| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 06/07/2001 | WO2001040809A1 Method and device for testing circuit boards |
| 06/07/2001 | WO2001040770A2 Adaptive tolerance reference inspection system |
| 06/07/2001 | WO2000034796A8 Scanning single electron transistor microscope for imaging ambient temperature objects |
| 06/07/2001 | US20010003209 Efficient generation of optimum test data |
| 06/07/2001 | US20010003196 Semiconductor integrated circuit having self-diagnosis test function and test method thereof |
| 06/07/2001 | US20010003098 Numerical total high/low lottery game |
| 06/07/2001 | US20010003051 Having logic circuit connected to external terminals, built-in memory connected to logic circuit, and burn-in test circuit for, when performing burn-in test, writing predetermined data into said built-in memory |
| 06/07/2001 | US20010002923 Multi-pair tranceiver decoder system with low computation slicer |
| 06/07/2001 | US20010002795 Test chip for molding material including filler and method for evaluating the molding material |
| 06/07/2001 | US20010002792 Electronic battery tester |
| 06/07/2001 | US20010002790 A method and integrated circuit arranged for feeding a test forcing pattern on a single shared pin of the circuit |
| 06/07/2001 | US20010002624 Tip structures. |
| 06/07/2001 | US20010002594 Use of a substrate having an upper side which generates an adhesive force for removing bond pad material deposits from the ends of contacting needles without damaging the bond pads and without effecting the electrical properites of needles |
| 06/07/2001 | DE19958529A1 Method to determine motor current through motor; involves defining parameter comparison with motor current as function of parameters motor characteristic data, such as rpm and operation voltage |
| 06/07/2001 | DE19950838A1 Verfahren und Vorrichtung zur Fehleranalyse digitaler Logikschaltungen Method and apparatus for fault analysis of digital logic circuits |
| 06/07/2001 | DE10058030A1 Integrated circuit e.g. read only memory, has several non-volatile memory locations to store certain data set and has logic to calculate test code |
| 06/07/2001 | DE10052721A1 Integrated circuit has switching circuit to switch between control signal from controller, and test data from test controller for input into data path unit |
| 06/07/2001 | DE10046952A1 Elektrooptik-Messfühler Electro-optic probe |
| 06/07/2001 | DE10030145A1 Semiconductor wafer testing method involves irradiating charged particle on small region of wafer containing maximum opening defect, based on position data |
| 06/07/2001 | DE10024801A1 Verbindererfassungssystem und -verfahren A connector detection system and method |
| 06/06/2001 | EP1104579A1 Memory supervision |
| 06/06/2001 | EP1104550A1 Projected display for portable sensor indicating the location of a detected hidden object |
| 06/06/2001 | CN2433635Y Testing instrument for fault of conducting wire |
| 06/06/2001 | CN2433634Y Alarm for short-circuit of tower high tension transmission line |
| 06/06/2001 | CN2433633Y Tester for line of conducting wire |
| 06/06/2001 | CN1298106A Apparatus for measuring battery charging state |
| 06/06/2001 | CN1066844C An auxiliary unit for indicating the state of circuit breaker |
| 06/05/2001 | US6243853 Development of automated digital libraries for in-circuit testing of printed curcuit boards |
| 06/05/2001 | US6243843 Post-mission test method for checking the integrity of a boundary scan test |
| 06/05/2001 | US6243841 Automated test and evaluation sampling system and method |
| 06/05/2001 | US6243801 System with wait state registers |
| 06/05/2001 | US6243665 Monitoring and control apparatus incorporating run-time fault detection by boundary scan logic testing |
| 06/05/2001 | US6243655 Circuit trace probe and method |
| 06/05/2001 | US6243308 Method for testing dynamic random access memory under wafer-level-burn-in |
| 06/05/2001 | US6243307 Semiconductor device including tester circuit suppressible of circuit scale increase and testing device of semiconductor device |
| 06/05/2001 | US6243304 Sample and load scheme for observability internal nodes in a PLD |
| 06/05/2001 | US6243016 System and a method for monitoring and warning regarding the presence of manually and temporarily fitted ground connectors on high voltage conductors, as well as a warning device and a conductor means included in the system |
| 06/05/2001 | US6242993 Apparatus for use in arcing fault detection systems |
| 06/05/2001 | US6242966 Leakage current correcting circuit |
| 06/05/2001 | US6242937 Hot carrier measuring circuit |
| 06/05/2001 | US6242936 Circuit for driving conductive line and testing conductive line for current leakage |
| 06/05/2001 | US6242934 Background leakage zeroing by temperature and voltage dependence for IDDQ measurement and defect resolution |
| 06/05/2001 | US6242925 EMI susceptibility testing apparatus and method |
| 06/05/2001 | US6242923 Method for detecting power plane-to-power plane shorts and I/O net-to power plane shorts in modules and printed circuit boards |
| 06/05/2001 | US6242921 Alternator testing apparatus and method |
| 06/05/2001 | US6242920 Apparatus for use in a DMM for measuring the battery voltage of the DMM |
| 06/05/2001 | US6242900 System for measuring partial discharge using digital peak detection |
| 06/05/2001 | US6242891 Battery charge indicator |
| 06/05/2001 | US6242803 Semiconductor devices with integral contact structures |
| 06/05/2001 | US6242756 Cross optical axis inspection system for integrated circuits |
| 06/05/2001 | US6242269 Parallel scan distributors and collectors and process of testing integrated circuits |
| 06/05/2001 | US6241907 Method and system for providing a package for decapsulating a chip-scale package |
| 06/05/2001 | US6240637 Connecting plate for battery holder and method of producing the same |
| 05/31/2001 | WO2001039254A2 Continuous application and decompression of test patterns to a circuit-under-test |
| 05/31/2001 | WO2001038981A1 Test pattern compression for an integrated circuit test environment |
| 05/31/2001 | WO2001038892A1 Electrical test of the interconnection of conductors on a substrate |
| 05/31/2001 | WO2001038891A1 Phase shifter with reduced linear dependency |
| 05/31/2001 | WO2001038890A1 Decompressor/prpg for applying pseudo-random and deterministic test patterns |
| 05/31/2001 | WO2001038889A1 Method and apparatus for selectively compacting test responses |
| 05/31/2001 | WO2001038883A1 Chip selector, and method of storing and delivering chip tube |
| 05/31/2001 | US20010002345 Socket for electrical parts |
| 05/31/2001 | US20010002111 Current limiting apparatus |
| 05/31/2001 | US20010002107 Wiring harness diagnostic system |
| 05/31/2001 | US20010002106 Method of manufacturing and testing an electronic device, and an electronic device |
| 05/31/2001 | US20010002103 Static event detection/protection device |
| 05/31/2001 | DE10059016A1 Method for testing for holes in semiconductor component using charged particle beam |
| 05/30/2001 | EP1104145A1 Mobile communication unit with bone conduction speaker |
| 05/30/2001 | EP1104092A2 Operational amplifier with digital offset calibration |
| 05/30/2001 | EP1103818A2 A PDA coupler containing a flexible joint |
| 05/30/2001 | EP1103817A2 Circuit arrangement for measuring the current through at least two inductive components |
| 05/30/2001 | EP1103815A2 Method and system for performance testing of rotating machines |
| 05/30/2001 | EP1103134A1 Method of and system for actuating faults |
| 05/30/2001 | EP1102999A1 Method and apparatus using an infrared laser probe for measuring voltages directly in an integrated circuit |
| 05/30/2001 | EP1102998A1 Closely-coupled multiple-winding magnetic induction-type sensor |
| 05/30/2001 | CN1297590A Rechargeable battery with protective circuit |
| 05/30/2001 | CN1297254A Cooling system for IC module processing device |
| 05/30/2001 | CN1297231A Distributed measurement of memory array bit unit threshold voltage in line |
| 05/30/2001 | CN1297154A Active sensor for detecting electric leakage |
| 05/30/2001 | CN1066582C Electric power apparatus |
| 05/29/2001 | US6240543 Integration of manufacturing test of multiple system on a chip without substantial simulation |
| 05/29/2001 | US6240537 Signature compression circuit and method |
| 05/29/2001 | US6240535 Device and method for testing integrated circuit dice in an integrated circuit module |
| 05/29/2001 | US6240505 System with wait state registers |
| 05/29/2001 | US6240504 Process of operating a microprocessor to change wait states |
| 05/29/2001 | US6240340 Control unit for vehicle and total control system therefor |
| 05/29/2001 | US6240329 Method and apparatus for a semiconductor wafer inspection system using a knowledge-based system |
| 05/29/2001 | US6240030 Integrated circuit devices having mode selection circuits that generate a mode signal based on the magnitude of a mode control signal when a power supply signal transitions from a first state to a second state |
| 05/29/2001 | US6239723 Encapsulated installation |
| 05/29/2001 | US6239611 Circuit and method for testing whether a programmable logic device complies with a zero-hold-time requirement |
| 05/29/2001 | US6239609 Reduced voltage quiescent current test methodology for integrated circuits |
| 05/29/2001 | US6239608 Method for analyzing schottky junction method for evaluating semiconductor wafer method for evaluating insulating film and schottky junction analyzing apparatus |
| 05/29/2001 | US6239607 Simulation-based method for estimating leakage currents in defect-free integrated circuits |
| 05/29/2001 | US6239606 Method to perform IDDQ testing in the presence of high background leakage current |
| 05/29/2001 | US6239605 Method to perform IDDQ testing in the presence of high background leakage current |
| 05/29/2001 | US6239604 Method for inspecting an integrated circuit by measuring a voltage drop in a supply line of sub-circuit thereof |
| 05/29/2001 | US6239603 Monitor TEG test circuit |
| 05/29/2001 | US6239602 Temperature managing apparatus for multi-stage container |
| 05/29/2001 | US6239586 System for digital measurement of breakdown voltage of high voltage samples |
| 05/29/2001 | US6239579 Device for managing battery packs by selectively monitoring and assessing the operative capacity of the battery modules in the pack |
| 05/29/2001 | US6239396 Semiconductor device handling and sorting apparatus for a semiconductor burn-in test process |