| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 06/20/2001 | EP0920727A4 Electric motor monitor |
| 06/20/2001 | CN1299975A Voltage detection apparatus, cell residual voltage detection apparatus, voltage detection method and cell residual voltage detection method |
| 06/20/2001 | CN1299974A Comprehensive aging and screening equipment for electronic components and devices |
| 06/19/2001 | US6249898 Method and system for reliability analysis of CMOS VLSI circuits based on stage partitioning and node activities |
| 06/19/2001 | US6249893 Method and structure for testing embedded cores based system-on-a-chip |
| 06/19/2001 | US6249891 High speed test pattern evaluation apparatus |
| 06/19/2001 | US6249889 Method and structure for testing embedded memories |
| 06/19/2001 | US6249860 System with wait state registers |
| 06/19/2001 | US6249859 IC with wait state registers |
| 06/19/2001 | US6249621 Optical fiber interface for integrated circuit test system |
| 06/19/2001 | US6249598 Solder testing apparatus |
| 06/19/2001 | US6249544 System and method for high-speed decoding and ISI compensation in a multi-pair transceiver system |
| 06/19/2001 | US6249533 Pattern generator |
| 06/19/2001 | US6249342 Method and apparatus for handling and testing wafers |
| 06/19/2001 | US6249173 Temperature stabilizing circuit |
| 06/19/2001 | US6249139 Lifetime measurement of an ultra-thin dielectric layer |
| 06/19/2001 | US6249138 Method for testing leakage current caused self-aligned silicide |
| 06/19/2001 | US6249137 Circuit and method for pulsed reliability testing |
| 06/19/2001 | US6249136 Bottom side C4 bumps for integrated circuits |
| 06/19/2001 | US6249135 Method and apparatus for passive optical characterization of semiconductor substrates subjected to high energy (MEV) ion implantation using high-injection surface photovoltage |
| 06/19/2001 | US6249134 Semiconductor integrated circuit device and testing method thereof |
| 06/19/2001 | US6249133 Low-current probe card |
| 06/19/2001 | US6249132 Inspection methods and apparatuses |
| 06/19/2001 | US6249127 Method and circuit for checking lead defects in a two-wire bus system |
| 06/19/2001 | US6249126 Capacity detecting circuit for a battery |
| 06/19/2001 | US6249125 Test system for detecting defective batteries |
| 06/19/2001 | US6249124 Electronic battery tester with internal battery |
| 06/19/2001 | US6249114 Electronic component continuity inspection method and apparatus |
| 06/19/2001 | US6248967 IC testing apparatus |
| 06/19/2001 | US6248601 Fix the glassivation layer's micro crack point precisely by using electroplating method |
| 06/19/2001 | US6247548 Moving apparatus with drive power assisting device and movement controlling method |
| 06/19/2001 | CA2199222C Inspection apparatus for inspecting performance of structure by inserting measuring element through gap formed therein |
| 06/14/2001 | WO2001042939A1 Measurement module and system for monitoring the status of armored vehicle electronic components |
| 06/14/2001 | WO2001042804A1 Device for controlling a storage battery condition |
| 06/14/2001 | WO2001042803A2 Bit fail map compression with fail signature analysis |
| 06/14/2001 | WO2001042802A1 Method for diagnosing degradation in aircraft wiring |
| 06/14/2001 | WO2001042800A1 Method and product palette for testing electronic products |
| 06/14/2001 | WO2001042799A1 Method for identifying the condition of an energy accumulator |
| 06/14/2001 | US20010003427 Method for diagnosing bridging faults in integrated circuits |
| 06/14/2001 | CA2393577A1 Measurement module and system for monitoring the status of armored vehicle electronic components |
| 06/13/2001 | EP1107370A2 Electrical socket apparatus |
| 06/13/2001 | EP1107013A2 A method and an apparatus for testing supply connections |
| 06/13/2001 | EP1107011A1 Method and device for measuring the temperature of high frequency components |
| 06/13/2001 | EP1105876A1 Method and apparatus for built-in self test of integrated circuits |
| 06/13/2001 | EP1105742A1 Method for measuring two-dimensional potential distribution in cmos semiconductor components |
| 06/13/2001 | EP1105741A1 Method and device for measuring an electrical equipment discharge |
| 06/13/2001 | EP1105716A1 Inspection of printed circuit boards using color |
| 06/13/2001 | DE19959140A1 Error diagnosis system for vehicles, has CPU that reads out test step data corresponding to input of certain error function from memory, and outputs to monitor and printer |
| 06/13/2001 | DE19959019A1 Verfahren zur Zustandserkennung eines Energiespeichers Method for detecting an energy storage device |
| 06/13/2001 | DE19958938A1 Monitoring method for current of electrical conductor involves triggering admission of LED depending on comparison result of digitized measurement values and digitized display thresholds |
| 06/13/2001 | DE19952943A1 Nadelkarten-Justageeinrichtung zur Planarisierung von Nadelsätzen einer Nadelkarte Probe card adjusting device for planarization of needle sets a probe card |
| 06/13/2001 | DE19950810C1 Vorrichtung zur Fehleremulation in digitalen Logikschaltungen Device emulation for error in digital logic circuits |
| 06/13/2001 | DE10052926A1 Self-testing integrated circuit has switch which selectively provides either output signal of test access port or output signal of command decoder to shift register |
| 06/13/2001 | DE10051984A1 Cell voltage measurement apparatus for secondary battery used in hybrid vehicles, drives switches connected in between battery module and capacitor and in between capacitor and voltage acquisition unit alternatively |
| 06/13/2001 | DE10048895A1 Testing method for electronic components that outputs a source-synchronized signal using an automatic test device by introduction of a time delay into the output signal and output clock signal to allow time balancing of path length errors |
| 06/13/2001 | CN2434785Y Precision light spot analyzer |
| 06/13/2001 | CN1299465A Device for inspecting printed board |
| 06/13/2001 | CN1299137A Integrated circuit testing device |
| 06/13/2001 | CN1299060A Device for testing electric passing through for electric wire connector |
| 06/13/2001 | CN1299059A Device for testing passing through electric wire connector |
| 06/13/2001 | CN1067190C 故障诊断电路 Troubleshooting Circuit |
| 06/13/2001 | CN1067176C Device for detecting deviation of pin of integrated circuit, and its data processing method |
| 06/12/2001 | US6247165 System and process of extracting gate-level descriptions from simulation tables for formal verification |
| 06/12/2001 | US6247155 Tool to reconfigure pin connections between a DUT and a tester |
| 06/12/2001 | US6247154 Method and apparatus for combined stuck-at fault and partial-scanned delay-fault built-in self test |
| 06/12/2001 | US6247153 Method and apparatus for testing semiconductor memory device having a plurality of memory banks |
| 06/12/2001 | US6247147 Enhanced embedded logic analyzer |
| 06/12/2001 | US6247111 System with wait state register |
| 06/12/2001 | US6246971 Testing asynchronous circuits |
| 06/12/2001 | US6246627 Semiconductor device capable of cutting off a leakage current in a defective array section and method thereof |
| 06/12/2001 | US6246618 Semiconductor integrated circuit capable of testing and substituting defective memories and method thereof |
| 06/12/2001 | US6246261 Circuit for detecting the disappearing of a periodic signal |
| 06/12/2001 | US6246251 Test process and apparatus for testing singulated semiconductor die |
| 06/12/2001 | US6246250 Probe card having on-board multiplex circuitry for expanding tester resources |
| 06/12/2001 | US6246249 Semiconductor inspection apparatus and inspection method using the apparatus |
| 06/12/2001 | US6246248 Tester for detecting an abnormal quiescent power supply current in a device under test |
| 06/12/2001 | US6246247 Probe card assembly and kit, and methods of using same |
| 06/12/2001 | US6246246 Test head assembly utilizing replaceable silicon contact |
| 06/12/2001 | US6246245 Probe card, test method and test system for semiconductor wafers |
| 06/12/2001 | US6246242 Method of screening varistors |
| 06/12/2001 | US6246241 Testing of bimetallic actuators with radio frequency induction heating |
| 06/12/2001 | US6246223 Method for use on a parametric tester to measure the output frequency of a ring oscillator through voltage sampling |
| 06/12/2001 | US6246216 Battery charge control device having function to decide gassing without temperature sensor |
| 06/12/2001 | US6246108 Integrated circuit package including lead frame with electrically isolated alignment feature |
| 06/12/2001 | US6246098 Apparatus for reducing reflections off the surface of a semiconductor surface |
| 06/12/2001 | US6246074 Thin film transistor substrate with testing circuit |
| 06/12/2001 | US6246072 Integrated circuit test pad |
| 06/12/2001 | US6245587 Method for making semiconductor devices having backside probing capability |
| 06/12/2001 | US6245582 Process for manufacturing semiconductor device and semiconductor component |
| 06/12/2001 | US6244675 Fail-safe brake system |
| 06/12/2001 | CA2125669C Improved carrier for testing circuit boards |
| 06/07/2001 | WO2001041190A2 A method for measuring stress induced leakage current and gate dielectric integrity using corona discharge |
| 06/07/2001 | WO2001040943A2 A system, method and apparatus pertaining to flexible selection scan test |
| 06/07/2001 | WO2001040941A2 Hardware debugging in a hardware description language |
| 06/07/2001 | WO2001040818A1 Capacity testing method and arrangement |
| 06/07/2001 | WO2001040817A1 Dry load test apparatus |
| 06/07/2001 | WO2001040816A1 A method and integrated circuit arranged for feeding a test forcing pattern on a single shared pin of the circuit |
| 06/07/2001 | WO2001040815A1 Testing electrical circuits |
| 06/07/2001 | WO2001040814A1 Time domain reflectometer display method |
| 06/07/2001 | WO2001040810A1 Method and apparatus for measuring complex self-immittance of a general electrical element |