| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 07/18/2000 | US6090634 Failure analysis apparatus of semiconductor integrated circuits and method thereof |
| 07/18/2000 | US6090261 Method and apparatus for controlling plating over a face of a substrate |
| 07/18/2000 | US6089880 Electric connector arrangement |
| 07/18/2000 | US6089635 Modular IC holding device in modular IC handler |
| 07/18/2000 | US6089463 Cooling system of a semiconductor testing device |
| 07/18/2000 | US6089107 Process for testing a semiconductor device |
| 07/18/2000 | CA2198949C Fault powered fault indicator having timed reset |
| 07/13/2000 | WO2000041101A1 Apparatus and method for verifying a multi-component electronic design |
| 07/13/2000 | WO2000040986A1 Pattern generator for a packet-based memory tester |
| 07/13/2000 | WO2000040985A1 Prognostic system for determining infrared signature patterns emitted from electronic devices |
| 07/13/2000 | WO2000040984A1 Waveform generating device |
| 07/13/2000 | WO2000040983A1 Method for controlling ic handler and control system using the same |
| 07/13/2000 | WO2000040982A1 Partial discharge site location system for determining the position of faults in a high voltage cable |
| 07/13/2000 | WO2000040981A1 Link incident reporting for fibre channels |
| 07/13/2000 | WO2000040980A1 Fiber optic difference current sensor |
| 07/13/2000 | WO2000040975A1 Text probe interface assembly and manufacture method |
| 07/13/2000 | DE19962702A1 Test card, for testing conductivity between a chip-sized package component and a solder ball on a BGA component, has a contact element block with a sloping face for uniform pressure application to a solder ball surface |
| 07/13/2000 | DE10000365A1 Methods for semiconductor testing using low voltage particle beam by locking up second surface locks and first surface and comparing registered image with reference in order to identify faults in checked substrate |
| 07/13/2000 | DE10000364A1 Defect detection method for patterned substrates, intended for detection of defects in voltage contrast of semiconductor wafers obtained using electron microscopes |
| 07/13/2000 | DE10000361A1 Means for detection of microstructure defects in semiconductor wafers around through contact holes using a charged particle beam scanning system which involves negatively charging the zone around the contact hole prior to scanning |
| 07/13/2000 | CA2371992A1 Fiber optic difference current sensor |
| 07/13/2000 | CA2358405A1 Text probe interface assembly and manufacture method |
| 07/12/2000 | EP1018652A1 Measuring circuit for electric cells mounted in series |
| 07/12/2000 | EP1018651A1 Grinding chip |
| 07/12/2000 | EP1018637A1 Apparatus and method for detecting change in the resistance of a connector in a sensor circuit |
| 07/12/2000 | EP1018568A1 Plating device |
| 07/12/2000 | EP1018031A1 Device for testing circuit boards |
| 07/12/2000 | EP1018030A1 A method of controlling test probes in a testing apparatus for electronic printed circuit boards, and an apparatus for performing the method |
| 07/12/2000 | EP1018029A1 Programmable formatter circuit for integrated circuit tester |
| 07/12/2000 | EP1018027A1 Method for the location of a high-resistance earth fault in a power distribution system on the basis of current measurements |
| 07/12/2000 | EP1018026A1 Load circuit for integrated circuit tester |
| 07/12/2000 | EP1018023A1 Probe card and system for testing wafers |
| 07/12/2000 | EP1007983A4 Analysis of noise in repetitive waveforms |
| 07/12/2000 | EP0990150A4 Detecting a bad cell in a storage battery |
| 07/12/2000 | EP0985154A4 Broadband impedance matching probe |
| 07/12/2000 | EP0975985A4 Probe assembly and method for switchable multi-dut testing of integrated circuit wafers |
| 07/12/2000 | EP0895598A4 Apparatus for performing logic and leakage current tests on a digital logic circuit |
| 07/12/2000 | CN2387546Y Residual electricity indicator for battery |
| 07/12/2000 | CN1260062A Electrical insulation testing device and method for electrosurgical instruments |
| 07/12/2000 | CN1259674A A. C. electron load simulator |
| 07/12/2000 | CN1054480C Electrostatic capacity metering device for stator winding of rotary motor |
| 07/11/2000 | US6088830 Method and apparatus for logic circuit speed detection |
| 07/11/2000 | US6088823 Circuit for efficiently testing memory and shadow logic of a semiconductor integrated circuit |
| 07/11/2000 | US6088822 Integrated circuit with tap controller |
| 07/11/2000 | US6088820 Static semiconductor memory device having test mode |
| 07/11/2000 | US6088819 Dynamic semiconductor memory device and method of testing the same |
| 07/11/2000 | US6088658 Statistical pattern analysis methods of partial discharge measurements in high voltage insulation |
| 07/11/2000 | US6088582 Controlled environment radio test apparatus and method |
| 07/11/2000 | US6088271 Method and apparatus for transferring signal to circuit without waveform distortion |
| 07/11/2000 | US6088112 Image sensor having test patterns for measuring characteristics of color filters |
| 07/11/2000 | US6087879 Semiconductor integrated circuit device and low-amplitude signal receiving method |
| 07/11/2000 | US6087845 Universal wafer carrier for wafer level die burn-in |
| 07/11/2000 | US6087844 IC testing device |
| 07/11/2000 | US6087843 Integrated circuit tester with test head including regulating capacitor |
| 07/11/2000 | US6087842 Integrated or intrapackage capability for testing electrical continuity between an integrated circuit and other circuitry |
| 07/11/2000 | US6087841 Contact test circuit |
| 07/11/2000 | US6087840 Probe card with vertical needle for enabling improved wafer testing and method of manufacturing the same |
| 07/11/2000 | US6087839 Apparatus for testing printed circuit board |
| 07/11/2000 | US6087838 Signal processing circuit for electro-optic probe |
| 07/11/2000 | US6087836 Apparatus for and method of monitoring the status of the insulation on the wire in a winding |
| 07/11/2000 | US6087835 LAN tester |
| 07/11/2000 | US6087834 Diagnostic tester for lighting systems and method of using same |
| 07/11/2000 | US6087826 Device for detecting electromagnetic stray effects in systems with at least two inductive sensors providing periodic output signal |
| 07/11/2000 | US6087808 System and method for accurately determining remaining battery life |
| 07/11/2000 | US6087807 Charge/discharge control circuit and chargeable electric power source apparatus |
| 07/11/2000 | US6086626 Method for verification of combinational circuits using a filtering oriented approach |
| 07/11/2000 | US6086387 Cover assembly for a socket adaptable to IC modules of varying thickness used for burn-in testing |
| 07/11/2000 | US6086386 Flexible connectors for microelectronic elements |
| 07/06/2000 | WO2000039959A2 Method for localizing a cable in a data transmission network |
| 07/06/2000 | WO2000039928A1 High speed pin driver integrated circuit architecture for commercial automatic test equipment applications |
| 07/06/2000 | WO2000039907A1 Systems for configuring and delivering power |
| 07/06/2000 | WO2000039880A1 Method and arrangement for measuring current on a storage battery cell |
| 07/06/2000 | WO2000039879A1 Cell monitoring and isolating system |
| 07/06/2000 | WO2000039851A1 Method and apparatus for cooling backside optically probed integrated circuits |
| 07/06/2000 | WO2000039848A2 Test method and assembly including a test die for testing a semiconductor product die |
| 07/06/2000 | WO2000039598A1 Internal unbalance detection in capacitors |
| 07/06/2000 | WO2000039597A1 Apparatus for diagnosing and indicating operational failure in automobiles |
| 07/06/2000 | DE19963611A1 Memory test device in which information indicating that error location is present in memory device is written into compact memory |
| 07/06/2000 | DE19962703A1 Control of discharge of semiconductor component, arriving from production for testing, with time saving |
| 07/06/2000 | DE19860708A1 Verfahren zur Lokalisation eines Kabels in einem Datenleitungsnetzwerk A method for localization of a cable in a cable data network |
| 07/06/2000 | DE19860580A1 Prüfkreis für die Prüfung des Abschaltens von kapazitiven Strömen Test circuit for testing the shutdown of capacitive currents |
| 07/06/2000 | DE19860561C1 Verfahren und Anordnung zur Strommessung an einer Batteriezelle Method and apparatus for current measurement on a battery cell |
| 07/06/2000 | CA2358874A1 Method of locating a cable in a data line network |
| 07/06/2000 | CA2355909A1 Systems for configuring and delivering power |
| 07/06/2000 | CA2355169A1 Apparatus for diagnosing and indicating operational failure in automobiles |
| 07/06/2000 | CA2292144A1 Apparatus and method for detecting electrical resistance change in connectors to a remote mounted sensor |
| 07/05/2000 | EP1017195A1 Signature generation circuit |
| 07/05/2000 | EP1017148A1 Electrical device including a battery and method for detecting the disconnection of a battery |
| 07/05/2000 | EP1016870A2 Circuit for testing the disconnection of capacitive currents |
| 07/05/2000 | EP1016869A2 Fault point location system |
| 07/05/2000 | EP1016337A1 Temperature control system for an electronic device |
| 07/05/2000 | EP1016089A1 Memory tester with data compression |
| 07/05/2000 | EP1015901A1 Test system for integrated circuits using a single memory for both the parallel and scan modes of testing |
| 07/05/2000 | EP1015900A1 Integrated circuit tester having multiple period generators |
| 07/05/2000 | EP1015899A1 A method for application of weighted random patterns to partial scan designs |
| 07/05/2000 | EP1015898A1 Measurement system |
| 07/05/2000 | EP1015894A2 Electrical tester for small motor vehicles |
| 07/05/2000 | CN2386564Y Large DC. electric motor testing and protecting device for steel rolling main mill |
| 07/05/2000 | CN2386450Y Instrument for testing sliding time of submersible electric machine with oil |
| 07/05/2000 | CN2386449Y Electrical instrument for estimating service life of electromechanical equipment |