| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 06/28/2001 | WO2000072444A3 Scannable flip flop circuit and method of operating an integrated circuit |
| 06/28/2001 | WO2000068972A3 Method of creating an electrical interconnect device bearing an array of electrical contact pads |
| 06/28/2001 | US20010005896 On-board testing circuit and method for improving testing of integrated circuits |
| 06/28/2001 | US20010005817 Circuit trace probe and method |
| 06/28/2001 | US20010005145 Methods for wireless testing of integrated circuits |
| 06/28/2001 | US20010005144 Configuration for testing a multiplicity of semiconductor chips |
| 06/28/2001 | US20010005143 Configuration for measurement of internal voltages in an integrated semiconductor apparatus |
| 06/28/2001 | US20010005142 Contact pin elastic body for supporting the same and socket having them for testing module |
| 06/28/2001 | US20010005141 Configuration for testing chips using a printed circuit board |
| 06/28/2001 | US20010005140 Waveform observing jig and waveform observing device |
| 06/28/2001 | US20010005132 Semiconductor device testing method and system and recording medium |
| 06/28/2001 | US20010005123 Battery monitoring system with integrated battery holder |
| 06/28/2001 | US20010005027 Semiconductor memory circuit |
| 06/28/2001 | DE19961592A1 Error function recognizing device for motor vehicle has sensors which obtain information required for control of internal combustion engine to be processed by microcomputer of electronic control device |
| 06/28/2001 | DE19957844A1 Checking device for semiconductor integrated circuit arrangement on support has anisotropic leading material which electrically contacts first contacts on first surface of support |
| 06/28/2001 | DE10063996A1 Sensor arrangement for measuring physical value of e.g. brake pressure, fuel pressure in motor vehicle has output device which outputs first signal to output line in absence of second signal |
| 06/28/2001 | DE10053878A1 Semi-conductor test system has a test head that can be used with different test device modules for use with DUTs of different performance and clocking properties, |
| 06/27/2001 | EP1111808A1 Method and apparatus for determining properties of a transmission channel |
| 06/27/2001 | EP1111724A2 Electric socket apparatus |
| 06/27/2001 | EP1111668A2 Semiconductor testing device comprising a light emitting device |
| 06/27/2001 | EP1111508A1 Integrated circuit with calibration means for calibrating an electronic module, and method for calibrating an electronic module in an integrated circuit |
| 06/27/2001 | EP1111400A1 Battery life indication |
| 06/27/2001 | EP1111399A1 Method and apparatus for measuring the state-of-charge of a battery |
| 06/27/2001 | EP1111398A2 Apparatus and method for inline testing of electrical components |
| 06/27/2001 | EP1111397A2 Means for testing chips using a printed circuit |
| 06/27/2001 | EP1110266A1 A battery having discharge state indication |
| 06/27/2001 | EP1110158A1 Method and arrangement for testing the stability of a working point of a circuit |
| 06/27/2001 | EP1110097A1 Terminator unit for wiring networks |
| 06/27/2001 | EP1110096A1 Vehicle electrical circuit failure monitor |
| 06/27/2001 | EP1110095A1 Method and apparatus for electromagnetic emissions testing |
| 06/27/2001 | EP1109629A1 Electronic component handler |
| 06/27/2001 | EP0880709B1 Method and apparatus for diagnosing bearing insulation impedance of a rotating electrical apparatus |
| 06/27/2001 | CN2437038Y Electromagnetic relay |
| 06/27/2001 | CN2436944Y Rotor position detector for dc brushless motor |
| 06/27/2001 | CN2436943Y Tester for action current of electricity leakage protector |
| 06/27/2001 | CN2436942Y Electricity test pen |
| 06/27/2001 | CN2436941Y Fault dectecting instrument for communication line |
| 06/27/2001 | CN1301349A Layout, method and current measuring device for measuring a current in a conductor |
| 06/27/2001 | CN1300943A Whisker calibrator for levelling set of whiskers |
| 06/27/2001 | CN1067795C 半导体集成电路器件 The semiconductor integrated circuit device |
| 06/26/2001 | US6253360 Timing generator |
| 06/26/2001 | US6253353 Method and system for providing a library for identifying VCC to ground shorts in a circuit in a semiconductor device |
| 06/26/2001 | US6253352 Circuit for validating simulation models |
| 06/26/2001 | US6253350 Method and system for detecting errors within complementary logic circuits |
| 06/26/2001 | US6253345 System and method for trellis decoding in a multi-pair transceiver system |
| 06/26/2001 | US6253343 Method of design for testability test sequence generation method and semiconductor integrated circuit |
| 06/26/2001 | US6253342 Semiconductor integrated circuit |
| 06/26/2001 | US6253341 IC test system |
| 06/26/2001 | US6253340 Integrated circuit implementing internally generated commands |
| 06/26/2001 | US6253333 Apparatus and method for testing programmable delays |
| 06/26/2001 | US6253307 Data processing device with mask and status bits for selecting a set of status conditions |
| 06/26/2001 | US6252904 High-speed decoder for a multi-pair gigabit transceiver |
| 06/26/2001 | US6252809 Semiconductor memory device capable of easily determining locations of defective memory cells by selectively isolating and testing redundancy memory cell block |
| 06/26/2001 | US6252805 Semiconductor memory device including programmable output pin determining unit and method of reading the same during test mode |
| 06/26/2001 | US6252447 Edge transition detection circuit with variable impedance delay elements |
| 06/26/2001 | US6252436 Method and arrangement for determining state information of power semiconductor |
| 06/26/2001 | US6252417 Fault identification by voltage potential signature |
| 06/26/2001 | US6252416 Semiconductor test system |
| 06/26/2001 | US6252415 Pin block structure for mounting contact pins |
| 06/26/2001 | US6252414 Method and apparatus for testing circuits having different configurations with a single test fixture |
| 06/26/2001 | US6252413 Positive side support test assembly |
| 06/26/2001 | US6252412 Method of detecting defects in patterned substrates |
| 06/26/2001 | US6252411 Method and apparatus for testing frequency-dependent electrical circuits |
| 06/26/2001 | US6252410 Pico fuse open or short detector tool |
| 06/26/2001 | US6252409 Directional short circuit detection system and method |
| 06/26/2001 | US6252407 Ground fault circuit interrupter miswiring prevention device |
| 06/26/2001 | US6252392 Probe station having environment control chamber with bendably extensible and retractable lateral wall assembly |
| 06/26/2001 | US6252387 Oscilloscope utilizing probe with electro-optic crystal |
| 06/26/2001 | US6252380 Battery pack having memory |
| 06/26/2001 | US6252378 Usage counter for portable jump-starting battery unit |
| 06/26/2001 | US6252377 Apparatus for detecting remaining charge of battery |
| 06/26/2001 | US6252376 Battery-state monitoring system for a battery group |
| 06/26/2001 | US6252239 Substrate removal from a semiconductor chip structure having buried insulator (BIN) |
| 06/26/2001 | US6252222 Differential pulsed laser beam probing of integrated circuits |
| 06/26/2001 | US6252175 Electronic assembly comprising a substrate and a plurality of springable interconnection elements secured to terminals of the substrate |
| 06/26/2001 | US6251706 Method for cooling the backside of a semiconductor device using an infrared transparent heat slug |
| 06/26/2001 | US6251696 Method of forming integrated circuit with evaluation contacts electrically connected by forming via holes through the chip, and bonding the chip with a substrate |
| 06/26/2001 | US6250933 Contact structure and production method thereof |
| 06/26/2001 | CA2202606C Diagnostic tester for lighting systems and method of using same |
| 06/21/2001 | WO2001044825A1 Battery sensor device |
| 06/21/2001 | WO2001044824A1 Automated domain reflectometry testing system |
| 06/21/2001 | US20010004760 Chip testing apparatus and method |
| 06/21/2001 | US20010004729 S-parameter measurement system for wideband non-linear networks |
| 06/21/2001 | US20010004556 Contact structure and production method thereof and probe contact assembly using same |
| 06/21/2001 | US20010004246 Electric device, electric device testing apparatus, and electric device testing method thereof |
| 06/21/2001 | US20010004208 Static event detection / protection device |
| 06/21/2001 | US20010004123 Semiconductor integrated circuit having diagnosis function |
| 06/21/2001 | DE19953602A1 Electrical sub-assemblies and modules testing device for verifying correct functioning of modules and unequipped circuit boards |
| 06/21/2001 | DE19940902C1 IC circuit testing device has stored IC circuit type and/or use data fed to display when tested IC is found to be faulty |
| 06/21/2001 | DE10059142A1 Strombegrenzungsapparat Current limiting apparatus |
| 06/21/2001 | DE10050758A1 Self diagnostic procedure of motor drive unit, involves applying test power to motors and detecting response of relevant drive units, to judge line or motor fault |
| 06/21/2001 | DE10047966A1 Logic instruction verification for electronic control unit in vehicle, involves comparing ID and execution timing of correct and instantaneous executed logic operations |
| 06/21/2001 | DE10027092A1 Analoge Signaldetektionsschaltung, und AC seitiger Stromdetektor für eine Halbleiterleistungsumsetzeinrichtung Analog signal detection circuit and AC side current detector for a Halbleiterleistungsumsetzeinrichtung |
| 06/21/2001 | DE10001345C1 Battery current measuring device e.g. for automobile battery, uses hollow measuring cable connected between negative terminal of battery and earth |
| 06/20/2001 | EP1109172A1 In-circuit memory array bit cell thereshold voltage distribution measurement |
| 06/20/2001 | EP1109029A1 Apparatus and method using photoelectric effect for testing electrical traces |
| 06/20/2001 | EP1109028A2 Monitoring the residual charge of a battery |
| 06/20/2001 | EP1108221A1 Method and arrangement for checking cable connections |
| 06/20/2001 | EP1108216A1 High resolution analytical probe station |
| 06/20/2001 | EP1031042B1 Device for testing printed boards |