| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 05/02/2000 | US6057691 Delay element testing apparatus and integrated circuit having testing function for delay elements |
| 05/02/2000 | US6057688 Residual capacity detecting apparatus for an electric vehicle's battery and a related residual capacity measuring method |
| 05/02/2000 | US6057679 Integrated circuit tester having amorphous logic for real-time data analysis |
| 05/02/2000 | US6057677 Electrooptic voltage waveform measuring method and apparatus |
| 05/02/2000 | US6056627 Probe cleaning tool, probe cleaning method and semiconductor wafer testing method |
| 05/02/2000 | US6056499 Lifting device and end effector for holding a circuit board test fixture |
| 05/02/2000 | US6056384 Failure diagnosing circuit and method |
| 04/27/2000 | WO2000023810A1 Battery pack having a state of charge indicator |
| 04/27/2000 | WO2000023809A1 Integrated multi-channel analog test instrument architecture |
| 04/27/2000 | WO1999064879A9 A method and apparatus for finding and locating manufacturing defects on a printed circuit board |
| 04/27/2000 | DE19950821A1 Evaluation system for large-scale integrated circuits uses a CAD logic process with the test circuit layout data to generate data for comparison with data arising from input of test data from a test data file |
| 04/27/2000 | DE19950536A1 Circuit for test board of burn-in test system, judges quality of device for comparing output signal with test signal based on run time difference data which are stored corresponding to each type of test signal |
| 04/27/2000 | DE19950347A1 Pattern generator for high speed testing of semiconductor circuits by generation and addressing of odd and even data and its delivery to the test component |
| 04/27/2000 | DE19946738A1 Electrical connection test device for printed circuit board; obtains multiple delta-Z X-ray images by varying Z-axis distances and compares the variance of gradients of the images |
| 04/27/2000 | DE19849055A1 Process for the continuous monitoring and control of the charge state of a traction battery for use in automobile hybrid drive systems has means for displaying battery charge state with reference to upper and lower charge limits |
| 04/27/2000 | DE19849020A1 Vorrichtung und Verfahren zum Orten von Störstellen in elektrischen Verteilnetzen Apparatus and method for locating defects in electric distribution systems |
| 04/27/2000 | CA2349570A1 Battery pack having a state of charge indicator |
| 04/27/2000 | CA2286473A1 Fault insertion method, boundary scan cells, and integrated circuit for use therewith |
| 04/26/2000 | EP0996244A2 Device and method for location of interference sources in electrical distribution networks |
| 04/26/2000 | EP0995999A2 Arbitrary waveform generator |
| 04/26/2000 | EP0995998A2 Chamber for an IC module handler |
| 04/26/2000 | EP0995997A1 Apparatus for detecting trouble with solenoid-operated device |
| 04/26/2000 | EP0995226A1 Heat-transfer enhancing features for semiconductor carriers and devices |
| 04/26/2000 | CN2375968Y Speed detecting circuit device for brushless fan |
| 04/26/2000 | CN2375967Y Far-end detector of positioning system for oil-field electric network fault |
| 04/26/2000 | CN1251655A Telescope tester structure with I-cached SIMD technology |
| 04/26/2000 | CN1251654A Method and device for detecting and locating irregularities in insulating covering |
| 04/26/2000 | CN1251425A Combined testing system and testing method using same |
| 04/25/2000 | US6055661 System configuration and methods for on-the-fly testing of integrated circuits |
| 04/25/2000 | US6055659 Boundary scan with latching output buffer and weak input buffer |
| 04/25/2000 | US6055658 Apparatus and method for testing high speed components using low speed test apparatus |
| 04/25/2000 | US6055657 Test board for testing IC devices operating in merged data output mode or standard mode |
| 04/25/2000 | US6055656 Control register bus access through a standardized test access port |
| 04/25/2000 | US6055655 Semiconductor integrated circuit device and method of testing the same |
| 04/25/2000 | US6055644 Multi-channel architecture with channel independent clock signals |
| 04/25/2000 | US6055463 Control system and method for semiconductor integrated circuit test process |
| 04/25/2000 | US6055209 Synchronous semiconductor memory device exhibiting an operation synchronous with an externally inputted clock signal |
| 04/25/2000 | US6055200 Variable test voltage circuits and methods for ferroelectric memory devices |
| 04/25/2000 | US6054931 Self-identifying circuit breaker |
| 04/25/2000 | US6054869 Bi-level test fixture for testing printed circuit boards |
| 04/25/2000 | US6054865 Multiple function electrical safety compliance analyzer |
| 04/25/2000 | US6054864 In-circuit capacitor checker |
| 04/25/2000 | US6054863 System for testing circuit board integrity |
| 04/25/2000 | US6054861 Apparatus for monitoring power of battery to supply electric power to load |
| 04/25/2000 | US6054849 Electrical testing device |
| 04/25/2000 | US6054843 High speed battery charging system with high accuracy voltage sensing |
| 04/25/2000 | US6054841 Charge/discharge control circuit and chargeable electric power source apparatus |
| 04/25/2000 | US6054840 Power supply device |
| 04/25/2000 | US6054720 Apparatus and method for evaluating the surface insulation resistance of electronic assembly manufacture |
| 04/25/2000 | US6054234 Battery tester label for battery |
| 04/24/2000 | WO2000049420A1 Current measuring device and corresponding method |
| 04/20/2000 | WO2000022445A1 Test socket |
| 04/20/2000 | WO2000022443A1 Improving multi-chip module testability using poled-polymer interlayer dielectrics |
| 04/20/2000 | WO2000004585A3 Chip carrier device and method for the production of a chip carrier device with an electrical test |
| 04/20/2000 | DE19951205A1 Test pattern generator for high-speed semiconductor memory test, generating test patterns based on control instructions read from address produced by address expander |
| 04/20/2000 | DE19948388A1 Testing memory embedded in integrated circuit chip including microprocessor by generating memory test pattern based on object code of assembler test program |
| 04/20/2000 | DE19947441A1 Test system for electric parts, comprising notification unit which notifies host computer if all auxiliary processors produce interrupt signals |
| 04/20/2000 | DE19945665A1 Receiver for determining length and quality of cable in digital data transmission system, has cable processor which calculates cable length based on amplification factor of variable amplifier |
| 04/20/2000 | DE19847648A1 Verfahren zur Bestimmung des Ladezustandes und der Hochstrombelastbarkeit von Batterien A method for determining the state of charge and peak current loadability of batteries |
| 04/20/2000 | DE19845562C1 Method to determine on-board network state of vehicle; involves evaluating instantaneous or time-averaged voltage from which transient alterations has been filtered as battery voltage, and assessing whether this reaches critical threshold |
| 04/20/2000 | DE19845409A1 Schnelle Bestimmung des Flush-Delays bei Chips mit LSSD-Design Rapid determination of the flush delays in chips with LSSD design |
| 04/20/2000 | DE19845108A1 Method of determining charged-device model test data for electronic housing components |
| 04/20/2000 | DE19839677C1 Length measuring device for electrical line using pulse echo method, such as for energy or communications line network, has complex 2-pole network matched to supplied pulse duration used as end termination |
| 04/19/2000 | EP0994645A2 Temperature control system for an electronic device in which device temperature is estimated from heater temperature and heat sink temperature |
| 04/19/2000 | EP0994548A2 Distance relay |
| 04/19/2000 | EP0994362A2 Method for determining the load state and the high current bearing capacity of batteries |
| 04/19/2000 | EP0994361A2 Fast calculaton of the flush delay on chips with LSSD design |
| 04/19/2000 | EP0994360A2 Method and apparatus for selecting test point nodes for limited access circuit test |
| 04/19/2000 | EP0994359A2 Test adapter |
| 04/19/2000 | EP0994328A2 Electronic parts checking apparatus |
| 04/19/2000 | EP0834124A4 Parallel testing of cpu cache and instruction units |
| 04/19/2000 | CN2374861Y Electronic detecting instrument for motor fault |
| 04/19/2000 | CN2374856Y Integrated detecting instrument for oil-way and circuit fault of motor vehicle |
| 04/19/2000 | CN1251256A Method and device for gauging device for producing electrical components |
| 04/19/2000 | CN1251208A Photoelectric conversion integrated circuit device |
| 04/19/2000 | CN1251016A Method for checking soft printing circuit |
| 04/19/2000 | CN1250964A Range relay device |
| 04/19/2000 | CN1250872A Automatic determination of position of arrangement in use of measuring |
| 04/18/2000 | US6052811 Method and apparatus for locating critical speed paths in integrated circuits using JTAG protocol |
| 04/18/2000 | US6052810 Differential driver circuit for use in automatic test equipment |
| 04/18/2000 | US6052809 Method for generating test patterns |
| 04/18/2000 | US6052808 Maintenance registers with Boundary Scan interface |
| 04/18/2000 | US6052807 Multiple probe test equipment with channel identification |
| 04/18/2000 | US6052806 Method and apparatus for testing an integrated circuit device |
| 04/18/2000 | US6052653 Spreading resistance profiling system |
| 04/18/2000 | US6052320 Integrated circuit memory devices having highly integrated merged data test capability and methods of testing same |
| 04/18/2000 | US6052170 Inspectable liquid-crystal display panel and method of inspecting same |
| 04/18/2000 | US6052053 Continuous monitoring system |
| 04/18/2000 | US6051987 Apparatus and method for detection of residual magnetic fields in dynamoelectric machines |
| 04/18/2000 | US6051986 Method of testing a transistor |
| 04/18/2000 | US6051984 Wafer-level method of hot-carrier reliability test for semiconductor wafers |
| 04/18/2000 | US6051983 Positive side support test assembly |
| 04/18/2000 | US6051980 Pulse width modulation simulator for testing insulating materials |
| 04/18/2000 | US6051979 System and method for detecting shorts, opens and connected pins on a printed circuit board using automatic test equipment |
| 04/18/2000 | US6051978 TDR tester for x-y prober |
| 04/18/2000 | US6051976 Method and apparatus for auditing a battery test |
| 04/18/2000 | US6051968 Test board provided with a capacitor charging circuit and related test method |
| 04/18/2000 | US6051957 Battery pack having a state of charge indicator |
| 04/18/2000 | US6051828 Light emission noise detection and characterization |
| 04/18/2000 | US6051442 CMOS integrated circuit device and its inspecting method and device |