| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 01/30/2001 | US6181108 Overcharge/overdischarge detecting circuit having current detecting means with latch function and chargeable electric power source apparatus |
| 01/30/2001 | US6181101 Intelligent junction box |
| 01/30/2001 | US6180426 High performance sub-system design and assembly |
| 01/30/2001 | US6180425 Data transfer circuit |
| 01/30/2001 | US6180424 Method for improving wafer sleuth capability by adding wafer rotation tracking |
| 01/30/2001 | CA2257969C Digital logic simulation/emulation system |
| 01/26/2001 | CA2311873A1 Battery management apparatus for portable electronic devices |
| 01/25/2001 | WO2001006369A1 Extending synchronous busses by arbitrary lengths using native bus protocol |
| 01/25/2001 | WO2001006273A1 Apparatus and method for temperature control of ic device during test |
| 01/25/2001 | WO2001006272A1 Short circuit detection method, apparatus and motor drive incorporating the same |
| 01/25/2001 | WO2001006271A1 A test socket and method for testing an ic device in a dead bug orientation |
| 01/25/2001 | WO2001006270A1 Wafer-level burn-in |
| 01/25/2001 | WO2001006267A1 Method and apparatus for detecting slow and small changes of electrical signals including the sign of the changes, and circuit arrangement for the exact detection of the peak value of an alternating voltage |
| 01/25/2001 | WO2001005466A1 Battery status detection |
| 01/25/2001 | DE19944037C1 Integrated memory e.g. ferroelectric random access memory |
| 01/25/2001 | DE19941845C1 Flat flexible cable (FFC) plug e.g. for flat data line arrangement |
| 01/25/2001 | DE10008180A1 Elektronische Gebereinrichtung Electronic timer means |
| 01/25/2001 | DE10002848A1 Vorrichtung zum Erfassen der Restladung einer Batterie Apparatus for detecting the residual capacity of a battery |
| 01/25/2001 | CA2579563A1 Method and system for measuring the relief of an object |
| 01/24/2001 | EP1071173A2 Terminal crimping quality decision method/device and frictional wear state detection method of crimping die |
| 01/24/2001 | EP1070967A1 Method and apparatus for electronic meter testing |
| 01/24/2001 | EP1070966A1 A method and device for determining the electrical field strength acting on an anatomical model |
| 01/24/2001 | EP1070385A1 Inhibitable, continuously-terminated, differential drive circuit for an integrated circuit tester |
| 01/24/2001 | EP1070297A1 Method and apparatus for automatically testing the design of a simulated integrated circuit |
| 01/24/2001 | EP1070260A1 An arrangement for transient-current testing of a digital electronic cmos circuit |
| 01/24/2001 | CN1281270A Socket of integrated circuit module |
| 01/24/2001 | CN1281250A DC degradated word line activating timing with self refreshed DRAM |
| 01/23/2001 | US6178534 System and method for using LBIST to find critical paths in functional logic |
| 01/23/2001 | US6178526 Testing memory modules with a PC motherboard attached to a memory-module handler by a solder-side adaptor board |
| 01/23/2001 | US6178525 Trigger sequencing controller |
| 01/23/2001 | US6178128 Programmable voltage divider and method for testing the impedance of a programmable element |
| 01/23/2001 | US6177813 Low frequency detection circuit |
| 01/23/2001 | US6177803 Monitoring elements in a multi-phase alternating current network |
| 01/23/2001 | US6177802 System and method for detecting defects in an interlayer dielectric of a semiconductor device using the hall-effect |
| 01/23/2001 | US6177801 Detection of bridge tap using frequency domain analysis |
| 01/23/2001 | US6177799 Rechargeable battery electrode testing device |
| 01/23/2001 | US6177733 Semiconductor device |
| 01/23/2001 | US6177288 Method of making integrated circuit packages |
| 01/23/2001 | US6177287 Simplified inter database communication system |
| 01/23/2001 | US6176709 Socket and adapter integrated circuit, and integrated circuit assembly |
| 01/23/2001 | CA2008431C Battery monitoring system |
| 01/18/2001 | WO2001004732A1 Waveform generator and test apparatus |
| 01/18/2001 | WO2001004654A1 Electronic device, and method and apparatus for testing electronic device |
| 01/18/2001 | WO2001004653A1 Method and apparatus for sub-micron imaging and probing on probe station |
| 01/18/2001 | WO2001004652A1 Apparatus for electrical testing of a substrate having a plurality of terminals |
| 01/18/2001 | WO2001004644A1 Automatic test manipulator with support internal to test head |
| 01/18/2001 | WO2001004643A2 Wafer-level burn-in and test cartridge and methods |
| 01/18/2001 | WO2001004642A2 Kinematic coupling |
| 01/18/2001 | WO2001004641A2 Wafer level burn-in and electrical test system and method |
| 01/18/2001 | WO2001004610A2 Method and apparatus for sensitive measurement of the lifetime of minority carriers in semiconductor materials |
| 01/18/2001 | WO2000045449A3 High speed battery charging system with high accuracy voltage sensing |
| 01/18/2001 | DE19962834A1 Procedure for isolating a partial discharge signal from a signal received at a detection body and for locating its origin for use in detecting such discharges in large resin impregnated bodies such as transformers or coils |
| 01/18/2001 | DE19932611A1 Procedure for measurement and analysis of high frequency none- sinusoidal partial voltage discharges from electric motors of any shape or amplitude |
| 01/18/2001 | DE19930169A1 Testeinrichtung zum Prüfen eines Speichers Test device for testing a memory |
| 01/18/2001 | DE10031536A1 Results based semiconductor testing system for use in the electronic development automation of integrated circuit components by conversion of data from logic simulation into machine code and storage in data files |
| 01/18/2001 | DE10029025A1 Integrated circuit socket e.g. for ball grid array device, has upper contact pins which are displaceable and mechanically biased to extend beyond upper surface of base |
| 01/18/2001 | DE10024190A1 Diagnoseeinrichtung Diagnostic device |
| 01/18/2001 | DE10021347A1 Semiconductor memory component, uses comparator during test mode to combine data read from memory cells for output at selected output terminal |
| 01/18/2001 | DE10015744A1 Contact structure in probe card, has projection made of electrically conducting material provided in contact board to connect contact pad that is in electrical communication with PCB, via contact trace in via hole |
| 01/17/2001 | EP1069437A1 Method for controlling ic handler and control system using the same |
| 01/17/2001 | EP1069407A1 Electronic sensor |
| 01/17/2001 | EP1069370A1 Rechargable security intelligent torch |
| 01/17/2001 | EP1068660A1 Process and apparatus for modulating terminal voltage of battery |
| 01/17/2001 | EP1068540A1 Battery parameter measurement |
| 01/17/2001 | EP1068104A2 Method for operating a restraint system connected by a bus line in case of a short circuit |
| 01/17/2001 | CN2415472Y 电连接器 The electrical connector |
| 01/17/2001 | CN2415368Y Electric cable break monitor |
| 01/17/2001 | CN2415367Y Line diagnosis, inspection and connecting tester |
| 01/17/2001 | CN1280691A Electronic assembly video inspectin system |
| 01/17/2001 | CN1280687A Method and system for improving a transistor model |
| 01/17/2001 | CN1280386A Equipment and method for screening test of fault leakage of storage device |
| 01/17/2001 | CN1280301A Method and device for output open circuit detection of DC puncture test and insulaing impedance test |
| 01/16/2001 | US6175939 Integrated circuit testing device with dual purpose analog and digital channels |
| 01/16/2001 | US6175812 Method and system for dynamic duration burn-in |
| 01/16/2001 | US6175810 Method of generating a signal identifying a three-pole short-circuit occuring in a three-phase power transmission line |
| 01/16/2001 | US6175808 Lightning effects monitoring and retest evaluation method |
| 01/16/2001 | US6175646 Apparatus for detecting defective integrated circuit dies in wafer form |
| 01/16/2001 | US6175534 Synchronous semiconductor storage device |
| 01/16/2001 | US6175529 Semiconductor integrated circuit device and method for manufacturing the same |
| 01/16/2001 | US6175524 Merged memory and logic (MML) integrated circuit devices including buffer memory and methods of detecting errors therein |
| 01/16/2001 | US6175498 Burn-in board and heat sink assembly mounting rack |
| 01/16/2001 | US6175393 Active-matrix type liquid crystal display device and method of compensating for defective pixel |
| 01/16/2001 | US6175303 Electric vehicle torque-o-meter |
| 01/16/2001 | US6175246 Method of increasing AC testing accuracy through linear extrapolation |
| 01/16/2001 | US6175245 CMOS SOI contact integrity test method |
| 01/16/2001 | US6175244 Current signatures for IDDQ testing |
| 01/16/2001 | US6175242 Method for forming coaxial silicon interconnects |
| 01/16/2001 | US6175241 Test carrier with decoupling capacitors for testing semiconductor components |
| 01/16/2001 | US6175240 Procedure and apparatus for measuring the DC voltage of circuits by applying a pulsed voltage and electron beam |
| 01/16/2001 | US6175238 Binary electrostatic discharge locator |
| 01/16/2001 | US6175230 Circuit-board tester with backdrive-based burst timing |
| 01/16/2001 | US6174744 Method of producing micro contact structure and contact probe using same |
| 01/16/2001 | US6174172 Electric contact unit |
| 01/16/2001 | US6173605 System and method for detecting snap ring position |
| 01/16/2001 | CA2207524C Apparatus for defining properties in finite-state machines |
| 01/12/2001 | CA2288918A1 Self-diagnostic circuitry for emergency lighting fixtures |
| 01/11/2001 | WO2001003139A1 Testing rambus memories |
| 01/11/2001 | WO2001002872A1 A method and system for detecting arcing faults and testing such system |
| 01/11/2001 | WO2001002871A1 Method and arrangement for checking cable connections |
| 01/11/2001 | DE19944461C1 Monitoring method for electromagnetic switching device |