| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 01/02/2001 | US6168002 Control system for use with semiconductor device transporting and handling apparatus |
| 01/02/2001 | US6167753 Detecting fields with a single-pass, dual-amplitude-mode scanning force microscope |
| 01/02/2001 | US6167614 Method of manufacturing and testing an electronic device, and an electronic device |
| 01/02/2001 | CA2308724A1 Flexible method for monitoring fuel cell voltage |
| 12/28/2000 | WO2000079421A2 Property coverage in formal verification |
| 12/28/2000 | WO2000079305A1 Projected display for portable sensor indicating the location of a detected hidden object |
| 12/28/2000 | WO2000079295A1 Apparatus for testing electronic components accommodated in a carrier strip |
| 12/28/2000 | WO2000079294A1 A method and apparatus for providing controllable compensation factors to a compensated driver circuit which may be used to perform testing of the structural integrity of the compensated driver circuit |
| 12/28/2000 | WO2000079292A1 Method and device for measuring an electrical equipment discharge |
| 12/28/2000 | WO2000079245A1 Method and apparatus for scanning, stitching, and damping measurements of a double-sided metrology inspection tool |
| 12/27/2000 | EP1063727A2 IC socket |
| 12/27/2000 | EP1063590A1 Method to configure a modular electronic system, and module used in this system |
| 12/27/2000 | EP1063530A1 Residual capacity measurement system for battery |
| 12/27/2000 | EP1063529A1 Method and apparatus for testing field programmable gate arrays |
| 12/27/2000 | CN2412220Y Electricity leakage switch detector |
| 12/27/2000 | CN1278332A Boundary scan system with address dependent instruction |
| 12/26/2000 | US6167558 Method for tolerating defective logic blocks in programmable logic devices |
| 12/26/2000 | US6167545 Self-adaptive test program |
| 12/26/2000 | US6167542 Arrangement for fault detection in circuit interconnections |
| 12/26/2000 | US6167537 Communications protocol for an automated testing system |
| 12/26/2000 | US6167359 Method and apparatus for characterizing phase noise and timing jitter in oscillators |
| 12/26/2000 | US6167352 Model-based diagnostic system with automated procedures for next test selection |
| 12/26/2000 | US6167349 Battery parameter measurement |
| 12/26/2000 | US6167309 Method for monitoring end of life for battery |
| 12/26/2000 | US6167025 Methods and apparatus for restoring connections in an ATM network |
| 12/26/2000 | US6166975 Dynamic random access memory |
| 12/26/2000 | US6166942 Embedded DRAM architecture with local data drivers and programmable number of data read and data write lines |
| 12/26/2000 | US6166569 Test interface circuits with waveform synthesizers having reduced spurious signals |
| 12/26/2000 | US6166557 Process of selecting dies for testing on a wafer |
| 12/26/2000 | US6166556 Method for testing a semiconductor device and semiconductor device tested thereby |
| 12/26/2000 | US6166555 Apparatus and method for seating and/or unseating printed circuit boards in a chamber |
| 12/26/2000 | US6166553 Prober-tester electrical interface for semiconductor test |
| 12/26/2000 | US6166552 Method and apparatus for testing a semiconductor wafer |
| 12/26/2000 | US6166549 Electronic circuit for measuring series connected electrochemical cell voltages |
| 12/26/2000 | US6166548 Method of detecting battery capacity in a zinc-air battery |
| 12/26/2000 | US6166532 Electrical circuit breaker locator with transmitter and receiver |
| 12/26/2000 | US6166524 Alternate fuel gauge for an alkali metal electrochemical cell |
| 12/26/2000 | US6165806 Fault isolation within an inner lead bond region of a μBGA (micro ball grid array) package for an integrated circuit die |
| 12/26/2000 | US6164982 IC socket for holding IC having multiple parallel pins |
| 12/26/2000 | US6164980 Socket for integrated circuit chip |
| 12/26/2000 | US6164894 Method and apparatus for integrated wafer handling and testing |
| 12/21/2000 | WO2000077845A1 Method of estimating lifetime of insulation film and method of managing semiconductor device |
| 12/21/2000 | WO2000077834A2 Modelling electrical characteristics of thin film transistors |
| 12/21/2000 | WO2000077649A1 Method for marking a hardware variant of an electrical or electronic hardware unit |
| 12/21/2000 | WO2000077529A2 Method and apparatus for testing a video display chip |
| 12/21/2000 | WO2000030308A3 Equalizer for multi-pair gigabit ethernet |
| 12/21/2000 | DE10028541A1 Voltage drive circuit has output voltage monitoring stage with comparator of shifted output voltage and predefined anticipated voltage that drives current driver stage's current setting input |
| 12/21/2000 | DE10026280A1 Sonde für ein elektro-optisch abtastendes Oszilloskop A probe for electro-optically scanning oscilloscope |
| 12/21/2000 | CA2365956A1 Method and apparatus for testing a video display chip |
| 12/20/2000 | EP1061786A2 Socket for IC package |
| 12/20/2000 | EP1061593A2 Battery pack |
| 12/20/2000 | EP1061527A1 On chip programmable data pattern generator for semiconductor memories |
| 12/20/2000 | EP1061526A1 On chip data comparator with variable data and compare result compression |
| 12/20/2000 | EP1061448A1 Semiconductor memory device with built-in self test and built-in self repair |
| 12/20/2000 | EP1061381A2 Method for optimizing probe card analysis and scrub mark analysis data |
| 12/20/2000 | EP1061375A1 Semiconductor device including macros and its testing method |
| 12/20/2000 | EP1061358A2 Apparatus and method for reviewing defects on an object |
| 12/20/2000 | EP1060508A1 Underfilling material for flip-chip fitted printed circuit boards, a printed circuit board equipped therewith, and a method for filling ratio verification of chips which are underfilled therewith |
| 12/20/2000 | EP1060399A1 Device for testing the electromagnetic compatibility of systems having large dimensions |
| 12/20/2000 | EP1060398A1 Coaxial probe interface for automatic test equipment |
| 12/20/2000 | CN2411584Y Charging counter for accumulator of electric motor car |
| 12/20/2000 | CN2411490Y Multifunction multi-harmonic oscillator |
| 12/20/2000 | CN2411489Y Logic testing probe with easyly testing frequency and duty ratio function |
| 12/20/2000 | CN2411488Y Anti-fraudulent electric testing device |
| 12/20/2000 | CN1277361A Semi-conductor integrated circuit with measurable component block |
| 12/20/2000 | CN1277360A Parallel driver circuit for electronic load simulator |
| 12/19/2000 | US6163875 Semiconductor testing equipment |
| 12/19/2000 | US6163874 Apparatus and method for doubling speed of random events generator |
| 12/19/2000 | US6163867 Input-output pad testing using bi-directional pads |
| 12/19/2000 | US6163866 System level IC testing arrangement and method |
| 12/19/2000 | US6163865 Built-in self-test circuit for read channel device |
| 12/19/2000 | US6163864 Method for cost-effective production testing of input voltage levels of the forwarded clock interface of high performance integrated circuits |
| 12/19/2000 | US6163862 On-chip test circuit for evaluating an on-chip signal using an external test signal |
| 12/19/2000 | US6163760 Method of producing a test pattern allowing determination of acceptance and rejection of a semiconductor device without causing a timing problem |
| 12/19/2000 | US6163759 Method for calibrating variable delay circuit and a variable delay circuit using the same |
| 12/19/2000 | US6163499 Programmable impedance output buffer drivers, semiconductor devices and static random access memories provided with a programmable impedance output port |
| 12/19/2000 | US6163491 Synchronous semiconductor memory device which can be inspected even with low speed tester |
| 12/19/2000 | US6163286 Digitally driven analog test signal generator |
| 12/19/2000 | US6163188 Input buffer and input-output buffer in full compliance with IDDQ testability |
| 12/19/2000 | US6163183 Multifunction reset for mixed-signal integrated circuits |
| 12/19/2000 | US6163161 Directed self-heating for reduction of system test time |
| 12/19/2000 | US6163160 Adjustable tooling pin |
| 12/19/2000 | US6163159 Charged particle beam test system |
| 12/19/2000 | US6163157 Insulation tester for squirrel cage rotors |
| 12/19/2000 | US6163156 Electrical connection for electronic battery tester |
| 12/19/2000 | US6163146 IC testing method |
| 12/19/2000 | US6163145 Transporting apparatus for semiconductor device |
| 12/19/2000 | US6163144 Electrical circuit tracing apparatus using modulated tracing signal |
| 12/19/2000 | US6163133 Process for determining the state of charge and the peak current loadability of batteries |
| 12/19/2000 | US6163063 Semiconductor device |
| 12/19/2000 | US6163000 Inspecting sorting machine for finished products of plastic film capacitor |
| 12/19/2000 | US6162652 Process for sort testing C4 bumped wafers |
| 12/19/2000 | US6162066 Socket for positioning and installing an integrated circuit chip on a flexible connector sheet |
| 12/19/2000 | CA2203833C A device for sensing of electric discharges in a test object |
| 12/19/2000 | CA2086331C Faulted circuit detector having isolated indicator |
| 12/14/2000 | WO2000076184A1 Mobile communication unit with bone conduction speaker |
| 12/14/2000 | WO2000076046A1 Method for operating an electronic overcurrent trip of a power circuit breaker |
| 12/14/2000 | WO2000076018A1 Battery dropout correction for battery monitoring in mobile unit |
| 12/14/2000 | WO2000076017A1 Low power indication circuit for lead acid battery pack |
| 12/14/2000 | WO2000075980A1 Method of estimating lifetime of semiconductor integrated circuit device and method of controlling the same |