| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 04/10/2001 | US6215321 Probe card for wafer-level measurement, multilayer ceramic wiring board, and fabricating methods therefor |
| 04/10/2001 | US6215320 High density printed circuit board |
| 04/10/2001 | US6215315 Flat cable wear and fault detection for library apparatus |
| 04/10/2001 | US6215314 Wire break locator and method of use |
| 04/10/2001 | US6215313 Diagnostic method and apparatus for detecting high electrical harness resistance |
| 04/10/2001 | US6215312 Method and apparatus for analyzing an AgZn battery |
| 04/10/2001 | US6215311 Battery cell inspecting method and apparatus |
| 04/10/2001 | US6215275 Method for the automatic determination of battery chemistry in portable electronic devices |
| 04/10/2001 | US6215274 Enhanced battery pack monitoring interface |
| 04/10/2001 | US6214630 Wafer level integrated circuit structure and method of manufacturing the same |
| 04/10/2001 | US6214487 Integral sensors for monitoring a fuel cell membrane and methods of monitoring |
| 04/10/2001 | US6213636 Furnace for testing integrated circuits |
| 04/05/2001 | WO2001024337A2 Instantaneous arc fault light detector with resistance to false tripping |
| 04/05/2001 | WO2001024185A1 Method and circuit for evaluating the information content of a memory cell |
| 04/05/2001 | WO2001023902A1 Enhancements in testing devices on burn-in boards |
| 04/05/2001 | WO2001023901A1 A reconfigurable integrated circuit with integrated debugging facilities for use in an emulation system |
| 04/05/2001 | WO2001023900A1 Test language conversion method |
| 04/05/2001 | WO2000065683A3 Consumer battery having a built-in indicator |
| 04/05/2001 | DE10027822A1 Unterdrückung von Datenabtastwerten Suppression of data samples |
| 04/05/2001 | CA2350615A1 Instantaneous arc fault light detector with resistance to false tripping |
| 04/04/2001 | EP1089182A2 System and method for communicating with an integrated circuit |
| 04/04/2001 | EP1089178A2 System and method for communicating with an integrated circuit |
| 04/04/2001 | EP1089174A2 System and method for communicating with an integrated circuit |
| 04/04/2001 | EP1089085A1 Data shift register |
| 04/04/2001 | EP1089084A1 On-line testing of the programmable interconnect network in field programmable gate arrays |
| 04/04/2001 | EP1089083A1 Semiconductor circuits having scan path circuits |
| 04/04/2001 | EP1089082A1 A method and apparatus for testing supply connections |
| 04/04/2001 | EP1089081A2 Method for computational determination of ground fault distance in an electrical power distribution network having a ring configuration |
| 04/04/2001 | EP1089080A1 Leak detection method for electrical equipment |
| 04/04/2001 | EP1089079A2 A test and measurement instrument having telecommunications mask testing capability with an autofit to mask feature |
| 04/04/2001 | EP1088706A2 Diagnostic remote control |
| 04/04/2001 | EP1088516A2 Apparatus and method for detecting defects in a multi-channel scan driver |
| 04/04/2001 | EP1088241A1 Voltage measuring device |
| 04/04/2001 | EP1088240A1 Method of and apparatus for measuring battery capacity |
| 04/04/2001 | EP1088239A1 Device for measuring and analyzing electrical signals of an integrated circuit component |
| 04/04/2001 | EP1088237A1 Method and system for performance testing of rotating machines |
| 04/04/2001 | EP1032912A4 Electronic assembly video inspection system |
| 04/04/2001 | CN2426242Y Acummulator state monitoring and open loop protection device for converting station |
| 04/04/2001 | CN1290079A Intrustment with multi-channel telecommunication time scales testing and measuring capacibility |
| 04/04/2001 | CN1290078A Instrument with focus variable characteristics for testing and measuring capacibility of telecommunication time scales test |
| 04/04/2001 | CN1290077A Instrument with self adaptable time scales characteristics for testing and measuring capacibility of telecommunication time scales test |
| 04/04/2001 | CN1290059A Method for protecting power transmission line and travelling wave sensor for it |
| 04/04/2001 | CN1290034A Manufacture of semiconductor device and equipment therefor |
| 04/04/2001 | CN1289934A Combined tester probe |
| 04/04/2001 | CN1289933A Socket for testing connector of circuit board |
| 04/04/2001 | CN1289932A Universal multifunctional automatic test controller |
| 04/04/2001 | CN1289931A Circuit for testing allowable current of capacitor |
| 04/03/2001 | US6212667 Integrated circuit test coverage evaluation and adjustment mechanism and method |
| 04/03/2001 | US6212656 Automated scan chain sizing using Synopsys |
| 04/03/2001 | US6212655 IDDQ test solution for large asics |
| 04/03/2001 | US6212652 Controlling logic analyzer storage criteria from within program code |
| 04/03/2001 | US6212650 Interactive dubug tool for programmable circuits |
| 04/03/2001 | US6212449 Diagnosing malfunctions in materials handling vehicles |
| 04/03/2001 | US6212161 Method and apparatus for a fault tolerant software transparent and high data integrity extension to a backplane bus or interconnect |
| 04/03/2001 | US6212119 Dynamic register with low clock rate testing capability |
| 04/03/2001 | US6211792 Method and apparatus detecting a failed thyristor |
| 04/03/2001 | US6211785 Method of manufacturing and testing an electronic device, and an electronic device |
| 04/03/2001 | US6211726 Low voltage, high-current electronic load |
| 04/03/2001 | US6211723 Programmable load circuit for use in automatic test equipment |
| 04/03/2001 | US6211711 Activation signal generating circuit |
| 04/03/2001 | US6211693 Testability circuit for cascode circuits used for high voltage interface |
| 04/03/2001 | US6211690 Apparatus for electrically testing bare printed circuits |
| 04/03/2001 | US6211689 Method for testing semiconductor device and semiconductor device with transistor circuit for marking |
| 04/03/2001 | US6211688 Test area with automatic positioning of a microprobe and a method of producing such a test area |
| 04/03/2001 | US6211684 Internal unbalance detection in capacitors |
| 04/03/2001 | US6211683 Impulse voltage generator circuit |
| 04/03/2001 | US6211681 Apparatus for diagnosing electric power source while power is supplied to load device from the power source |
| 04/03/2001 | US6211663 Baseband time-domain waveform measurement method |
| 04/03/2001 | US6211654 Method for predicting battery capacity |
| 04/03/2001 | US6211653 Method and apparatus for measuring the state-of-charge of a battery |
| 04/03/2001 | US6211647 Method enabling communications between an electronic device and a battery, an apparatus comprising an electronic device and a battery, and a battery enabling communication |
| 04/03/2001 | US6211644 Method and apparatus for identifying a battery |
| 04/03/2001 | US6211571 Method and apparatus for testing chips |
| 04/03/2001 | US6211517 Electron beam fault detection of semiconductor devices |
| 04/03/2001 | US6211513 Automated test system and method for device having circuit and ground connections |
| 04/03/2001 | US6210984 Method and apparatus for automatically positioning electronic dice within component packages |
| 04/03/2001 | US6210983 Method for analyzing probe yield sensitivities to IC design |
| 04/03/2001 | US6210982 Method for improving spatial resolution and accuracy in scanning probe microscopy |
| 04/03/2001 | US6209295 Plastic and metal tube holder for SOIC package |
| 04/03/2001 | US6209194 Apparatus for loading and unloading semiconductor device packages using servo motors |
| 04/03/2001 | CA2198501C Malfunction diagnosis system and method for on-vehicle electronic control units |
| 03/29/2001 | WO2001022588A1 Integrated circuit comprising at least two clock systems |
| 03/29/2001 | WO2001022504A1 Organic electroluminescent device |
| 03/29/2001 | WO2001022107A1 Battery power source protecting device for an electromotive device |
| 03/29/2001 | WO2001022106A1 Method and device for the data protecting self-test of a microcontroller |
| 03/29/2001 | WO2001022105A1 Method and arrangement for dielectric integrity testing |
| 03/29/2001 | WO2001022104A1 Method for detection of high-impedance ground faults in a medium-voltage network |
| 03/29/2001 | WO2001022103A1 Charge-based frequency measurement bist |
| 03/29/2001 | WO2001022097A1 Measuring probe for measuring high frequencies and a method for producing the same |
| 03/29/2001 | WO2001004653A8 Method and apparatus for sub-micron imaging and probing on probe station |
| 03/29/2001 | DE19946471A1 Multichannel safety-control switching element e.g. for industrial machines and equipment |
| 03/29/2001 | DE19941099A1 Programmgesteuerte Einheit und Verfahren zum Erkennen und/oder Analysieren von Fehlern in programmgesteuerten Einheiten Program-controlled unit and method for detecting and / or analyzing faults in programmable units |
| 03/29/2001 | DE19939638A1 Cable assembly has length and identity markings eases fault location |
| 03/29/2001 | DE10045568A1 Semiconductor test system supported by event, includes event generator that produces individual events for determining test signal or strobe signals, based on event start signal and fractional data part |
| 03/29/2001 | DE10033519A1 Integrated circuit has address converter that generates address of selected memory device, and data generator that generates data signal that is sent to selected memory device, based on clock signal |
| 03/28/2001 | EP1087467A2 Contact and contact assembly using the same |
| 03/28/2001 | EP1087343A1 Method and device for remote diagnosis of vehicles by a communication network |
| 03/28/2001 | EP1087233A1 Method and device for data protecting selftest for microcontroller |
| 03/28/2001 | EP1087036A1 Method and apparatus for observing porous amorphous film, and method and apparatus for forming the same |
| 03/28/2001 | EP1086382A1 Measuring and compensating for warp in the inspection of printed circuit board assemblies |