| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 10/11/2000 | CN1269546A Processor with built-in self-checking function |
| 10/11/2000 | CN1269511A Electrod-array test apparatus and relative method |
| 10/11/2000 | CN1057403C Integrated circuit assembling and disassembling device and assembling and disassembling head |
| 10/10/2000 | US6131181 Method and system for identifying tested path delay faults |
| 10/10/2000 | US6131175 Automatic selection of a special mode of operation in multi-channel test equipment |
| 10/10/2000 | US6131173 Clock domain test isolation |
| 10/10/2000 | US6131171 Process of testing and a process of making circuits |
| 10/10/2000 | US6131074 Apparatus for calibrating a programmable comparator |
| 10/10/2000 | US6130875 Hybrid centralized/distributed precomputation of network signal paths |
| 10/10/2000 | US6130547 Test apparatus for printed circuit board and assembly kit therefor |
| 10/10/2000 | US6130545 Method and apparatus for scrubbing the bond pads of an integrated circuit during wafer sort |
| 10/10/2000 | US6130544 System for evaluating probing networks |
| 10/10/2000 | US6130543 Inspection method and apparatus for semiconductor integrated circuit, and vacuum contactor mechanism |
| 10/10/2000 | US6130540 Measurement system for electric disturbances in a high-voltage switchboard plant |
| 10/10/2000 | US6130442 Memory chip containing a non-volatile memory register for permanently storing information about the quality of the device and test method therefor |
| 10/10/2000 | US6130428 Laser fault correction of semiconductor devices |
| 10/10/2000 | US6130427 Scanning probe microscope with multimode head |
| 10/10/2000 | US6130104 Cleaner for inspecting projections, and inspection apparatus and method for integrated circuits |
| 10/10/2000 | US6129577 Connector testing system having connector latching |
| 10/10/2000 | US6129575 Testing system for a connector with a self-sealing connector housing |
| 10/10/2000 | US6129459 Apparatus for analyzing radiating electromagnetic wave from multilayer substrate |
| 10/10/2000 | US6129428 Storage device for objects, storage station and air-conditioned cabinet |
| 10/10/2000 | CA2156903C A method for determining a stator flux estimate for an asynchronous machine |
| 10/05/2000 | WO2000059064A1 Rechargeable battery with protective circuit |
| 10/05/2000 | WO2000058741A1 Integrated circuit testing device with dual purpose analog and digital channels |
| 10/05/2000 | WO2000058740A2 Static charge warning device |
| 10/05/2000 | WO2000058694A1 Identifiable electric component, method of identification and evaluation device |
| 10/05/2000 | DE19913373A1 Laser regulation circuit function testing circuit |
| 10/05/2000 | DE19911939A1 Vorrichtung und Verfahren für den eingebauten Selbsttest einer elektronischen Schaltung Device and method for the built-in self test of an electronic circuit |
| 10/05/2000 | DE10004436A1 Gripper arrangement of picking apparatus in module IC handler, has shock absorber and sensor which senses module IC during movement of jaws |
| 10/04/2000 | EP1041390A1 Synchronous data adaptor |
| 10/04/2000 | EP1041389A1 System and method for characterising a test fixture |
| 10/04/2000 | EP1040547A1 Method and apparatus for charging a rechargeable battery |
| 10/04/2000 | EP1040546A1 Battery monitoring system |
| 10/04/2000 | EP1040420A1 Process for repairing integrated circuits |
| 10/04/2000 | EP1040358A2 A memory test system with a means for test sequence optimisation and a method of its operation |
| 10/04/2000 | CN2399737Y Bad insulator detect or for a. c. transmission line |
| 10/04/2000 | CN2399736Y Multifunctional tester for automotive electrical appliances |
| 10/04/2000 | CN1268670A Multifunctional safe standard automatic test device |
| 10/03/2000 | US6128759 Flexible test environment for automatic test equipment |
| 10/03/2000 | US6128757 Low voltage screen for improving the fault coverage of integrated circuit production test programs |
| 10/03/2000 | US6128756 System for optimizing the testing and repair time of a defective integrated circuit |
| 10/03/2000 | US6128754 Tester having event generation circuit for acquiring waveform by supplying strobe events for waveform acquisition rather than using strobe events specified by the test program |
| 10/03/2000 | US6128583 Motor stator condition analyzer |
| 10/03/2000 | US6128560 Malfunction diagnosis system and method for on-vehicle electronic control units |
| 10/03/2000 | US6128404 Method of detecting defects in semiconductor package leads |
| 10/03/2000 | US6128320 Communication status confirmation system using user data |
| 10/03/2000 | US6128253 Delay test system for normal circuit |
| 10/03/2000 | US6128170 Analog based first and fast second pulse removal system |
| 10/03/2000 | US6128169 Arc fault detector with circuit interrupter and early arc fault detection |
| 10/03/2000 | US6127838 IDDQ testable programmable logic arrays |
| 10/03/2000 | US6127837 Method of testing semiconductor devices |
| 10/03/2000 | US6127836 Electronic test apparatus |
| 10/03/2000 | US6127834 Apparatus for testing an integrated circuit in an oven during burn-in |
| 10/03/2000 | US6127833 Test carrier for attaching a semiconductor device |
| 10/03/2000 | US6127832 Electrical test tool having easily replaceable electrical probe |
| 10/03/2000 | US6127831 Method of testing a semiconductor device by automatically measuring probe tip parameters |
| 10/03/2000 | US6127828 Apparatus for measuring resistance of electronic component |
| 10/03/2000 | US6127808 Overcharge/overdischarge detecting circuit having a reset means and chargeable electric power source apparatus |
| 10/03/2000 | US6127807 Method for testing residual characteristics of battery |
| 10/03/2000 | US6127806 State of charge indicator |
| 10/03/2000 | US6127805 Battery charge level detecting device |
| 10/03/2000 | US6127794 Magnetic recording/reproducing apparatus and semiconductor integrated circuit device for driving it |
| 10/03/2000 | US6127746 Method of controlling the switching DI/DT and DV/DT of a MOS-gated power transistor |
| 10/03/2000 | US6127729 Semiconductor chip with corner electrode terminals and detecting wiring for defect inspection |
| 10/03/2000 | US6127694 Semiconductor wafer and method of manufacturing the same, and semiconductor device and test board of the same |
| 10/03/2000 | US6127254 Method and device for precise alignment of semiconductor chips on a substrate |
| 10/03/2000 | US6127195 Methods of forming an apparatus for engaging electrically conductive pads and method of forming a removable electrical interconnect apparatus |
| 10/03/2000 | US6127194 Package removal for FBGA devices |
| 10/03/2000 | CA2219847C Method and apparatus for scan testing digital circuits |
| 09/30/2000 | CA2303473A1 Prober for electrical measurement and method of measuring electrical characteristics with said prober |
| 09/29/2000 | CA2300499A1 A method for checking designs with a verification tool |
| 09/28/2000 | WO2000057540A1 Monitoring internal parameters of electrical motor systems |
| 09/28/2000 | WO2000057508A1 Circuit module for protecting a rechargeable battery and method of manufacture thereof |
| 09/28/2000 | WO2000057199A1 A method and apparatus for determining the state of charge of a battery |
| 09/28/2000 | WO2000057197A1 Method for monitoring a substantially direct current flow in a load |
| 09/28/2000 | WO2000057196A1 Wafer probe card |
| 09/28/2000 | WO2000029902A3 System for removing spurious signatures in motor current signature analysis |
| 09/28/2000 | DE19913471A1 Überwachungseinrichtung für elektrische Verbraucher Monitoring device for electric consumers |
| 09/28/2000 | DE19912232A1 Portable shield screen device e.g. for measuring radio power of mobile telephone, has base and lip which is opened by hinge and side panels have slanted contact surfaces |
| 09/28/2000 | DE19910016A1 Anordnung zur Erfassung von Impedanzstörstellen bei symmetrischen Datenübertragungsleitungen Arrangement for detecting Impedanzstörstellen for balanced data transmission lines |
| 09/28/2000 | DE10014111A1 Methods for X-ray test of mounting or connection status of ball grid arrays and chip scale packages by irradiating sample with x-rays from x-ray source that rotates together with X-ray detector about same line |
| 09/28/2000 | DE10013553A1 Delay device for delaying incoming transmission signals in electronic instrument, has delay elements operating on power supply voltages, connected in series, and with a switch unit that outputs one of outputs of delay elements |
| 09/28/2000 | DE10007985A1 Developing trigger definition in signal measuring system with graphic user interface by displaying description element in trigger description element region of display window that corresponds to majority of trigger functions |
| 09/28/2000 | CA2366539A1 Method for monitoring a substantially direct current flow in a load |
| 09/27/2000 | EP1039389A1 Method and apparatus for adaptively learning test error sources to reduce the total number of test measurements required in real-time |
| 09/27/2000 | EP1039359A2 Monitoring apparatus for electric consumers |
| 09/27/2000 | EP1039306A2 Method for estimating the residual capacity of a charge storage device |
| 09/27/2000 | EP1039305A1 Method of determining the position of a fault in an antenna path and communication device for carrying out the method |
| 09/27/2000 | EP1038331A1 Lithium-polymer type battery and control system |
| 09/27/2000 | EP1038225A1 Parallel test method |
| 09/27/2000 | EP1038223A1 Monitoring system for a digital trimming cell |
| 09/27/2000 | EP1038186A1 Test socket |
| 09/27/2000 | EP1038185A2 Wideband isolation system |
| 09/27/2000 | CN2398641Y Withstand voltage testing instrument |
| 09/27/2000 | CN2398640Y Resistance simulator of flash bulb |
| 09/26/2000 | US6125465 Isolation/removal of faults during LBIST testing |
| 09/26/2000 | US6125464 High speed boundary scan design |
| 09/26/2000 | US6125463 Integrated circuit with serial test interface and logic for loading a functional register using said interface |
| 09/26/2000 | US6125462 Testing mechanism in a semiconductor integrated circuit device using an external clock signal and a non-connection pin input signal |