| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 09/26/2000 | US6125461 Method for identifying long paths in integrated circuits |
| 09/26/2000 | US6125460 Method for testing semiconductor device having embedded nonvolatile memory |
| 09/26/2000 | US6125416 Method and device for communicating across a chip boundary including a serial-parallel data packet converter having flow control logic |
| 09/26/2000 | US6125336 Apparatus for device qualification |
| 09/26/2000 | US6125334 Module-configurable full-chip power profiler |
| 09/26/2000 | US6125107 Dual-band RF test interface circuit |
| 09/26/2000 | US6124797 Backup battery monitoring device and method |
| 09/26/2000 | US6124745 Delay and interpolation timing structures and methods |
| 09/26/2000 | US6124725 Apparatus and method for testing semiconductor devices formed on a semiconductor wafer |
| 09/26/2000 | US6124724 Method of increasing AC testing accuracy through linear extrapolation |
| 09/26/2000 | US6124722 Universal apparatus for testing printed circuit boards utilizing independently movable needle boards |
| 09/26/2000 | US6124721 Method of engaging electrically conductive test pads on a semiconductor substrate |
| 09/26/2000 | US6124717 Low frequency suppression circuit for a time domain reflectometer |
| 09/26/2000 | US6124716 Circuit continuity test apparatus |
| 09/26/2000 | US6124715 Testing of live circuit boards |
| 09/26/2000 | US6124714 Lightning and surge arrester test apparatus and method |
| 09/26/2000 | US6124706 Electro-optic voltage sensor with Multiple Beam Splitting |
| 09/26/2000 | US6124701 System and method for determining battery condition and telecommunications equipment incorporating the same |
| 09/26/2000 | US6124692 Method and apparatus for reducing electrical power consumption in a machine monitor |
| 09/26/2000 | US6124677 Method and circuit for testing the output connections of a driver circuit for a plasma display panel |
| 09/26/2000 | US6124559 Integrated circuit sorter that automatically prevents binning of integrated circuits into a wrong container |
| 09/26/2000 | US6124144 Metal electrode mask in a method of fault failure analysis and characterization of semiconductor devices |
| 09/26/2000 | US6124143 Process monitor circuitry for integrated circuits |
| 09/26/2000 | US6124141 Non-destructive method and device for measuring the depth of a buried interface |
| 09/26/2000 | CA2249088C Method and apparatus for high-speed interconnect testing |
| 09/26/2000 | CA2079468C Arcing fault detector |
| 09/21/2000 | WO2000055863A1 Device and method for carrying out the built-in self-test of an electronic circuit |
| 09/21/2000 | WO2000055641A1 Ground fault location system and ground fault detector therefor |
| 09/21/2000 | WO2000055639A1 Laplace transform impedance spectrometer and its measurement method |
| 09/21/2000 | WO2000055342A1 Compositions and methods for helper-free production of recombinant adeno-associated viruses |
| 09/21/2000 | DE19949377A1 Automatic storage of trigger definition in signal measuring system registers and stores signal data in accordance with trigger specification, uses trigger definition and control parameter to store specification that actuates memory state |
| 09/21/2000 | DE19912732A1 Test device for electric light of vehicle brake system, such as for trailing electrical outlet, has test circuit which undertakes simulation of incandescent lamp resistance of brake light system |
| 09/21/2000 | DE19912300A1 Verfahren Method |
| 09/21/2000 | DE19910287A1 Method and device for assessing or determining the usefulness of a battery or for operating a battery includes a photovoltaic generator connected to DC or AC voltage mains operated as a DC or AC converter. |
| 09/21/2000 | DE19909609C1 Current source power characteristic measuring method e.g. for solar module, uses offset measurement of voltage across load capacitor and capacitor charging current |
| 09/21/2000 | DE19906276A1 Verfahren und Strommeßmodul zur Stromüberwachung in einem Stromversorgungssystem And current measuring method for power control in a power supply system |
| 09/20/2000 | EP1037065A1 Battery charge monitor for a electronic appliance |
| 09/20/2000 | EP1037064A2 Battery pack, method for charging/discharging counting and method for setting residual capacity of the battery pack |
| 09/20/2000 | EP1037063A1 Fault determination apparatus and fault determination method for a battery set |
| 09/20/2000 | EP1037062A2 Apparatus for heating electronic components |
| 09/20/2000 | EP1037061A2 Method for testing on-vehicle electronic unit |
| 09/20/2000 | EP1036338A1 Boundary scan system with address dependent instructions |
| 09/20/2000 | EP0859953B1 Process and arrangement for testing solder joints |
| 09/20/2000 | EP0824776B1 Method and apparatus for detecting arcing in ac power systems by monitoring high frequency noise |
| 09/20/2000 | CN2397502Y Seizing device for testing battary |
| 09/20/2000 | CN2397501Y Portable electric circuit tracking detector |
| 09/20/2000 | CN2397500Y Fault display device for electronic equipment |
| 09/20/2000 | CN1267376A Packed battery tester |
| 09/20/2000 | CN1266991A Battery package, method for counting of charging/discharging and providing with residual electricity quantity of battery package |
| 09/19/2000 | USRE36875 Semiconductor memory device capable of performing test mode operation and method of operating such semiconductor device |
| 09/19/2000 | US6122762 Memory interface device and method for supporting debugging |
| 09/19/2000 | US6122761 IC chip tester using compressed digital test data and a method for testing IC chip using the tester |
| 09/19/2000 | US6122760 Burn in technique for chips containing different types of IC circuitry |
| 09/19/2000 | US6122600 Method device qualification |
| 09/19/2000 | US6122577 Device and method to monitor sensors in vehicles |
| 09/19/2000 | US6122576 Diagnosis of electrical consumers in a motor vehicle |
| 09/19/2000 | US6122563 Method of sorting a group of integrated circuit devices for those devices requiring special testing |
| 09/19/2000 | US6122320 Circuit for motion estimation in digitized video sequence encoders |
| 09/19/2000 | US6122313 Self-contained self-testing data modulator |
| 09/19/2000 | US6122248 Data transmission system with bus failure recovery |
| 09/19/2000 | US6122190 Semiconductor memory device capable of high speed plural parallel test |
| 09/19/2000 | US6121820 Semiconductor device having fuse and method for checking whether the fuse is fused |
| 09/19/2000 | US6121788 Method and fixture for evaluating stator core quality in production |
| 09/19/2000 | US6121787 Electronic test apparatus |
| 09/19/2000 | US6121786 Semiconductor integrated circuit |
| 09/19/2000 | US6121785 Circuit and a method for configuring pad connections in an integrated device |
| 09/19/2000 | US6121784 Probe tip and a process for testing a semiconductor device |
| 09/19/2000 | US6121783 Method and apparatus for establishing electrical contact between a wafer and a chuck |
| 09/19/2000 | US6121779 Bulk current injection system |
| 09/19/2000 | US6121778 Method and apparatus for testing frequency-dependent electrical circuits |
| 09/19/2000 | US6121777 Apparatus for detecting at least one property of a cable |
| 09/19/2000 | US6121754 Method for displaying a "low battery" state in electrical equipment with electrical energy stores and electrical equipment with electrical energy stores with means for displaying a "low battery" state |
| 09/19/2000 | US6121753 Apparatus and method for testing and indicating battery charge and functionality |
| 09/19/2000 | US6121576 Method and process of contact to a heat softened solder ball array |
| 09/19/2000 | US6121065 Wafer scale burn-in testing |
| 09/19/2000 | US6121063 Method of testing a ball grid array IC |
| 09/19/2000 | US6121059 Method and apparatus for identifying failure sites on IC chips |
| 09/19/2000 | US6121058 Method for removing accumulated solder from probe card probing features |
| 09/19/2000 | US6120550 Design file templates for implementation of logic designs |
| 09/19/2000 | US6119460 Temperature control system for test heads |
| 09/19/2000 | CA2276571A1 System and method for diagnosing and controlling electric machines |
| 09/19/2000 | CA2192856C Monitoring of internal partial discharges in a power transformer |
| 09/14/2000 | WO2000054365A1 Reverberation chamber tuner and shaft with electromagnetic radiation leakage device |
| 09/14/2000 | WO2000054098A1 Liquid crystal display and its inspecting method |
| 09/14/2000 | WO2000054067A1 Method for testing integrated circuits with memory element access |
| 09/14/2000 | WO2000054066A1 Cooling system for test head |
| 09/14/2000 | WO2000054065A1 Device for detecting impedance disturbance points in symmetrical data transmission lines |
| 09/14/2000 | DE4243592C2 Paralleltestschaltung für einen Halbleiter-Speicherchip Parallel test circuitry for a semiconductor memory chip |
| 09/14/2000 | DE19951269A1 Verfahren zur Charakterisierung elektronischer Eigenschaften eines Halbleiters A method for characterizing the electronic properties of a semiconductor |
| 09/14/2000 | DE19908379A1 Einrichtung zum Testen der elektrischen Funktionstüchtigkeit einer kontaktbehafteten Chipkarte Means for testing the electrical functionality of a contact smart card |
| 09/14/2000 | DE10011658A1 Verfahren für die Korrektur frequenzabhängiger, nichtlinearer Fehler und digitaler Korrekturschaltkreis für seine Verwirklichung A method for the correction of frequency-dependent non-linear error correction and digital circuit for its realization |
| 09/13/2000 | EP1034487A1 Method and system for improving a transistor model |
| 09/13/2000 | EP1034479A1 TEST CIRCUITRY FOR ASICs |
| 09/13/2000 | EP1034438A2 Method and apparatus for distinguishing regions where a material is present on a surface |
| 09/13/2000 | EP1034437A2 In-situ fault detection apparatus and method for an encased energy storing device |
| 09/13/2000 | EP1034436A1 Apparatus for and method of monitoring the status of the insulation on the wire in a winding |
| 09/13/2000 | EP1034435A1 Apparatus for testing multi-terminal electronic components |
| 09/13/2000 | EP1034100A1 Control device for a motor vehicle with a remote control or transponder |
| 09/13/2000 | CN2396458Y Power supply unit for high-voltage testing |
| 09/13/2000 | CN2396401Y Voltage sampler for rechargeable cell |