Patents
Sitemap › G01 - Measuring; Testing › G01R - Measuring electric variables; Measuring magnetic variables › G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
10/2000
10/24/2000US6137299 Method and apparatus for testing integrated circuit chips
10/24/2000US6137298 Method and apparatus for clamping land grid array integrated circuit devices
10/24/2000US6137297 Electronic test probe interface assembly and method of manufacture
10/24/2000US6137296 Probe card for testing semiconductor devices
10/24/2000US6137295 Method of detecting defect of integrated circuit and apparatus thereof
10/24/2000US6137292 Self-adjusting battery diagnostic method for continuously providing best prediction of battery reserve time
10/24/2000US6137287 Physical parameter sensor having a self-testing circuit which recognizes an abnormal sensor state
10/24/2000US6137286 Test handler
10/24/2000US6137285 Electrical voltage tester
10/24/2000US6137284 Method and apparatus for detecting supply voltage
10/24/2000US6137282 Time-domain reflectometry user input device
10/24/2000US6137271 Automatic polarity exchange circuit with current detection feedback capabilities
10/24/2000US6137269 Method and apparatus for electronically evaluating the internal temperature of an electrochemical cell or battery
10/24/2000US6137263 Method and device for checking battery charge
10/24/2000US6137262 Process and arrangement for monitoring and/or controlling charging of a modular battery, particularly in a battery powered vehicle
10/24/2000US6137261 Rechargeable battery maintenance and testing system
10/24/2000US6136619 Method for measuring electromigration-induced resistance changes
10/24/2000US6136618 Semiconductor device manufacturing process diagnosis system suitable for diagnoses of manufacturing process of logic LSI composed of a plurality of logic circuit blocks and diagnosis method thereof
10/24/2000US6135699 IC transporting apparatus, IC posture altering apparatus and IC take-out apparatus
10/24/2000US6135291 Vertical magazine method for integrated circuit device dispensing, receiving, storing, testing or binning
10/19/2000WO2000062339A1 Semiconductor integrated circuit, method for testing the same, and method for manufacturing the same
10/19/2000WO2000062208A1 Circuit simulator
10/19/2000WO2000062087A1 Consumer usage recorder
10/19/2000WO2000062086A1 Method of and device for determining the charge condition of a battery
10/19/2000WO2000062085A1 Methods and apparatus for time domain reflectometry
10/19/2000WO2000062083A1 Apparatus and method for fault detection on conductors
10/19/2000WO2000062049A1 Electronic battery tester
10/19/2000WO2000061291A1 Apparatus for experimenting on discharge phenomena using high voltages
10/19/2000WO2000029953A9 Method and installation for fast fault localization in an integrated circuit
10/19/2000WO2000028691A9 Multi-pair gigabit ethernet transceiver
10/19/2000DE19920986A1 Shielding quality assessment method, for electrical equipment or chamber, based on comparison of LF or MF broadcast signal field strength within and outside screened area
10/19/2000DE19917473A1 Battery charge state monitor
10/19/2000DE19916282A1 Connector system for building block of electronic equipment has insulated output lead connected to metal terminal clip and diode
10/19/2000DE10015871A1 Semiconductor wafer tester has many power supply control devices forming a matrix, and signal holder for retaining control signal
10/18/2000EP1045438A2 Probe card for testing semiconductor device, and semiconductor device test method
10/18/2000EP1045397A2 Dynamic random access memory circuit having a testing system and method to determine the sensitivity of a sense amplifier
10/18/2000EP1045254A1 Method for monitoring the end of travel of a mobile element and device for carrying out the method
10/18/2000EP1045253A2 Prober for electrical measurements and method of measuring electrical characteristics with said prober
10/18/2000EP1045252A2 Deriving statistical device models from worst-case files
10/18/2000EP0990166A4 Integrated circuit tester including at least one quasi-autonomous test instrument
10/18/2000EP0979413A4 Integrated circuit tester with compensation for leakage current
10/18/2000CN2401899Y Electric power system trouble recording instrument
10/18/2000CN2401896Y Testing and printing integrated instrument for testing electric control system of car
10/18/2000CN1270673A System for storing and searching named device parameter dada in a test system for testing an integrated circuit
10/18/2000CN1270672A Production interface for an integrated circuit test system
10/18/2000CN1270671A Test system for integrated circuits using a single memory for both the parallel and scan modes of testing
10/18/2000CN1270431A Circuits for monitoing status of secondary batteries and secondary battery device
10/18/2000CN1270416A Manufacture of semiconductor device
10/18/2000CN1270412A System and method for compensating parameter of crystal sheets
10/18/2000CN1057645C Earthleakage-current protection device
10/18/2000CN1057610C Method and apparatus for ageing of emitter coupled logic circuit
10/17/2000US6134705 Generation of sub-netlists for use in incremental compilation
10/17/2000US6134689 Method of testing logic devices
10/17/2000US6134688 Electronic device selectably operable as a sequential logic circuit or a combinatorial logic circuit and circuit testing method
10/17/2000US6134687 Peripheral partitioning and tree decomposition for partial scan
10/17/2000US6134686 Technique to detect drive strength of input pin
10/17/2000US6134685 Package parallel test method and apparatus
10/17/2000US6134578 Data processing device and method of operation with context switching
10/17/2000US6134517 Method of implementing a boundary scan chain
10/17/2000US6134505 Testing analog circuits using sigma-delta modulators
10/17/2000US6134457 Device and method for monitoring a battery in a mobile communication terminal
10/17/2000US6134191 Oscillator for measuring on-chip delays
10/17/2000US6134173 Programmable logic array integrated circuits
10/17/2000US6133952 System for detecting defective photosensors in an image sensor array
10/17/2000US6133949 Measuring circuit
10/17/2000US6133745 Socket type module test apparatus and socket for the same
10/17/2000US6133744 Apparatus for testing semiconductor wafer
10/17/2000US6133742 Multi-pulse sampling of signals using electrostatic force sampling
10/17/2000US6133739 Electric battery monitoring systems
10/17/2000US6133727 Method for verifying semiconductor device tester
10/17/2000US6133726 Handling device
10/17/2000US6133725 Compensating for the effects of round-trip delay in automatic test equipment
10/17/2000US6133724 Remote light indication fault indicator with a timed reset circuit and a manual reset circuit
10/17/2000US6133711 Combination battery charger and battery driven power supply
10/17/2000US6133709 Signalling system
10/17/2000US6133054 Method and apparatus for testing an integrated circuit
10/17/2000US6133053 Circuit and a method for configuring pad connections in an integrated device
10/17/2000US6131275 Methods and devices relating to circuit board constructions
10/17/2000US6131255 Repairable wafer scale integration system
10/17/2000CA2232683C Systems for determining fault location on power distribution lines
10/12/2000WO2000060606A1 Failure capture apparatus and method for automatic test equipment
10/12/2000WO2000060601A1 Device for weighting the cell resistances in a magnetoresistive memory
10/12/2000WO2000060600A1 Device for weighting the cell resistances in a magnetoresistive memory
10/12/2000WO2000060475A1 A system for monitoring connection pattern of data ports
10/12/2000WO2000060368A1 Improved apparatus and method for measuring minority carrier lifetimes in semiconductor materials
10/12/2000DE19915978A1 Method for measuring contact wear of power switch of medium or high voltage by comparing of distance S1 to contact point of movable contact piece with initial contact of current and target time diagram
10/12/2000DE19915051A1 Methods for determining electronic characteristics of semiconductor material by determining interaction of IR rays with free charge carriers in semiconductor material through evaluation and/or displaying of heat image
10/12/2000DE10017195A1 Vorrichtung und Verfahren zur Ermittlung der Restspielzeit von batteriebetriebenen Geräten Apparatus and method for determining the remaining time of battery-powered devices
10/12/2000DE10015743A1 Device for restoration of compressed data included in semiconductor test device has restoration processor that processes compressed data series and forms substitute control data
10/12/2000DE10015370A1 Halbleiterspeicherbauelement mit aktivierbaren und deaktivierbaren Wortleitungen Semiconductor memory device with and deactuable word lines
10/12/2000CA2385059A1 Improved apparatus and method for measuring minority carrier lifetimes in semiconductor materials
10/11/2000EP1043596A2 Pulse width detection
10/11/2000EP1042683A1 Method and fixture for evaluating stator core quality in production
10/11/2000EP1042682A1 Device and method for testing an electronic chip sensitive element
10/11/2000EP1042681A1 Compound switching matrix for probing and interconnecting devices under test to measurement equipment
10/11/2000EP1042651A1 Electrode integrity checking
10/11/2000EP0950273A4 Multiple rolling contacts
10/11/2000EP0948747A4 Scalable tester architecture with i-cached simd technology
10/11/2000EP0808459B1 Top load socket for ball grid array devices
10/11/2000CN1269888A Analysis method for electric magnetic field in rotary motor and analysis instrument for electric magnetic fields
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