| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 07/26/2000 | EP1022807A2 Examination of insulation displacement connection |
| 07/26/2000 | EP1022575A1 Apparatus for the measurement of electrical consumption of a portable terminal processing data or signals |
| 07/26/2000 | EP1022574A2 System and method for testing on-chip modules and the interconnections between on-chip modules |
| 07/26/2000 | EP1022573A2 Scan test machine for densely spaced test sites |
| 07/26/2000 | EP1022572A1 Scan test apparatus for continuity testing of bare printed circuit boards |
| 07/26/2000 | EP1022571A2 Apparatus and method for testing electric conductivity of circuit pathways on circuit board |
| 07/26/2000 | EP1022570A2 Failsafe monitoring system for potentiometers |
| 07/26/2000 | EP1022494A2 Fault detection system and method for solenoid controlled actuators of a transmission system |
| 07/26/2000 | EP1022183A2 Assist device for use in electric vehicle |
| 07/26/2000 | EP1021776A1 System and method for automated design verification |
| 07/26/2000 | CN2389376Y Online internal resistance measurer for accumulator |
| 07/26/2000 | CN2389375Y Magnetic quick positioning clamp for button cell |
| 07/26/2000 | CN1261205A Method and system for analyzing parameters of semiconductor |
| 07/26/2000 | CN1054783C High speed sorting apparatus for semiconductor device equipped with rotatable sorting drum |
| 07/25/2000 | US6094738 Test pattern generation apparatus and method for SDRAM |
| 07/25/2000 | US6094736 Semiconductor integrated circuit device |
| 07/25/2000 | US6094735 Speed-signaling testing for integrated circuits |
| 07/25/2000 | US6094730 Hardware-assisted firmware tracing method and apparatus |
| 07/25/2000 | US6094624 Electronic test facility |
| 07/25/2000 | US6094609 Modular wireless diagnostic, test, and information |
| 07/25/2000 | US6094527 Method and apparatus for estimating IC power consumption |
| 07/25/2000 | US6094263 Visual examination apparatus and visual examination method of semiconductor device |
| 07/25/2000 | US6094144 Method and apparatus for early detection of reliability degradation of electronic devices |
| 07/25/2000 | US6094061 Automated testing method for electronic circuitry |
| 07/25/2000 | US6094060 Test head for applying signals in a burn-in test of an integrated circuit |
| 07/25/2000 | US6094059 Apparatus and method for burn-in/testing of integrated circuit devices |
| 07/25/2000 | US6094058 Temporary semiconductor package having dense array external contacts |
| 07/25/2000 | US6094057 Board for evaluating the characteristics of a semiconductor chip and a method for mounting a semiconductor chip thereon |
| 07/25/2000 | US6094056 Multi-chip module with accessible test pads and test fixture |
| 07/25/2000 | US6094053 Method and apparatus for identifying electronic circuits in a distributed electronic system |
| 07/25/2000 | US6094052 Survivor capacity measuring apparatus for a battery |
| 07/25/2000 | US6094051 Apparatus and method for detecting memory effect in nickel cadmium batteries |
| 07/25/2000 | US6094031 Battery condition-detecting apparatus and battery condition-detecting unit using an optical signal |
| 07/25/2000 | US6094030 Resistance and charging monitor within a standby battery bank |
| 07/25/2000 | US6093933 Method and apparatus for fabricating electronic device |
| 07/25/2000 | US6093331 Backside silicon removal for face down chip analysis |
| 07/25/2000 | US6093212 Method for selecting operation cycles of a semiconductor IC for performing an IDDQ test by using a simulation |
| 07/22/2000 | CA2296939A1 Failsafe monitoring system for potentiometers |
| 07/22/2000 | CA2258223A1 Vibroacoustic signature handling process in a high voltage electromechanical switching system |
| 07/20/2000 | WO2000042689A1 Energy gauge |
| 07/20/2000 | WO2000042509A1 Integrated circuit tester with real time branching |
| 07/20/2000 | WO2000042444A1 Testing electric cables and their joints |
| 07/20/2000 | WO2000042443A1 Method of identifying the condition of a lamp or fuse of a pinball machine |
| 07/20/2000 | WO2000042442A1 Apparatus for testing the pattern of pcb and method thereof |
| 07/20/2000 | WO2000041536A2 Test head manipulator |
| 07/20/2000 | WO2000004582A9 Temperature control of electronic devices using power following feedback |
| 07/20/2000 | DE19901819A1 Short circuit test lamp for INTERBUS-S system tests parallel input lines simultaneously. |
| 07/20/2000 | DE19901767A1 Verfahren und Vorrichtung zum Testen der Funktion einer Vielzahl von Mikrostrukturelementen Method and device for testing the function of a plurality of micro-structural elements |
| 07/20/2000 | DE19852086C1 Verfahren zur Korrektur der frequenz- und längenabhängigen Leitungsdämpfung bei FDR-Messungen an Hochfrequenzkabeln Method for correcting the frequency and length-dependent line attenuation in FDR measurements on high-frequency cables |
| 07/20/2000 | CA2361387A1 Energy gauge |
| 07/19/2000 | EP1020733A2 Integrated circuit and procedure for functional testing of bond pad cells |
| 07/19/2000 | EP1020732A2 Procedure and apparatus for testing the function of a multitude of active microstructure elements |
| 07/19/2000 | EP1020731A2 Direct-measurement provision to keep backdriving within safe levels |
| 07/19/2000 | EP1020730A2 Circuit-board tester with backdrive-based burst timing |
| 07/19/2000 | EP1020729A2 Fault detection for power lines |
| 07/19/2000 | EP1020319A2 Assist device for use in electric vehicle |
| 07/19/2000 | EP1019881A1 Digital output unit with means for detecting wire breakage |
| 07/19/2000 | EP1019744A1 Method for detecting a motor vehicle battery failure |
| 07/19/2000 | EP1019743A2 Battery capacity measurement circuit |
| 07/19/2000 | EP1019742A1 Method for monitoring end of life for battery |
| 07/19/2000 | EP1019741A1 Method and device for determining the operating temperature of engines |
| 07/19/2000 | EP1019740A4 Method and apparatus for testing encapsulated circuits |
| 07/19/2000 | EP1019740A2 Method and apparatus for testing encapsulated circuits |
| 07/19/2000 | EP1019739A1 Zero voltage wrist strap monitor |
| 07/19/2000 | EP1019735A2 Format sensitive timing calibration for an integrated circuit tester |
| 07/19/2000 | EP1019314A1 Diagnosing malfunctions in materials handling vehicles |
| 07/19/2000 | EP1015894A4 Electrical tester for small motor vehicles |
| 07/19/2000 | EP1008124A4 An electrical insulation testing device and method for electrosurgical instruments |
| 07/19/2000 | EP0979389A4 Cable tray assembly for testing device |
| 07/19/2000 | CN2388607Y Cable tester |
| 07/19/2000 | CN1260496A Intelligent detecting instrument for chromatron-converged screen characteristics |
| 07/19/2000 | CN1260495A Method and apparatus for detecting internal electric-arc in armoured connection wire |
| 07/19/2000 | CN1260318A Method and apparatus for taking out IC model from normal tray of IC model conveying device |
| 07/18/2000 | US6092227 Test circuit |
| 07/18/2000 | US6092226 Fabrication of test logic for level sensitive scan on a circuit |
| 07/18/2000 | US6092225 Algorithmic pattern generator for integrated circuit tester |
| 07/18/2000 | US6092224 Logic analyzer probe assembly with probe and interface boards |
| 07/18/2000 | US6092030 Timing delay generator and method including compensation for environmental variation |
| 07/18/2000 | US6091705 Method and apparatus for a fault tolerant, software transparent and high data integrity extension to a backplane bus or interconnect |
| 07/18/2000 | US6091651 Semiconductor memory device with improved test efficiency |
| 07/18/2000 | US6091475 Connector for display inspection of a liquid crystal display panel and method for the preparation thereof |
| 07/18/2000 | US6091290 Semiconductor integrated circuit |
| 07/18/2000 | US6091281 High precision reference voltage generator |
| 07/18/2000 | US6091277 Input buffer circuit for semiconductor IC circuit |
| 07/18/2000 | US6091268 Potential detecting circuit and semiconductor integrated circuit |
| 07/18/2000 | US6091257 Vacuum activated backside contact |
| 07/18/2000 | US6091256 Contact device for making connection to an electronic circuit device |
| 07/18/2000 | US6091254 Universal wafer carrier for wafer level die burn-in |
| 07/18/2000 | US6091253 Jig for electrically bridging between a circuit board and a tester during testing of the circuit board |
| 07/18/2000 | US6091252 Method, apparatus and system for testing bumped semiconductor components |
| 07/18/2000 | US6091251 Discrete die burn-in for nonpackaged die |
| 07/18/2000 | US6091250 Discrete die burn-in for nonpackaged die |
| 07/18/2000 | US6091249 Method and apparatus for detecting defects in wafers |
| 07/18/2000 | US6091248 Method for measuring the electrical potential in a semiconductor element |
| 07/18/2000 | US6091246 Battery remaining capacity measuring apparatus |
| 07/18/2000 | US6091245 Method and apparatus for auditing a battery test |
| 07/18/2000 | US6091236 System and method for measuring and analyzing electrical signals on the shaft of a machine |
| 07/18/2000 | US6091226 Voltage judgment circuit and battery cell pack having the same |
| 07/18/2000 | US6091079 Semiconductor wafer |
| 07/18/2000 | US6091062 Method and apparatus for temperature control of a semiconductor electrical-test contractor assembly |