| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 12/14/2000 | WO2000075816A1 Test generation for analog circuits using partitioning and inverted system simulation |
| 12/14/2000 | WO2000075746A2 System and method for measuring temporal coverage detection |
| 12/14/2000 | WO2000075678A1 Battery capacity measurement |
| 12/14/2000 | WO2000075677A1 Segmented contactor |
| 12/14/2000 | DE19925802A1 Leakage current testing device in which the electrode mounting arrangement is improved to give a constant application force of the electrodes on the sample surface |
| 12/14/2000 | CA2376148A1 Low power indication circuit for lead acid battery pack |
| 12/13/2000 | EP1059584A2 Method and apparatus for generating test pattern for circuit blocks |
| 12/13/2000 | EP1059538A2 Printed circuit board testing apparatus |
| 12/13/2000 | EP1059537A2 Electrically powered apparatus with electronic safety control |
| 12/13/2000 | CN2410798Y Automatic power-off alarm device for fast heating type electric water heater |
| 12/13/2000 | CN2410652Y Detector for lead-acid battery |
| 12/13/2000 | CN2410651Y Detecting inductor for testing opening/closing state of electrical equipment |
| 12/13/2000 | CN2410650Y In-phase high voltage measuring device with wire-connecting function |
| 12/13/2000 | CN2410649Y Cable short-circuit accident indicator |
| 12/13/2000 | CN2410648Y Improvement of printed circuit board short-circuit or disconnection tester |
| 12/13/2000 | CN1276925A Circuit board arrangement |
| 12/13/2000 | CN1276534A Method and apparatus for producing test model of circuit block capable of reducing load and time |
| 12/13/2000 | CN1276533A Semiconductor device contg. macro and its test method |
| 12/13/2000 | CN1276530A Probe unit for inspection of base board for assemblying semiconductor chip |
| 12/12/2000 | US6161211 Method and apparatus for automated circuit design |
| 12/12/2000 | US6161206 Pattern generator for a semiconductor integrated circuit tester |
| 12/12/2000 | US6161205 Testing and burn-in of IC chips using radio frequency transmission |
| 12/12/2000 | US6161077 Partial discharge site location system for determining the position of faults in a high voltage cable |
| 12/12/2000 | US6161052 Method for identifying a component with physical characterization |
| 12/12/2000 | US6160517 Method and apparatus for testing electronic systems using electromagnetic emissions profiles |
| 12/12/2000 | US6160420 Programmable interconnect architecture |
| 12/12/2000 | US6160415 Apparatus and method for setting zero point of Z-axis in a wafer probe station |
| 12/12/2000 | US6160414 Method for diagnosing abnormality of circuit member of inverter driving controller for driving and controlling motor |
| 12/12/2000 | US6160413 Apparatus and method for disabling and re-enabling access to IC test functions |
| 12/12/2000 | US6160411 Apparatus for testing an integrated circuit in an oven during burn-in |
| 12/12/2000 | US6160410 Apparatus, method and kit for adjusting integrated circuit lead deflection upon a test socket conductor |
| 12/12/2000 | US6160409 Inspection method of conductive patterns |
| 12/12/2000 | US6160408 Thin profile vertically oriented probe adapter with code disassembly capability |
| 12/12/2000 | US6160407 Inspection method and wiring current observation method for semiconductor device and apparatus of the same |
| 12/12/2000 | US6160405 Method and apparatus for remotely changing signal characteristics of a signal generator |
| 12/12/2000 | US6160402 Method and apparatus for determining contact resistance |
| 12/12/2000 | US6160394 Burn-in board |
| 12/12/2000 | US6160382 Method and apparatus for determining Characteristic parameters of a charge storage device |
| 12/12/2000 | US6160380 Method and apparatus of correcting battery characteristic and of estimating residual capacity of battery |
| 12/12/2000 | US6160276 Double-sided programmable interconnect structure |
| 12/12/2000 | US6159838 Method of performing rework test on integrated circuit packages |
| 12/07/2000 | WO2000074192A1 Fail safe fault interrupter |
| 12/07/2000 | WO2000074110A2 Integrated circuit wafer probe card assembly |
| 12/07/2000 | WO2000074069A1 Method and apparatus for testing an impedance-controlled input/output (i/o) buffer in a highly efficient manner |
| 12/07/2000 | WO2000073905A2 Test interface for electronic circuits |
| 12/07/2000 | WO2000073809A1 Semiconductor integrated circuit |
| 12/07/2000 | WO2000073808A1 Use of converging beams for transmitting electromagnetic energy to power devices for die testing |
| 12/07/2000 | WO2000073807A1 Multi-stage test fixture |
| 12/07/2000 | DE19962112A1 Power module has information transmission stage for receiving decision value from external unit, outputting to decision value storage device, and outputting stored decision value to external unit |
| 12/07/2000 | DE19925963A1 Test device for low voltage circuit breaker |
| 12/07/2000 | DE19922786A1 Semiconductor memory testing method |
| 12/07/2000 | DE19922082A1 Device for testing electronic functional capability of elements with various geometries uses a sliding contact device without depending on an element's geometry. |
| 12/06/2000 | EP1058493A2 Socket for electrical parts |
| 12/06/2000 | EP1058121A1 Method and apparatus for adaptive clocking for boundary scan testing and device programming |
| 12/06/2000 | EP1058093A1 Method and circuit for powering and monitoring the functioning of at least one sensor |
| 12/06/2000 | EP1057263A1 High speed pin driver integrated circuit architecture for commercial automatic test equipment applications |
| 12/06/2000 | EP1057233A1 Zone arc fault detection |
| 12/06/2000 | EP1057038A1 Method and device for testing printed circuit boards |
| 12/06/2000 | EP0585435B1 Transparent testing of integrated circuits |
| 12/06/2000 | CN2409528Y On-line vacuum monitor for 10 KV vacuum switch |
| 12/06/2000 | CN2409527Y Open circuit alarm for electrostatic protection system |
| 12/06/2000 | CN2409526Y Signal generator for dc system earth fault detector |
| 12/06/2000 | CN2409525Y Cable tester |
| 12/06/2000 | CN1276085A Method for testing the bus terminals of writable-readable integrated electronic circuit |
| 12/06/2000 | CN1276061A Electric arc monitoring systems |
| 12/06/2000 | CN1275719A Probe adapter for spherical grid array component |
| 12/06/2000 | CN1059275C Meter for residual capacityof accumulator and calculating method for residual capacity |
| 12/05/2000 | US6158037 Memory tester |
| 12/05/2000 | US6158035 Serial data input/output method and apparatus |
| 12/05/2000 | US6158034 Boundary scan method for terminating or modifying integrated circuit operating modes |
| 12/05/2000 | US6158033 Multiple input signature testing & diagnosis for embedded blocks in integrated circuits |
| 12/05/2000 | US6158032 Data processing system, circuit arrangement and program product including multi-path scan interface and methods thereof |
| 12/05/2000 | US6158030 System and method for aligning output signals in massively parallel testers and other electronic devices |
| 12/05/2000 | US6158028 Semiconductor integrated circuit |
| 12/05/2000 | US6157877 Apparatus and method for testing automotive electronic control units and batteries and related equipment |
| 12/05/2000 | US6157451 Sample CD measurement system |
| 12/05/2000 | US6157309 Battery pack |
| 12/05/2000 | US6157308 Detecting hidden faults in reliable power systems |
| 12/05/2000 | US6157296 Lamp burnout detecting unit with branch connection function |
| 12/05/2000 | US6157236 Parametric tuning of an integrated circuit after fabrication |
| 12/05/2000 | US6157224 High speed pin driver integrated circuit architecture for commercial automatic test equipment applications |
| 12/05/2000 | US6157210 Programmable logic device with circuitry for observing programmable logic circuit signals and for preloading programmable logic circuits |
| 12/05/2000 | US6157202 Hybrid IC with circuit for burn-in test |
| 12/05/2000 | US6157201 Burn-in system for reliable integrated circuit manufacturing |
| 12/05/2000 | US6157200 Integrated circuit device tester |
| 12/05/2000 | US6157197 Auto-lock type continuity check unit |
| 12/05/2000 | US6157196 Method for monitoring of tap changers by acoustic analysis |
| 12/05/2000 | US6157185 Miltiple bus switching and testing system |
| 12/05/2000 | US6157171 Voltage monitoring circuit for rechargeable battery |
| 12/05/2000 | US6157170 Means for detecting the integrated value of current flow, a means for detecting the value of current flow and a battery pack employing those means |
| 12/05/2000 | US6157169 Monitoring technique for accurately determining residual capacity of a battery |
| 12/05/2000 | US6157046 Semiconductor reliability test chip |
| 12/05/2000 | US6156450 Battery tester having printed electronic components |
| 12/05/2000 | US6156216 Etching top working surface of silicon wafer to make silicon stylus of a specific area with a base and an apex, depositing nitride film, spin coating a resist, etching specific area of nitride covered silcone stylus to expose apex of stylus |
| 12/05/2000 | US6156078 Testing and finishing apparatus for integrated circuit package units |
| 11/30/2000 | WO2000072444A2 Scannable flip flop circuit and method of operating an integrated circuit |
| 11/30/2000 | WO2000072030A1 Method and apparatus for wireless testing of integrated circuits |
| 11/30/2000 | WO2000072029A2 Analog test output switchably connected to pcmcia connector pin |
| 11/30/2000 | WO2000072028A1 Voltage monitor circuit with adjustable hysteresis using a single comparator |
| 11/30/2000 | WO2000071986A2 Diagnostic device |