| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 04/18/2000 | US6050836 Socket apparatus |
| 04/18/2000 | US6049977 Method of forming electrically conductive pillars |
| 04/18/2000 | US6049976 Method of mounting free-standing resilient electrical contact structures to electronic components |
| 04/18/2000 | CA2100651C Fault indicator with remote indication |
| 04/16/2000 | CA2273526A1 On-line detection of partial discharge in electrical power systems |
| 04/13/2000 | WO2000020879A1 Imaging using spatial frequency filtering and masking |
| 04/13/2000 | WO2000020878A1 Motor winding contamination detector and detection |
| 04/13/2000 | WO2000020877A1 Improved safety high voltage test method and equipment |
| 04/13/2000 | WO2000020876A1 Communication network |
| 04/13/2000 | WO2000003252A3 Multi-point probe |
| 04/13/2000 | WO1999039354A3 Event phase modulator for integrated circuit tester |
| 04/13/2000 | DE19948530A1 Programme-generating device for semiconductor test meters; enables user to generate program by selection from appropriate menus |
| 04/13/2000 | DE19944911A1 Waveform generator for producing arbitrary waveforms used in testing semiconductor devices uses an input terminal coupled to a delay unit, a processor and a composition unit |
| 04/13/2000 | DE19920842A1 Determining motor vehicle generator power reserve by calculation of instantaneous maximum power available and comparison with instantaneous power being drawn |
| 04/13/2000 | DE19845064A1 Halbleiterschaltkreis mit integrierter Selbsttestschaltung Semiconductor circuit with integrated self-test circuit |
| 04/13/2000 | DE19844428A1 Prüfsonde für einen Fingertester Probe for a finger tester |
| 04/13/2000 | DE19842540A1 Ohmic rotor impedance measurement method for asynchronous machine, involves applying test signal with ac component of frequency corresponding to slip frequency |
| 04/12/2000 | EP0993243A2 Method and system for thermal coupling an electronic device to a heat exchange member |
| 04/12/2000 | EP0993035A1 Probe device |
| 04/12/2000 | EP0992810A2 Burn-in testing device |
| 04/12/2000 | EP0992809A1 Circuit with deactivatable scan path |
| 04/12/2000 | EP0992808A2 Integrated circuit with two modes of operation |
| 04/12/2000 | EP0992807A2 Method and apparatus for board model correction |
| 04/12/2000 | EP0992806A2 Method and apparatus for canceling errors induced by the measurement system during circuit test |
| 04/12/2000 | EP0992805A2 Method and apparatus for correcting for detector inaccuracies in limited access testing |
| 04/12/2000 | EP0992804A2 Method and apparatus for selecting stimulus locations during limited access circuit test |
| 04/12/2000 | EP0992803A2 Method and apparatus for limited access circuit test |
| 04/12/2000 | EP0992802A2 Method and apparatus for selecting targeted components in limited access test |
| 04/12/2000 | EP0992801A2 Method and apparatus for determining the state of an on-board network in a motor vehicle |
| 04/12/2000 | EP0992800A1 Apparatus and method for measuring the resonance frequency of an electric circuit |
| 04/12/2000 | EP0992115A2 Testable ic having analog and digital circuits |
| 04/12/2000 | EP0992100A2 Device and system for management of battery back up power source |
| 04/12/2000 | EP0991996A1 Jitter reduction module |
| 04/12/2000 | EP0901695A4 Connectors for microelectronic elements |
| 04/12/2000 | EP0792486B1 Test apparatus/method for level sensitive scan designs |
| 04/12/2000 | CN1250524A A device for sensing electric discharges in test object, preferably a cable joint |
| 04/11/2000 | US6049901 Test system for integrated circuits using a single memory for both the parallel and scan modes of testing |
| 04/11/2000 | US6049900 Automatic parallel electronic component testing method and equipment |
| 04/11/2000 | US6049898 Failure-data storage system |
| 04/11/2000 | US6049895 Failure analyzer with distributed data processing network and method used therein |
| 04/11/2000 | US6049870 System and method for identifying and configuring modules within a digital electronic device |
| 04/11/2000 | US6049740 Printed circuit board testing system with page scanner |
| 04/11/2000 | US6049662 System and method for model size reduction of an integrated circuit utilizing net invariants |
| 04/11/2000 | US6049660 Simulation method in lithographic process |
| 04/11/2000 | US6049220 Apparatus and method for evaluating a wafer of semiconductor material |
| 04/11/2000 | US6049219 Signal probing of microwave integrated circuit internal nodes |
| 04/11/2000 | US6049218 Semiconductor device having embedded test device for testing design specifications |
| 04/11/2000 | US6049216 Contact type prober automatic alignment |
| 04/11/2000 | US6049215 Bare die carrier |
| 04/11/2000 | US6049214 Universal printed circuit board inspection apparatus, and method of using same |
| 04/11/2000 | US6049213 Method and system for testing the reliability of gate dielectric films |
| 04/11/2000 | US6049210 Device for displaying remaining battery capacity |
| 04/11/2000 | US6049203 Apparatus and method for testing an inker of the semiconductor wafer probe station |
| 04/11/2000 | US6049139 Method and apparatus for detecting abnormality of cable having electrical conduction line surrounding power supply line used in car |
| 04/11/2000 | US6048746 Method for making die-compensated threshold tuning circuit |
| 04/11/2000 | US6048744 Integrated circuit package alignment feature |
| 04/11/2000 | US6048572 That may be integrated into a label of battery. |
| 04/11/2000 | US6047599 Drawer style fixture with integral RF door |
| 04/11/2000 | CA2224340C Portable device battery technique |
| 04/11/2000 | CA2108538C Digital circuit design assist system for designing hardware units and software units in a desired circuit and method thereof |
| 04/06/2000 | WO2000019775A1 Wafer level burn-in and test thermal chuck and method |
| 04/06/2000 | WO2000019578A1 Method and apparatus for monitoring and maintaining a plurality of batteries using a fuzzy logic |
| 04/06/2000 | WO2000019225A1 Method and apparatus for automotive and other battery testing |
| 04/06/2000 | WO2000019224A1 Circuit configuration with a scan path that can be deactivated |
| 04/06/2000 | WO2000019223A1 Low redesign application-specific module |
| 04/06/2000 | WO2000019222A2 Semiconductor switching circuit with an integrated self-testing circuit |
| 04/06/2000 | WO2000019221A1 Method and device for locating an insulation fault in an electric cable |
| 04/06/2000 | WO2000019220A1 Apparatus for testing multi-terminal electronic components |
| 04/06/2000 | WO2000019215A1 Thermal isolation plate for probe card |
| 04/06/2000 | WO2000004671A9 Method and apparatus for identifying and tracking connections of communication lines |
| 04/06/2000 | WO2000003257A9 Thermal platform and method |
| 04/06/2000 | WO1999035505A3 Method for removing accumulated solder from probe card probing features |
| 04/06/2000 | DE19940232A1 Burn-in rack test device for testing assembled computers; has simple network management protocol switching device with ports connected to work cells by cables |
| 04/06/2000 | DE19842208A1 Integrierter Schaltkreis mit zwei Betriebszuständen Integrated circuit having two operating states |
| 04/06/2000 | CA2312131A1 Method and apparatus for automotive and other battery testing |
| 04/05/2000 | EP0990918A2 Device and method for nondestructive inspection on semiconductor device |
| 04/05/2000 | EP0990917A1 Test method of the output connection of at least one power circuit for plasma display and power circuit for its implementation |
| 04/05/2000 | EP0990916A1 Method of diagnosing deterioration of electric power cable |
| 04/05/2000 | EP0990915A2 Testing appliance for a connector with cable |
| 04/05/2000 | EP0990912A2 Test probe actuator |
| 04/05/2000 | EP0990167A1 Battery measuring terminal |
| 04/05/2000 | EP0990166A1 Integrated circuit tester including at least one quasi-autonomous test instrument |
| 04/05/2000 | EP0990165A1 Virtual channel data distribution system for integrated circuit tester |
| 04/05/2000 | EP0990164A1 Method and device for monitoring a cable |
| 04/05/2000 | EP0990163A4 Reusable die carrier for burn-in and burn-in process |
| 04/05/2000 | EP0990163A1 Reusable die carrier for burn-in and burn-in process |
| 04/05/2000 | EP0990150A1 Detecting a bad cell in a storage battery |
| 04/05/2000 | CN1249535A Device and method for nondestructive inspection of semiconductor device |
| 04/05/2000 | CN1249534A Method and system for testing IC in wafer stage |
| 04/05/2000 | CN1249435A Failure recorder of electric power system |
| 04/05/2000 | CN1051173C Electronic apparatus including battery arrangement and discharging arrangement |
| 04/04/2000 | US6047394 Circuit for easily testing a logic circuit having a number of input-output pins by scan path |
| 04/04/2000 | US6047393 Memory testing apparatus |
| 04/04/2000 | US6047387 Simulation system for testing and displaying integrated circuit's data transmission function of peripheral device |
| 04/04/2000 | US6047293 System for storing and searching named device parameter data in a test system for testing an integrated circuit |
| 04/04/2000 | US6047243 Method for quantifying ultra-thin dielectric reliability: time dependent dielectric wear-out |
| 04/04/2000 | US6047119 Method for tracking, analyzing and responding to lightning service interruptions using LCM technology |
| 04/04/2000 | US6047114 Method of constructing testing procedures for analog circuits by using fault classification tables |
| 04/04/2000 | US6046955 Semiconductor memory device with testable spare columns and rows |
| 04/04/2000 | US6046947 Integrated circuit memory devices having direct access mode test capability and methods of testing same |