Patents
Sitemap › G01 - Measuring; Testing › G01R - Measuring electric variables; Measuring magnetic variables › G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
11/2000
11/30/2000WO2000045569A3 A portable multi-band communication device, and a method for determining a charge consumption thereof
11/30/2000WO2000045450A3 Integral sensors for monitoring a fuel cell membrane and methods of monitoring
11/30/2000WO2000045189A3 Power consumption reporting by an accessory of an electronic device
11/30/2000WO2000044077A3 Transfer impedance measurement instrument system
11/30/2000DE19930685A1 Electronic circuit for detecting short circuit in electric motor evaluates component in inverter voltage having six times supply frequency
11/30/2000DE19925189A1 Automatic selecting device for detecting earthed wire in compensated or isolated network based on power measurement
11/30/2000DE19924315A1 Monitoring quality of contacts between network analyser and device under test by filtering out reflection parameters of contacts from those measured by analyser
11/30/2000DE19921295A1 Earth wire monitoring device for electric cable of welding machine uses coil to detect current and interrupts supply accordingly
11/30/2000DE10017619A1 Semiconductor device testing device e.g. for LSI circuit, has restart address register which sets up restart address, based on which control sequence is restarted after stoppage
11/30/2000DE10006551A1 Delay fault detection in PLL circuit for very large integrated circuit, involves measuring oscillation frequency maintaining time period, using delay time of variation parameter of instantaneous signal phase
11/29/2000EP1056181A2 Apparatus for diagnosing electric power source while power is supplied to load device from the power source
11/29/2000EP1055934A1 Battery remaining capacity measuring apparatus suitable for hybrid car
11/29/2000EP1055933A1 Battery remaining capacity measuring apparatus suitable for hybrid car
11/29/2000EP1055932A2 Apparatus and method for inspecting wiring on board
11/29/2000EP1055238A1 Circuit and method for testing a digital semi-conductor circuit
11/29/2000EP1055131A2 System for removing spurious signatures in motor current signature analysis
11/29/2000EP1055130A1 Electrical parameter monitoring system
11/29/2000CN2408468Y Fixed connector for testing wire of battery group characteristic
11/29/2000CN1275205A Method and fixture for evaluating stator core quality in production
11/29/2000CN1275204A Grinding chip
11/29/2000CN1274976A Distribution control device
11/29/2000CN1274889A Method of detecting the open-cicuit, earthing and short-circuit state of pins in computer parallel port
11/29/2000CN1274852A Automatic battery detecting and sorting system
11/29/2000CN1274851A Burn-out fault detecting method and equipment
11/29/2000CN1274850A Integrated circuit having frequency division operation testing function
11/29/2000CN1274849A Abnormal detector of electric rotating machinery
11/29/2000CN1274848A Detection instrument of ceramic quality of insulator string for AC transmission line
11/28/2000US6154865 Instruction processing pattern generator controlling an integrated circuit tester
11/28/2000US6154863 Apparatus and method for testing non-componented printed circuit boards
11/28/2000US6154862 Defect analysis memory for memory tester
11/28/2000US6154860 High-speed test system for a memory device
11/28/2000US6154715 Integrated circuit tester with real time branching
11/28/2000US6154714 Method for using wafer navigation to reduce testing times of integrated circuit wafers
11/28/2000US6154712 Test procedure and test station for carrying out the test procedure
11/28/2000US6154710 Method and apparatus for searching electromagnetic disturbing source and non-contact voltage probe apparatus therefor
11/28/2000US6154709 Method for determining the load capacity of an AC network
11/28/2000US6154682 Self-checking circuit in microwave equipment
11/28/2000US6154263 Liquid crystal display and battery label including a liquid crystal display
11/28/2000US6154099 Ring oscillator and method of measuring gate delay time in this ring oscillator
11/28/2000US6154074 Semiconductor device with test circuit for high accuracy chip testing
11/28/2000US6154043 Method and apparatus for identifying the position of a selected semiconductor die relative to other dice formed from the same semiconductor wafer
11/28/2000US6154042 Uniform temperature environmental testing apparatus for semiconductor devices
11/28/2000US6154041 Method and apparatus for measuring thickness of semiconductor substrates
11/28/2000US6154040 Apparatus for testing an electronic device
11/28/2000US6154039 Functional OBIC analysis
11/28/2000US6154038 Apparatus and method for testing circuit board
11/28/2000US6154036 Ground fault location system and ground fault detector therefor
11/28/2000US6154035 Remote control fleet safety inspection system
11/28/2000US6154034 Method and apparatus for testing photovoltaic solar cells using multiple pulsed light sources
11/28/2000US6154033 Method and apparatus for analyzing nickel-cadmium batteries
11/28/2000US6154023 Remote current sensor
11/28/2000US6154020 Test circuit and method for determining the operating status of a coaxial cable
11/28/2000US6154012 Gas gauge implementation
11/28/2000US6154009 Power supply monitoring IC and battery pack
11/28/2000US6153887 Sucked material detector, sucked material detecting method using the same detector, shift detecting method using the same detector, and cleaning method using the same detector
11/28/2000US6153444 Method of measuring free carrier concentration and/or thickness of a semiconductor and process of manufacturing semiconductor device and semiconductor wafer using such method
11/28/2000US6152755 Device for loading/unloading modular IC to/from socket in modular IC handler
11/28/2000US6152744 Integrated circuit test socket
11/28/2000US6152597 Apparatus for monitoring temperature of a power source
11/23/2000WO2000070360A1 A microvia inspection system
11/23/2000WO2000070359A1 Integrated circuit and method for determining the current yield of a part of the integrated circuit
11/23/2000WO2000070358A1 Method for testing circuits
11/23/2000WO2000070355A1 Component geometry-independent device for testing electronic components with movable contact means
11/23/2000WO2000070315A1 Audio signal detector and meter
11/23/2000WO2000039848A3 Test method and assembly including a test die for testing a semiconductor product die
11/23/2000WO2000028691A3 Multi-pair gigabit ethernet transceiver
11/23/2000DE19923384A1 Appliance for automatic testing of printed circuit cards before components are fitted with separate hf test adapter for network impedances
11/23/2000DE19923362A1 Method for evaluating the condition of circuit breaker contacts based on measurement of arcing time and fault current
11/23/2000DE19922818A1 Checking an evaluation circuit, involves checking for correct switch or button contacting, and switching input buffer to active state during interval for which output buffer is active
11/23/2000DE19918529A1 Method and appliance for determining state of charge and/or capacity of battery with correction based on previously determined characteristic of residual charge as function of recovery voltage
11/23/2000DE19852429C1 Halbleiterbaustein für Burn-In-Testanordnung Semiconductor device for burn-in test assembly
11/23/2000DE10023483A1 Delay time evaluation device to determine whether to apply a delay to an input signal includes a phase comparison unit to compare a shift clock timing's phase with a phase for a delay clock timing.
11/23/2000DE10017622A1 Test equipment and method for electrically testing electronic devices converts digital signals defining analogue test patterns to analogue signals
11/22/2000EP1053518A1 Protection circuit for an integrated circuit
11/22/2000EP1053481A1 Measuring and electrochromic display system for electrically measured variables
11/22/2000EP1053480A1 System and method for measurement of partial discharge signals in high voltage apparatus
11/22/2000EP1053479A1 Electric arc monitoring systems
11/22/2000EP1040546A4 Battery monitoring system
11/22/2000CN2407366Y Multifunctional power transformer and line break alarm
11/22/2000CN1274518A Burn-in board with adaptable heat sink device
11/22/2000CN1274425A Burn-in board with adaptable heat sink device
11/22/2000CN1274159A Inner disk data comparator with variable data and comparable results compression function
11/22/2000CN1274088A DC electronic load simulator
11/22/2000CN1274087A 部分放电检测装置 Partial discharge detection device
11/22/2000CN1274083A Method for measuring complex dielectric constant of solid dielectric medium
11/21/2000US6151695 Test method of chips in a semiconductor wafer employing a test algorithm
11/21/2000US6151694 Method of evaluating fault coverage
11/21/2000US6151692 Integrated circuit having memory built-in self test (BIST) for different memory sizes and method of operation
11/21/2000US6151561 Method of estimating lifetime of floating SOI-MOSFET
11/21/2000US6151560 Open circuit failure monitoring apparatus for controlled electrical resistance heaters
11/21/2000US6151063 Printed circuit board inspection apparatus and method
11/21/2000US6150992 Traceable self-contained programmable frequency source for performing alternate test site and open area test site comparisons
11/21/2000US6150945 Static charge warning device
11/21/2000US6150832 Noncontact capacitance measuring device
11/21/2000US6150831 Test method and device for semiconductor circuit
11/21/2000US6150830 Test head for microstructures with interface
11/21/2000US6150829 Three-dimensional programmable connector
11/21/2000US6150828 Method and apparatus for automatically positioning electronic dice with component packages
11/21/2000US6150827 Automatic adjustment method for elimination of the centering error during the electrical test on printed circuit boards
11/21/2000US6150823 Battery charge detecting variable loads
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