| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 03/28/2001 | EP1086381A1 System for digital measurement of breakdown voltage of high-voltage samples |
| 03/28/2001 | EP1085896A1 Conformationally constrained backbone cyclized somatostatin analogs |
| 03/28/2001 | EP0783170B1 Apparatus and method for the acquisition and analysis of a three-dimensional distribution of discrete points |
| 03/28/2001 | EP0680672B1 Retriggered oscillator for jitter-free phase locked loop frequency synthesis |
| 03/28/2001 | CN1289052A Fuel cell unit voltage measuring method |
| 03/28/2001 | CN1289051A DC system earthing-point detecting method |
| 03/28/2001 | CN1289050A Electricity-leakage detection method for electric appliance |
| 03/28/2001 | CN1289049A Recovering unit for copying machine |
| 03/28/2001 | CN1289038A Intelligent analysts system and method for electric equipment filled with fluid |
| 03/28/2001 | CN1063849C Integrated circuit carrier |
| 03/27/2001 | US6209121 Method and system for improving delay error |
| 03/27/2001 | US6209118 Method for modifying an integrated circuit |
| 03/27/2001 | US6209075 Method and apparatus for extending memory of an integrated circuit |
| 03/27/2001 | US6208947 Method in an integrated circuit (IC) manufacturing process for identifying and redirecting IC's mis-processed during their manufacture |
| 03/27/2001 | US6208945 Harmonic component measuring method for power system |
| 03/27/2001 | US6208583 Synchronous semiconductor memory having an improved reading margin and an improved timing control in a test mode |
| 03/27/2001 | US6208571 Semiconductor memory device, circuit board mounted with semiconductor memory device, and method for testing interconnection between a semiconductor memory device with a circuit board |
| 03/27/2001 | US6208567 Semiconductor device capable of cutting off a leakage current in a defective array section |
| 03/27/2001 | US6208496 Lightening arrester in a discharge counter to protect a power system and an electric apparatus from overvoltage connected in parallel to nonlinear resistor of zinc oxide, bismuth oxide, and titanium oxide and capacitor material |
| 03/27/2001 | US6208375 Test probe positioning method and system for micro-sized devices |
| 03/27/2001 | US6208242 Circuit configuration to monitor a regulated output voltage in a motor vehicle |
| 03/27/2001 | US6208172 System margin and core temperature monitoring of an integrated circuit |
| 03/27/2001 | US6208161 Differential signal transmission circuit |
| 03/27/2001 | US6208159 Machine press motor load monitor |
| 03/27/2001 | US6208155 Probe tip and method for making electrical contact with a solder ball contact of an integrated circuit device |
| 03/27/2001 | US6208153 System for fast piezoelectric-resonator parameter measurements |
| 03/27/2001 | US6208149 Method and apparatus for monitoring electric insulation conditions in energized electric systems |
| 03/27/2001 | US6208147 Method of and apparatus for measuring battery capacity by impedance spectrum analysis |
| 03/27/2001 | US6208130 Electrical transfer switch and related method |
| 03/27/2001 | US6208117 Battery pack and electronic apparatus using the same |
| 03/27/2001 | US6208114 Battery monitoring system with integrated battery holder |
| 03/27/2001 | US6208043 Fault error generation in electronic sensors |
| 03/27/2001 | US6205660 Method of making an electronic contact |
| 03/27/2001 | CA2196482C Method and apparatus for enhancing security in and discouraging theft ofvlsi and ulsi devices |
| 03/27/2001 | CA2126481C Non-contact photothermal method for measuring thermal diffusivity and electronic defect properties of solids |
| 03/22/2001 | WO2001020630A1 Control system for an electromagnetic switching device and electromagnetic switching device corresponding thereto |
| 03/22/2001 | WO2001020614A1 Method of testing a memory |
| 03/22/2001 | WO2001020455A1 Microcomputer with test instruction memory |
| 03/22/2001 | WO2001020355A1 Method for locating faulty elements in an integrated circuit |
| 03/22/2001 | WO2001020354A1 Leak sensor |
| 03/22/2001 | WO2001020347A1 Nano-drive for high resolution positioning and for positioning of a multi-point probe |
| 03/22/2001 | WO2001020310A1 Inspecting component placement relative to component pads |
| 03/22/2001 | WO2001008161A3 A method and a device for testing a memory array in which fault response is compresed |
| 03/22/2001 | DE4433512C2 Wellenform-Formatierungseinrichtung Waveform formatter |
| 03/22/2001 | DE19944036A1 Integrierter Speicher mit wenigstens zwei Plattensegmenten Integrated memory having at least two plate segments |
| 03/22/2001 | DE19941135A1 Defect analysis method for semiconductor material |
| 03/22/2001 | DE19911939C2 Verfahren für den eingebauten Selbsttest einer elektronischen Schaltung Procedures for built-in self test of an electronic circuit |
| 03/22/2001 | DE10033314A1 Vorrichtung zur Fehlerbehebung bei Bildaufbereitungsgeräten und Verfahren zum Testen von Bildaufbereitungsgeräten Device for troubleshooting imaging devices and methods for testing imaging devices |
| 03/22/2001 | CA2381803A1 Nano-drive for high resolution positioning and for positioning of a multi-point probe |
| 03/21/2001 | EP1085635A2 Fluid-filled electrical equipment intelligent analysis system and method |
| 03/21/2001 | EP1085592A2 Method for detecting abnormal battery cell |
| 03/21/2001 | EP1085534A2 Intelligent analysis system and method for fluid-filled electrical equipment |
| 03/21/2001 | EP1085523A1 Integrated memory with memory cells and reference cells |
| 03/21/2001 | EP1085517A2 Integrated memory circuit with at least two plate segments |
| 03/21/2001 | EP1085413A1 Electronic circuit and corresponding method for trimming an IC |
| 03/21/2001 | EP1085335A1 Method and apparatus for testing integrated circuits with automatic test equipment |
| 03/21/2001 | EP1085333A1 A method of testing an integrated circuit |
| 03/21/2001 | EP1085332A2 Semiconductor integrated circuit, liquid crystal apparatus, electronic apparatus and method for testing semiconductor integrated circuit |
| 03/21/2001 | EP1085331A2 Semiconductor integrated circuit and method of measuring characteristics thereof |
| 03/21/2001 | EP1085327A1 Multi-point probe |
| 03/21/2001 | EP1085326A2 Multilayer wiring board, manufacturing method thereof, and wafer block contact board |
| 03/21/2001 | EP1084419A1 Method of and device for determining the charge condition of a battery |
| 03/21/2001 | EP1084418A1 Turning center with integrated non-contact inspection system |
| 03/21/2001 | EP1032844A4 Modular integrated circuit tester with distributed synchronization and control |
| 03/21/2001 | EP1008025A4 Configuration control in a programmable logic device using non-volatile elements |
| 03/21/2001 | EP0588425B1 Electronic drive circuits for active matrix devices, and a method of self-testing and programming such circuits |
| 03/21/2001 | CN2424471Y Signal on-line automatic detecting and calling device for power system fault |
| 03/21/2001 | CN2424469Y Multipurpose electronic test pencil |
| 03/21/2001 | CN1288420A Diagnostic system for the wattage power regulator of a high-pressure gas discharge lamp in a vehicle |
| 03/21/2001 | CN1288270A Method and device for judging service life of secondary cell, and recording medium for recording judging program therefor |
| 03/21/2001 | CN1288237A Integrated storage unit having at least two slice frayments |
| 03/21/2001 | CN1288236A Integrated storage unit having storage cells and reference unit |
| 03/21/2001 | CN1288161A Single board festing method and device |
| 03/21/2001 | CN1288160A Semiconductor integrated circuit and method for testing characteristics |
| 03/21/2001 | CN1288159A Fault location |
| 03/20/2001 | US6205579 Method for providing remote software technical support |
| 03/20/2001 | US6205567 Fault simulation method and apparatus, and storage medium storing fault simulation program |
| 03/20/2001 | US6205566 Semiconductor integrated circuit, method for designing the same, and storage medium where design program for semiconductor integrated circuit is stored |
| 03/20/2001 | US6205559 Method and apparatus for diagnosing failure occurrence position |
| 03/20/2001 | US6205408 Continuous monitoring system |
| 03/20/2001 | US6205407 System and method for generating test program code simultaneously with data produced by ATPG or simulation pattern capture program |
| 03/20/2001 | US6205238 Apparatus and method for inspecting leads of an IC |
| 03/20/2001 | US6205067 Semiconductor memory device having burn-in mode operation stably accelerated |
| 03/20/2001 | US6205056 Automated reference cell trimming verify |
| 03/20/2001 | US6205042 Indirect calculation of bus voltage for voltage source inverter |
| 03/20/2001 | US6205039 Device for supervising a high voltage converter station |
| 03/20/2001 | US6204770 Master automotive sensor tester |
| 03/20/2001 | US6204682 TFT and reliability evaluation method thereof |
| 03/20/2001 | US6204681 IC device contactor |
| 03/20/2001 | US6204680 Test socket |
| 03/20/2001 | US6204678 Direct connect interconnect for testing semiconductor dice and wafers |
| 03/20/2001 | US6204677 Contact pressure jig for signal analysis |
| 03/20/2001 | US6204676 Testing apparatus for testing a ball grid array device |
| 03/20/2001 | US6204675 Device for inserting at least one semiconductor component into a receptacle |
| 03/20/2001 | US6204647 Battery emulating power supply |
| 03/20/2001 | US6204638 Method for charging capacitor |
| 03/20/2001 | US6204636 Battery control apparatus for hybrid vehicle |
| 03/20/2001 | US6204464 Electronic component handler |
| 03/20/2001 | US6204074 Chip design process for wire bond and flip-chip package |
| 03/20/2001 | US6204072 Circuit and a method for configuring pad connections in an integrated device |