| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 03/20/2001 | US6203332 Attachment structure of semiconductor device socket |
| 03/20/2001 | US6202858 Method for sorting IC-components |
| 03/20/2001 | US6202291 Apparatus for aligning device interconnections |
| 03/15/2001 | WO2001018938A1 Apparatus for battery capacity measurement and for remaining capacity calculation |
| 03/15/2001 | WO2001018931A1 System and method for providing surge, short and reverse polarity connection protection |
| 03/15/2001 | WO2001018899A1 Electric device with timer means |
| 03/15/2001 | WO2001018555A1 Automated optical inspection system with improved field of view |
| 03/15/2001 | WO2001018554A1 Partial discharge monitoring system for transformers |
| 03/15/2001 | WO2000033632A9 Apparatus and method for inverting an ic device |
| 03/15/2001 | US20010000013 High performance sub-system design and assembly |
| 03/15/2001 | DE19947118C1 Verfahren und Schaltungsanordnung zum Bewerten des Informationsgehalts einer Speicherzelle Method and circuit for evaluating the information content of a memory cell |
| 03/15/2001 | DE19943388A1 Vorrichtung zum Prüfen von Leiterplatten An apparatus for testing printed circuit boards |
| 03/15/2001 | DE19938060A1 Electric circuit with circuit connections testing device |
| 03/15/2001 | DE19936542A1 Determination of the charge remaining in a partially used high capacity battery by measurement of unit area capacitance for the battery and comparing this with a calibration curve for capacitance against remaining charge |
| 03/15/2001 | DE19936398A1 Function testing method for circuit board subjected to condensation e.g. in automobile electrics |
| 03/15/2001 | DE10044408A1 Pin block structure for containment and support of connector pins for use in automatic testing of a wide range of semiconductor structures having different connector pin arrangements |
| 03/15/2001 | DE10043397A1 Flash memory device with programming state diagnosis circuit, includes column drive circuit and programming state diagnosis circuit for verifying data bits from column drive are associated with programming state |
| 03/15/2001 | DE10041720A1 Burn-in test circuit e.g. for testing microcomputer internal circuits, includes flip-flop circuit in which a reset signal for triggering a reset state, is supplied to a first input |
| 03/15/2001 | DE10025900A1 Sonde für ein elektro-optisch abtastendes Oszilloskop A probe for electro-optically scanning oscilloscope |
| 03/15/2001 | DE10021076A1 Fehlererfassungsanordnung eines Notrufendgeräts Error detection arrangement of an emergency call terminal |
| 03/15/2001 | DE10016853A1 Delay clock generation apparatus for semiconductor test device, delays clock pulses for predetermined time, based on comparison of phase of standard clock signal with that of reference shift clock signals |
| 03/15/2001 | CA2387714A1 Electric device with timer |
| 03/14/2001 | EP1083658A1 Circuit arrangement for monitoring an electronic switch intended for controlling a load |
| 03/14/2001 | EP1083575A1 Non volatile memory with detection of short circuits between word lines |
| 03/14/2001 | EP1083502A1 Noise checking method and device |
| 03/14/2001 | EP1083436A1 Method and circuit for testing the presence of multiple supply voltages in an integrated circuit |
| 03/14/2001 | EP1083435A2 Integrated circuit test apparatus |
| 03/14/2001 | EP1083434A2 Apparatus for testing printed circuit boards |
| 03/14/2001 | EP1082830A1 Method and system for monitoring broadband quality of services |
| 03/14/2001 | EP1082617A1 Method for detecting the position of defective shielding of a coaxial cable or connector in a coaxial cable network |
| 03/14/2001 | CN1287696A 天线适配器 Antenna adapter |
| 03/14/2001 | CN1287618A Method and apparatus for automotive and other battery testing |
| 03/14/2001 | CN1287362A Non-volatile semiconductor memory |
| 03/14/2001 | CN1287272A DC motor tachometer |
| 03/13/2001 | US6202187 Pattern generator for use in a semiconductor test device |
| 03/13/2001 | US6202186 Integrated circuit tester having pattern generator controlled data bus |
| 03/13/2001 | US6202185 Methods and apparatus for facilitating scan testing of circuitry |
| 03/13/2001 | US6202184 Semiconductor integrated circuit device |
| 03/13/2001 | US6202183 Analog test access port and method therefor |
| 03/13/2001 | US6202182 Method and apparatus for testing field programmable gate arrays |
| 03/13/2001 | US6202181 Method for diagnosing bridging faults in integrated circuits |
| 03/13/2001 | US6202172 Smart debug interface circuit |
| 03/13/2001 | US6202168 Device for regulating variation of delay time for data transfer between logic circuits |
| 03/13/2001 | US6202044 Concurrent hardware-software co-simulation |
| 03/13/2001 | US6202030 Calibrating test equipment |
| 03/13/2001 | US6202029 Non-contact electrical conduction measurement for insulating films |
| 03/13/2001 | US6201831 Demodulator for a multi-pair gigabit transceiver |
| 03/13/2001 | US6201750 Scannable fuse latches |
| 03/13/2001 | US6201748 Semiconductor memory device having test mode |
| 03/13/2001 | US6201746 Test method for high speed memory devices in which limit conditions for the clock are defined |
| 03/13/2001 | US6201479 Switching arrangement for monitoring leakage current |
| 03/13/2001 | US6201403 Integrated circuit package shielding characterization method and apparatus |
| 03/13/2001 | US6201402 Probe tile and platform for large area wafer probing |
| 03/13/2001 | US6201401 Method for measuring the electrical potential in a semiconductor element |
| 03/13/2001 | US6201398 Non-contact board inspection probe |
| 03/13/2001 | US6201397 Device for measuring and displaying the operating autonomy of a storage battery |
| 03/13/2001 | US6201385 Voltage and continuity tester |
| 03/13/2001 | US6201383 Method and apparatus for determining short circuit conditions using a gang probe circuit tester |
| 03/13/2001 | US6201373 Battery remaining capacity measuring apparatus suitable for hybrid car |
| 03/13/2001 | US6201318 Headlight warning system |
| 03/13/2001 | US6201235 Electro-optic sampling oscilloscope |
| 03/13/2001 | US6200144 Interposer/converter to allow single-sided contact to circuit modules |
| 03/13/2001 | US6199741 Enhanced pad design for substrate |
| 03/13/2001 | CA2119862C Battery voltage measurement system |
| 03/13/2001 | CA2101279C Process for determining the backup time of a battery |
| 03/08/2001 | WO2001016956A1 Method and apparatus for supplying regulated power to memory device components |
| 03/08/2001 | WO2001016615A1 Method and apparatus for evaluating stored charge in an electrochemical cell or battery |
| 03/08/2001 | WO2001016614A1 Method and apparatus for electronically evaluating the internal temperature of an electrochemical cell or battery |
| 03/08/2001 | WO2001016613A1 Tester for concurrently testing multiple chips |
| 03/08/2001 | WO2001016612A1 Variable length pattern generator for chip tester system |
| 03/08/2001 | WO2001016611A1 Device for and method of preventing bus contention |
| 03/08/2001 | WO2001016610A1 Device for and method of preventing bus contention |
| 03/08/2001 | WO2001016609A1 Programme-controlled unit and method for identifying and/or analysing errors in programme-controlled units |
| 03/08/2001 | WO2000072029A3 Analog test output switchably connected to pcmcia connector pin |
| 03/08/2001 | DE10040454A1 Testing embedded analogue or mixed signal components of integrated system chip involves installing assembler program to generate test pattern for analogue component, evaluating response |
| 03/08/2001 | DE10033687A1 Diagnoseverfahren zum Erfassen eines fehlerhaften Kontaktes, der durch einen Feinkurzschluss eines Leitungsdrahtes verursacht wird Diagnostic method for detecting a faulty contact, which is caused by a short circuit of a fine conductive wire |
| 03/08/2001 | DE10023379A1 Thin film probe manufacturing method for testing integrated circuit, involves removing substrate from electrical conducting material after connecting track to electrical conducting material |
| 03/08/2001 | DE10012287A1 Signal processing device for testing differential signal transmitted by data line pair, compares data line voltages with upper and lower limits and compares results with reference logic pattern |
| 03/07/2001 | EP1081809A1 Plug for flexible flat wiring device |
| 03/07/2001 | EP1081499A1 Means for estimating charged state of battery and method for estimating degraded state of battery |
| 03/07/2001 | EP1081498A1 Scan latch circuit |
| 03/07/2001 | EP1081497A2 Flat panel display support framework |
| 03/07/2001 | EP1080471A2 High speed memory test system with intermediate storage buffer and method of testing |
| 03/07/2001 | EP1079993A1 Method and device for checking an electric circuit, especially an ignition circuit of a motor vehicle occupant protection system |
| 03/07/2001 | EP1065502A4 Method for carrying out the electrical breakdown of a gaseous dielectric in a highly non-uniform field |
| 03/07/2001 | EP0871931A4 Signal deskewing system for synchronous logic circuit |
| 03/07/2001 | CN2422651Y Comprehensive testing table for fluorescent lamp |
| 03/07/2001 | CN1286757A Apparatus for testing multi-terminal electronic components |
| 03/07/2001 | CN1286405A Method for determining position of failure in dectric distribution network |
| 03/07/2001 | CN1062984C Device for testing connectors |
| 03/06/2001 | US6199185 Test method for high speed semiconductor devices using a clock modulation technique |
| 03/06/2001 | US6199184 Parallel signature compression circuit and method for designing the same |
| 03/06/2001 | US6199183 Method of forming a scan path network |
| 03/06/2001 | US6199182 Probeless testing of pad buffers on wafer |
| 03/06/2001 | US6199025 Semiconductor device having selectable device type and methods of testing device operation |
| 03/06/2001 | US6199023 System for removing spurious signatures in motor current signature analysis |
| 03/06/2001 | US6198700 Method and apparatus for retiming test signals |
| 03/06/2001 | US6198699 Semiconductor testing apparatus |
| 03/06/2001 | US6198669 Semiconductor integrated circuit |
| 03/06/2001 | US6198663 Non-volatile semiconductor memory IC |