| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 06/07/2000 | CN2382027Y Instrument for measuring output power of motor |
| 06/07/2000 | CN2382026Y Instrument for measuring high voltage D. C. insulation |
| 06/07/2000 | CN1256028A Radio communication equipment having selective functions of utilizing analog mode and digital mode |
| 06/07/2000 | CN1255744A Rotary assembly of module integrated circuit processor |
| 06/07/2000 | CN1255639A Positioning system of fault point |
| 06/07/2000 | CN1255454A Multi-sheet stocker of stacker-reclaimer |
| 06/07/2000 | CN1255453A Transporting and loading/unloading appts. for modular integrated circuit processor |
| 06/07/2000 | CN1053277C Method for detecting short-circuit fault current path and indicator |
| 06/06/2000 | US6073265 Pipeline circuit with a test circuit with small circuit scale and an automatic test pattern generating method for testing the same |
| 06/06/2000 | US6073264 Debug vector launch tool |
| 06/06/2000 | US6073263 Parallel processing pattern generation system for an integrated circuit tester |
| 06/06/2000 | US6073261 Circuit for evaluating signal timing |
| 06/06/2000 | US6073260 Integrated circuit |
| 06/06/2000 | US6073259 Low cost CMOS tester with high channel density |
| 06/06/2000 | US6073254 Selectively accessing test access ports in a multiple test access port environment |
| 06/06/2000 | US6073088 EMS testing system |
| 06/06/2000 | US6073082 Method of estimating lifetime of floating SOI-MOSFET |
| 06/06/2000 | US6072559 Active matrix display device having defect repair extension line beneath each pixel |
| 06/06/2000 | US6072327 Method and device of testing semiconductor integrated circuit chip capable of preventing electron-hole pairs |
| 06/06/2000 | US6072325 Probe device |
| 06/06/2000 | US6072324 Method for testing semiconductor packages using oxide penetrating test contacts |
| 06/06/2000 | US6072323 Temporary package, and method system for testing semiconductor dice having backside electrodes |
| 06/06/2000 | US6072322 Thermally enhanced test socket |
| 06/06/2000 | US6072321 Micromachined silicon probe card for semiconductor dice and method of fabrication |
| 06/06/2000 | US6072320 Product wafer junction leakage measurement using light and eddy current |
| 06/06/2000 | US6072317 Plug-in multifunction tester for AC electrical distribution system |
| 06/06/2000 | US6072316 Detection of surface anomalies in elongate conductive members by pulse propagation analysis |
| 06/06/2000 | US6072300 Battery state diagnostic apparatus for battery set and battery module charger/discharger |
| 06/06/2000 | US6072299 Smart battery with maintenance and testing functions |
| 06/06/2000 | US6072192 Test structure responsive to electrical signals for determining lithographic misalignment of vias relative to electrically active elements |
| 06/06/2000 | US6072190 Micro contact pin structure with a piezoelectric element and probe card using the same |
| 06/06/2000 | US6072179 Method and apparatus using an infrared laser based optical probe for measuring voltages directly from active regions in an integrated circuit |
| 06/06/2000 | US6071314 Programmable I/O cell with dual boundary scan |
| 06/06/2000 | US6071137 Pressure actuated zero insertion force circuit board edge connector socket |
| 06/06/2000 | US6071009 Semiconductor wirebond machine leadframe thermal map system |
| 06/06/2000 | US6071003 Method and apparatus for locating critical speed paths in integrated circuits using a clock driver circuit with variable delay |
| 06/06/2000 | US6070731 IC receiving tray storage device and mounting apparatus for the same |
| 06/06/2000 | CA2091262C Electronic tester for assessing battery/cell capacity |
| 06/06/2000 | CA2069805C Television signal level meter |
| 06/02/2000 | WO2000031557A1 Method and apparatus for determining characteristic parameters of a charge storage device |
| 06/02/2000 | WO2000031556A1 Method for diagnosing insulation degradation in underground cable |
| 06/02/2000 | WO2000031555A1 Probe assembly for testing |
| 06/02/2000 | WO2000031554A1 Method for determining an earth-faulted branch |
| 05/31/2000 | EP1004884A1 Method and device for the detection of internal arcing in an electric conductor in a metal casing |
| 05/31/2000 | EP1004059A1 Method for detecting malfunctions of a first relay |
| 05/31/2000 | EP1004032A1 Battery testing and classification |
| 05/31/2000 | EP1004031A1 Electric arc monitoring systems |
| 05/31/2000 | EP1004027A1 Magnetic current sensing and short circuit detection in plate structure |
| 05/31/2000 | DE4413832C2 Vorrichtungen zur Kontrolle von Halbleiterscheiben Devices for control of semiconductor wafers |
| 05/31/2000 | DE4413831C2 Verfahren zur Kontrolle von Halbleiterscheiben A method for controlling semiconductor wafers |
| 05/31/2000 | DE19958029A1 Burn-in circuit board for burn-in testing of electronic apparatus, provides heat sink load for device under test (DUT) |
| 05/31/2000 | DE19957289A1 Controlling battery group charging and discharging involves blocking charging and discharging if upper and lower group capacity limit values are reached respectively |
| 05/31/2000 | DE19955802A1 Maintenance-free test system for semiconductor components; has number of redundant pins in both its test head and test unit so that defective pins and channels can be swapped out as controlled by system control unit |
| 05/31/2000 | DE19914488C1 Cell resistance evaluation device for magnetoresistive memory |
| 05/31/2000 | CN1254989A Scannable latch circuit for providing scan output from it and its method |
| 05/31/2000 | CN1254935A Classfication method for monolithic ceramic capacitors |
| 05/31/2000 | CN1254847A Characteristic tester for sensor |
| 05/30/2000 | US6070261 Multi-phase test point insertion for built-in self test of integrated circuits |
| 05/30/2000 | US6070260 Test methodology based on multiple skewed scan clocks |
| 05/30/2000 | US6070259 Dynamic logic element having non-invasive scan chain insertion |
| 05/30/2000 | US6070258 Logic synthesis for testability system which enables improvement in testability and effective selection of center state and logic synthesis method thereof |
| 05/30/2000 | US6070257 Integration type input circuit and method of testing it |
| 05/30/2000 | US6070252 Method and apparatus for interactive built-in-self-testing with user-programmable test patterns |
| 05/30/2000 | US6070130 Method for testing a large quantity of products |
| 05/30/2000 | US6069849 Method and system for measuring signal propagation delays using the duty cycle of a ring oscillator |
| 05/30/2000 | US6069484 Source measure unit current preamplifier |
| 05/30/2000 | US6069468 Battery pack |
| 05/30/2000 | US6069366 Endpoint detection for thinning of silicon of a flip chip bonded integrated circuit |
| 05/30/2000 | US6069017 Method for real-time in-line testing of semiconductor wafers |
| 05/30/2000 | US6068669 Compliant interconnect for testing a semiconductor die |
| 05/30/2000 | US6068508 Connector assembly test block |
| 05/30/2000 | US6068317 Device for adjusting space between chip in semiconductor chip tester |
| 05/30/2000 | US6067702 Stator manufacturing and testing method and apparatus |
| 05/25/2000 | WO2000030417A2 Method and apparatus for aligning device interconnections |
| 05/25/2000 | WO2000030308A2 Equalizer for multi-pair gigabit ethernet |
| 05/25/2000 | WO2000030119A1 Ic test software system for mapping logical functional test data of logic integrated circuits to physical representation |
| 05/25/2000 | WO2000030038A1 Method for comparing recorded pixel images representing equipotential lines of at least an integrated circuit chip |
| 05/25/2000 | WO2000029953A1 Method and installation for fast fault localization in an integrated circuit |
| 05/25/2000 | WO2000029951A1 Method and system for controlling logic analyzer storage criteria from within program code |
| 05/25/2000 | WO2000029902A2 System for removing spurious signatures in motor current signature analysis |
| 05/25/2000 | WO2000029863A1 Instruction processing pattern generator controlling an integrated circuit tester |
| 05/25/2000 | WO2000029862A1 Method for correcting frequency- and length-dependent line attenuation for fdr-measurements carried out on high-frequency cables |
| 05/25/2000 | WO2000029860A2 Dynamic register with iddq testing capability |
| 05/25/2000 | WO2000029255A1 Diagnostic system for the wattage power regulator of a high-pressure gas-discharge lamp in a vehicle |
| 05/25/2000 | WO2000007084A3 Algorithmic pattern generator |
| 05/25/2000 | DE19956533A1 Semiconductor test system for mixed signal integrated circuits with continuous analog - digital conversion of analog test signal responses |
| 05/25/2000 | DE19944517A1 Verfahren und Vorrichtung für die Zustandsbestimmung von Automobilbatterien Method and apparatus for determining the condition of automotive batteries |
| 05/25/2000 | DE19911590A1 Battery residual charge indicator for battery packs has a test circuit integrated in battery case |
| 05/25/2000 | DE19853445A1 Contact pins, for semiconductor chip test cards, are produced by electroforming pin tips and adjoining spring stirrups using structured resist layers |
| 05/25/2000 | DE19852917A1 Verfahren und Anordnung zur Ermittlung der Leerlaufspannung einer Batterie Method and apparatus for determining the open circuit voltage of a battery |
| 05/25/2000 | DE19852591A1 Verfahren zur Prüfung einer Erdverbindung A method for testing an earth connection |
| 05/25/2000 | DE19852430A1 Circuit arrangement with temperature dependent semiconductor test and repair logic |
| 05/25/2000 | DE19852071A1 Integrierter Halbleiterchip mit über Bondpads voreingestellter Dateneingabe-/Datenausgabe-Organisationsform Integrated semiconductor chip bond pads on preset data input / output organizational form |
| 05/25/2000 | CA2290799A1 Process and device for detecting an internal arc in an electrical connection under a metal cover |
| 05/24/2000 | EP1003290A2 Electronic devices and low-voltage detection method |
| 05/24/2000 | EP1003262A2 Circuit breaker |
| 05/24/2000 | EP1003234A1 Method and apparatus for the determination of the open-circuit voltage of a battery |
| 05/24/2000 | EP1003026A2 Scanning depletion microscopy for carrier profiling |
| 05/24/2000 | EP1002427A1 Multi-function viewer/tester for miniature electric components |
| 05/24/2000 | EP1002354A1 Memorizing the first operating time of a stand-by battery and/or indicating the end of a stand-by battery lifetime |