| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 02/07/2001 | CN2418490Y Device for automatically detecting preformance of generator |
| 02/07/2001 | CN1282876A Method and equipment for positioning failure point on electric power transmission line |
| 02/06/2001 | US6185721 Method of design for testability at RTL and integrated circuit designed by the same |
| 02/06/2001 | US6185714 Address trap comparator capable of carrying out high speed fault detecting test |
| 02/06/2001 | US6185713 Method and apparatus for improving stuck-at fault detection in large scale integrated circuit testing |
| 02/06/2001 | US6185712 Chip performance optimization with self programmed built in self test |
| 02/06/2001 | US6185711 Methods and apparatus for synchronizing asynchronous test structures and eliminating clock skew considerations |
| 02/06/2001 | US6185710 High-performance IEEE1149.1-compliant boundary scan cell |
| 02/06/2001 | US6185708 Maintenance free test system |
| 02/06/2001 | US6185707 IC test software system for mapping logical functional test data of logic integrated circuits to physical representation |
| 02/06/2001 | US6185706 Performance monitoring circuitry for integrated circuits |
| 02/06/2001 | US6185594 Versatile signal generator |
| 02/06/2001 | US6185510 PLL jitter measuring method and integrated circuit therewith |
| 02/06/2001 | US6185509 Analysis of noise in repetitive waveforms |
| 02/06/2001 | US6185488 Diagnosing apparatus for passenger protective systems |
| 02/06/2001 | US6185273 Process and circuit arrangement for testing solder joints |
| 02/06/2001 | US6185261 Determination of transmitter distortion |
| 02/06/2001 | US6185139 Circuit and method for enabling semiconductor device burn-in |
| 02/06/2001 | US6184794 Portable lighting device having externally attached voltage tester |
| 02/06/2001 | US6184720 Internal voltage generating circuit of a semiconductor device using test pad and a method thereof |
| 02/06/2001 | US6184698 Semiconductor component mounting apparatus |
| 02/06/2001 | US6184697 Semiconductor integrated circuit testing apparatus with reduced installation area |
| 02/06/2001 | US6184696 Use of converging beams for transmitting electromagnetic energy to power devices for die testing |
| 02/06/2001 | US6184695 Diagnostic circuit for potentiometric sensors |
| 02/06/2001 | US6184693 Electromagnetic noise measurement apparatus |
| 02/06/2001 | US6184692 Loop back test apparatus and technique |
| 02/06/2001 | US6184691 Apparatus and method for testing coating of an electrical conductor |
| 02/06/2001 | US6184690 Pole to pole surge test for wound products |
| 02/06/2001 | US6184689 Secondary service conductor tester |
| 02/06/2001 | US6184688 Method of measuring insulation resistance of capacitor and apparatus for screening characteristics |
| 02/06/2001 | US6184676 Cooling system for test head |
| 02/06/2001 | US6184675 Horizontal transfer test handler |
| 02/06/2001 | US6184587 Resilient contact structures, electronic interconnection component, and method of mounting resilient contact structures to electronic components |
| 02/06/2001 | US6184569 Semiconductor chip inspection structures |
| 02/06/2001 | US6184504 Temperature control system for electronic devices |
| 02/06/2001 | US6184048 Testing method and apparatus assuring semiconductor device quality and reliability |
| 02/06/2001 | US6184047 Contactor sleeve assembly for a pick and place semiconductor device handler |
| 02/06/2001 | US6184046 Non-contact voltage stressing method for thin dielectrics at the wafer level |
| 02/06/2001 | US6182828 Reel tape for provisionally supporting a bare chip |
| 02/06/2001 | CA2063686C Abnormal battery cell voltage detection circuitry |
| 02/03/2001 | CA2314838A1 Fault detection in electrical transmission lines |
| 02/01/2001 | WO2001008161A2 A method and a device for testing a memory array in which fault response is compresed |
| 02/01/2001 | WO2001007925A1 Low cost timing system for highly accurate multi-modal semiconductor testing |
| 02/01/2001 | WO2001007924A1 Built-in spare row and column replacement analysis system for embedded memories |
| 02/01/2001 | WO2001007923A1 Self-aligning interface apparatus for use in testing electrical devices |
| 02/01/2001 | WO2001007901A1 Infrared thermographic method for process monitoring and control of multilayer conductive compositions |
| 02/01/2001 | WO2001007871A1 Enhancing voltmeter functionality |
| 02/01/2001 | WO2000067068A3 Application specific waveform generator |
| 02/01/2001 | WO2000062208B1 Circuit simulator |
| 02/01/2001 | DE4423186C2 Verfahren zum Betreiben einer automatischen Testeinrichtung sowie automatische Testeinrichtung A method for operating an automatic test equipment as well as automatic test equipment |
| 02/01/2001 | DE19748029C2 Verfahren zum Testen von elektrische Bauelemente aufweisenden Baugruppen A method of testing modules comprising electric components |
| 02/01/2001 | DE10020981A1 Motor control device with earth-leakage circuit-breaker (ELCB), uses error logic circuit for detecting excessive current condition, for smooth shut-down |
| 02/01/2001 | DE10002370A1 Large Scale Integration test device has I/O connections corresponding to the number of connecting pins on the LSI and a control circuits corresponding to the I/O connections |
| 02/01/2001 | CA2380267A1 Enhancing voltmeter functionality |
| 02/01/2001 | CA2378832A1 Self-aligning interface apparatus for use in testing electrical devices |
| 01/31/2001 | EP1073325A2 Testing and transporting semiconductor chips |
| 01/31/2001 | EP1073164A1 A probe, a wire insertion detection jig, a wire mount control apparatus and a wire mount control method |
| 01/31/2001 | EP1073065A1 Nonvolatile semiconductor memory device |
| 01/31/2001 | EP1072897A2 Method and apparatus for searching electromagnetic disturbing source and noncontact voltage probe therefor |
| 01/31/2001 | EP1072894A2 Capacitive probe for in situ measurement of wafer DC bias voltage |
| 01/31/2001 | EP1072285A1 Battery management apparatus for portable electronic devices |
| 01/31/2001 | EP1072113A1 Method and system for estimating the ability of a subscriber loop to support broadband services |
| 01/31/2001 | EP1071962A1 High speed, real-time, state interconnect for automatic test equipment |
| 01/31/2001 | EP1071961A1 Layout, method and current measuring device for measuring a current in a conductor |
| 01/31/2001 | EP1046093A4 An improved power contact for testing a power delivery system |
| 01/31/2001 | EP0855037A4 Loaded board drop pin fixture |
| 01/31/2001 | CN2417481Y Arrangement for testing single phase socket connection and leakage of switch |
| 01/31/2001 | CN2417480Y On-line testing arrangement for lightning protector |
| 01/31/2001 | CN2417477Y Earthing test pencil |
| 01/31/2001 | CN2417091Y Automatic terminal-selecting testing pen for auxiliary circuit of locomotive |
| 01/31/2001 | CN1282108A Semiconductor integrated circuit and checking method, crystal device and electronic device |
| 01/31/2001 | CN1281991A Testing method for electronic component |
| 01/31/2001 | CN1281990A Method for testing imperfect contact caused by tiny short circuit on conducting wire |
| 01/30/2001 | US6182258 Method and apparatus for test generation during circuit design |
| 01/30/2001 | US6182256 Scan flip-flop that simultaneously holds logic values from a serial load and a subsequent parallel load |
| 01/30/2001 | US6182255 IC tester |
| 01/30/2001 | US6182254 Rambus ASIC having high speed testing function and testing method thereof |
| 01/30/2001 | US6182247 Embedded logic analyzer for a programmable logic device |
| 01/30/2001 | US6182237 System and method for detecting phase errors in asics with multiple clock frequencies |
| 01/30/2001 | US6181992 Automotive diagnostic service tool with hand held tool and master controller |
| 01/30/2001 | US6181616 Circuits and systems for realigning data output by semiconductor testers to packet-based devices under test |
| 01/30/2001 | US6181615 Circuitry, apparatus and method for embedding quantifiable test results within a circuit being tested |
| 01/30/2001 | US6181587 Analog signal detecting circuit, and AC side current detector of semiconductor power conversion device |
| 01/30/2001 | US6181179 Scan flip-flop circuit |
| 01/30/2001 | US6181161 Apparatus and method for verifying macrocell base field programmable logic devices |
| 01/30/2001 | US6181155 Method and apparatus for testing dynamic logic using an improved reset pulse |
| 01/30/2001 | US6181154 Method and apparatus for testing of dielectric defects in a packaged semiconductor memory device |
| 01/30/2001 | US6181153 Method and system for detecting faults in a flip-chip package |
| 01/30/2001 | US6181152 Method and system for testing an integrated circuit input capacitance, particularly for a contactless operating integrated circuit |
| 01/30/2001 | US6181151 Integrated circuit tester with disk-based data streaming |
| 01/30/2001 | US6181149 Grid array package test contactor |
| 01/30/2001 | US6181148 Automated test head interface board locking and docking mechanism |
| 01/30/2001 | US6181147 Device evaluation circuit |
| 01/30/2001 | US6181146 Burn-in board |
| 01/30/2001 | US6181143 Method for performing a high-temperature burn-in test on integrated circuits |
| 01/30/2001 | US6181141 Failsafe monitoring system for potentiometers and monitor interface |
| 01/30/2001 | US6181140 Method of estimating the location of a cable break including a means to measure resistive fault levels for cable sections |
| 01/30/2001 | US6181139 Method and apparatus for testing the insulating ability of an insulation on an electric conductor |
| 01/30/2001 | US6181117 Power supply circuit of an electronic component in a test machine |
| 01/30/2001 | US6181109 Method and apparatus for monitoring and maintaining a plurality of batteries |