| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 07/05/2000 | CN2386448Y Multifunctional on-line monitor for lighting protector |
| 07/05/2000 | CN1258847A Electric device with accumulator and method for detecting accumulator off |
| 07/05/2000 | CN1258846A Equivalent circuit measuring method |
| 07/05/2000 | CN1258845A Fault locating system |
| 07/04/2000 | US6085345 Timing control for input/output testability |
| 07/04/2000 | US6085344 Data communication interface with memory access controller |
| 07/04/2000 | US6085343 Method for concurrent testing of on-chip circuitry and timing counters |
| 07/04/2000 | US6084930 Triggered clock signal generator |
| 07/04/2000 | US6084809 Main amplifier circuit and input-output bus for a dynamic random access memory |
| 07/04/2000 | US6084808 Circuits and methods for burn-in of integrated circuits using potential differences between adjacent main word lines |
| 07/04/2000 | US6084787 Device for supervising in a high voltage converter station |
| 07/04/2000 | US6084756 Apparatus for testing protection of an electric power distribution circuit by an arc fault circuit breaker |
| 07/04/2000 | US6084663 Method and an apparatus for inspection of a printed circuit board assembly |
| 07/04/2000 | US6084523 Non-intrusive battery status indicator and inventory system |
| 07/04/2000 | US6084482 Oscillatory circuit having built-in test circuit for checking oscillating signal for duty factor |
| 07/04/2000 | US6084423 Method and device of testing a semiconductor integrated circuit chip in which a voltage across the semiconductor integrated circuit chip is detected while an ultrasonic wave beam is projected thereon |
| 07/04/2000 | US6084422 Printed circuit board testing device |
| 07/04/2000 | US6084421 Test socket |
| 07/04/2000 | US6084420 Probe assembly for testing |
| 07/04/2000 | US6084419 Method and apparatus for inspecting semiconductor integrated circuits, and contactor incorporated in the apparatus |
| 07/04/2000 | US6084414 Testing for leakage currents in planar lambda probes |
| 07/04/2000 | US6084267 Design propagation delay measurement device |
| 07/04/2000 | US6083848 Removing solder from integrated circuits for failure analysis |
| 07/04/2000 | US6083273 Static timing analyzer and analyzing method for semiconductor integrated circuits |
| 07/04/2000 | US6083266 Simulation apparatus and simulation method using moment method |
| 07/04/2000 | CA2159134C Spread spectrum code pulse position modulated receiver having delay spread compensation |
| 06/29/2000 | WO2000038289A1 A system and a method for monitoring and warning regarding the presence of manually and temporarily fitted ground connectors on high voltage conductors, as well as a warning device and a conductor means included in the system |
| 06/29/2000 | WO2000038288A1 Self-balancing ionizer monitor |
| 06/29/2000 | WO2000037951A1 An arrangement and method relating to exchange of digital information between devices comprising electric circuitry |
| 06/29/2000 | WO2000037950A1 Lead frame structure for testing integrated circuits |
| 06/29/2000 | DE19960112A1 Testvorrichtung zum Testen von Rückwandplatinen bzw. bestückten Leiterplatten Test apparatus for testing of backplanes and printed circuit boards |
| 06/29/2000 | DE19957236A1 Elektro-Optische Abtast-Sondiervorrichtung Electro-optic sampling Sounding |
| 06/29/2000 | DE19956982A1 Carrier handling device of module integrated circuit handler, has image pickup to detect correct movement of carrier from loading to unloading position |
| 06/29/2000 | DE19956981A1 Swivel mechanism for handling device of tested integrated circuit components for changing direction of support contains swivel plate swivels about its axis at one side of a discharge closure at the testing position |
| 06/29/2000 | DE19858757A1 Pattern data compression and decompression method for semiconductor IC test system |
| 06/29/2000 | CA2352817A1 A system and a method for monitoring and warning regarding the presence of manually and temporarily fitted ground connectors on high voltage conductors, as well as a warning device and a conductor means included in the system |
| 06/28/2000 | EP1014643A2 Network interface unit |
| 06/28/2000 | EP1014533A2 A battery charge management architecture |
| 06/28/2000 | EP1014100A1 Appliance for detecting an open circuit in an electrical line, in particular a telephone line |
| 06/28/2000 | EP1014099A2 Method of and apparatus for identifying cable and method of infusing pilot signal for cable identification |
| 06/28/2000 | EP1014096A2 Substrate and method for inspection |
| 06/28/2000 | EP1013426A2 Short detection for ink jet printhead |
| 06/28/2000 | EP1013224A1 Methods and apparatus for cable interconnection verification |
| 06/28/2000 | EP1012849A1 Low cost, highly parallel memory tester |
| 06/28/2000 | EP1012848A1 Memory test system with defect compression |
| 06/28/2000 | EP1012615A1 System for storing and searching named device parameter data in a test system for testing an integrated circuit |
| 06/28/2000 | EP1012614A1 Production interface for an integrated circuit test system |
| 06/28/2000 | EP1012613A1 Method and device for charging integrated circuits and structures with a pulsed heavy current |
| 06/28/2000 | EP1012612A1 Method and device for detecting and locating irregularities in a dielectric |
| 06/28/2000 | EP1012611A2 Arcing fault detection system |
| 06/28/2000 | EP1012610A2 Testing the integrity of an electrical connection to a device using an onboard controllable signal source |
| 06/28/2000 | EP1012607A1 Sensor device |
| 06/28/2000 | EP0979416A4 Coherent switching power supply for an analog circuit tester |
| 06/28/2000 | EP0883915B1 Method for producing a connection of data transmission lines, and plug connector |
| 06/28/2000 | CN2385345Y Combined test probe carriage |
| 06/28/2000 | CN2385344Y Device for testing circuit board function |
| 06/28/2000 | CN2385343Y Small current neutral ground automatic selective display device for transformer station |
| 06/28/2000 | CN2385342Y Switching capacity collector |
| 06/28/2000 | CN1258136A Apparatus and method for diagnosis of line shunting and grounding fault |
| 06/28/2000 | CN1258096A Semiconductor device contactor, detection device and method thereby and cleaning method |
| 06/28/2000 | CN1258008A 传感器 Sensor |
| 06/28/2000 | CN1053966C Open frame gantry probing system |
| 06/28/2000 | CN1053965C Method and apparatus for displaying measured electric energy by electronic mode |
| 06/27/2000 | US6081916 IC with test cells having separate data and test paths |
| 06/27/2000 | US6081915 Method and apparatus for reducing the time required to test an integrated circuit using slew rate control |
| 06/27/2000 | US6081913 Method for ensuring mutual exclusivity of selected signals during application of test patterns |
| 06/27/2000 | US6081771 Apparatus checking method and apparatus to which the same is applied |
| 06/27/2000 | US6081770 Apparatus and method for testing snow removal equipment |
| 06/27/2000 | US6081613 System for inspecting an appearance of a printed circuit board |
| 06/27/2000 | US6081484 Measuring signals in a tester system |
| 06/27/2000 | US6081465 Static RAM circuit for defect analysis |
| 06/27/2000 | US6081464 Circuit for SRAM test mode isolated bitline modulation |
| 06/27/2000 | US6081436 Multi-output power supply voltage sensing |
| 06/27/2000 | US6081428 Cooling apparatus for electric devices |
| 06/27/2000 | US6081396 Magnetic read/write head that detects open and short-circuits |
| 06/27/2000 | US6081154 Circuit for determining the remaining operating life of a system |
| 06/27/2000 | US6081127 Method and arrangement for the response analysis of semiconductor materials with optical excitation |
| 06/27/2000 | US6081124 Testing unit for connector testing |
| 06/27/2000 | US6081122 Electrical ground fault detection apparatus |
| 06/27/2000 | US6081110 Thermal isolation plate for probe card |
| 06/27/2000 | US6081098 Method and apparatus for charging a battery |
| 06/27/2000 | US6081096 Apparatus and method for discharging and charging a multiple battery arrangement |
| 06/27/2000 | US6081024 TAB tape semiconductor device |
| 06/27/2000 | US6080595 Method for estimating the thickness of layer coated on wafer |
| 06/27/2000 | US6080203 Apparatus and method for designing a test and modeling system for a network switch device |
| 06/27/2000 | US6079259 Apparatus and method for a diagnostic check of the electrical wiring of an internal combustion engine electronic unit injector system |
| 06/27/2000 | CA2184578C Battery energy monitoring circuits |
| 06/27/2000 | CA2182384C Optical time domain reflectometry |
| 06/21/2000 | EP1011240A2 Efficient full duplex simultaneous message transfer |
| 06/21/2000 | EP1011134A1 Contactor for semiconductor devices, a testing apparatus using such contactor, a testing method using such contactor, and a method of cleaning such contactor |
| 06/21/2000 | EP1010986A1 Device for measuring and displaying the operating autonomy of a storage battery |
| 06/21/2000 | EP1010294A1 Computer network cross-connect panel providing physical layer monitoring |
| 06/21/2000 | EP1010110A1 Concurrent hardware-software co-simulation |
| 06/21/2000 | EP1010079A1 Device for controlling conformity of consumption of an electronic component in a testing machine |
| 06/21/2000 | EP1010012A2 Apparatus for measuring minority carrier lifetimes in semiconductor materials |
| 06/21/2000 | EP0815461B1 Timing generator with multiple coherent synchronized clocks |
| 06/21/2000 | DE4338714C2 Schaltungsanordnung zur Strommessung über einen Schalttransistor Circuit arrangement for measuring the current through a switching transistor |
| 06/21/2000 | DE19960804A1 Verfahren und Apparat für das Testen eines Leitungskreisunterbrechers für Leitungsstörungen mit Lichtbogenbildung Method and apparatus for testing a line circuit breaker Line Noise arcing |
| 06/21/2000 | DE19960289A1 Fault detection system for brushless electric motor, e.g. for power-steering system; has fault detector constructed to measure fault by detecting excitation in electromagnet coil of either rotor or stator |
| 06/21/2000 | DE19959779A1 Faulty cell identification information delivery device for semiconductor memory uses faulty cell specification memory, faulty cell block information memory and sub-block information memory |