| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 05/03/2001 | WO2001031718A2 Shunt resistance device for monitoring battery state of charge |
| 05/03/2001 | WO2001031356A1 High-speed failure capture apparatus and method for automatic test equipment |
| 05/03/2001 | WO2001031355A1 Chip identification reader |
| 05/03/2001 | WO2001031354A1 A method and system for predicting failures in a power resistive grid of a vehicle |
| 05/03/2001 | WO2001031353A1 Field test chamber arrangement |
| 05/03/2001 | WO2001031352A1 Measuring instrument with multiple signal terminals shared in multiple operation modes |
| 05/03/2001 | WO2001031285A2 Automatic measuring apparatus, automatic measurement data processing and control apparatus, network system, and record medium of automatic measurement processing and control program |
| 05/03/2001 | US20010000651 Contactless total charge measurement with corona |
| 05/03/2001 | US20010000650 Test system having alignment member for aligning semiconductor components |
| 05/03/2001 | US20010000649 Dynamically switched voltage screen |
| 05/03/2001 | US20010000648 Method of forming tester substrates |
| 05/03/2001 | US20010000647 Circuitry testing substrates |
| 05/03/2001 | US20010000646 Test system with mechanical alignment for semiconductor chip scale packages and dice |
| 05/03/2001 | DE10053207A1 Design validation method for integrated system chip circuit, involves validating entire design using simulation test banks of complete system chip and execution of application |
| 05/03/2001 | DE10053188A1 Sensor for detecting physical value, has diagnostic portion that measures current flowing in external wirings and processes measured current to detect resistance and fault of circuit system |
| 05/02/2001 | EP1096455A1 Non-isolated type voltage sensor |
| 05/02/2001 | EP1096264A1 Device for estimating the charge in a battery |
| 05/02/2001 | EP1095333A2 Fault detection in digital system |
| 05/02/2001 | EP1095287A1 Integrated circuit tester with amorphous logic |
| 05/02/2001 | EP1095286A1 Driver with transmission path loss compensation |
| 05/02/2001 | EP1095285A1 Method and device for determining the dependence of a first measured quantity on a second measured quantity |
| 05/02/2001 | EP0890109B1 Process for testing and ensuring the availability of a networked system |
| 05/02/2001 | CN2428777Y Detection probe automatic-assembling device |
| 05/02/2001 | CN1293824A Process for manufacturing semiconductor device |
| 05/02/2001 | CN1293817A Method of screening laminated ceramic capacitor |
| 05/02/2001 | CN1293371A Charge or discharge state indicator of battery for protable electronic products |
| 05/02/2001 | CN1293370A Battery voltage measuring device |
| 05/01/2001 | US6226779 Programmable IC with gate array core and boundary scan capability |
| 05/01/2001 | US6226765 Event based test system data memory compression |
| 05/01/2001 | US6226764 Integrated circuit memory devices including internal stress voltage generating circuits and methods for built-in self test (BIST) |
| 05/01/2001 | US6226753 Single chip integrated circuit with external bus interface |
| 05/01/2001 | US6226602 Electric circuit arrangement |
| 05/01/2001 | US6226574 Method for testing on-vehicle electronic unit |
| 05/01/2001 | US6226332 Multi-pair transceiver decoder system with low computation slicer |
| 05/01/2001 | US6226230 Timing signal generating apparatus and method |
| 05/01/2001 | US6226211 Merged memory-logic semiconductor device having a built-in self test circuit |
| 05/01/2001 | US6226200 In-circuit memory array bit cell threshold voltage distribution measurement |
| 05/01/2001 | US6226188 Modular integrated pneumatic connection device |
| 05/01/2001 | US6225818 Integrated circuits including function identification circuits having operating modes that identify corresponding functions of the integrated circuits |
| 05/01/2001 | US6225817 Loaded-board, guided-probe test fixture |
| 05/01/2001 | US6225815 Charged particle beam test system |
| 05/01/2001 | US6225813 Portable apparatus for in situ field stator bar insulation capacitance mapping |
| 05/01/2001 | US6225811 Wire degradation testing system |
| 05/01/2001 | US6225810 Loop resistance tester (LRT) for cable shield integrity |
| 05/01/2001 | US6225808 Test counter for electronic battery tester |
| 05/01/2001 | US6225798 Semiconductor device tester |
| 05/01/2001 | US6225785 Electrical safety test apparatus and test method for rechargeable lithium batteries |
| 05/01/2001 | US6225784 Battery control apparatus for battery carried by hybrid vehicle |
| 05/01/2001 | US6225779 Power supply monitoring integrated circuit device for individually monitoring voltages of cells |
| 05/01/2001 | US6225137 Semiconductor wafer evaluation method |
| 05/01/2001 | US6224121 Quick disconnect articulated chuck apparatus and method |
| 05/01/2001 | CA2225879C Clock skew management method and apparatus |
| 05/01/2001 | CA2119435C Self diagnostic ph sensor |
| 04/26/2001 | WO2001030048A2 Notification of low-battery in a wireless network |
| 04/26/2001 | WO2001029971A2 Built-in self test for integrated digital-to-analog converters |
| 04/26/2001 | WO2001029970A2 Test circuit for integrated analog-to-digital converters |
| 04/26/2001 | WO2001029571A1 Circuit and method for improved test and calibration in automated test equipment |
| 04/26/2001 | WO2001029569A1 Apparatus and method for programmable parametric toggle testing of digital cmos pads |
| 04/26/2001 | WO2001029568A1 Non-invasive electrical measurement of semiconductor wafers |
| 04/26/2001 | WO2001029567A1 Method and apparatus for testing media drivers |
| 04/26/2001 | WO2000077834A3 Modelling electrical characteristics of thin film transistors |
| 04/26/2001 | US20010000424 Crosstalk test unit and method of calibration |
| 04/26/2001 | EP1145281A3 Modelling electrical characteristics of thin film transistors |
| 04/26/2001 | DE19950424A1 Verfahren zur Bestimmung der Startfähigkeit einer Starterbatterie eines Kraftfahrzeugs A method for determining the starting ability of a starter battery of a motor vehicle |
| 04/26/2001 | CA2388498A1 Apparatus and method for programmable parametric toggle testing of digital cmos pads |
| 04/25/2001 | EP1094471A2 Method for electronic component testing |
| 04/25/2001 | EP1094327A1 Battery voltage measuring device |
| 04/25/2001 | EP1094326A2 Method for determining the starting ability of a starter-battery of a motor-vehicle |
| 04/25/2001 | EP1094325A2 Method and arrangement for determining the number of partial discharge sources |
| 04/25/2001 | EP1094324A2 Method and arrangement for defining location of partial discharge sources |
| 04/25/2001 | EP1094323A2 Method and system for identifying cause of partial discharge |
| 04/25/2001 | EP1094321A2 A test and measurement instrument having telecommunications mask testing capability with a mask zoom feature |
| 04/25/2001 | EP1094320A2 A test and measurement instrument having multi-channel telecommunications mask testing capability |
| 04/25/2001 | EP1093645A1 Bus-operational sensor device and corresponding test method |
| 04/25/2001 | EP1093619A1 System and method for identifying finite state machines and verifying circuit designs |
| 04/25/2001 | EP1093586A1 Integrated circuit with improved synchronism for an external clock signal at a data output |
| 04/25/2001 | CN2427885Y DC insulation supervisory relay |
| 04/25/2001 | CN2427815Y Apparatus for testing electric capacit in batter |
| 04/25/2001 | CN2427812Y Three phase measuring loop monitoring instrument |
| 04/25/2001 | CN1292491A Fluid-filled electric equipment intelligent analytical system and method |
| 04/24/2001 | US6223333 Pattern matching method, timing analysis method and timing analysis device |
| 04/24/2001 | US6223318 IC tester having region in which various test conditions are stored |
| 04/24/2001 | US6223316 Vector restoration using accelerated validation and refinement |
| 04/24/2001 | US6223315 IP core design supporting user-added scan register option |
| 04/24/2001 | US6223314 Method of dynamic on-chip digital integrated circuit testing |
| 04/24/2001 | US6223313 Method and apparatus for controlling and observing data in a logic block-based asic |
| 04/24/2001 | US6223312 Test-facilitating circuit for information processing devices |
| 04/24/2001 | US6223272 Test vector verification system |
| 04/24/2001 | US6223148 Logic analysis system for logic emulation systems |
| 04/24/2001 | US6223098 Control system for semiconductor integrated circuit test process |
| 04/24/2001 | US6223097 Semiconductor integrated circuit device, method of estimating failure ratio of such devices on the market, and method of manufacturing the devices |
| 04/24/2001 | US6222379 Conventionally sized temporary package for testing semiconductor dice |
| 04/24/2001 | US6222378 Probe adapter for a ball-grid-array package |
| 04/24/2001 | US6222374 Wiring harness diagnostic system |
| 04/24/2001 | US6222370 Universal battery monitor |
| 04/24/2001 | US6222369 Method and apparatus for determining battery properties from complex impedance/admittance |
| 04/24/2001 | US6222358 Automatic circuit locator |
| 04/24/2001 | US6222348 Battery system featuring transmission of battery data from a battery pack |
| 04/24/2001 | US6221682 Method and apparatus for evaluating a known good die using both wire bond and flip-chip interconnects |
| 04/24/2001 | US6220084 Detecting fields with a single-pass, dual-amplitude-mode scanning force microscope |