| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 09/13/2000 | CN1266547A Memorizing the first operating time of stand-by battery and/or indicating the end of a stand-by battery lifetime |
| 09/13/2000 | CN1266496A Low cost CMOS tester with high channel density |
| 09/13/2000 | CN1266495A Tester with fast refire recovery time |
| 09/13/2000 | CN1266492A Test socket lattice |
| 09/13/2000 | CN1266491A Aging test socket |
| 09/13/2000 | CN1266191A Method and apparatus for on-line testing lightning arrester |
| 09/13/2000 | CN1056449C Tester and method for circuit traces on a flexible substrate |
| 09/13/2000 | CN1056448C Resistance-measurement based arrangement for monitoring integrity of travel path ground link in electronic components handling apparatus |
| 09/12/2000 | US6119257 Semiconductor device testing apparatus capable of high speed test operation |
| 09/12/2000 | US6119256 Apparatus for testing a fixed logic value interconnection between integrated circuits |
| 09/12/2000 | US6119255 Testing system for evaluating integrated circuits, a burn-in testing system, and a method for testing an integrated circuit |
| 09/12/2000 | US6119254 Hardware tracing/logging for highly integrated embedded controller device |
| 09/12/2000 | US6119253 Method and device for setting a plurality of test modes using external pins |
| 09/12/2000 | US6119250 Semiconductor integrated circuit |
| 09/12/2000 | US6119064 Vehicular control apparatus arranged for undergoing initial failure test after burn-in and method arranged therefor |
| 09/12/2000 | US6118894 Integrated circuit probe card inspection system |
| 09/12/2000 | US6118759 Network system and frame relay switch |
| 09/12/2000 | US6118710 Semiconductor memory device including disturb refresh test circuit |
| 09/12/2000 | US6118409 Method and device for inspecting at least one antenna branch, in particular in a vehicle |
| 09/12/2000 | US6118306 Changing clock frequency |
| 09/12/2000 | US6118296 Semiconductor integrated logic circuit |
| 09/12/2000 | US6118294 Integrated circuit testing device |
| 09/12/2000 | US6118293 High resolution (quiescent) supply current system (IDD monitor) |
| 09/12/2000 | US6118292 Method and device for correcting misalignment between test needles and test points during electrical testing of printed circuit boards |
| 09/12/2000 | US6118290 Prober and method for cleaning probes provided therein |
| 09/12/2000 | US6118288 Adaptive PCB testing system employing rearrangable test probes |
| 09/12/2000 | US6118286 Semiconductor device tester-to-handler Interface board with large test area |
| 09/12/2000 | US6118285 Non-contact plasma probe for testing electrical continuity of printed wire boards |
| 09/12/2000 | US6118281 Method for determining the shielding effect of a shielded cabling path |
| 09/12/2000 | US6118278 Short circuit detection in particular for a measuring bridge |
| 09/12/2000 | US6118277 Appearance inspection apparatus for electronic parts and appearance inspection method for electronic parts |
| 09/12/2000 | US6118275 Method and apparatus for measuring battery capacity using voltage response signal based on pulse current |
| 09/12/2000 | US6118252 Process for determining the starting capacity of the starter battery of a motor vehicle |
| 09/12/2000 | US6118138 Reduced terminal testing system |
| 09/12/2000 | US6117974 For screening bioactive molecules; compounds have n-alpha derivative amino acids linked by bridging group of disulfide, amide, thioether, thioester, imine, ether, or alkene to terminus located at a side chain or a backbone nitrogen |
| 09/12/2000 | US6117696 Circuit and method for measuring and forcing an internal voltage of an integrated circuit |
| 09/12/2000 | US6117693 System for fabricating and testing assemblies containing wire bonded semiconductor dice |
| 09/12/2000 | US6117352 Removal of a heat spreader from an integrated circuit package to permit testing of the integrated circuit and other elements of the package |
| 09/12/2000 | US6117193 Attaching a fixture to the lens for joining the package of the detector array to the lens, finding the absolute locations of the plane, the center, and the horizontal and vertical axes of the sensor |
| 09/12/2000 | US6116935 Connector examination instrument |
| 09/12/2000 | US6116413 Coating for bioelectrical stimulation and recording electrodes |
| 09/12/2000 | US6115925 Probepin-adjusting jig |
| 09/08/2000 | WO2000052703A1 Parallel testing of integrated circuit devices using cross-dut and within-dut comparisons |
| 09/08/2000 | WO2000052488A1 Distributed interface for parallel testing of multiple devices using a single tester channel |
| 09/08/2000 | WO2000052487A1 Efficient parallel testing of integrated circuit devices using a known good device to generate expected responses |
| 09/08/2000 | WO2000052485A1 Telemetry system and method for emi susceptibility testing of motor vehicles |
| 09/08/2000 | WO2000052484A2 Interface independent test system |
| 09/08/2000 | WO2000017853A9 Multi-pulse sampling of signals using force sampling |
| 09/08/2000 | CA2363753A1 Telemetry system and method for emi susceptibility testing of motor vehicles |
| 09/07/2000 | DE19929546C1 Multi-mode memory element has combination circuit that implements Boolean function for first state of control signal and connects its second input logically to output for second state |
| 09/07/2000 | DE19904608A1 Vorrichtung zur Prüfung eines Kondensators und Verfahren zur Prüfung eines Kondensators Device for examination of a capacitor and methods for examination of a capacitor |
| 09/07/2000 | DE10000588A1 Laminate ceramic capacitor selection procedure involves impressing specific voltage to capacitor and then measuring insulation resistance of capacitor, based on which capacitor is selected |
| 09/06/2000 | EP1032964A2 Universal power supply |
| 09/06/2000 | EP1032955A1 Apparatus and method for carrying out diagnostic tests on batteries and for rapidly charging batteries |
| 09/06/2000 | EP1032912A1 Electronic assembly video inspection system |
| 09/06/2000 | EP1032846A1 Diagnostic device for recognizing short circuits or line interruptions of an inductive sensor |
| 09/06/2000 | EP1032845A1 Integrated circuit tester having pattern generator controlled data bus |
| 09/06/2000 | EP1032844A1 Modular integrated circuit tester with distributed synchronization and control |
| 09/06/2000 | EP1032843A1 Method and device for measuring electromagnetic compatibility |
| 09/06/2000 | EP1032519A1 Protective circuit for a controlling element and method for testing the control circuit of a controlling element |
| 09/06/2000 | CN2395394Y Charging and discharging device for lithium ion cell volume detector |
| 09/06/2000 | CN2395284Y Switch device for short circuit test of communication power source |
| 09/06/2000 | CN2395283Y Property detector for infrared focal plane array probe |
| 09/06/2000 | CN2395282Y Detection and test device for insulation tools |
| 09/06/2000 | CN2395281Y Monitor for workaing condition of arrester |
| 09/06/2000 | CN1265470A Gripping jaw of gripping device for use in modular integrated circuit information processor |
| 09/06/2000 | CN1056230C Fluid leakage electric detecting cable |
| 09/05/2000 | US6115836 Scan path circuitry for programming a variable clock pulse width |
| 09/05/2000 | US6115835 Method and apparatus for determining a set of tests for integrated circuit testing |
| 09/05/2000 | US6115833 Semiconductor memory testing apparatus |
| 09/05/2000 | US6115832 Process and circuitry for monitoring a data processing circuit |
| 09/05/2000 | US6115831 Integrated circuit for coupling a microcontrolled control apparatus to a two-wire bus |
| 09/05/2000 | US6115827 Clock skew management method and apparatus |
| 09/05/2000 | US6115783 Integrated circuit |
| 09/05/2000 | US6115645 Semiconductor tester with remote debugging for handler |
| 09/05/2000 | US6115389 Auto-negotiation for multiple ports using shared logic |
| 09/05/2000 | US6115361 Link incident reporting extended link service for networks |
| 09/05/2000 | US6115305 Method and apparatus for testing a video display chip |
| 09/05/2000 | US6115304 Semiconductor memory device and method of burn-in testing |
| 09/05/2000 | US6114892 Low power scan test cell and method for making the same |
| 09/05/2000 | US6114880 Dynamic over frequency detection and protection circuitry |
| 09/05/2000 | US6114871 Abnormality detecting method and apparatus for electrical equipment, particularly for a rotating electric machine |
| 09/05/2000 | US6114870 Test system and process with a microcomputer at each test location |
| 09/05/2000 | US6114868 Uniform temperature environmental testing method for semiconductor devices |
| 09/05/2000 | US6114867 Device testing apparatus |
| 09/05/2000 | US6114866 Semiconductor device test board and method for evaluating semiconductor devices |
| 09/05/2000 | US6114865 Device for electrically contacting a floating semiconductor wafer having an insulating film |
| 09/05/2000 | US6114864 Probe card with plural probe tips on a unitary flexible tongue |
| 09/05/2000 | US6114861 Apparatus for and method of evaluating the polarization characteristic of a ferroelectric capacitor |
| 09/05/2000 | US6114856 Method for detecting faults in electrical circuits having pin type connector |
| 09/05/2000 | US6114848 Direct-measurement provision of safe backdrive levels |
| 09/05/2000 | US6114838 Battery capacity test method and apparatus |
| 09/05/2000 | US6114836 Apparatus and method for controlling a power source applicable to portable electronic equipment |
| 09/05/2000 | US6114181 Pre burn-in thermal bump card attach simulation to enhance reliability |
| 09/05/2000 | US6113646 Method of selecting layout of integrated circuit probe card |
| 09/05/2000 | US6113262 Apparatus for testing electrical components |
| 09/05/2000 | US6113053 Electronic chip component for measurement and tape cartridge holding the same |
| 09/05/2000 | US6112905 Automatic semiconductor part handler |
| 09/01/2000 | CA2264328A1 A method and apparatus for increasing the speed of electromagnetic scanning of electronic devices |
| 08/31/2000 | WO2000050908A1 Multi-ended fault location system |