| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 05/16/2001 | CN1295255A Image signal processing device and picture element flaw detecting method |
| 05/16/2001 | CN1295254A Single-phase earthing-fault display method and instrument for power supply line |
| 05/16/2001 | CN1295252A Electrical characteristics determining device |
| 05/15/2001 | US6233720 Logic circuit analysis system for deleting pseudo error |
| 05/15/2001 | US6233706 Method and apparatus for limited access circuit test |
| 05/15/2001 | US6233705 Test method for data storage characteristics of memory |
| 05/15/2001 | US6233702 Self-checked, lock step processor pairs |
| 05/15/2001 | US6233701 Method and apparatus for test program execution control, and a computer-readable recording medium with a program for making a computer execute the method recorded therein |
| 05/15/2001 | US6233533 Turning center with integrated non-contact inspection system |
| 05/15/2001 | US6233528 Method and device for signal testing |
| 05/15/2001 | US6233509 Electronic diagnostic system |
| 05/15/2001 | US6233431 Radio page receiver with automatic cyclical turn on |
| 05/15/2001 | US6233312 Inter-circuit line fault location in telecommunication networks |
| 05/15/2001 | US6233274 Non-invasive digital cable test system |
| 05/15/2001 | US6233205 Built-in self test method for measuring clock to out delays |
| 05/15/2001 | US6233184 Structures for wafer level test and burn-in |
| 05/15/2001 | US6232846 Oscillator module and communications device using the same |
| 05/15/2001 | US6232845 Circuit for measuring signal delays in synchronous memory elements |
| 05/15/2001 | US6232834 Calibrated compensation for an operational amplifier |
| 05/15/2001 | US6232819 Semiconductor integrated circuit device and low-amplitude signal receiving method |
| 05/15/2001 | US6232815 ATE pin electronics with complementary waveform drivers |
| 05/15/2001 | US6232791 Testing Board |
| 05/15/2001 | US6232789 Probe holder for low current measurements |
| 05/15/2001 | US6232788 Wafer probe station for low-current measurements |
| 05/15/2001 | US6232787 Microstructure defect detection |
| 05/15/2001 | US6232785 Portable microphone/speaker for audio signal line testing |
| 05/15/2001 | US6232784 Circuit continuity tester and method |
| 05/15/2001 | US6232782 On cell circumferential battery indicator |
| 05/15/2001 | US6232781 False-closure detection device for electrical consumers |
| 05/15/2001 | US6232766 Test station for sequential testing |
| 05/15/2001 | US6232765 Electro-optical oscilloscope with improved sampling |
| 05/15/2001 | US6232764 Accessory with internal adjustments controlled by host |
| 05/15/2001 | US6232759 Linear ramping digital-to-analog converter for integrated circuit tester |
| 05/15/2001 | US6232747 Remaining-amount-of-battery detecting device |
| 05/15/2001 | US6232746 Battery charging apparatus and full-charging detecting method |
| 05/15/2001 | US6232744 Method of controlling battery condition of self-generation electric vehicle |
| 05/15/2001 | US6232743 Electric vehicle |
| 05/15/2001 | US6232734 Power module |
| 05/15/2001 | US6232669 Contact structure having silicon finger contactors and total stack-up structure using same |
| 05/15/2001 | US6230569 Use of a stream of compressed gas to detect semiconductor interconnect problems |
| 05/10/2001 | WO2001033241A1 System for testing ic chips selectively with stored or internally generated bit streams |
| 05/10/2001 | WO2001033240A2 High resolution skew detection apparatus and method |
| 05/10/2001 | WO2001033239A1 Method and apparatus for on-chip monitoring of integrated circuits with a distributed system |
| 05/10/2001 | WO2001033238A1 A scan test point observation system and method |
| 05/10/2001 | WO2001033237A1 Method and apparatus for testing circuits with multiple clocks |
| 05/10/2001 | WO2001033236A1 Multi-stage algorithmic pattern generator for testing ic chips |
| 05/10/2001 | WO2001033235A1 Algorithmic test pattern generator for testing ic chips |
| 05/10/2001 | US20010001157 Method and apparatus for testing a cache |
| 05/10/2001 | US20010000948 System, IC chip, on-chip test structure, and corresponding method for modeling one or more target interconnect capacitances |
| 05/10/2001 | US20010000947 Test socket |
| 05/10/2001 | DE19953726A1 Test equipment for integrated circuits can move test device into contact with the circuit card, traverse it two horizontal directions and rotate it |
| 05/10/2001 | DE19952899A1 Zerstörungsfreie Prüfung von passiven Bauelementen Non-destructive testing of passive components |
| 05/10/2001 | DE10022697A1 Dynamic random access memory outputs test-mode-entry signal in response to address key, if write-enable and column-address-trigger signals are output before activation of row address trigger signal |
| 05/09/2001 | EP1098458A2 An apparatus and a method for locating a fault of a transmission line |
| 05/09/2001 | EP1098363A2 Testing integrated circuits |
| 05/09/2001 | EP1098201A2 Testing passive components |
| 05/09/2001 | EP1098200A2 Adjusting device for the planarization of probe sets of a probe card |
| 05/09/2001 | EP1097617A1 Interconnect assembly for printed circuit boards and method of fabrication |
| 05/09/2001 | EP1097460A2 Integrated circuit comprising a self-test device for executing a self-test of the integrated circuit |
| 05/09/2001 | EP1097388A1 Method of and apparatus for estimating the charge in a battery |
| 05/09/2001 | EP1097387A2 Device without set-up kit for the targeted moving of electronic components |
| 05/09/2001 | EP1004027A4 Magnetic current sensing and short circuit detection in plate structure |
| 05/09/2001 | CN1294769A Electrical protection systems |
| 05/09/2001 | CN1294683A Voltage indicator for indicating that voltage of battery passes given value |
| 05/09/2001 | CN1294420A Battery state displaying device of electric vehicle |
| 05/09/2001 | CN1294304A Method for testing SRAM |
| 05/09/2001 | CN1065682C Checker usign measuring device, arm device and cylindrical surface peripheral movement |
| 05/09/2001 | CN1065661C package for mounting semiconductor package |
| 05/08/2001 | US6230301 Method and system for creating a netlist allowing current measurement through a subcircuit |
| 05/08/2001 | US6230293 Method for quality and reliability assurance testing of integrated circuits using differential Iddq screening in lieu of burn-in |
| 05/08/2001 | US6230115 Simulator, simulation method, and medium having simulation program recorded, taking account of timing in electronic component and signal transmission through transmission line on printed-circuit board |
| 05/08/2001 | US6230109 Multiconductor continuity and intermittent fault analyzer with distributed processing and dynamic stimulation |
| 05/08/2001 | US6230106 Method of characterizing a device under test |
| 05/08/2001 | US6230105 Transfer impedance measurement instrument system |
| 05/08/2001 | US6230067 In-line programming system and method |
| 05/08/2001 | US6229751 Electronic devices and low-voltage detection method |
| 05/08/2001 | US6229728 Ferroelectric memory and method of testing the same |
| 05/08/2001 | US6229725 Full bridge converter current sense approach using virtual current summing and cancellation |
| 05/08/2001 | US6229385 Control feature for IC without using a dedicated pin |
| 05/08/2001 | US6229367 Method and apparatus for generating a time delayed signal with a minimum data dependency error using an oscillator |
| 05/08/2001 | US6229343 Integrated circuit with two operating states |
| 05/08/2001 | US6229331 Apparatus for and method of inspecting patterns on semiconductor integrated devices |
| 05/08/2001 | US6229329 Method of testing electrical characteristics of multiple semiconductor integrated circuits simultaneously |
| 05/08/2001 | US6229328 Integrated circuit with a test function implemented by circuitry which identifies the presence of a control signal |
| 05/08/2001 | US6229327 Broadband impedance matching probe |
| 05/08/2001 | US6229326 Method and apparatus for testing electronic device in burn-in process |
| 05/08/2001 | US6229325 Method and apparatus for burn-in and test of field emission displays |
| 05/08/2001 | US6229324 Test system with mechanical alignment for semiconductor chip scale packages and dice |
| 05/08/2001 | US6229323 Automated multi-chip module handler, method of module handling, and module magazine |
| 05/08/2001 | US6229321 Process for manufacturing high frequency multichip module enabling independent test of bare chip |
| 05/08/2001 | US6229320 IC socket, a test method using the same and an IC socket mounting mechanism |
| 05/08/2001 | US6229319 Chip carrier to allow electron beam probing and fib modifications |
| 05/08/2001 | US6229296 Circuit and method for measuring and forcing an internal voltage of an integrated circuit |
| 05/08/2001 | US6229281 Packed battery examining apparatus |
| 05/08/2001 | US6229280 Power tool charging system having a charge level indicator and charge control functions |
| 05/08/2001 | US6229206 Bonding pad test configuration |
| 05/08/2001 | US6227701 Apparatus for thermally testing an electronic device |
| 05/08/2001 | US6227373 Electronic device handling system and method |
| 05/08/2001 | CA2081601C Smart battery |
| 05/03/2001 | WO2001031770A1 A method and system for detecting incipient failures in a power inverter |