| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 08/31/2000 | DE19910165A1 Bus-bar test device esp. for compartment-type, gas-insulated medium voltage switchgear for power transmission |
| 08/31/2000 | DE19905709A1 Procedure to recognise automobile lamp failure |
| 08/31/2000 | DE19901460C1 Integrierte Halbleiterschaltung und Verfahren zur Überprüfung des Übertragungsverhaltens von Pad-Zellen Semiconductor integrated circuit and method for checking the transmission behavior of the pad cells |
| 08/31/2000 | DE10007427A1 Semiconductor test system supported by the event for testing integrated semiconductor components has storage data compression by which event data can be stored in test system |
| 08/31/2000 | DE10006919A1 Semiconductor test system for testing electronic components is supported by event for testing signals and strobe signals sensing for generation of evaluation of semiconductor component on basis of event data stored in event memory |
| 08/31/2000 | DE10006144A1 Timer circuit for time control of signal used for test of semiconductor component in semiconductor test system, has second fine delay circuit that receives output signal of first fine delay circuit |
| 08/31/2000 | DE10004198A1 Internal data signal refresh method for analysis with logic analyzer involves loading signal refresh data from emulation logic, deriving internal signal from data signals and refresh data |
| 08/31/2000 | DE10003426A1 Elektro-optische Abtastsonde Electro-optical scanning probe |
| 08/31/2000 | DE10000362A1 Detecting structured substrates defects involves scanning charged particle beam over substrate with optical column stationary w.r.t. surface, comparing detected images with reference |
| 08/30/2000 | EP1031995A1 Built-in self-test circuit for memory |
| 08/30/2000 | EP1031843A2 Valuation of tester accuracy |
| 08/30/2000 | EP1031842A1 Device for testing the performance of a chip card with contacts |
| 08/30/2000 | EP1031840A2 Electric resistance measuring apparatus and method for circuit board |
| 08/30/2000 | EP1031839A2 Test fixture for matched impedance testing |
| 08/30/2000 | EP1031044A1 Electro-chemical deterioration test method and apparatus |
| 08/30/2000 | EP1031043A1 Method and system for monitoring the condition of a battery pack in a defibrillator |
| 08/30/2000 | EP1031042A1 Device for testing printed boards |
| 08/30/2000 | EP1031041A1 Device for checking an electric drive |
| 08/30/2000 | EP1031026A1 Process and device for detecting the location of components and/or for checking the position of component connections and mounting head with a device for detecting the location of components and/or checking the position of component connections |
| 08/30/2000 | EP0934580A4 Battery capacity monitoring system |
| 08/30/2000 | EP0855071B1 Enhanced security semiconductor device, semiconductor circuit arrangement, and method of production thereof |
| 08/30/2000 | CN1265198A Thermochromic battery testers |
| 08/30/2000 | CN1265197A Electrical tester for small motor vehicles |
| 08/30/2000 | CN1264921A Method and device for arranging test in measuring dynamic logic circuit |
| 08/30/2000 | CN1056002C Detection appts. for cast-aluminium rotor of electric machine |
| 08/29/2000 | US6112321 Nonvolatile semiconductor storage device |
| 08/29/2000 | US6112163 Semiconductor integrated circuit and test method therefor |
| 08/29/2000 | US6112159 Robust electrical utility meter |
| 08/29/2000 | US6112156 Apparatus and method for detecting abnormality of motor |
| 08/29/2000 | US6112020 Apparatus and method for generating configuration and test files for programmable logic devices |
| 08/29/2000 | US6111891 Serial interface transmission structure |
| 08/29/2000 | US6111801 Technique for testing wordline and related circuitry of a memory array |
| 08/29/2000 | US6111637 Apparatus and method for examining wafers |
| 08/29/2000 | US6111602 Method and apparatus for inspecting solder joints |
| 08/29/2000 | US6111513 Apparatus for detecting open circuits in parallel-wired thermo modules |
| 08/29/2000 | US6111424 Testing method and apparatus for flat panel displays using infrared imaging |
| 08/29/2000 | US6111423 Method and apparatus for measuring pinch-off voltage of a field effect transistor |
| 08/29/2000 | US6111422 Method of testing susceptibility to failure of functional circuitry embodied in an integrated circuit |
| 08/29/2000 | US6111421 Probe method and apparatus for inspecting an object |
| 08/29/2000 | US6111420 Fine alignment IC handler and method for assembling the same |
| 08/29/2000 | US6111419 Method of processing a substrate including measuring for planarity and probing the substrate |
| 08/29/2000 | US6111417 Semiconductor component test apparatus including sucking mechanism maintaining components in tray during testing |
| 08/29/2000 | US6111416 Electro-optical and magneto-optical sensing apparatus and method for characterizing free-space electromagnetic radiation |
| 08/29/2000 | US6111414 System, circuit, and method for testing an interconnect in a multi-chip substrate |
| 08/29/2000 | US6111399 Measurement system and antenna therefor |
| 08/29/2000 | US6111330 Arrangement for sensing the temperature of the armature of a direct current motor |
| 08/29/2000 | US6111269 Circuit, structure and method of testing a semiconductor, such as an integrated circuit |
| 08/29/2000 | US6111246 Semiconductor device testing apparatus having presence or absence detectors issuing an alarm when an error occurs |
| 08/29/2000 | US6110823 Method of modifying the thickness of a plating on a member by creating a temperature gradient on the member, applications for employing such a method, and structures resulting from such a method |
| 08/29/2000 | US6110223 Graphic editor for block diagram level design of circuits |
| 08/29/2000 | US6109879 Fluid pressure source apparatus |
| 08/29/2000 | CA2130434C Method and apparatus for electronic meter testing |
| 08/29/2000 | CA2045426C Dump valve operational fault-determination system |
| 08/24/2000 | WO2000049715A2 Serial switch driver architecture for automatic test equipment |
| 08/24/2000 | WO2000049421A1 Testing integrated circuit dice |
| 08/24/2000 | DE19963493A1 Test pattern generator for fault detection in LSI, arranges flip-flops in ascending order of processing time based on which test pattern for partial circuit is generated |
| 08/24/2000 | DE19908777A1 Rechargeable electric battery capacitance display method and device |
| 08/24/2000 | DE19906932A1 Binary input device with one or more binary input channels has evaluation device for input channels that assesses device function capability |
| 08/24/2000 | DE19903430A1 Measurement adapter for inspection of electric drive for robots; uses selection switch through which socket elements of pin jack and measurement sockets may be operable |
| 08/24/2000 | DE19680641C2 Fehlerspeicher-Analysiervorrichtung in einem Halbleiterspeichertestsystem Error analyzer memory in a semiconductor memory test system |
| 08/24/2000 | DE10007983A1 Circuit for measuring power currents circuit for measuring power currents for burn-in test; sets current measurement circuit and power supply circuit for high currents and measurement and power supply circuit for weak currents |
| 08/23/2000 | EP1030391A1 Battery pack |
| 08/23/2000 | EP1030313A2 Semiconductor device having test mode entry circuit |
| 08/23/2000 | EP1030185A2 Process and means for monitoring the current in a power distribution network |
| 08/23/2000 | EP1030182A1 Calibrating a RF integrated circuit sensor |
| 08/23/2000 | EP1029385A1 Battery having a built-in controller |
| 08/23/2000 | EP1029348A1 A system for identifying defective electronic devices |
| 08/23/2000 | EP1029249A2 Test head structure for integrated circuit tester |
| 08/23/2000 | CN2393107Y Detection device for image sensing apparatus |
| 08/23/2000 | CN2393103Y Radio fault detector positioner for high-voltage transmission line |
| 08/23/2000 | CN1264471A Battery testing and classification |
| 08/23/2000 | CN1264042A Method and device for rapidly and precisely measuring secondary pick-up voltage of relay |
| 08/23/2000 | CN1263857A Palletization transporting device for integral circuit assembly processer and transporting method thereof |
| 08/22/2000 | US6108807 Apparatus and method for hybrid pin control of boundary scan applications |
| 08/22/2000 | US6108806 Method of testing and diagnosing field programmable gate arrays |
| 08/22/2000 | US6108805 Domino scan architecture and domino scan flip-flop for the testing of domino and hybrid CMOS circuits |
| 08/22/2000 | US6108804 Method and apparatus for testing adjustment of a circuit parameter |
| 08/22/2000 | US6108803 Memory cell circuit for executing specific tests on memory cells that have been designated by address data |
| 08/22/2000 | US6108798 Self programmed built in self test |
| 08/22/2000 | US6108794 Signal comparison system and method for improving data analysis by determining transitions of a data signal with respect to a clock signal |
| 08/22/2000 | US6108793 Semiconductor device having timing-stabilization circuit and method of testing such semiconductor device |
| 08/22/2000 | US6108579 Battery monitoring apparatus and method for programmers of cardiac stimulating devices |
| 08/22/2000 | US6108252 Integrated circuit memory devices having self-test circuits therein and method of testing same |
| 08/22/2000 | US6108073 Electromagnetic wave detecting system |
| 08/22/2000 | US6107867 Load termination sensing circuit |
| 08/22/2000 | US6107855 Redundant clock signal generating circuitry |
| 08/22/2000 | US6107818 High speed, real-time, state interconnect for automatic test equipment |
| 08/22/2000 | US6107816 Test apparatus for time dependent dielectric breakdown |
| 08/22/2000 | US6107815 Test circuit and testing method for function testing of electronic circuits |
| 08/22/2000 | US6107814 Methods and circuits for testing open collectors and open drains |
| 08/22/2000 | US6107808 Internal unbalance detection in capacitors |
| 08/22/2000 | US6107807 Method and circuit for locating a short circuit or cable break in a bus system |
| 08/22/2000 | US6107804 Apparatus for measuring the amount of electric charge induced in conductive part and method of measuring electric charge |
| 08/22/2000 | US6107802 Battery pack with monitoring function utilizing association with a battery charging system |
| 08/22/2000 | US6107791 Non-disturbing electric field sensor using piezoelectric and converse piezoelectric resonances |
| 08/22/2000 | US6107779 Apparatus for detecting remaining capacity of battery |
| 08/22/2000 | US6107777 Circuit for causing a voltage step in a multi-cell battery |
| 08/22/2000 | US6107111 Circuit and method for configuring a redundant bond pad for probing a semiconductor |
| 08/22/2000 | US6107107 Forming a layer of an antireflective coating material upon the backside surface of the substrate prior to detecting electromagnetic radiation emanating from the backside surface and detecting a response from the electronic circuit |
| 08/22/2000 | US6106568 Hierarchical scan architecture for design for test applications |