| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 03/06/2001 | US6198612 Method and apparatus for the monitoring of electric lines |
| 03/06/2001 | US6198418 Digital-to analog converter accurately testable without complicated circuit configuration, semiconductor integrated circuit device using the same and testing method thereof |
| 03/06/2001 | US6198302 System and method for testing power supplies |
| 03/06/2001 | US6198301 Method for determining the hot carrier lifetime of a transistor |
| 03/06/2001 | US6198300 Silicided silicon microtips for scanning probe microscopy |
| 03/06/2001 | US6198299 High Resolution analytical probe station |
| 03/06/2001 | US6198295 Apparatus and method for detecting electrical resistance change in connectors to a remote mounted sensor |
| 03/06/2001 | US6198292 Crosstalk test unit and method of calibration |
| 03/06/2001 | US6198291 Double-speed tester and method of use thereof for testing microelectronic devices |
| 03/06/2001 | US6198290 Method to detect defective capacitors in circuit and meters for that |
| 03/06/2001 | US6198274 IC testing apparatus |
| 03/06/2001 | US6198273 IC tester simultaneously testing plural ICS |
| 03/06/2001 | US6198272 Plug construction having positive and negative poles for circuit testing on vehicles |
| 03/06/2001 | US6198270 Electronic wire sorter |
| 03/06/2001 | US6198254 Battery capacity measurement apparatus, taking into consideration a gassing voltage that changes relative to temperature |
| 03/06/2001 | US6198253 Smart battery with maintenance and testing functions, communications, and display |
| 03/06/2001 | US6198252 Battery state monitoring circuit and battery device |
| 03/06/2001 | US6198199 Method for diagnosing a short circuit at a capacitive actuator |
| 03/06/2001 | US6198172 Semiconductor chip package |
| 03/06/2001 | US6197605 Method and device for test vector analysis |
| 03/06/2001 | US6197602 Burn-in method for microwave semiconductor transistor |
| 03/06/2001 | US6196849 Method and apparatus for aligning an integrated circuit chip |
| 03/06/2001 | US6196677 Parallel test method |
| 03/01/2001 | WO2001015300A1 Device, system and method for monitoring a household electric appliance |
| 03/01/2001 | WO2001015174A1 A memory module test system with reduced driver output impedance |
| 03/01/2001 | WO2001014898A1 Measuring cell voltages of a fuel cell stack |
| 03/01/2001 | WO2001014897A1 Method and device for measuring the ohmic resistance of a stator circuit of an induction machine |
| 03/01/2001 | WO2001014896A1 Testing device for an electrical connector |
| 03/01/2001 | WO2001014895A1 Circuit and method for evaluating capacitances |
| 03/01/2001 | DE19940988A1 Monitoring heating body in domestic machine involves connecting first and/or second test voltages to test heating coil resistance and/or insulation resistance before switching on heating body |
| 03/01/2001 | DE10036387A1 Semiconductor test program diagnostic device has packet extraction and display unit for extracting part of test signal based on data fed in by data feed unit and for displaying its contents |
| 03/01/2001 | DE10035705A1 Defective relief analysis procedure of memory, involves detecting line or row address of defective cell in searched memory area, and specifying and storing address of defective cell |
| 03/01/2001 | DE10035690A1 Semiconductor memory device has input/output mode set by shifting levels of signals received at contacts of mode setting circuit |
| 03/01/2001 | DE10034706A1 Elektrooptik-Meßfühler Electro-optic probe |
| 03/01/2001 | CA2382397A1 Testing device for an electrical connector |
| 02/28/2001 | EP1079235A1 Method and system for testing an electrical component |
| 02/28/2001 | EP1079234A1 System and method for diagnozing a malfunction of an electrical or electronic apparatus of a motor vehicle |
| 02/28/2001 | EP1078272A1 Method for generating a shmoo plot contour for integrated circuit tester |
| 02/28/2001 | EP1002427A4 Multi-function viewer/tester for miniature electric components |
| 02/28/2001 | CN2421659Y Acoustooptic alarm for open circuit and short circuit of automobile |
| 02/28/2001 | CN2421658Y Cable correcting apparatus |
| 02/28/2001 | CN1285642A Accumulator controller and management method |
| 02/28/2001 | CN1285615A Probe card for testing semiconductor chip with many semiconductor device and method thereof |
| 02/28/2001 | CN1285516A According to load current compensation type voltage sampling measurement circuit |
| 02/27/2001 | US6195776 Method and system for transforming scan-based sequential circuits with multiple skewed capture events into combinational circuits for more efficient automatic test pattern generation |
| 02/27/2001 | US6195775 Boundary scan latch configuration for generalized scan designs |
| 02/27/2001 | US6195774 Boundary-scan method using object-oriented programming language |
| 02/27/2001 | US6195773 LSI defective automatic analysis system and analyzing method therefor |
| 02/27/2001 | US6195772 Electronic circuit testing methods and apparatus |
| 02/27/2001 | US6195771 Semiconductor device having semiconductor memory circuit to be tested, method of testing semiconductor memory circuit and read circuit for semiconductor memory circuit |
| 02/27/2001 | US6195619 System for aligning rectangular wafers |
| 02/27/2001 | US6195616 Method and apparatus for the functional verification of digital electronic systems |
| 02/27/2001 | US6195614 Method of characterizing events in acquired waveform data from a metallic transmission cable |
| 02/27/2001 | US6195408 Methods and apparatus for cable interconnection verification |
| 02/27/2001 | US6194970 Oscillator stability monitoring and compensation system |
| 02/27/2001 | US6194925 Time interval measurement system incorporating a linear ramp generation circuit |
| 02/27/2001 | US6194911 Integrated circuit tester with compensation for leakage current |
| 02/27/2001 | US6194910 Relayless voltage measurement in automatic test equipment |
| 02/27/2001 | US6194909 Constructive module of an electronic telecommunications equipment, with an interface towards a testing and diagnosing system |
| 02/27/2001 | US6194908 Test fixture for testing backplanes or populated circuit boards |
| 02/27/2001 | US6194907 Prober and electric evaluation method of semiconductor device |
| 02/27/2001 | US6194906 Inspection adapter board for printed board, method for inspecting printed board, and method and apparatus for producing information for fabricating the inspection adapter board |
| 02/27/2001 | US6194901 Measuring circuit for a system of electrical modules connected in series |
| 02/27/2001 | US6194895 Asymmetry measuring apparatus and method |
| 02/27/2001 | US6194877 Fault detection in a motor vehicle charging system |
| 02/27/2001 | US6194870 System for automatically indicating that battery should be replaced and method thereof |
| 02/27/2001 | US6194868 Voltage indicator for indicating that the voltage of a battery passes a given value |
| 02/27/2001 | US6194866 Arrangement and a method relating to exchange of digital information between devices comprising electric circuitry |
| 02/27/2001 | US6194738 Method and apparatus for storage of test results within an integrated circuit |
| 02/27/2001 | US6194679 Four electrical contact testing machine for miniature inductors and process of using |
| 02/27/2001 | US6192576 Mechanism for loading a respective fuzz button into each of a high number of button holes within an IC contactor |
| 02/22/2001 | WO2001013487A1 Method and apparatus for detecting a failed thyristor |
| 02/22/2001 | WO2001013347A1 Measuring instrument control adapter, measuring instrument, measuring instrument controller, measurement execution method, and recorded medium |
| 02/22/2001 | WO2001013143A1 Locating device and method |
| 02/22/2001 | WO2001013136A1 Method for correcting timing for ic tester and ic tester having correcting function using the correcting method |
| 02/22/2001 | WO2001013135A1 Internal signal monitor of integrated circuit |
| 02/22/2001 | WO2001013133A1 Method and apparatus for detecting a failed thyristor |
| 02/22/2001 | WO2001013132A1 Fault location device and method |
| 02/22/2001 | WO2001013130A1 Electrical contactor, especially wafer level contactor, using fluid pressure |
| 02/22/2001 | DE10034702A1 Analysing and repairing defective cells in memory by comparing numbers of defective cells to determine if repair is required |
| 02/22/2001 | DE10026993A1 Semiconductor memory device e.g. EEPROM, has write-in driver circuit that substitutes the defect data in primary row with the data of secondary row selected by redundancy selector |
| 02/22/2001 | CA2380172A1 Method and apparatus for detecting a failed thyristor |
| 02/22/2001 | CA2379957A1 Method and apparatus for detecting a failed thyristor |
| 02/21/2001 | EP1077520A2 Battery control apparatus and management methods for batteries |
| 02/21/2001 | EP1077381A2 Probe card and method of testing wafer having a plurality of semiconductor devices |
| 02/21/2001 | EP1076832A2 Integrated circuit with scan register chain |
| 02/21/2001 | EP1076827A1 Method and apparatus for testing interconnect networks |
| 02/21/2001 | CN2420651Y Intelligent cell detector |
| 02/21/2001 | CN1285073A Circuit and method for testing a digital semi-conductor circuit |
| 02/21/2001 | CN1285043A Instrument for measuring and sorting resistors, sorting device and method therefor |
| 02/21/2001 | CN1285042A Electrical parameter monitoring system |
| 02/21/2001 | CN1284808A Display unit and electronic machine using the same and detecting method of the same |
| 02/21/2001 | CN1284775A Automatic pole exchanging circuit with current detecting feedback function |
| 02/21/2001 | CN1284750A Solar battery and its load switching controller |
| 02/21/2001 | CN1284724A Programmable data mode generator for use in chip of semiconductor memory |
| 02/21/2001 | CN1284655A Test method of residual characteristics of battery |
| 02/20/2001 | US6192496 System for verifying signal timing accuracy on a digital testing device |
| 02/20/2001 | US6192495 On-board testing circuit and method for improving testing of integrated circuits |
| 02/20/2001 | US6192494 Apparatus and method for analyzing circuit test results and recording medium storing analytical program therefor |
| 02/20/2001 | US6192328 Method and configuration for computer-aided determination of a system relationship function |