interference in order to determine isoelectric level for end interference |
| 03/29/2000 | CN1050924C 半导体存储装置 The semiconductor memory device |
| 03/28/2000 | US6044331 Battery capacity measuring system employing a voltage-to-current approximated straight line |
| 03/28/2000 | US6044214 Fault simulation method operable at a high speed |
| 03/28/2000 | US6044025 PROM with built-in JTAG capability for configuring FPGAs |
| 03/28/2000 | US6043923 Modulator and electro-optic sensor equipped with the modulator |
| 03/28/2000 | US6043876 Method and apparatus for detecting a solder bridge in a ball grid array |
| 03/28/2000 | US6043780 Antenna adapter |
| 03/28/2000 | US6043672 Selectable power supply lines for isolating defects in integrated circuits |
| 03/28/2000 | US6043671 Semiconductor inspection device with guide member for probe needle for probe card and method of controlling the same |
| 03/28/2000 | US6043670 Method for testing integrated circuits |
| 03/28/2000 | US6043668 Planarity verification system for integrated circuit test probes |
| 03/28/2000 | US6043667 Substrate tester location clamping, sensing, and contacting method and apparatus |
| 03/28/2000 | US6043665 Capacitor charging current measurement method |
| 03/28/2000 | US6043664 Method and apparatus for turn fault detection in multi-phase AC motors |
| 03/28/2000 | US6043663 Coaxial cable test instruments |
| 03/28/2000 | US6043662 Detecting defects in integrated circuits |
| 03/28/2000 | US6043661 School bus and trailer systems tester |
| 03/28/2000 | US6043630 Fast battery charging system and method |
| 03/28/2000 | US6043563 Electronic components with terminals and spring contact elements extending from areas which are remote from the terminals |
| 03/28/2000 | US6043443 Fabrication of semiconductor devices |
| 03/28/2000 | US6043442 Handler contact checking device and a method of testing integrated circuit devices |
| 03/28/2000 | US6043101 In-situ multiprobe retest method with recovery recognition |
| 03/28/2000 | US6042712 Apparatus for controlling plating over a face of a substrate |
| 03/28/2000 | CA2179235C Built-in test scheme for a jitter tolerance test of a clock and data recovery unit |
| 03/28/2000 | CA2121471C Monitoring system for batteries during charge and discharge |
| 03/28/2000 | CA2002344C Measurement system control using real-time clocks and data buffers |
| 03/23/2000 | WO2000016515A1 Triggered clock signal generator |
| 03/23/2000 | WO2000016510A1 Signal conversion for fault isolation |
| 03/23/2000 | WO2000016428A1 Method and apparatus for measuring complex impedance of cells and batteries |
| 03/23/2000 | WO2000016115A1 Apparatus and method for determining the capacity of a nickel-cadmium battery |
| 03/23/2000 | WO2000016114A1 System and method for restricted reuse of intact portions of failed paths |
| 03/23/2000 | WO2000016108A1 Battery voltage detector |
| 03/23/2000 | WO2000016106A1 Checker head and method of manufacturing the checker head |
| 03/23/2000 | WO2000016088A1 Apparatus and method for detecting memory effect in nickel-cadmium batteries |
| 03/23/2000 | WO2000016083A1 Method and apparatus for determining battery properties from complex impedance/admittance |
| 03/23/2000 | WO2000015464A1 Electrical tell tale system for trailers |
| 03/23/2000 | WO2000015456A1 Monitoring method and monitoring device for a filter |
| 03/23/2000 | WO2000004620A3 System and method for monitoring a vehicle battery |
| 03/23/2000 | DE19919946A1 Reproducible and retractable electromagnetic interference source having programmable frequency source that can be contained in sealed container usable in test location either closed or partially open |
| 03/23/2000 | DE19843435A1 Burn-in test arrangement for semiconductor memory devices |
| 03/23/2000 | CA2344386A1 Apparatus and method for determining the capacity of a nickel-cadmium battery |
| 03/23/2000 | CA2343631A1 Apparatus and method for detecting memory effect in nickel-cadmium batteries |
| 03/22/2000 | EP0987634A1 Boundary scanning element and communication equipment using the same |
| 03/22/2000 | EP0987633A1 Communication system |
| 03/22/2000 | EP0987632A1 Boundary scan element and communication device made by using the same |
| 03/22/2000 | EP0987631A1 Communication equipment |
| 03/22/2000 | EP0987556A2 Device for measuring the diffusion length in semiconductor bodies |
| 03/22/2000 | EP0987555A2 Method of measuring quantities indicating state of electrochemical device and apparatus for the same |
| 03/22/2000 | EP0986762A2 Condition monitoring system for batteries |
| 03/22/2000 | EP0885380A4 Real time/off line applications testing system |
| 03/22/2000 | EP0663092B1 Robust delay fault built-in self-testing method and apparatus |
| 03/22/2000 | CN2370547Y High temperature aging table for capacitor |
| 03/22/2000 | CN1248325A Method and device for idneitfying system parameters stator resistance and rotor resistance of transmitter-free induction machine operated in field-oriented manner |
| 03/22/2000 | CN1248101A Semiconductor integrated circuit and its testing method |
| 03/22/2000 | CN1248063A Device for connection of test head and probe board in substrate-testing system |
| 03/22/2000 | CN1247988A Method for automatic measuring asynchronous machine rotor ohmic resistance |
| 03/21/2000 | US6041429 System for test data storage reduction |
| 03/21/2000 | US6041426 Built in self test BIST for RAMS using a Johnson counter as a source of data |
| 03/21/2000 | US6041378 Integrated circuit device and method of communication therewith |
| 03/21/2000 | US6041287 System architecture for on-line machine diagnostics |