| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 05/11/2000 | DE19954041A1 Ball grid array measuring device for integrated circuit (IC) component uses spring biased test pins contained in angled bores in measuring device housing mounted on circuit board |
| 05/11/2000 | DE19943941A1 Programmierbare JTAG-Netzwerkarchitektur zum Unterstützen eines proprietären Debug-Protokolls Programmable JTAG network architecture for supporting a proprietary debug log |
| 05/11/2000 | DE19849580A1 Measuring available effective power or source reflection factor at reference impedance of signal generator involves measuring three or more load reflection factors and respective effective powers delivered by signal generator |
| 05/11/2000 | DE19843432C1 Driver characteristics evaluation method for IC driver circuit |
| 05/10/2000 | EP0999635A1 Power supply monitoring ic and battery pack |
| 05/10/2000 | EP0999634A1 Power supply monitoring integrated circuit device and battery pack |
| 05/10/2000 | EP0999451A2 Connecting apparatus, method of fabricating wiring film with holder, inspection system and method of fabricating semiconductor element |
| 05/10/2000 | EP0999450A1 Modular interface between test and application equipment |
| 05/10/2000 | EP0998778A1 Fault-tolerant battery system employing intra-battery network architecture |
| 05/10/2000 | EP0998692A1 Liquid crystal display and battery label including a liquid crystal display |
| 05/10/2000 | EP0998680A1 Thermochromic battery testers |
| 05/10/2000 | EP0864153B1 Device and method for programming high impedance states upon select input/output pads |
| 05/10/2000 | EP0711447B1 Programmable logic device with verify circuitry for classifying fuse link states as validly closed, validly open or invalid |
| 05/10/2000 | EP0698273B1 Memory iddq-testable through cumulative word line activation |
| 05/10/2000 | CN2377687Y Motor device having display of cell capacity |
| 05/10/2000 | CN2377541Y Arrangement for testing DC resistance between commutator segments of armature |
| 05/10/2000 | CN2377540Y Automotive electrical system test pencil |
| 05/10/2000 | CN2377539Y Test pencil |
| 05/10/2000 | CN1252894A BGA connector with heat activated connection and disconnection means |
| 05/10/2000 | CN1252583A Device for detecting electronic storage card |
| 05/10/2000 | CN1252526A Method and apparatus for detecting electric box condition of automobile |
| 05/10/2000 | CN1052308C Method and device for testing of an integrated circuit |
| 05/10/2000 | CN1052307C Testing device for reverse plug-in capacitor on detecting test board |
| 05/10/2000 | CN1052306C Field transmitter built-in test equipment |
| 05/09/2000 | US6061819 Generation of reproducible random initial states in RTL simulators |
| 05/09/2000 | US6061818 Altering bit sequences to contain predetermined patterns |
| 05/09/2000 | US6061817 Method and apparatus for generating test pattern for sequence detection |
| 05/09/2000 | US6061816 Timing generator for testing semiconductor storage devices |
| 05/09/2000 | US6061815 Programming utility register to generate addresses in algorithmic pattern generator |
| 05/09/2000 | US6061814 Test circuitry for determining the defect density of a semiconductor process as a function of individual metal layers |
| 05/09/2000 | US6061813 Memory test set |
| 05/09/2000 | US6061639 Battery capacity measuring device |
| 05/09/2000 | US6061638 Microprocessor-based battery tester system |
| 05/09/2000 | US6061511 Reconstruction engine for a hardware circuit emulator |
| 05/09/2000 | US6061507 Scheduling diagnostic testing of automated equipment for testing integrated circuit devices |
| 05/09/2000 | US6061466 Apparatus and method for inspecting an LSI device in an assembling process, capable of detecting connection failure of individual flexible leads |
| 05/09/2000 | US6061393 Non-invasive digital cable test system |
| 05/09/2000 | US6061284 Core test control |
| 05/09/2000 | US6061283 Semiconductor integrated circuit evaluation system |
| 05/09/2000 | US6061282 Semiconductor memory having an improved test circuit |
| 05/09/2000 | US6061006 Apparatus for sensing RF current delivered to a plasma with two inductive loops |
| 05/09/2000 | US6060924 Semiconductor integrated circuit which contains scan circuits of different types |
| 05/09/2000 | US6060900 Method for measuring current density in a semiconductor device with kink effect |
| 05/09/2000 | US6060899 Semiconductor device with test circuit |
| 05/09/2000 | US6060898 Format sensitive timing calibration for an integrated circuit tester |
| 05/09/2000 | US6060897 Testability method for modularized integrated circuits |
| 05/09/2000 | US6060896 Super-voltage circuit with a fast reset |
| 05/09/2000 | US6060895 Wafer level dielectric test structure and related method for accelerated endurance testing |
| 05/09/2000 | US6060894 Temporary package, method and system for testing semiconductor dice having backside electrodes |
| 05/09/2000 | US6060893 Carrier having slide connectors for testing unpackaged semiconductor dice |
| 05/09/2000 | US6060892 Probe card attaching mechanism |
| 05/09/2000 | US6060891 Probe card for semiconductor wafers and method and system for testing wafers |
| 05/09/2000 | US6060890 Apparatus and method for measuring the length of a transmission cable |
| 05/09/2000 | US6060879 Current magnitude sensing circuit |
| 05/09/2000 | US6060864 Battery set structure and charge/discharge control apparatus for lithium-ion battery |
| 05/09/2000 | US6060862 Rechargeable electronic apparatus |
| 05/09/2000 | US6060781 Semiconductor device |
| 05/09/2000 | US6060185 Comprising a battery voltage-monitoring means, an overcharge-detecting means for sending out a charge-finishing signal when a voltage detected by the battery voltage-detecting means is higher than a preset value |
| 05/09/2000 | US6059451 Method for improving fault coverage of an electric circuit |
| 05/04/2000 | WO2000025425A1 Method and apparatus for logic synchronization |
| 05/04/2000 | WO2000025195A1 Electronic device, control circuit for electronic device, and method of controlling electronic device |
| 05/04/2000 | WO2000025145A1 Method for analyzing an electromagnetic field of a rotating machine and device for analyzing an electromagnetic field |
| 05/04/2000 | WO2000025144A1 Remote test module for automatic test equipment |
| 05/04/2000 | WO2000025143A1 Integrated circuit tester with disk-based data streaming |
| 05/04/2000 | WO2000025141A1 High density printed circuit board |
| 05/04/2000 | WO2000003074A8 Plating device |
| 05/04/2000 | DE19952272A1 System with test device for testing components embedded on integrated circuit (IC), such as system-chip circuit uses hardware in IC itself with only minimum additional hardware needed for testing process |
| 05/04/2000 | DE19951750A1 Test system for multiple memory integrated circuit has device for sequential selection of test circuits and hence reduction in overall testing time |
| 05/04/2000 | DE19951534A1 Integrated semiconductor circuit with large capacity memory with reduced packing size a number for testing patterns |
| 05/04/2000 | DE19946112A1 Electron beam test device and adjustment for testing electronic devices accurately determines slice level of S-curve used in determination of secondary electron current |
| 05/04/2000 | DE19941110A1 Vereinheitlichtes Testsystem und Testverfahren mit Verwendung selbiges Unified Test System and method using selbiges |
| 05/04/2000 | DE19847821A1 Modular frame for testing groups of cable as found in vehicle wiring arrangements has adjustable support elements, a base plate, and a top assembly frame |
| 05/04/2000 | DE19847146A1 Testadapter Test Adapter |
| 05/04/2000 | DE19846163A1 Electrical isolation test device for domestic appliances has connector for making simultaneous connections between three-phase connectors and neutral while measuring resistance between neutral and earth |
| 05/03/2000 | EP0998041A2 Variable delay circuit |
| 05/03/2000 | EP0998007A1 Integrated circuit device for monitoring power supply |
| 05/03/2000 | EP0997742A2 State-of-charge-measurable batteries |
| 05/03/2000 | EP0997741A2 Carrier for an integrated circuit module handler |
| 05/03/2000 | EP0997740A1 Test appliance for electronic memory cards |
| 05/03/2000 | EP0997739A2 Apparatus for testing of single leads |
| 05/03/2000 | EP0996956A1 Overvoltage protector for high or medium voltage |
| 05/03/2000 | EP0812428A4 Method and apparatus for combining writes to memory |
| 05/03/2000 | CN1252131A Optical driver, optical output type voltage sensor and IC tester using them |
| 05/03/2000 | CA2251511A1 Aa laser scan |
| 05/02/2000 | US6058502 Diagnostic system analyzing frequency spectrum of electric power for diagnosing integrated circuit, method and information storage medium storing computer program for the method |
| 05/02/2000 | US6058497 Testing and burn-in of IC chips using radio frequency transmission |
| 05/02/2000 | US6058496 Self-timed AC CIO wrap method and apparatus |
| 05/02/2000 | US6058495 Multi-bit test circuit in semiconductor memory device and method thereof |
| 05/02/2000 | US6058492 Method and apparatus for design verification using emulation and simulation |
| 05/02/2000 | US6058486 Timing generator for plural reference clock frequencies |
| 05/02/2000 | US6058255 JTAG instruction decode test register and method |
| 05/02/2000 | US6058057 Timing generator for semiconductor test system |
| 05/02/2000 | US6057716 Inhibitable continuously-terminated differential drive circuit for an integrated circuit tester |
| 05/02/2000 | US6057706 Field programmable gate array with integrated debugging facilities |
| 05/02/2000 | US6057701 Constant resistance deep level transient spectroscopy (CR-DLTS) system and method, averging methods for DLTS, and apparatus for carrying out the methods |
| 05/02/2000 | US6057699 Built-in frequency test circuit for testing the frequency of the output of a frequency generating circuit |
| 05/02/2000 | US6057698 Test system for variable selection of IC devices for testing |
| 05/02/2000 | US6057696 Apparatus, method and kit for aligning an integrated circuit to a test socket |
| 05/02/2000 | US6057695 Method and apparatus for automated docking of a test head to a device handler |
| 05/02/2000 | US6057694 Testing method including the removal of insulative films for electrical contact and apparatus therefor |