| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 04/24/2001 | US6219908 Method and apparatus for manufacturing known good semiconductor die |
| 04/24/2001 | CA2082204C High frequency surge tester methods and apparatus |
| 04/21/2001 | CA2324055A1 Electronic component testing process |
| 04/19/2001 | WO2001028100A1 Low jitter phase-locked loop with duty-cycle control |
| 04/19/2001 | WO2001028067A1 Household electric user having an electronic control, and control and programming system thereof |
| 04/19/2001 | WO2001028064A2 Battery management system |
| 04/19/2001 | WO2001027992A1 Substrate falling-preventive mechanism and substrate tester having the same |
| 04/19/2001 | WO2001027761A2 Circuit cell for test pattern generation and test pattern compression |
| 04/19/2001 | WO2001027648A1 Method of characterizing a device under test |
| 04/19/2001 | WO2001027646A1 Battery capacity calculating method and device therefor |
| 04/19/2001 | WO2001027645A1 Easy to program automatic test equipment |
| 04/19/2001 | WO2001027641A1 Measurement of current in a vehicle using battery cable as a shunt |
| 04/19/2001 | WO2001027639A1 Sensor for detecting high-frequency oscillations of a voltage and an arrangement of a sensor |
| 04/19/2001 | WO2001027587A1 Contactless smart card test/encoding machine |
| 04/19/2001 | WO2000068700A3 Electronic monitoring device for a multipart electrical energy storage unit |
| 04/19/2001 | WO2000004671A3 Method and apparatus for identifying and tracking connections of communication lines |
| 04/19/2001 | DE4226719C2 Verfahren zum Prüfen der Funktion elektronischer Bauteile und Prüfvorrichtung zum Durchführen des Verfahrens Method for testing the function of electronic components and test apparatus for performing the method |
| 04/19/2001 | DE19946495A1 Anordnung zur Verringerung der Anzahl der Messpads auf einem Halbleiterchip Arrangement for reducing the number of the measuring pads on a semiconductor chip |
| 04/19/2001 | DE19945900A1 Configuration of trace interface in SoC-ASIC |
| 04/19/2001 | DE10057486A1 Semiconductor switching device defect recognition method e.g. for sense field effect transistor, involves measuring current on switched contacts of switching device redundantly |
| 04/19/2001 | DE10049506A1 Integrated electric motor monitor records all parameters gives early fault diagnosis |
| 04/19/2001 | DE10047136A1 Electrical property testing method of ICs, obtains laser and reference interference signals by enabling overlapping of primary and secondary laser signals and reference signals within given time respectively |
| 04/19/2001 | CA2386907A1 Measurement of current in a vehicle using battery cable as a shunt |
| 04/19/2001 | CA2386882A1 Household electric user having an electronic control, and control and programming system thereof |
| 04/18/2001 | EP1093220A1 Method of anomalous offset detection and circuit |
| 04/18/2001 | EP1093178A1 Rechargeable battery with protective circuit |
| 04/18/2001 | EP1092983A1 Integrated circuit tester with multi-port testing functionality |
| 04/18/2001 | EP1092982A1 Diagnostic system with learning capabilities |
| 04/18/2001 | EP1092338A1 Assembly of an electronic component with spring packaging |
| 04/18/2001 | CN1292110A Protection circuit for integrated circuit |
| 04/18/2001 | CN1292092A Method for controlling IC handler and control system using same |
| 04/18/2001 | CN1292091A Coaxial probe interface for automatic test equipment |
| 04/18/2001 | CN1291728A Supporting frame of panel display device or probe block |
| 04/18/2001 | CN1291724A Automatic sampling correction method for voltage of battery |
| 04/17/2001 | US6219813 Programmable timing circuit for testing the cycle time of functional circuits on an integrated circuit chip |
| 04/17/2001 | US6219812 Apparatus and method for interfacing boundary-scan circuitry with DTL output drivers |
| 04/17/2001 | US6219811 Test circuit and method for interconnect testing of chips |
| 04/17/2001 | US6219810 Intelligent binning for electrically repairable semiconductor chips |
| 04/17/2001 | US6219809 System and method for applying flexible constraints |
| 04/17/2001 | US6219808 Semiconductor device capable of carrying out high speed fault detecting test |
| 04/17/2001 | US6219806 Method of executing test programs for semiconductor testing system |
| 04/17/2001 | US6219629 Apparatus for combined simulation of electromagnetic wave analysis and circuit analysis, and computer-readable medium containing simulation program therefor |
| 04/17/2001 | US6219305 Method and system for measuring signal propagation delays using ring oscillators |
| 04/17/2001 | US6219293 Method and apparatus for supplying regulated power to memory device components |
| 04/17/2001 | US6219289 Data writing apparatus, data writing method, and tester |
| 04/17/2001 | US6219039 Compact PC video subsystem tester |
| 04/17/2001 | US6219029 Emphasizing infrequent events in a digital oscilloscope having variable intensity rasterizer and variable intensity or color display |
| 04/17/2001 | US6218852 Automated circuit board testing apparatus |
| 04/17/2001 | US6218850 Apparatus for selecting high-reliability integrated circuits |
| 04/17/2001 | US6218849 Device for detecting proper mounting of an IC for testing in an IC testing apparatus |
| 04/17/2001 | US6218846 Multi-probe impedance measurement system and method for detection of flaws in conductive articles |
| 04/17/2001 | US6218844 Method and apparatus for testing an arcing fault circuit interrupter |
| 04/17/2001 | US6218843 Zero gravity simulator for testing battery cells |
| 04/17/2001 | US6218809 Method for monitoring operating parameters of a rechargeable power supply |
| 04/17/2001 | US6218805 Measuring battery clamps |
| 04/17/2001 | US6218264 Method of producing a calibration standard for 2-D and 3-D profilometry in the sub-nanometer range |
| 04/17/2001 | US6218202 Semiconductor device testing and burn-in methodology |
| 04/17/2001 | US6218201 Method of manufacturing a liquid crystal display module capable of performing a self-test |
| 04/17/2001 | CA2219368C A method and a device for detecting and handling short-circuit phenomena for power semiconductor devices of turn-off type connected in series |
| 04/17/2001 | CA2203782C Semiconductor test chip with on-wafer switching matrix |
| 04/17/2001 | CA2122748C Battery with tester label and method for producing it |
| 04/17/2001 | CA2101280C Device for detecting failure of battery cells |
| 04/15/2001 | CA2287354A1 Battery storage measure through remote frequency measure |
| 04/12/2001 | WO2001026290A1 Method and system for performing time domain reflectometry contemporaneously with recurrent transmissions on computer network |
| 04/12/2001 | WO2001026163A1 Apparatus for localizing production errors in a photovoltaic element |
| 04/12/2001 | WO2001025811A1 Arrangement for determining the complex transmission function of a measuring device |
| 04/12/2001 | WO2001025804A1 Method for detecting system failures and a device for carrying out said method |
| 04/12/2001 | WO2001025801A1 Integrated test cell |
| 04/12/2001 | US20010000219 Demodulator for a multi-pair gigabit transceiver |
| 04/12/2001 | US20010000212 Battery system providing indicia of a charging parameter |
| 04/12/2001 | DE19963384A1 Circuit layout for monitoring an electronic switch set to control a load resistance and traversed by a load current for driving the load resistance at operating intervals has linear resistance behaviour in part of its operating state. |
| 04/12/2001 | DE19944246A1 Testing electric strength of electronic component, e.g. integrated circuit |
| 04/12/2001 | DE10049029A1 Circuit for determining latency of buffer circuit generates latency interval and latency indication from clock signal and from test signal derived from clock signal with delay |
| 04/12/2001 | DE10048372A1 Address control circuit has selection clock signal, generator of address conversion data for converting test object addresses to memory addresses, conversion data memory, address converter |
| 04/12/2001 | DE10043193A1 Test device for semiconductor wafers allowing precise determination of the measurement waveform and so compensation for phase shifts during measurement and increased accuracy |
| 04/12/2001 | CA2330781A1 Verification of pwb electrical parameters |
| 04/11/2001 | EP1091405A2 Arrangement for diminishing the number of measurement pads on semiconductor chip |
| 04/11/2001 | EP1091218A2 A constant current termination for cable locating tones |
| 04/11/2001 | EP1090357A1 Functional verification of integrated circuit designs |
| 04/11/2001 | EP1090338A1 Temperature tracking voltage-to-current converter |
| 04/11/2001 | EP1090305A1 Device for testing solar home systems |
| 04/11/2001 | EP1090304A1 Method for monitoring electromechanical, pneumatic or hydraulic actuators, and implementing device |
| 04/11/2001 | EP1090303A1 Method and device for monitoring an electrode line of a bipolar high voltage direct current (hvdc) transmission system |
| 04/11/2001 | EP1090302A1 System measuring partial discharge using digital peak detection |
| 04/11/2001 | CN1291286A Method and device for testing printed circuit board |
| 04/11/2001 | CN1290862A Battery level indicator for telephone unit |
| 04/10/2001 | US6216254 Integrated circuit design using a frequency synthesizer that automatically ensures testability |
| 04/10/2001 | US6216252 Method and system for creating, validating, and scaling structural description of electronic device |
| 04/10/2001 | US6216243 Permanent failure monitoring in complex systems |
| 04/10/2001 | US6216099 Test system and methodology to improve stacked NAND gate based critical path performance and reliability |
| 04/10/2001 | US6215895 Apparatus and method for display panel inspection |
| 04/10/2001 | US6215767 Quality of service adjustment and traffic shaping on a multiple access network |
| 04/10/2001 | US6215723 Semiconductor memory device having sequentially disabling activated word lines |
| 04/10/2001 | US6215670 Method for manufacturing raised electrical contact pattern of controlled geometry |
| 04/10/2001 | US6215408 Vibro-acoustic signature treatment process in high-voltage electromechanical switching system |
| 04/10/2001 | US6215345 Semiconductor device for setting delay time |
| 04/10/2001 | US6215338 Monitoring of low currents through a low-side driver DMOS by modulating its internal resistance |
| 04/10/2001 | US6215324 Dynamic burn-in test equipment |
| 04/10/2001 | US6215323 Method and apparatus for temperature-controlled testing of integrated circuits |
| 04/10/2001 | US6215322 Conventionally sized temporary package for testing semiconductor dice |