| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 08/22/2000 | US6106367 Method and device for analysis of flip chip electrical connections |
| 08/22/2000 | CA2196821C Motor initialization method and apparatus |
| 08/17/2000 | WO2000048157A1 Measuring transducer and method for evaluating the supply to a measuring transducer |
| 08/17/2000 | WO2000048013A1 Method for determining a state of charge of a battery |
| 08/17/2000 | WO2000048012A1 Method for the verification of the polarity, presence, alignment of components and short circuits on a printed circuit board |
| 08/17/2000 | WO2000048011A1 An arrangement for transient-current testing of a digital electronic cmos circuit |
| 08/17/2000 | WO2000048007A1 Coupling and centering system, particularly for aligning printed circuits in testing procedures |
| 08/17/2000 | WO2000047885A1 Method and device in vehicle control system, and system for error diagnostics in vehicle |
| 08/17/2000 | WO2000028663A3 Fir filter structure with low latency for gigabit ethernet applications |
| 08/17/2000 | DE19905550A1 Verfahren zur Bestimmung eines Ladungszustandes einer Batterie A method of determining a charge state of a battery |
| 08/17/2000 | CA2362151A1 Method for the verification of the polarity, presence, alignment of components and short circuits on a printed circuit board |
| 08/16/2000 | EP1028526A2 Switching device with weak-current detecting function |
| 08/16/2000 | EP1028322A1 Method and apparatus for eliminating shoot-through events during master-slave flip-flop scan operations |
| 08/16/2000 | EP1027707A1 Method for testing the bus terminals of writable-readable integrated electronic integrated circuits, especially of memory chips |
| 08/16/2000 | EP1027615A1 Inspection system for inspecting discrete wiring patterns formed on a continuous substrate sheet of a flexible material |
| 08/16/2000 | EP1027614A1 Method for testing electrical modules |
| 08/16/2000 | EP1027613A1 Dual-band rf test interface circuit |
| 08/16/2000 | EP1027612A1 Method and measuring unit for verifying the presence of a neutral conductor connection between a four wire system and a measuring unit |
| 08/16/2000 | EP0979415A4 Manipulator with expanded range of motion |
| 08/16/2000 | EP0912979B1 Semiconductor memory tester with redundancy analysis |
| 08/16/2000 | EP0782747B1 Memory with stress circuitry for detecting defects |
| 08/16/2000 | CN1263638A Method and apparatus for cooling semiconductor die |
| 08/16/2000 | CN1263618A Configuration control in programmable logic device using non-volatile elements |
| 08/16/2000 | CN1263600A Battery measuring terminal |
| 08/16/2000 | CN1263369A Full-wave/half-wave automatic repeat frequency charging and discharging circuit |
| 08/16/2000 | CN1263270A Method for testing abnormality of electronic element and device on printed circuit board and its testing instrument |
| 08/16/2000 | CN1263257A Colour purity drift testing method of colour kinescope and its device |
| 08/15/2000 | US6105157 Salphasic timing calibration system for an integrated circuit tester |
| 08/15/2000 | US6105156 LSI tester for use in LSI fault analysis |
| 08/15/2000 | US6105154 Multi-bus multi-data transfer protocols controlled by a bus arbiter coupled to a CRC signature compactor |
| 08/15/2000 | US6105153 Semiconductor integrated circuit and its evaluating method |
| 08/15/2000 | US6104985 Device for classifying electronic components |
| 08/15/2000 | US6104967 Fault-tolerant battery system employing intra-battery network architecture |
| 08/15/2000 | US6104312 Device for adjusting parameters and/or operating conditions in electrical shop apparatus |
| 08/15/2000 | US6104304 Self-test and status reporting system for microcontroller-controlled devices |
| 08/15/2000 | US6104297 Corona discharge detection system |
| 08/15/2000 | US6104287 Circulator reverse power alarm |
| 08/15/2000 | US6104280 Method of manufacturing and testing an electronic device, and an electronic device |
| 08/15/2000 | US6104239 Method for correcting frequency-varying nonlinear errors and digital correction circuit implementing same |
| 08/15/2000 | US6104206 Product wafer junction leakage measurement using corona and a kelvin probe |
| 08/15/2000 | US6104203 Test apparatus for electronic components |
| 08/15/2000 | US6104202 Interface apparatus for automatic test equipment |
| 08/15/2000 | US6104201 Method and apparatus for passive characterization of semiconductor substrates subjected to high energy (MEV) ion implementation using high-injection surface photovoltage |
| 08/15/2000 | US6104199 Magnetic-head short-circuit detector |
| 08/15/2000 | US6104198 Testing the integrity of an electrical connection to a device using an onboard controllable signal source |
| 08/15/2000 | US6104197 Apparatus for acquiring waveform data from a metallic transmission cable |
| 08/15/2000 | US6104196 Cruise control tester |
| 08/15/2000 | US6104194 Method of detecting secondary electron charge in a cathode ray tube |
| 08/15/2000 | US6104183 Semiconductor device testing apparatus |
| 08/15/2000 | US6104167 Method and apparatus for charging a battery |
| 08/15/2000 | US6104166 Method and device for detecting a state of charge of a battery assembly, and battery assembly charge and discharge control device |
| 08/15/2000 | US6104164 Cell voltage detecting device for combination battery |
| 08/15/2000 | US6103978 Printed wiring board having inner test-layer for improved test probing |
| 08/15/2000 | US6103553 Method of manufacturing a known good die utilizing a substrate |
| 08/15/2000 | US6103408 Electric battery |
| 08/15/2000 | US6102964 Fitting for incremental compilation of electronic designs |
| 08/15/2000 | US6102962 Method for estimating quiescent current in integrated circuits |
| 08/15/2000 | US6102960 Automatic behavioral model generation through physical component characterization and measurement |
| 08/15/2000 | CA2063558C Portable low power computer |
| 08/10/2000 | WO2000046820A1 Method of screening laminated ceramic capacitor |
| 08/10/2000 | WO2000046810A1 Method for functionally testing memory cells of an integrated semiconductor memory |
| 08/10/2000 | WO2000046611A1 Rapid determination of present and potential battery capacity |
| 08/10/2000 | WO2000046610A1 Automatic test equipment using sigma delta modulation to create reference levels |
| 08/10/2000 | WO2000046609A1 Low-cost configuration for monitoring and controlling parametric measurement units in automatic test equipment |
| 08/10/2000 | WO2000046608A1 Multi-layered electronic parts |
| 08/10/2000 | WO2000046607A1 Apparatus and method for testing coating of an electrical conductor |
| 08/10/2000 | DE4404445C2 Integrierte Halbleiterschaltung und Verfahren zum Testen derselben A semiconductor integrated circuit and method for testing the same |
| 08/10/2000 | DE19905071A1 Meßumformer sowie Verfahren zur Diagnose der Versorgung eines Meßumformers Transmitter as well as methods for diagnosing the supply of a transmitter |
| 08/10/2000 | DE19903239A1 Determining state of charge of battery connected to charger involves forming ratio of battery voltage and load current differences for two different charger output voltages at same temperature |
| 08/10/2000 | DE19843435C2 Burn-In-Testvorrichtung Burn-in test device |
| 08/10/2000 | DE10001290A1 Elektrooptische Abtastsonde Electro-optical scanning probe |
| 08/10/2000 | CA2373116A1 Multi-layered electronic parts |
| 08/10/2000 | CA2361842A1 Rapid determination of present and potential battery capacity |
| 08/10/2000 | CA2361764A1 Apparatus and method for testing coating of an electrical conductor |
| 08/09/2000 | EP1026789A2 Device for checking a plug-type connector provided with cables |
| 08/09/2000 | EP1026696A2 Test method and test circuit for electronic device |
| 08/09/2000 | EP1026590A2 Circuit board with self-test |
| 08/09/2000 | EP1026512A2 Test circuit for a communication element |
| 08/09/2000 | EP1026511A2 Semiconductor device |
| 08/09/2000 | EP1026510A2 Appliance and process for testing an electrolytical capacitor |
| 08/09/2000 | EP1025479A1 Parallel processing pattern generation system for an integrated circuit tester |
| 08/09/2000 | EP1025476A1 Multiple output programmable reference voltage source |
| 08/09/2000 | EP1024985A1 Circuit configuration to monitor a regulated output voltage in a motor vehicle |
| 08/09/2000 | EP1024855A1 Packaging and coating for bio-electrical stimulation and recording electrodes |
| 08/09/2000 | EP1023580A4 Apparatus for monitoring temperature of a power source |
| 08/09/2000 | EP1012611A4 Arcing fault detection system |
| 08/09/2000 | EP0934533B1 Switching arrangement for monitoring leakage current |
| 08/09/2000 | EP0891272B1 Control device for a windshield wiper motor |
| 08/09/2000 | CN2391377Y Independent switch power supply device for chargable battery detection |
| 08/09/2000 | CN2391207Y Apparatus for detecting accumulator capacitance |
| 08/09/2000 | CN2391206Y Power line short-circuit fault indicator |
| 08/09/2000 | CN2391205Y Automatic pole exchange apparatus with electric current test feedback function |
| 08/09/2000 | CN1262540A Method and system for diagnosing partial discharging in gas insulator |
| 08/09/2000 | CN1262443A Radiation effect detector for satellite |
| 08/09/2000 | CN1262442A Scanning tester for continuously testing bare PC board |
| 08/09/2000 | CN1262441A Voltage distribution measurer of insulator string for DC transmission line |
| 08/09/2000 | CN1262216A Method for making conveying tray cycle by using module IC to operate lifting unit and device therefor |
| 08/08/2000 | US6101623 Current reduction circuit for testing purpose |
| 08/08/2000 | US6101622 Asynchronous integrated circuit tester |
| 08/08/2000 | US6101458 Automatic ranging apparatus and method for precise integrated circuit current measurements |