| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 05/29/2001 | US6239388 Device for reducing the time for measuring on a cable |
| 05/29/2001 | US6238060 Machine-vision ring-reflector illumination system and method |
| 05/29/2001 | US6237783 Apparatus for storing customer trays |
| 05/29/2001 | US6237422 Apparatus and method for testing strength of electrical bond sites on semiconductor devices |
| 05/29/2001 | US6237401 Modulator mis-wire test |
| 05/29/2001 | US6237400 Vehicle diagnosing apparatus |
| 05/29/2001 | CA2210232C Multilayer moisture barrier for electrochemical cell tester |
| 05/29/2001 | CA2200850C Electrochemical cell label with integrated tester |
| 05/25/2001 | WO2001037233A1 Programmable connector |
| 05/25/2001 | WO2001037150A1 System and method for product yield prediction using device and process neighborhood characterization vehicle |
| 05/25/2001 | WO2001037091A2 Method of discriminating between different types of scan failures, a computer implemented circuit simulation and fault detection system |
| 05/25/2001 | WO2001036991A1 Device for testing cables that are provided with plug connectors |
| 05/25/2001 | WO2001036990A2 Wafer level interposer |
| 05/25/2001 | WO2001036987A1 Probe device, method of manufacture thereof, method of testing substrate using probe device |
| 05/25/2001 | WO2001036986A1 Probe card |
| 05/25/2001 | WO2001036985A1 Measuring station for integrated circuits on wafers or other electronic components and kits for assembly of said measuring stations |
| 05/25/2001 | WO2001035718A2 System and method for product yield prediction |
| 05/25/2001 | WO2000075746A3 System and method for measuring temporal coverage detection |
| 05/25/2001 | WO2000030417A3 Method and apparatus for aligning device interconnections |
| 05/25/2001 | CA2356318A1 Device for testing cables that are provided with plug connectors |
| 05/24/2001 | US20010001542 Test carrier with decoupling capacitors for testing semiconductor components |
| 05/24/2001 | US20010001541 Structure and method for probing wiring bond pads |
| 05/24/2001 | US20010001538 Wafer probe station having environment control enclosure |
| 05/24/2001 | US20010001536 Ultra-high-frequency current probe in surface-mount form factor |
| 05/24/2001 | US20010001532 Computer program product for estimating the service life of a battery |
| 05/24/2001 | US20010001508 Enhanced pad design for substrate |
| 05/24/2001 | US20010001371 Mini-tension tester |
| 05/23/2001 | EP1102071A1 Holder of electroconductive contactor, and method for producing the same |
| 05/23/2001 | EP1101287A1 Low charge injection mosfet switch |
| 05/23/2001 | EP1101158A2 Algorithmic pattern generator |
| 05/23/2001 | EP1101121A1 Polarization-sensitive near-field microwave microscope |
| 05/23/2001 | EP1101120A1 Voltage monitor circuit with adjustable hysteresis using a single comparator |
| 05/23/2001 | EP0786780B1 Data output control circuit of semiconductor memory device having pipeline structure |
| 05/23/2001 | DE19960761C1 Battery residual charge monitoring method uses difference between minimum current and current at intersection point between current/voltage curve and minimum voltage threshold of battery |
| 05/23/2001 | DE19954346A1 Memory device arrangement for 16-bit data storage |
| 05/23/2001 | DE19952693A1 Measurement, determination and display of condition of an automotive starter battery using one or more sensor for measuring charge, temperature, voltage, etc. to provided detailed information about current and future state, etc. |
| 05/23/2001 | DE19936858C1 Aktoranordnung, insbesondere zur Ansteuerung eines Einspritzventils einer Brennkraftmaschine Actuator assembly, in particular for actuating an injection valve of an internal combustion engine |
| 05/23/2001 | DE10053534A1 Vibrating gyroscope automatic diagnostic circuit for detecting faults due to a short circuit, using a differential operational amplifier circuit |
| 05/23/2001 | DE10050077A1 Contact structure for establishing electrical connection with contact target, has contact substrate with traces on surface connected to silicon bases of contactors to establish signal paths for external components |
| 05/23/2001 | DE10022698A1 Halbleiterspeichereinrichtung A semiconductor memory device |
| 05/23/2001 | CN2431569Y Wireless page type multifunctional watt-hour meter |
| 05/23/2001 | CN1296568A Power contact for testing power source |
| 05/23/2001 | CN1296300A Automatic testing sorting machine for alkali-manageness cell |
| 05/23/2001 | CN1296287A Device for checking semiconductor device |
| 05/23/2001 | CN1296187A Accident point positioning system |
| 05/22/2001 | US6237124 Methods for errors checking the configuration SRAM and user assignable SRAM data in a field programmable gate array |
| 05/22/2001 | US6237123 Built-in self-test controlled by a token network and method |
| 05/22/2001 | US6237122 Semiconductor memory device having scan flip-flops |
| 05/22/2001 | US6237121 Method and apparatus for performing register transfer level scan selection |
| 05/22/2001 | US6237119 Method and system for making internal states of an integrated circuit visible during normal operation without the use of dedicated I/O pins |
| 05/22/2001 | US6237118 Method and apparatus for correcting for detector inaccuracies in limited access testing |
| 05/22/2001 | US6237117 Method for testing circuit design using exhaustive test vector sequence |
| 05/22/2001 | US6237054 Network interface unit including a microcontroller having multiple configurable logic blocks, with a test/program bus for performing a plurality of selected functions |
| 05/22/2001 | US6236952 System and method for automatically creating and transmitting test conditions of integrated circuit devices |
| 05/22/2001 | US6236947 Method of monitoring placement of voltage/current probes on motors |
| 05/22/2001 | US6236547 Zener zapping device and zener zapping method |
| 05/22/2001 | US6236371 System and method for testing antenna frequency response |
| 05/22/2001 | US6236325 Position detector with irregularity detectable function and cable for use in the same |
| 05/22/2001 | US6236227 Method and apparatus for turn fault detection in multi-phase AC motors |
| 05/22/2001 | US6236226 Test method and system for uninterruptible power supply |
| 05/22/2001 | US6236225 Method of testing the gate oxide in integrated DMOS power transistors and integrated device comprising a DMOS power transistor |
| 05/22/2001 | US6236224 Method of operating an integrated circuit |
| 05/22/2001 | US6236223 Method and apparatus for wireless radio frequency testing of RFID integrated circuits |
| 05/22/2001 | US6236222 Method and apparatus for detecting misalignments in interconnect structures |
| 05/22/2001 | US6236220 Method for the testing of an inductive resonant circuit |
| 05/22/2001 | US6236219 Programmable voltage divider and method for testing the impedance of a programmable element |
| 05/22/2001 | US6236218 Method and a device for space-charge measurement in cables using a pulsed electroacoustic method |
| 05/22/2001 | US6236217 Cable fault monitoring system |
| 05/22/2001 | US6236216 Temperature/voltage detecting unit and battery element unit |
| 05/22/2001 | US6236215 Cell voltage detection circuit, and method of detecting cell voltage |
| 05/22/2001 | US6236214 Method and apparatus for determining the remaining operation time of a mobile communication unit |
| 05/22/2001 | US6236213 Method and apparatus for inspecting spark plug while spark plug is installed in engine |
| 05/22/2001 | US6236196 Thermal modulation system and method for locating a circuit defect such as a short or incipient open independent of a circuit geometry |
| 05/22/2001 | US6236189 Method for determining a charge status of a battery |
| 05/22/2001 | US6234321 Automatic semiconductor part handler |
| 05/17/2001 | WO2001035606A1 Non-contact signal analyzer |
| 05/17/2001 | WO2001035365A1 Time constrained sensor data retrieval system and method |
| 05/17/2001 | WO2001035111A1 METHOD AND APPARATUS FOR ANALYZING AN AgZn BATTERY |
| 05/17/2001 | WO2001035110A1 Method and system for wafer and device-level testing of an integrated circuit |
| 05/17/2001 | WO2001035051A2 X-ray tomography bga (ball grid array) inspections |
| 05/17/2001 | US20010001326 Intelligent binning for electrically repairable semiconductor chips |
| 05/17/2001 | US20010001291 Burn-in apparatus for burning-in microwave transistors |
| 05/17/2001 | DE19948384A1 Anordnung zum Bestimmen der komplexen Übertragungsfunktion eines Messgerätes Arrangement for determining the complex transfer function of a measuring instrument |
| 05/17/2001 | DE10056160A1 Automatic semiconductor device test system has pin unit bus to transmit data between main computer and pin units which are configured according to input or output pins of test item when group selection address is provided by computer |
| 05/17/2001 | DE10055456A1 Semiconductor test system for integrated circuit, has main computer which is connected with test device modules through test device bus for regulating entire operation |
| 05/17/2001 | CA2390068A1 Inspection method utilizing vertical slice imaging |
| 05/16/2001 | EP1100205A2 Error code wire fault detection |
| 05/16/2001 | EP1100171A2 Device and method for determining state of charge |
| 05/16/2001 | EP1100170A2 Battery charging device |
| 05/16/2001 | EP1099953A2 Semiconductor device with testing capability |
| 05/16/2001 | EP1099952A1 Circuit cell with built-in self test function and method to test it |
| 05/16/2001 | EP1099951A2 Failure point locating system |
| 05/16/2001 | EP1099119A1 Signalling system |
| 05/16/2001 | EP1055130A4 Electrical parameter monitoring system |
| 05/16/2001 | EP0840897B1 Functional test process for a mechanical switching element |
| 05/16/2001 | EP0818079B1 Timing generator for automatic test equipment operating at high data rates |
| 05/16/2001 | CN2430786Y Testing clamp for lithium polymer battery |
| 05/16/2001 | CN2430697Y Detector for DC power insulation shunt circuit |
| 05/16/2001 | CN2430696Y Tester for sobering and pressure reducing instrument |
| 05/16/2001 | CN2430695Y Fault indication device for motor circuit |