| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 01/11/2001 | DE19930993A1 Synthetic testing the capacity of high power switches in high voltage devices has auxiliary switches and diode arrangement for switching the high current through the test switch |
| 01/11/2001 | DE10031035A1 Thermal chuck for holding test devices such as integrated circuits for carrying out low voltage and low power tests at varying temperatures has a capacitative connection for filtering out electrical noise |
| 01/11/2001 | DE10026747A1 Test apparatus for detecting defective through-hole in integrated circuit uses current meters to measure current flowing at each end of through-hole |
| 01/11/2001 | DE10025211A1 Test socket for measuring electric characteristics of electronic device or semiconductor package has protrusions formed from smooth curved surfaces in portion to contact external connection terminals of electronic device |
| 01/11/2001 | DE10024640A1 Delay-signal generation device for semiconductor device testing apparatus, chooses a suitable signal from phase shifter, which is phase shifted by predefined amount from reference, and outputs it as delay signal |
| 01/11/2001 | DE10020713A1 Contact structure for probe card, has contactor formed on dielectric substrate by minute machining operation such that contact section of contactor is perpendicularly formed on one end of horizontal section |
| 01/11/2001 | CA2377891A1 A method and system for detecting arcing faults and testing such system |
| 01/10/2001 | EP1067652A2 Battery charging apparatus and full-charging detecting method |
| 01/10/2001 | EP1067393A2 Voltage level bus translator and safety interlock system for battery modules |
| 01/10/2001 | EP1067392A2 Method for testing electronic components |
| 01/10/2001 | EP1066671A1 Electrical protection systems |
| 01/10/2001 | EP1066658A1 Battery having a built-in controller |
| 01/10/2001 | EP1066565A1 Integrated circuit architecture having an array of test cells providing full controllability for automatic circuit verification |
| 01/10/2001 | EP1066536A1 Voltage indicator for indicating that the voltage of a battery passes a given value |
| 01/10/2001 | EP1066535A1 Device, assembly and method for testing electronic components, and calibrating method therefor |
| 01/10/2001 | EP0858689B1 System for equalizing the level of charge in batteries |
| 01/10/2001 | EP0679295B1 Load analysis system for fault detection |
| 01/10/2001 | CN2414538Y Three-phase motor operation carrent ac sampling device |
| 01/10/2001 | CN2414424Y Clamp for testing battery |
| 01/10/2001 | CN2414423Y Cable core tester |
| 01/10/2001 | CN2414422Y Multi-purpose leakage protector tester |
| 01/10/2001 | CN2414421Y Universal electricity test pencil |
| 01/10/2001 | CN1279176A Device for detecting electric supply at working status |
| 01/10/2001 | CN1060573C Load detector |
| 01/09/2001 | WO2000062317A1 Monitoring leakage currents from high-voltage devices |
| 01/09/2001 | US6173428 Apparatus and method for testing using clocked test access port controller for level sensitive scan designs |
| 01/09/2001 | US6173427 Immunity evaluation method and apparatus for electronic circuit device and LSI tester |
| 01/09/2001 | US6173426 Method of locating faults in LSI |
| 01/09/2001 | US6173424 Programmable pulse generator and method for using same |
| 01/09/2001 | US6173242 Circuit for simulating a break-over component |
| 01/09/2001 | US6173238 Memory testing apparatus |
| 01/09/2001 | US6173235 Method of estimating lifetime of floating SOI-MOSFET |
| 01/09/2001 | US6173071 Apparatus and method for processing video data in automatic optical inspection |
| 01/09/2001 | US6172966 Diagnosis of networks of components, with stripwise modeling |
| 01/09/2001 | US6172910 Test cell for analyzing a property of the flash EEPROM cell and method of analyzing a property of the flash EEPROM cell using the same |
| 01/09/2001 | US6172860 DC power source unit alarming before electrically powered tool is overheated and stopping power supply thereafter |
| 01/09/2001 | US6172544 Timing signal generation circuit for semiconductor test system |
| 01/09/2001 | US6172514 Test probe retainer |
| 01/09/2001 | US6172513 Method for analyzing electrical contact between two conductive members of semiconductor device without destruction thereof |
| 01/09/2001 | US6172512 Image processing methods for the optical detection of dynamic errors in integrated circuits |
| 01/09/2001 | US6172509 Detecting polyphase machine faults via current deviation |
| 01/09/2001 | US6172508 System for testing tractor and trailer light systems |
| 01/09/2001 | US6172507 Circuit configuration for measuring resistance and leakage |
| 01/09/2001 | US6172506 Capacitance atomic force microscopes and methods of operating such microscopes |
| 01/09/2001 | US6172505 Electronic battery tester |
| 01/09/2001 | US6172497 High-frequency wave measurement substrate |
| 01/09/2001 | US6172496 Static event detection/protection device |
| 01/09/2001 | US6172485 Power supply monitoring integrated circuit device and battery pack |
| 01/09/2001 | US6172483 Method and apparatus for measuring complex impedance of cells and batteries |
| 01/09/2001 | US6172413 Chip leads constrained in dielectric media |
| 01/09/2001 | US6172363 Method and apparatus for inspecting integrated circuit pattern |
| 01/09/2001 | US6172318 Base for wire bond checking |
| 01/09/2001 | US6171874 Non-defect image and data transfer and storage methodology |
| 01/09/2001 | US6170323 Self-diagnosis apparatus for vehicle meters and method starting a self-diagnosis mode for vehicle meters |
| 01/09/2001 | US6170316 Pressure and vacuum switch testing tool |
| 01/09/2001 | US6170116 Abrasive member and cleaning device for probe needle for probe card |
| 01/09/2001 | CA2162347C Method and apparatus for high-speed scanning of electromagnetic field levels |
| 01/05/2001 | CA2313346A1 Method for the testing of electronic components |
| 01/04/2001 | WO2001001422A1 Built-in self test schemes and testing algorithms for random access memories |
| 01/04/2001 | WO2001001421A1 Test device for testing a memory |
| 01/04/2001 | WO2001001247A2 Semiconductor parallel tester |
| 01/04/2001 | WO2001001245A1 Input/output probing apparatus and input/output probing method using the same, and mixed emulation/simulation method based on it |
| 01/04/2001 | WO2001001162A1 Multi-mode storage cell |
| 01/04/2001 | WO2001000334A1 Electronic component handler |
| 01/04/2001 | DE19930798A1 Testing connections of component containing circuit involves measuring time to reach second signal level after applying second signal level to connection with first level already applied |
| 01/04/2001 | DE19904375C2 Verfahren zur Funktionsüberprüfung von Speicherzellen eines integrierten Halbleiterspeichers Method for functional testing of memory cells of an integrated semiconductor memory, |
| 01/04/2001 | DE10030209A1 Test socket has IC holder with housing contg. contacts, each of which makes contact with IC connection points, apertures in housing and open to side that contacts test socket |
| 01/03/2001 | EP1065773A2 Battery capacity measurement apparatus, taking into consideration a gassing voltage that changes relative to temperature |
| 01/03/2001 | EP1065772A2 Battery charge control device having a gassing detection unit without temperature sensor |
| 01/03/2001 | EP1065740A2 Flexible method for monitoring fuel cell voltage |
| 01/03/2001 | EP1065609A2 Verification of sequential circuits with same state encoding |
| 01/03/2001 | EP1065511A1 Battery capacity detection system |
| 01/03/2001 | EP1065510A1 Location of restriking and transient earth faults |
| 01/03/2001 | EP1065502A1 Method for carrying out the electrical breakdown of a gaseous dielectric in a highly non-uniform field |
| 01/03/2001 | EP1064716A1 Electric motor monitoring circuit |
| 01/03/2001 | EP1064560A1 Compensating for the effects of round-trip delay in automatic test equipment |
| 01/03/2001 | CN2413295Y Double-face circuit board detecting machine |
| 01/03/2001 | CN1278940A Detection of subsidence current in the determination of circuit breaker status in apower system |
| 01/03/2001 | CN1278915A Process and device for detecting the location of components and/or for checking the position of component connections and mounting head with a device for detecting the location of components and/or |
| 01/03/2001 | CN1278647A Semiconductor device with test circuit capable of inhibiting enlargement of circuit scale and test apparatus for semiconductor device |
| 01/02/2001 | US6170078 Fault simulation using dynamically alterable behavioral models |
| 01/02/2001 | US6170072 Logic circuit verification apparatus and method for semiconductor integrated circuit |
| 01/02/2001 | US6170071 Method for optimizing test fixtures to minimize vector load time for automated test equipment |
| 01/02/2001 | US6169694 Circuit and method for fully on-chip wafer level burn-in test |
| 01/02/2001 | US6169489 Motor winding contamination detector and detection |
| 01/02/2001 | US6169451 System for sensing operating state of tower top amplifier for mobile communication system and method of sensing the same |
| 01/02/2001 | US6169428 Single supply voltage to frequency converter optimized for low voltage sensing above and below ground |
| 01/02/2001 | US6169415 Characteristic evaluation apparatus for insulated gate type transistors |
| 01/02/2001 | US6169414 Measuring apparatus and method for measuring characteristic of solar cell |
| 01/02/2001 | US6169413 System for testing hard disk drives |
| 01/02/2001 | US6169412 Adjustable tooling pin for a card test fixture |
| 01/02/2001 | US6169411 Integrated circuit testing assembly and method |
| 01/02/2001 | US6169409 Low-temperature wafer testing method and prober |
| 01/02/2001 | US6169408 Method and apparatus for testing an integrated circuit with a pulsed radiation beam |
| 01/02/2001 | US6169406 Very low frequency high voltage sinusoidal electrical testing method, systems and apparatus |
| 01/02/2001 | US6169405 Functional test process for a mechanical switching element |
| 01/02/2001 | US6169395 Test for determining polarity of electrolytic capacitors within electronic assemblies |
| 01/02/2001 | US6169387 Battery management apparatus for portable electronic devices |
| 01/02/2001 | US6169282 Defect inspection method and apparatus therefor |
| 01/02/2001 | US6168470 Connecting plate for battery holder and method of producing the same |