| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 08/08/2000 | US6101457 Test access port |
| 08/08/2000 | US6101148 Dynamic random access memory |
| 08/08/2000 | US6100828 Analog-to-digital converter test system and method |
| 08/08/2000 | US6100815 Compound switching matrix for probing and interconnecting devices under test to measurement equipment |
| 08/08/2000 | US6100771 Multi-signal generator |
| 08/08/2000 | US6100743 Circuit arrangement for adding functionality to a circuit with reduced propagation delays |
| 08/08/2000 | US6100711 Miniature air gap inspection device |
| 08/08/2000 | US6100710 Semiconductor device having two ground pads connected to a ground connection lead and method for testing the same |
| 08/08/2000 | US6100709 Silicon wafer testing rig and a method for testing a silicon wafer wherein the silicon wafer is bent into a dome shape |
| 08/08/2000 | US6100707 Apparatus for testing multi-terminal electronic components |
| 08/08/2000 | US6100706 Burn-in board support frame having inserter and ejector bars for racks of burn-in boards |
| 08/08/2000 | US6100705 Method and structure for viewing static signal levels on integrated circuits using electron beam deflection device |
| 08/08/2000 | US6100704 Quantitative mobility spectrum analysis of magnetic-field dependent hall and resistivity data |
| 08/08/2000 | US6100703 Polarization-sensitive near-field microwave microscope |
| 08/08/2000 | US6100702 In-situ fault detection apparatus and method for an encased energy storing device |
| 08/08/2000 | US6100699 Faulty filter detection technique |
| 08/08/2000 | US6100674 Method of monitoring a tap changer |
| 08/08/2000 | US6100666 Method for calibrating rechargeable battery capacity |
| 08/08/2000 | US6100486 Method for sorting integrated circuit devices |
| 08/08/2000 | US6100102 Method of in-line monitoring for shallow pit on semiconductor substrate |
| 08/08/2000 | US6100101 Sensitive technique for metal-void detection |
| 08/08/2000 | US6099161 Asynchronous analog or digital frequency measurement on digital test equipment |
| 08/08/2000 | US6098460 Acceleration sensor and shock detecting device using the same |
| 08/03/2000 | WO2000050909A1 Testing fastenings of printed circuit board |
| 08/03/2000 | WO2000045569A2 A portable multi-band communication device, and a method for determining a charge consumption thereof |
| 08/03/2000 | WO2000045495A1 A method and an apparatus for identifying a battery |
| 08/03/2000 | WO2000045450A2 Integral sensors for monitoring a fuel cell membrane and methods of monitoring |
| 08/03/2000 | WO2000045449A2 High speed battery charging system with high accuracy voltage sensing |
| 08/03/2000 | WO2000045433A1 Contactor holding mechanism and automatic change mechanism for contactor |
| 08/03/2000 | WO2000045432A1 Drivingly rotatable mechanism of specimen loading table and specimen loading mechanism |
| 08/03/2000 | WO2000045323A1 In-line programming system and method |
| 08/03/2000 | WO2000045279A1 A method enabling communication between an electronic device and a battery, an apparatus comprising an electronic device and a battery, and a battery enabling communication |
| 08/03/2000 | WO2000045189A2 Power consumption reporting by an accessory of an electronic device |
| 08/03/2000 | WO2000045188A1 System for testing real and simulated versions of an integrated circuit |
| 08/03/2000 | WO2000045187A1 Algorithmic pattern generator for integrated circuit tester |
| 08/03/2000 | WO2000045186A1 Integrated circuit tester having pattern generator controlled data bus |
| 08/03/2000 | WO2000045182A1 Deflection device |
| 08/03/2000 | DE19962868A1 Burn-in-board for performing burn-in-test of semiconductor device e.g. LSI, IC, has substrate consisting of protrusion and connector which are connected to burn-in-apparatus |
| 08/03/2000 | DE19905084A1 Arrangement for determining, locating, and signaling events such as occurrence of errors in automatic control units, has display module to indicate incoming signal screened by logic circuit and evaluation logic |
| 08/03/2000 | DE10003073A1 Covered electrical connection used for testing semiconductor wafers contains a connecting track electrically joined to one end of a connecting structure made of conducting material on a substrate |
| 08/03/2000 | CA2359686A1 A method enabling communication between an electronic device and a battery, an apparatus comprising an electronic device and a battery, and a battery enabling communication |
| 08/02/2000 | EP1024573A2 Method and system for diagnosing partial discharge in gas-insulated apparatus |
| 08/02/2000 | EP1024500A2 Test circuit for boost circuit output node potential measurement of a semiconductor ic device |
| 08/02/2000 | EP1024369A1 Characterization of a semiconductor/dielectric interface by photocurrent measurements |
| 08/02/2000 | EP1024368A2 Fault detection device and transport means |
| 08/02/2000 | EP1024367A2 Frequency measurement test circuit and semiconductor integrated circuit having the same |
| 08/02/2000 | EP1024366A1 Test method of semiconductor device and anisotropic conductive film therefor |
| 08/02/2000 | EP1023710A1 Detection of subsidence current in the determination of circuit breaker status in a power system |
| 08/02/2000 | EP1023652A1 Power supply circuit of an electronic component in a test machine |
| 08/02/2000 | EP1023580A2 Apparatus for monitoring temperature of a power source |
| 08/02/2000 | CN2390212Y Portable low-voltage power supply line grounding detecting device |
| 08/02/2000 | CN1261980A Overvoltage protector for high or medium voltage |
| 08/02/2000 | CN1261672A Fault detection of electric line |
| 08/02/2000 | CN1261671A Fault locator using positive phase, sequence electricity quantity |
| 08/02/2000 | CN1261589A Solenoid controlled ectuator fault detecting system and method for driving system |
| 08/02/2000 | CN1055160C Dielectric loss measuring method and equipment for high voltage electric equipment |
| 08/02/2000 | CA2297857A1 Headlight warning system |
| 08/01/2000 | US6098187 Method for selecting operation cycles of a semiconductor IC for performing an IDDQ test by using a logical simulation and a fault simulation |
| 08/01/2000 | US6098186 Test permutator |
| 08/01/2000 | US6098027 Charge mode open/short test circuit |
| 08/01/2000 | US6097884 Probe points and markers for critical paths and integrated circuits |
| 08/01/2000 | US6097755 Time domain reflectometer having optimal interrogating pulses |
| 08/01/2000 | US6097699 Method and system for monitoring broadband quality of services |
| 08/01/2000 | US6097696 Optical layer quasi-centralized restoration |
| 08/01/2000 | US6097647 Efficient method for obtaining usable parts from a partially good memory integrated circuit |
| 08/01/2000 | US6097280 Fault locator that uses positive-phase-sequence electricity |
| 08/01/2000 | US6097206 Memory tester and method of switching the tester to RAM test mode and ROM test mode |
| 08/01/2000 | US6097205 Method and apparatus for characterizing a specimen of semiconductor material |
| 08/01/2000 | US6097204 Inspection apparatus with real time display |
| 08/01/2000 | US6097203 Integrated or intrapackage capability for testing electrical continuity between an integrated circuit and other circuitry |
| 08/01/2000 | US6097202 Circuit board inspection apparatus and method |
| 08/01/2000 | US6097201 System to simultaneously test trays of integrated circuit packages |
| 08/01/2000 | US6097200 Modular, semiconductor reliability test system |
| 08/01/2000 | US6097199 Universal decoder test board |
| 08/01/2000 | US6097198 Inspection jig |
| 08/01/2000 | US6097196 Non-contact tunnelling field measurement for a semiconductor oxide layer |
| 08/01/2000 | US6097194 Method and apparatus for obtaining transfer characteristics of a device under test |
| 08/01/2000 | US6097193 Vehicle starting battery cold-cranking AMPS meter and method |
| 08/01/2000 | US6097191 Testing high intensity discharge lamp fixtures |
| 08/01/2000 | US6097107 Short prevention control apparatus of air conditioner for electric vehicles |
| 08/01/2000 | US6097001 Portable heating tent and method for testing telecommunications equipment |
| 08/01/2000 | US6096997 Method of assembling an igniter including infrared testing of heating element and welds |
| 08/01/2000 | US6096568 Process for preparing a semiconductor device package for analysis of a die |
| 08/01/2000 | US6096567 Method and apparatus for direct probe sensing |
| 08/01/2000 | US6095850 Electric adapter with display unit |
| 08/01/2000 | CA2223841C Battery gauge |
| 08/01/2000 | CA2056139C Electrochromic thin film state-of-charge detector for on-the-cell application |
| 07/29/2000 | CA2296135A1 Testing system for circuit board self-test |
| 07/27/2000 | WO2000044142A1 Trellis decoder with correction of pair swaps, for use in gigabit ethernet transceivers |
| 07/27/2000 | WO2000044077A2 Transfer impedance measurement instrument system |
| 07/27/2000 | WO2000044041A1 Semiconductor integrated circuit and manufacture thereof |
| 07/27/2000 | WO2000044011A1 Vibro-acoustic signature treatment process in high-voltage electromechanical switching system |
| 07/27/2000 | WO2000043884A1 On-chip debug system |
| 07/27/2000 | WO2000043799A1 Apparatus and method for evaluating a condition of a magnetic circuit of an electric machine |
| 07/27/2000 | WO2000043798A1 Voltage indicator for indicating that the voltage of a battery passes a given value |
| 07/27/2000 | WO2000043797A1 Control device for controlling applications which are crucial to safety |
| 07/27/2000 | WO2000017853A3 Multi-pulse sampling of signals using force sampling |
| 07/27/2000 | DE19958789A1 Electron beam tester for semiconductor, produces image of semiconductor from secondary electron emitted from semiconductor |
| 07/27/2000 | DE19902031A1 Control system for use in safety critical applications, has watchdog processor and range of peripherals. |
| 07/27/2000 | DE10002360A1 Error localizer for executing troubleshooting at parallel transmission line has error localizing unit that executes troubleshooting according to electrical data synchronous correction processing |