| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 02/20/2001 | US6192317 Statistical pattern analysis methods of partial discharge measurements in high voltage insulation |
| 02/20/2001 | US6191987 Semiconductor memory test circuit |
| 02/20/2001 | US6191967 Voltage supply device having self-testing circuit |
| 02/20/2001 | US6191697 Circuit continuity detection system and method |
| 02/20/2001 | US6191605 Contactless method for measuring total charge of an insulating layer on a substrate using corona charge |
| 02/20/2001 | US6191604 Integrated circuit testing device |
| 02/20/2001 | US6191603 Modular embedded test system for use in integrated circuits |
| 02/20/2001 | US6191601 Test fixture for matched impedance testing |
| 02/20/2001 | US6191600 Scan test apparatus for continuity testing of bare printed circuit boards |
| 02/20/2001 | US6191599 IC device under test temperature control fixture |
| 02/20/2001 | US6191598 High resolution analytical probe station |
| 02/20/2001 | US6191597 Printed circuit board test device with test adapter and method for adjusting the latter |
| 02/20/2001 | US6191596 Method for detecting a contact position between an object to be measured and measuring pins |
| 02/20/2001 | US6191595 Adhesive attaching, thermal releasing flat pack probe assembly |
| 02/20/2001 | US6191592 Connection inspecting apparatus for a cord and a method for inspecting a connection of a cord |
| 02/20/2001 | US6191591 Battery cell grading holder |
| 02/20/2001 | US6191590 Device and a process for monitoring the state of charge of a battery |
| 02/20/2001 | US6191589 Test circuit for an AFCI/GFCI circuit breaker |
| 02/20/2001 | US6191573 Ringing preventive circuit, device under test board, pin electronics card, and semiconductor device |
| 02/20/2001 | US6191572 Adjustable fast press with PCA shuttle and modular expansion capabilities |
| 02/20/2001 | US6191570 System and method for detecting shorts, opens and connected pins on a printed circuit board using automatic test equipment |
| 02/20/2001 | US6191559 Battery capacity calculator and method of calculating battery capacity |
| 02/20/2001 | US6191556 Method and apparatus for estimating the service life of a battery |
| 02/20/2001 | US6191434 Semiconductor device measuring socket having socket position adjustment member |
| 02/20/2001 | US6191396 Heater abnormality detecting circuit |
| 02/20/2001 | US6191352 Device for projecting a defined light beam onto a photosensitive area |
| 02/20/2001 | US6190972 Method for storing information in a semiconductor device |
| 02/20/2001 | US6190111 Tray inverting apparatus and methods |
| 02/20/2001 | CA2113850C Microwave oven leakage checker |
| 02/19/2001 | CA2316746A1 Apparatus and method for detecting defects in a multi-channel scan driver |
| 02/15/2001 | WO2001011753A1 Battery monitor and battery device |
| 02/15/2001 | WO2001011680A1 Method and apparatus for characterizing a semiconductor device |
| 02/15/2001 | WO2001011536A1 Built-in self-test for multi-channel transceivers without data alignment |
| 02/15/2001 | WO2001011378A1 Actuator arrangement, especially for controlling an injection valve in an internal combustion engine |
| 02/15/2001 | WO2001011377A1 Method and device for individually determining the ageing condition of a capacitor |
| 02/15/2001 | WO2001010575A1 Four electrical contact testing machine for miniature inductors and process of using |
| 02/15/2001 | WO2000049715A3 Serial switch driver architecture for automatic test equipment |
| 02/15/2001 | DE19935867A1 Device for locating cable faults using an impulse reflection method using impulse and power capacitors for generation of a spark across a spark gap that generates a signal in the faulty cable |
| 02/15/2001 | DE19807905C2 Schaltungsanordnung und Verfahren zum Testen von logischen Schaltnetzen Circuit arrangement and method for testing of logic networks |
| 02/15/2001 | DE19619916C2 Ratengeneratorschaltung für Halbleiter-Prüfsystem Rate generator circuit for semiconductor test system |
| 02/15/2001 | DE10037216A1 Connecting structure for forming an electrical connection which can be mounted on a testing card for testing semiconductor wafers comprises a connecting substrate with a connecting element |
| 02/14/2001 | EP1076292A2 Display unit, electronic device using the same, and method of inspecting the display unit |
| 02/14/2001 | EP1076242A2 Method for detecting minor short in battery cells and method for detecting cell shorts |
| 02/14/2001 | EP1076241A2 Engine control device |
| 02/14/2001 | EP1075663A1 Method for testing an integrated circuit and corresponding integrated circuit |
| 02/14/2001 | EP1075655A1 Electronic battery tester |
| 02/14/2001 | CN2419604Y Signal tester for infrared remote controller for household electric appliances |
| 02/14/2001 | CN1284182A Method and appts for utilizing mux scan flip-flops to test speed related defects |
| 02/14/2001 | CN1283934A Cathode pulse generator of CRT |
| 02/14/2001 | CN1283796A Circuit and method for detecting voltage state of power supply |
| 02/13/2001 | US6189128 Design for testability method selectively employing two methods for forming scan paths in a circuit |
| 02/13/2001 | US6189121 Semiconductor device containing a self-test circuit |
| 02/13/2001 | US6189120 Testing system for evaluating integrated circuits, a burn-in testing system, and a method for testing an integrated circuit |
| 02/13/2001 | US6189119 Semiconductor memory device having test mode |
| 02/13/2001 | US6189115 Boundary scan input output serializer (BIOS) circuit |
| 02/13/2001 | US6188253 Analog clock module |
| 02/13/2001 | US6188235 System and method for verifying proper connection of an integrated circuit to a circuit board |
| 02/13/2001 | US6188234 Method of determining dielectric time-to-breakdown |
| 02/13/2001 | US6188233 Method for determining proximity effects on electrical characteristics of semiconductor devices |
| 02/13/2001 | US6188230 Pickup chuck for double sided contact |
| 02/13/2001 | US6188229 Conductive-pattern recognition apparatus |
| 02/13/2001 | US6188227 Bifilar wound isolation network |
| 02/13/2001 | US6188225 Circuit and method for checking the contacting of a switch or pushbutton |
| 02/13/2001 | US6187602 CMOS integrated circuit device and its inspecting method and device |
| 02/13/2001 | US6186804 Mounting and testing of electrical devices using a lever operated bay for receiving the electrical devices |
| 02/13/2001 | US6185999 Mini-tension tester |
| 02/13/2001 | US6185952 Refrigeration system for cooling chips in test |
| 02/13/2001 | CA2265137C Power supply apparatus with circuit load sensor |
| 02/13/2001 | CA2205539C Transformer testing method |
| 02/13/2001 | CA2105076C Line disturbance monitor and recorder system |
| 02/08/2001 | WO2001009980A2 Controlled compliance fine pitch interconnect |
| 02/08/2001 | WO2001009724A1 Mobile maintenance assistant |
| 02/08/2001 | WO2001009635A2 Apparatus having a single sensor for locating a concealed conductor energized by an alternating electric field |
| 02/08/2001 | WO2001009631A1 Assessing a parameter of cells in the batteries of uninterruptable power supplies |
| 02/08/2001 | WO2001009630A1 System for aligning rectangular wafers |
| 02/08/2001 | WO2001009628A1 Electricity supply monitoring system |
| 02/08/2001 | WO2001009627A2 Environmental test chamber and carrier for use therein |
| 02/08/2001 | WO2001009623A1 Construction structures and manufacturing processes for integrated circuit wafer probe card assemblies |
| 02/08/2001 | WO2000072028B1 Voltage monitor circuit with adjustable hysteresis using a single comparator |
| 02/08/2001 | WO2000065705A3 System and method for accurately determining remaining battery life |
| 02/08/2001 | WO2000052484A3 Interface independent test system |
| 02/08/2001 | DE19939595C1 Test signals generation circuit arrangement for testing a number of integrated-circuit semiconductor chips |
| 02/08/2001 | DE19932849A1 Electrical contact device has an elastic isolating body with elastic contacts fixed within it with pointed protrusions at each end so that arranged between two sets of conductors an efficient pressurized connection is made |
| 02/08/2001 | DE19927029A1 Verfahren zum Betrieb eines elektronischen Überstromauslösers eines Leistungsschalters A method for operating an electronic overcurrent trip a circuit breaker |
| 02/08/2001 | DE10035976A1 Highly reliable test connection structure for large numbers of components on semiconductor wafer or components on PCB, is machine-assembled with great precision in silicon |
| 02/08/2001 | DE10031528A1 Pattern generator for electric component inspection device, has sub-address unit which generates address of pattern information, during service interruption of main memory using sub-memory |
| 02/08/2001 | DE10016611A1 Prüfsystem Test system |
| 02/08/2001 | CA2380649A1 Electricity supply monitoring system |
| 02/08/2001 | CA2346141A1 Single sensor concealed conductor locator |
| 02/07/2001 | EP1075071A2 Fault detection in a motor vehicle charging system |
| 02/07/2001 | EP1074991A2 Semiconductor memory device |
| 02/07/2001 | EP1074915A1 One-chip microcomputer and control method thereof as well as an ic card having sucha one-chip microcomputer |
| 02/07/2001 | EP1074851A1 Arrangement for monitoring a battery consisting of a plurality of sub-units connected in series |
| 02/07/2001 | EP1074850A2 Circuit for the synthetic testing of the switch capability of high voltage switches |
| 02/07/2001 | EP1074849A2 Fault detection in electrical transmission lines |
| 02/07/2001 | EP1074844A2 Testing integrated circuits |
| 02/07/2001 | EP1073911A1 Fault location in a medium-voltage network |
| 02/07/2001 | EP1073906A2 Method and apparatus for protecting sensitive data during automatic testing of hardware |
| 02/07/2001 | EP0868687A4 Timing signal generator |
| 02/07/2001 | CN2418619Y Detected-object displacement initator with inductive artical near switch |