| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 06/21/2000 | DE19958873A1 Pallet circulation method for IC module handling device uses transfer device for moving palette into pivot position for reception by lowering device delivering palette to loading or unloading lifting plate |
| 06/21/2000 | DE19956621A1 Elektrooptische Abtastsonde und Messverfahren unter Verwendung derselben Electro-optical scanning probe and measuring method using the same |
| 06/21/2000 | DE19858424A1 Circuit board tester especially for use in automobile industry |
| 06/21/2000 | CN1257209A Small interval contactor |
| 06/21/2000 | CN1053757C Wafer burn-in test circuit of a semiconductor memory device |
| 06/20/2000 | US6079040 Module level scan testing |
| 06/20/2000 | US6079039 Test circuit and test method for testing semiconductor chip |
| 06/20/2000 | US6079038 Method for generating a Shmoo plot contour for integrated circuit tester |
| 06/20/2000 | US6078875 Automated auditing system |
| 06/20/2000 | US6078871 Method of displaying a status condition of a battery |
| 06/20/2000 | US6078387 Test apparatus |
| 06/20/2000 | US6078210 Internal voltage generating circuit |
| 06/20/2000 | US6078189 Dynamic test reordering |
| 06/20/2000 | US6078188 Semiconductor device transporting and handling apparatus |
| 06/20/2000 | US6078187 Hemispherical test head for integrated circuit tester employing radially distributed circuit cards |
| 06/20/2000 | US6078186 Force applying probe card and test system for semiconductor wafers |
| 06/20/2000 | US6078185 Apparatus for controlling insertion of an integrated circuit into a socket for testing and measurement |
| 06/20/2000 | US6078183 Thermally-induced voltage alteration for integrated circuit analysis |
| 06/20/2000 | US6078180 Monitoring partial discharges |
| 06/20/2000 | US6078173 Simultaneous self test of multiple inverters in an AC motor system |
| 06/20/2000 | US6078165 Multiplexed modular battery management system for large battery packs |
| 06/20/2000 | US6078164 Portable electronic appliance |
| 06/20/2000 | US6078057 Semiconductor devices having backside probing capability |
| 06/20/2000 | US6077128 Press-in contact |
| 06/20/2000 | CA2032384C Remote instrument testing system |
| 06/18/2000 | CA2292349A1 Arc fault detector device with two stage arc sensing |
| 06/15/2000 | WO2000035262A2 Method for mounting an electronic component |
| 06/15/2000 | WO2000035002A1 Method and device for optically monitoring processes for manufacturing microstructured surfaces in the production of semiconductors |
| 06/15/2000 | WO2000034797A1 A tester interface system for current drive mode memory device |
| 06/15/2000 | WO2000034796A1 Scanning single electron transistor microscope for imaging ambient temperature objects |
| 06/15/2000 | WO2000034795A1 Test chamber |
| 06/15/2000 | WO2000019775B1 Wafer level burn-in and test thermal chuck and method |
| 06/15/2000 | DE19836141C1 Verfahren und Überwachungsvorrichtung zur Überwachung wenigstens eines zur Notversorgung von elektrischen und/oder elektronischen Verbrauchern zuschaltbaren Batteriesatzes Procedures and monitoring device for monitoring at least one selectable for emergency electrical and / or electronic consumers battery pack |
| 06/14/2000 | EP1008859A2 Testing device enclosures |
| 06/14/2000 | EP1008858A2 Circuit with logic circuit for temperature dependant semi-conductor element test and repair |
| 06/14/2000 | EP1008857A1 System and method for detecting defects within an electrical circuit by analyzing quiescent current |
| 06/14/2000 | EP1008144A1 Method for monitoring the operating condition of an integrated circuit |
| 06/14/2000 | EP1008124A2 An electrical insulation testing device and method for electrosurgical instruments |
| 06/14/2000 | EP1008025A1 Configuration control in a programmable logic device using non-volatile elements |
| 06/14/2000 | EP1007987A1 A device for sensing electric discharges in test object, preferably a cable joint |
| 06/14/2000 | EP1007986A1 Fault detection apparatus and method of detecting faults in an electrical distribution network |
| 06/14/2000 | EP1007985A1 A method and a device for space-charge measurement in cables using a pulsed electroacoustic method |
| 06/14/2000 | EP1007983A1 Analysis of noise in repetitive waveforms |
| 06/14/2000 | EP1007981A1 Robotic twin probe for measurement on printed circuit boards and electrical and electronic assemblies |
| 06/14/2000 | EP1007980A1 Printed circuit board testing device |
| 06/14/2000 | CN1256424A Defect detector for cage type motor cast aluminium rotor in hot state |
| 06/14/2000 | CN1256238A Modular integrated circuit for use in modular integrated circuit handling device and handling method of carrier thereof |
| 06/14/2000 | CN1053502C Abnormality detection method, abnormality detection apparatus and power generating system using the same |
| 06/14/2000 | CA2292120A1 Short detection for ink jet printhead |
| 06/13/2000 | US6076179 Method and apparatus of increasing the vector rate of a digital test system |
| 06/13/2000 | US6076178 Test circuit and method for DC testing LSI capable of preventing simultaneous change of signals |
| 06/13/2000 | US6076177 Method and apparatus for testing a circuit module concurrently with a non-volatile memory operation in a multi-module data processing system |
| 06/13/2000 | US6076173 Architectural coverage measure |
| 06/13/2000 | US6075936 Logic circuit simulation apparatus having cycle-based simulator for simulating circuits including multi-cycle paths |
| 06/13/2000 | US6075880 Method for detection of defects in the inspection of structured surfaces |
| 06/13/2000 | US6075769 Method and apparatus for network flow control |
| 06/13/2000 | US6075768 Fair bandwidth sharing for video traffic sources using distributed feedback control |
| 06/13/2000 | US6075592 Fiber-optics based micro-photoluminescence system |
| 06/13/2000 | US6075448 Apparatus and method for testing an electrical circuit |
| 06/13/2000 | US6075418 System with downstream set or clear for measuring signal propagation delays on integrated circuits |
| 06/13/2000 | US6075417 Ring oscillator test structure |
| 06/13/2000 | US6075396 Using power-on mode to control test mode |
| 06/13/2000 | US6075389 Operation speed measuring circuit and semiconductor device incorporating the same circuit |
| 06/13/2000 | US6075386 Dynamic logic gate with relaxed timing requirements and output state holding |
| 06/13/2000 | US6075377 Method of confirming connecting states of signal terminals in a semiconductor device |
| 06/13/2000 | US6075376 Low-current probe card |
| 06/13/2000 | US6075374 Test head of an IC test device |
| 06/13/2000 | US6075373 Inspection device for inspecting a semiconductor wafer |
| 06/13/2000 | US6075358 Device in a semiconductor manufacturing installation in particular for integrated circuits |
| 06/13/2000 | US6075342 Fast battery charging system and method |
| 06/13/2000 | US6075340 Battery pack having memory |
| 06/13/2000 | US6075263 Method of evaluating the surface state and the interface trap of a semiconductor |
| 06/13/2000 | US6075245 High speed electron beam based system for testing large area flat panel displays |
| 06/13/2000 | US6075234 Non-contact method and apparatus to obtain a timing signal from internal integrated circuit nodes |
| 06/13/2000 | US6075216 Device transfer and reinspection method for IC handler |
| 06/13/2000 | US6074886 Electrical characterization of an insulating layer covering a conducting or semiconducting substrate |
| 06/13/2000 | US6074426 Method for automatically generating behavioral environment for model checking |
| 06/13/2000 | US6074158 IC transporting apparatus, IC posture altering apparatus and IC take-out apparatus |
| 06/13/2000 | CA2202544C Process for monitoring electrical wear on high-voltage switchgear |
| 06/09/2000 | CA2281452A1 Arc fault circuit interrupter |
| 06/08/2000 | WO2000033632A1 Apparatus and method for inverting an ic device |
| 06/08/2000 | WO2000033630A1 Device for grasping and aligning an electronic component on a spindle |
| 06/08/2000 | WO2000033517A1 Method and circuit configuration for determining the reliability performance of connection cables in a switching device |
| 06/08/2000 | WO2000033360A1 A method and apparatus for the transport and tracking of an electronic component |
| 06/08/2000 | WO2000033098A1 Uninterruptible power supply, systems and methods of monitoring an uninterruptible power supply |
| 06/08/2000 | WO2000033097A1 Methods and apparatus for synchronizing asynchronous test structures and eliminating clock skew consideration |
| 06/08/2000 | WO2000033096A1 Probe card for probing wafers with raised contact elements |
| 06/08/2000 | WO2000033095A1 Circuit with improved dynamic response for measuring current in pulse width modulated amplifiers |
| 06/08/2000 | WO2000033094A1 Boundary scan method for terminating or modifying integrated circuit operating modes |
| 06/08/2000 | WO2000033093A1 Test circuit and method for determining the operating status of a coaxial cable |
| 06/08/2000 | WO2000033027A1 An apparatus and method to transport, inspect and measure objects and surface details at high speeds |
| 06/08/2000 | WO2000019222A3 Semiconductor switching circuit with an integrated self-testing circuit |
| 06/08/2000 | DE19957792A1 Transport and active temperature control of IC circuits to be tested using rotary transporter with liquid heated or cooled temperature control stations |
| 06/08/2000 | DE19957614A1 Method for manipulating IC modules for insertion in test equipment with simplified carrier system |
| 06/08/2000 | DE19914489C1 Memory cell condition evaluation device for magnetoresistive memory |
| 06/08/2000 | CA2347846A1 Boundary scan method for terminating or modifying integrated circuit operating modes |
| 06/07/2000 | EP1006703A2 Portable electronic device |
| 06/07/2000 | EP1006049A2 Method and apparatus for integration and testing of satellites |
| 06/07/2000 | EP1005785A1 Automated auditing system |
| 06/07/2000 | EP1005708A1 Circuit board arrangement |