Patents
Sitemap › G01 - Measuring; Testing › G01R - Measuring electric variables; Measuring magnetic variables › G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
11/2000
11/21/2000US6150807 Integrated circuit architecture having an array of test cells providing full controllability for automatic circuit verification
11/21/2000US6150797 Charge and discharge control circuit with function detecting charge and discharge current and chargeable power supply unit
11/21/2000US6150186 Method of making a product with improved material properties by moderate heat-treatment of a metal incorporating a dilute additive
11/21/2000CA2190000C Detector for monitoring the integrity of a ground connection to an electrical appliance
11/16/2000WO2000069062A1 Shaft voltage and current monitoring system
11/16/2000WO2000068972A2 Method of creating an electrical interconnect device bearing an array of electrical contact pads
11/16/2000WO2000068701A1 Battery testers
11/16/2000WO2000068700A2 Electronic monitoring device for a multipart electrical energy storage unit
11/16/2000WO2000068699A1 Driver with transmission path loss compensation
11/16/2000WO2000068698A1 Apparatus and method for implementing a wireless system-on-a-chip with a reprogrammable tester, debugger, and bus monitor
11/16/2000WO2000039959A3 Method for localizing a cable in a data transmission network
11/16/2000WO2000020879A9 Imaging using spatial frequency filtering and masking
11/16/2000DE19921675A1 Methode zur Erfassung von Kenn- und Meßgrößen von Batteriesätzen und dergleichen Method for the detection of identification and measurement variables of battery packs and the like
11/16/2000DE19918512C1 Schaltungsanordnung mit einer Reduktionsschaltung zur Reduktion von Störlängsspannungen auf einer Zweidrahtleitung Circuit arrangement with a reduction circuit for reducing Störlängsspannungen on a two-wire cable
11/16/2000DE19917884C1 Schaltung mit eingebautem Selbsttest Circuit with built-in self-test
11/16/2000DE19823943C2 Schaltungsanordnung für Burn-In-Systeme zum Testen von Bausteinen mittels eines Boards Circuit arrangement for burn-in systems for testing devices using a board
11/16/2000DE19811868C2 Hochauflösende Verzögerungsschaltung High-resolution delay circuit
11/16/2000CA2372347A1 Apparatus and method for implementing a wireless system-on-a-chip with a reprogrammable tester, debugger, and bus monitor
11/15/2000EP1052704A2 Reverse blasing apparatus for solar battery module
11/15/2000EP1052649A1 Response time measurement
11/15/2000EP1052518A1 A system for the complete diagnosis of a driver
11/15/2000EP1051751A2 Test head structure for integrated circuit tester
11/15/2000EP1051632A1 Location of fault on series-compensated power transmission lines
11/15/2000EP0979417A4 Single pass doublet mode intergrated circuit tester
11/15/2000CN2406257Y High-performance electric power line fault indicator
11/15/2000CN2406256Y On-line testing machine with picture identifying function
11/15/2000CN2406255Y Automatic detector for resistance error
11/15/2000CN2405835Y Pantograph detection instrument
11/15/2000CN1273639A Inspection system for inspecting discrete wiring patterns formed on continuous substrate sheet of flexible material
11/14/2000USRE36952 One time programmable fully-testable programmable logic device with zero power and anti-fuse cell architecture
11/14/2000US6148436 System and method for automatic generation of gate-level descriptions from table-based descriptions for electronic design automation
11/14/2000US6148427 Method and apparatus for test data generation
11/14/2000US6148426 Apparatus and method for generating addresses in a SRAM built-in self test circuit using a single-direction counter
11/14/2000US6148425 Bist architecture for detecting path-delay faults in a sequential circuit
11/14/2000US6148424 Pattern generating apparatus
11/14/2000US6148420 Method and apparatus for analyzing serial data
11/14/2000US6148275 System for and method of connecting a hardware modeling element to a hardware modeling system
11/14/2000US6148273 Method of estimating lifetime of floating SOI-MOSFET
11/14/2000US6148055 Counter and a revolution stop detection apparatus using the counter
11/14/2000US6147936 Electronic watch
11/14/2000US6147739 Drive IC, liquid crystal panel, liquid crystal device, and electronic apparatus
11/14/2000US6147507 System and method of mapping leakage current and a defect profile of a semiconductor dielectric layer
11/14/2000US6147506 Wafer test fixture using a biasing bladder and methodology
11/14/2000US6147505 Adapter arrangement for electrically testing printed circuit boards
11/14/2000US6147499 Instrument for measuring voltages of cells
11/14/2000US6147498 Device for detecting fault in solenoid valve
11/14/2000US6147484 Device for measuring power using switchable impedance
11/14/2000US6147482 Method for and apparatus of detecting and displaying radiated noise
11/14/2000US6147316 Method for sorting integrated circuit devices
11/14/2000US6146913 Method for making enhanced performance field effect devices
11/14/2000US6145445 Rail vehicle bogie, a method of machining the bogie, and a tool for implementing the method
11/14/2000CA2179249C Resistive fault location
11/14/2000CA2122747C Method for securing a tester device to a battery and the battery so produced
11/13/2000CA2308526A1 Resistance and charging monitor within a standby battery bank
11/09/2000WO2000067378A1 Method and apparatus for a single event upset (seu) tolerant clock splitter
11/09/2000WO2000067359A1 Energy management system for automotive vehicle
11/09/2000WO2000067164A1 Method and apparatus for creating testable circuit designs having embedded cores
11/09/2000WO2000067068A2 Application specific waveform generator
11/09/2000WO2000067041A1 Method and indicator detecting grounded metal
11/09/2000WO2000028341A3 Dynamic register with low clock rate testing capability
11/09/2000DE4042519C2 Diagnostic fault test system and circuit
11/09/2000DE10007434A1 Support module for a micro-ball grid array (BGA) device for testing semiconductor devices and solder connections, includes projections and elastic device to hold the module body and test container
11/08/2000EP1050816A2 Microcomputer having built-in nonvolatile memory and check system thereof
11/08/2000EP1050053A2 Event phase modulator for integrated circuit tester
11/08/2000EP1021776A4 System and method for automated design verification
11/08/2000EP1005708A4 Circuit board arrangement
11/08/2000EP0817974B1 Reflectometry methods for insulated pipes
11/08/2000CN2405231Y Instrument for detecting incorrect cable connection
11/08/2000CN2405230Y Front end tester for device locating earth-fault in dc system
11/08/2000CN1272696A Semiconductor storage device and method for fetch said device in test pattern
11/07/2000US6145107 Method for early failure recognition in power semiconductor modules
11/07/2000US6145106 State relaxation based subsequence removal method for fast static compaction in sequential circuits
11/07/2000US6145105 Method and apparatus for scan testing digital circuits
11/07/2000US6145104 Data processing system external pin connectivity to complex functions
11/07/2000US6145087 Semiconductor integrated device
11/07/2000US6144933 Method and apparatus for remotely probing and stimulating a programmable logic device
11/07/2000US6144924 Motor condition and performance analyzer
11/07/2000US6144621 Charging type electronic timepiece
11/07/2000US6144598 Method and apparatus for efficiently testing rambus memory devices
11/07/2000US6144596 Semiconductor memory test apparatus
11/07/2000US6144595 Semiconductor device performing test operation under proper conditions
11/07/2000US6144341 Electromagnetic emission location and measurement apparatus and method
11/07/2000US6144262 Circuit for measuring signal delays of asynchronous register inputs
11/07/2000US6144215 Setup for testing an integrated circuit in a semiconductor chip wherein the temperature of the semiconductor chip is controlled
11/07/2000US6144214 Method and apparatus for use in IDDQ integrated circuit testing
11/07/2000US6144213 Ball grid array probing technique
11/07/2000US6144210 Method and apparatus for finding and locating manufacturing defects on a printed circuit board
11/07/2000US6144185 Method and apparatus for determining the condition of a battery through the use of multiple battery tests
11/07/2000US6144084 Semiconductor integrated circuit having a logic verifying structure and method of manufacturing the same
11/07/2000US6144040 Van der pauw structure to measure the resistivity of a doped area under diffusion areas and gate structures
11/07/2000US6142723 Transfer apparatus
11/07/2000CA2119577C Battery with electrochemical tester
11/02/2000WO2000065791A1 Gigabit ethernet with timing offsets between the twisted pairs
11/02/2000WO2000065772A2 Phy control module for a multi-pair gigabit transceiver
11/02/2000WO2000065705A2 System and method for accurately determining remaining battery life
11/02/2000WO2000065683A2 Consumer battery having a built-in indicator
11/02/2000WO2000065364A1 Semiconductor integrated circuit and method of designing the same
11/02/2000WO2000065363A1 Distributed processing system for component lifetime prediction
11/02/2000WO2000065361A1 Simulator cart
11/02/2000EP1049365A2 Socket for electrical parts
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