Patents
Sitemap › G01 - Measuring; Testing › G01R - Measuring electric variables; Measuring magnetic variables › G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
11/2000
11/02/2000EP1049231A1 Parameter measuring method, charge/discharge control method and apparatus and life predicting method for secondary batteries and power storage apparatus using the same
11/02/2000EP1049104A1 Technique for testing bitline and related circuitry of a memory array
11/02/2000EP1049103A1 Techniue for testing wordline and related circuitry of a memory array
11/02/2000EP1048957A2 Integrated circuit device having process parameter measuring circuit
11/02/2000EP1048955A1 Test arrangement for a cable having an accessory mounted at one of it's ends
11/02/2000EP1048755A1 Plating device and method of confirming current feed
11/02/2000EP1048133A1 System and method for sharing a spare channel among two or more optical ring networks
11/02/2000EP1047947A1 Test device for testing a module for a data carrier intended for contactless communication
11/02/2000EP1047575A1 Diagnostic system for the wattage power regulator of a high-pressure gas-discharge lamp in a vehicle
11/02/2000DE19919360A1 Integrated memory device
11/02/2000DE19918625A1 Passive electronic component, especially capacitor
11/02/2000DE19917586A1 Anordnung zur Durchführung von Burn-In-Behandlungen von Halbleitervorrichtungen auf Waferebene An arrangement for carrying out burn-in processing of semiconductor devices at the wafer level
11/02/2000DE19917336A1 Circuit arrangement of burn-in test of semiconductor module
11/02/2000DE10017074A1 Elektro-Optische Abtastsonde und ein Verfahren zur Einstellung derselben Electro-optic sampling probe and method for setting the same
11/02/2000DE10010043A1 Semiconductor device simulating apparatus, simulates and outputs current value based on input test signal and various parameters
11/02/2000DE10005161A1 Semiconductor circuit with test function activated according to state of specific connection when supply switched on
11/02/2000DE10004193A1 Carrier handling device for module IC handler, has drive motor with pulley at one side of vertical frame for moving module IC accommodation carrier connected to timing belt and fixed to carrier holder
11/02/2000CA2370829A1 System and method for accurately determining remaining battery life
11/02/2000CA2369354A1 Consumer battery having a built-in indicator
11/01/2000CN2404129Y Multifunction leakage detecting fixed point instrument
11/01/2000CN1272241A Rotating electric machine
11/01/2000CN1272237A Electronic device, method of controlling electronic device, method of estimating charge in rechargeable battery, and method of charging rechargeable battery
11/01/2000CN1271942A Integrated memory possessing bit line, word line and plate line and its working method
10/2000
10/31/2000US6141790 Instructions signature and primary input and primary output extraction within an IEEE 1149.1 compliance checker
10/31/2000US6141782 Pseudo-scan testing using hardware-accessible IC structures
10/31/2000US6141630 System and method for automated design verification
10/31/2000US6141286 Embedded DRAM architecture with local data drivers and programmable number of data read and data write lines
10/31/2000US6141278 Semiconductor memory device allowing fast successive selection of word lines in a test mode operation
10/31/2000US6141271 Circuits for testing memory devices having direct access test mode and methods for testing the same
10/31/2000US6141195 Data and/or energy transmission device with a disconnecting unit
10/31/2000US6141093 Method and apparatus for locating power plane shorts using polarized light microscopy
10/31/2000US6141040 Measurement and inspection of leads on integrated circuit packages
10/31/2000US6140928 Remaining battery capacity measuring device
10/31/2000US6140905 Electrically conductive contact pin having a temperature fuse function
10/31/2000US6140856 Parametric tuning of an intergrated circuit after fabrication
10/31/2000US6140840 Macro cell signal selector and semiconductor integrated circuit including these parts
10/31/2000US6140832 Method of utilizing IDDQ tests to screen out defective parts
10/31/2000US6140831 Apparatus and methods selectively deriving a boosted voltage exceeding an internal voltage
10/31/2000US6140830 Adapter system for component assembly circuit boards, for use in a test device
10/31/2000US6140829 Modular design for an integrated circuit testing apparatus
10/31/2000US6140828 Prober and probe method
10/31/2000US6140827 Method and apparatus for testing bumped die
10/31/2000US6140826 Method and apparatus for conducting failure analysis on IC chip package
10/31/2000US6140823 Method and apparatus for measuring a transfer impedance of shielded devices and common mode currents in shieldings
10/31/2000US6140822 System for signal path characterization with a reference signal using stepped-frequency increments
10/31/2000US6140821 Method and system for the recognition of insulation defects
10/31/2000US6140820 Measuring cell voltages of a fuel cell stack
10/31/2000US6140811 Hand-held measurement device combining two logic level indicators
10/31/2000US6140616 Wafer level burn-in and test thermal chuck and method
10/31/2000US6140212 Semiconductor device and method therefor
10/31/2000US6140141 Method for cooling backside optically probed integrated circuits
10/31/2000US6139759 Method of manufacturing silicided silicon microtips for scanning probe microscopy
10/31/2000US6139155 Projector display device
10/30/2000CA2687316A1 Control arrangement and method for power electronic system
10/26/2000WO2000063999A1 On cell circumferential battery indicator
10/26/2000WO2000063932A1 System for diagnosing electric contact with mechanical displacement
10/26/2000WO2000063713A1 Pass/fail battery indicator
10/26/2000WO2000063712A1 Gauge effect battery tester
10/26/2000WO2000063711A1 Circuit with built-in self-tester
10/26/2000WO2000063709A1 Detection of bridge tap using frequency domain analysis
10/26/2000WO2000063708A1 Device for electrically contacting a floating semiconductor wafer having an insulating film
10/26/2000WO2000063054A1 Modulator mis-wire test
10/26/2000WO2000028340A9 Analog clock module
10/26/2000WO2000016428A9 Method and apparatus for measuring complex impedance of cells and batteries
10/26/2000DE19917686A1 Test procedure for integrated circuits that do not have variable signal levels by an arrangement that allows a variable test signal to be applied to the circuit under test
10/26/2000DE19914004A1 Identifizierbares elektrisches Bauteil mit Verfahren zur Identifikation und Auswerteeinheit Identifiable electrical component with methods for the identification and evaluation
10/26/2000DE10013013A1 Chemical synthesized components, intersects pair of crossing conductors which form crossing which has function for measurement in nanometer range
10/26/2000DE10002098A1 System for testing dense connection area arrays has probe tip arrangement with connection area in array and probe tip resistance coupled to connection area and access transfer line
10/25/2000EP1047205A2 Circuit device having reduction circuit for reducing the crosstalk on a two-wire line
10/25/2000EP1047173A2 Method of generating data for use in monitoring and controlling charge and discharge statuses of secondary battery
10/25/2000EP1046923A2 Apparatus for inspecting electric component for inverter circuit
10/25/2000EP1046922A1 A method for checking designs with a verification tool
10/25/2000EP1046921A2 Apparatus for carrying out Burn-in procedures of semiconductor devices on wafer planes
10/25/2000EP1046093A2 An improved power contact for testing a power delivery system
10/25/2000EP1046044A1 Motor winding contamination detector and detection
10/25/2000CN2403035Y Power line leakage detecting device
10/25/2000CN1271468A Battery tester having printed electronic components
10/25/2000CN1271427A Liquid crystal display and battery label including a liquid crystal display
10/25/2000CN1271188A Method for producing monitoring and controlling the data of secondary cell discharge state
10/25/2000CN1271178A Probe card for testing semiconductor device and method for testing semiconductor device
10/25/2000CN1271177A Pulse width detection
10/25/2000CN1271093A Non-destructive measuring method for minotiry carrier diffusion length and life of semiconductor device
10/25/2000CN1057840C Insulation state measurement method, judgment apparatus and dispersion type power generating system using the same
10/24/2000US6138266 Functional verification of integrated circuit designs
10/24/2000US6138259 Semiconductor memory testing apparatus
10/24/2000US6138258 Circuit and method to prevent inadvertent test mode entry
10/24/2000US6138257 IC testing apparatus and method
10/24/2000US6138256 Intelligent binning for electrically repairable semiconductor chips
10/24/2000US6138255 Semiconductor integrated circuit device and method for monitoring its internal signal
10/24/2000US6138080 Method and system for node side analysis of computer network link
10/24/2000US6138078 Machine monitor with tethered sensors
10/24/2000US6137667 Circuit and method for triggering an over-voltage protection unit
10/24/2000US6137346 Temperature tracking voltage to current converter
10/24/2000US6137310 Serial switch driver architecture for automatic test equipment
10/24/2000US6137305 Method and apparatus for testing laser bars
10/24/2000US6137304 Method and device of testing semiconductor integrated circuit chip capable of preventing electron-hole pairs
10/24/2000US6137303 Integrated testing method and apparatus for semiconductor test operations processing
10/24/2000US6137302 Low-current probe card with reduced triboelectric current generating cables
10/24/2000US6137301 EPROM used as a voltage monitor for semiconductor burn-in
10/24/2000US6137300 Test probe device for a display panel and test probe positioning method
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