| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 05/24/2000 | EP1002238A1 Instrument for measuring and sorting resistors and method therefor |
| 05/24/2000 | CN2379810Y Device for on-line monitoring and locating locally discharging near high voltage electric appliance |
| 05/24/2000 | CN1254417A Leakage current correction circuit |
| 05/24/2000 | CN1254416A Partial discharge detector of gas-insulated apparatus |
| 05/23/2000 | US6067652 Tester-compatible timing translation system and method using time-set partnering |
| 05/23/2000 | US6067651 Test pattern generator having improved test sequence compaction |
| 05/23/2000 | US6067650 Method and apparatus for performing partial unscan and near full scan within design for test applications |
| 05/23/2000 | US6067649 Method and apparatus for a low power self test of a memory subsystem |
| 05/23/2000 | US6067648 Programmable pulse generator |
| 05/23/2000 | US6067628 Method to monitor universal serial bus hub overcurrent |
| 05/23/2000 | US6067610 Method and data processor for synchronizing multiple masters using multi-bit synchronization indicators |
| 05/23/2000 | US6067507 Method in an integrated circuit (IC) manufacturing process for identifying and redirecting IC's mis-processd during their manufacture |
| 05/23/2000 | US6067263 Dynamic random access memory circuit having a testing system and method to determine the sensitivity of a sense amplifier |
| 05/23/2000 | US6067261 Timing of wordline activation for DC burn-in of a DRAM with the self-refresh |
| 05/23/2000 | US6067255 Merged memory and logic (MML) integrated circuits including independent memory bank signals and methods |
| 05/23/2000 | US6067153 Pattern defect inspecting apparatus |
| 05/23/2000 | US6067101 Power source circuit having charge function and recording apparatus |
| 05/23/2000 | US6066957 Floating spring probe wireless test fixture |
| 05/23/2000 | US6066956 Inspection method and wiring current observation method for semiconductor device |
| 05/23/2000 | US6066953 Architecture for RF signal automatic test equipment |
| 05/23/2000 | US6066951 External light tester |
| 05/23/2000 | US6066946 Semiconductor device having ringing preventive circuit for removing noise from an output source |
| 05/23/2000 | US6066822 Semiconductor device testing apparatus and semiconductor device testing system having a plurality of semiconductor device testing apparatus |
| 05/23/2000 | CA2141624C Lift truck diagnostics |
| 05/18/2000 | WO2000028707A1 Point-to-point link implemented over a broadcast network |
| 05/18/2000 | WO2000028691A2 Multi-pair gigabit ethernet transceiver |
| 05/18/2000 | WO2000028663A2 Fir filter structure with low latency for gigabit ethernet applications |
| 05/18/2000 | WO2000028635A1 Method and device for detecting the disconnection of a fuse |
| 05/18/2000 | WO2000028399A1 Protection circuit for an integrated circuit |
| 05/18/2000 | WO2000028341A2 Dynamic register with low clock rate testing capability |
| 05/18/2000 | WO2000028340A1 Analog clock module |
| 05/18/2000 | WO2000028339A1 Method and apparatus for wireless radio frequency testing of rfid integrated circuits |
| 05/18/2000 | WO2000004582A8 Temperature control of electronic devices using power following feedback |
| 05/18/2000 | DE19955380A1 Test pattern generator for testing electrical characteristics of electrical device; uses read control and transfer control to extract test pattern from master memory and enter it in cache memory |
| 05/18/2000 | DE19953166A1 Multiple stacker for handling device, with stacking frame, container stacking sector, test plate position checking guide and up and down movement device |
| 05/18/2000 | DE19945080A1 Component handling device for integrated circuit chip, has controller to drive pressure cylinder when waiting time, after interrupt signal generation, exceeds a predetermined value |
| 05/18/2000 | DE19908157A1 Memory test circuit has latching unit and matrix control unit for activating respective matrices |
| 05/18/2000 | DE19852350A1 Diagnosesystem für das Vorschaltgerät einer Hochdruckgasentladungslampe in einem Kraftfahrzeug Diagnostic system for the ballast of a high-pressure gas discharge lamp in a motor vehicle |
| 05/17/2000 | EP1001554A2 Line shunt and ground fault detection apparatus and method |
| 05/17/2000 | EP1001273A2 Integrated semiconductor chip with preset input output configuration over bond pads |
| 05/17/2000 | EP1001272A2 Semiconductor module for a burn-in test system |
| 05/17/2000 | EP1001271A1 Fault point location system |
| 05/17/2000 | EP1001270A2 Method for testing a ground connection |
| 05/17/2000 | EP1001269A1 Testing insulation between conductors |
| 05/17/2000 | EP1000498A1 Fault location in the access network |
| 05/17/2000 | EP1000443A1 Battery tester having printed electronic components |
| 05/17/2000 | EP1000366A1 Device for measuring partial discharges in gas-insulated high voltage facilities |
| 05/17/2000 | EP1000365A1 Tester with fast refire recovery time |
| 05/17/2000 | EP1000364A1 Low cost cmos tester with high channel density |
| 05/17/2000 | EP1000363A1 Spreading resistance profiling system |
| 05/17/2000 | EP0999956A2 System and method for testing a circuit device for controlling an automobile passenger protection mechanism |
| 05/17/2000 | EP0950285A4 Timing signal generator |
| 05/17/2000 | EP0653073B1 Electric arc detector |
| 05/17/2000 | CN2378738Y Flashing relay |
| 05/17/2000 | CN2378737Y Electric circuit board automatic testing and signal waveform contrast equipment |
| 05/17/2000 | CN2378736Y Multifunction sound electric fast electronic detecting instrument for motorcycle |
| 05/17/2000 | CN1052541C Circuit arrangement for current measurement via switching transistor |
| 05/16/2000 | US6065145 Method for testing path delay faults in sequential logic circuits |
| 05/16/2000 | US6065144 Testing unit with testing information divided into redundancy-free information and redundancy information |
| 05/16/2000 | US6065143 Semiconductor memory device capable of fast testing without externally considering address scramble or data scramble |
| 05/16/2000 | US6065142 ROM testing circuit |
| 05/16/2000 | US6065106 Resuming normal execution by restoring without refetching instructions in multi-word instruction register interrupted by debug instructions loading and processing |
| 05/16/2000 | US6064948 Tester systems |
| 05/16/2000 | US6064804 Battery having a battery mailbox for exchanging information |
| 05/16/2000 | US6064652 Cell grant mechanism |
| 05/16/2000 | US6064608 Semiconductor memory device and methods for inspecting and manufacturing the same |
| 05/16/2000 | US6064601 Integrated circuit memory devices and controlling methods that simultaneously activate multiple column select lines during a write cycle of a parallel bit test mode |
| 05/16/2000 | US6064599 Programmable logic array integrated circuits |
| 05/16/2000 | US6064314 Inspecting system for welding apparatus |
| 05/16/2000 | US6064313 Alternating current circuit and outlet tester |
| 05/16/2000 | US6064256 High frequency multi-stage capacitively coupled amplifier circuits |
| 05/16/2000 | US6064242 I/O pin electronics circuit having a pair of drivers |
| 05/16/2000 | US6064233 Semiconductor integrated circuit measuring current to test damaged transistor |
| 05/16/2000 | US6064222 Liquid-crystal display device having checkout circuit |
| 05/16/2000 | US6064221 Method of temporarily securing a die to a burn-in carrier |
| 05/16/2000 | US6064220 Semiconductor integrated circuit failure analysis using magnetic imaging |
| 05/16/2000 | US6064219 Modular test chip for multi chip module |
| 05/16/2000 | US6064218 Peripherally leaded package test contactor |
| 05/16/2000 | US6064217 Fine pitch contact device employing a compliant conductive polymer bump |
| 05/16/2000 | US6064216 Apparatus for testing semiconductor wafers |
| 05/16/2000 | US6064215 High temperature probe card for testing integrated circuits |
| 05/16/2000 | US6064214 Perimeter trace probe for plastic ball grid arrays |
| 05/16/2000 | US6064213 Wafer-level burn-in and test |
| 05/16/2000 | US6064195 Test probe positioning device |
| 05/16/2000 | US6064194 Method and apparatus for automatically positioning electronic dice within component packages |
| 05/16/2000 | US6064183 Device detecting the amount of charge remaining in a battery |
| 05/16/2000 | US6064182 Battery pack, battery remaining capacity detection method, and application device driven with battery pack as power source |
| 05/16/2000 | US6064181 Method for detecting fully-charged state of rechargeable battery |
| 05/16/2000 | US6064180 Method and apparatus for determining battery state-of-charge using neural network architecture |
| 05/16/2000 | US6064179 Battery set structure and charge/discharge control apparatus for lithium-ion battery |
| 05/16/2000 | US6064172 Method and apparatus for detection, classification and reduction of internal electrical faults in alternating current propulsion machinery using synchronous detection scheme |
| 05/16/2000 | US6063641 Method of measuring electrical characteristics of semiconductor circuit in wafer state and semiconductor device for the same |
| 05/16/2000 | US6062874 IC socket for IC package |
| 05/16/2000 | US6062873 Socket for chip package test |
| 05/11/2000 | WO2000027173A1 Test coupon for printed wiring board |
| 05/11/2000 | WO2000027097A1 Fault conditions affecting high speed data services |
| 05/11/2000 | WO2000027065A1 Measurement of nonlinear distortion in transmitters |
| 05/11/2000 | WO2000026824A1 Method and arrangement for comparing a first characteristic with given characteristics of a technical system |
| 05/11/2000 | WO2000026681A1 Device for testing printed boards |
| 05/11/2000 | WO2000009992A3 Device for measuring work pieces using an image processing system |