| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
|---|
| 07/10/2001 | US6259260 Apparatus for coupling a test head and probe card in a wafer testing system |
| 07/10/2001 | US6259257 Nonintrusive power and continuity testing tools |
| 07/10/2001 | US6259256 Cable testing apparatus |
| 07/10/2001 | US6259255 Surge locating system of power transmission line and method thereof |
| 07/10/2001 | US6259254 Apparatus and method for carrying out diagnostic tests on batteries and for rapidly charging batteries |
| 07/10/2001 | US6259247 Method of transferring IC devices on test handler |
| 07/10/2001 | US6259244 Electrooptic voltage waveform measuring method employing light sampling technique using Pockels effect |
| 07/10/2001 | US6259243 Method for electromagnetically shielding inductive voltage detectors |
| 07/10/2001 | US6259241 Projected display for portable sensor indicating the location of a detected hidden object behind a surface |
| 07/10/2001 | US6259230 Apparatus for charging and discharging a battery device |
| 07/10/2001 | US6259227 Arrangement and method for controlling the power supply to a load |
| 07/10/2001 | US6259094 Electron beam inspection method and apparatus |
| 07/10/2001 | US6258595 Compositions and methods for helper-free production of recombinant adeno-associated viruses |
| 07/10/2001 | US6257933 Connector |
| 07/10/2001 | US6257363 Automotive passenger restraint and protection apparatus |
| 07/10/2001 | US6257319 IC testing apparatus |
| 07/05/2001 | WO2001048823A1 An integrated circuit with metal programmable logic having enhanced reliability |
| 07/05/2001 | WO2001048497A1 Measuring cell voltages of a fuel cell stack |
| 07/05/2001 | WO2001048496A1 Battery disconnect method and system |
| 07/05/2001 | WO2001048495A1 Non-linear light-emitting load current control |
| 07/05/2001 | WO2001048494A2 Digital signal testing |
| 07/05/2001 | WO2001048493A2 Low power scan flipflop |
| 07/05/2001 | WO2001048471A2 Electro-optic system controller and method of operation |
| 07/05/2001 | WO2001048465A2 Cam reference for inspection of multi-color and contour images |
| 07/05/2001 | US20010007092 Method in an integrated circuit (IC) manufacturing process for indentifying and redirecting IC's mis-processed during their manufacture |
| 07/05/2001 | US20010007091 Integrated circuit provided with means for calibrating an electronic module and method for calibrating an electronic module of an integrated circuit |
| 07/05/2001 | US20010006906 Battery life indication |
| 07/05/2001 | US20010006481 Integrated semiconductor memory with a memory unit for storing addresses of defective memory cells |
| 07/05/2001 | US20010006346 Connector checker |
| 07/05/2001 | US20010006343 Integrated circuit and lot selection system therefor |
| 07/05/2001 | US20010006233 Semiconductor devices having backside probing capability |
| 07/05/2001 | DE19964057A1 Verfahren zur Erkennung einer defekten Kraftfahrzeug-Batterie Method for detecting a defective motor vehicle battery |
| 07/05/2001 | DE19963207A1 Semiconductor component testing method, has offset potential levels applied to each two adjacent semiconductor component terminals |
| 07/05/2001 | DE19962677A1 Anordnung zum Testen einer Vielzahl von Halbleiterchips An arrangement for testing a plurality of semiconductor chips |
| 07/05/2001 | DE19957286A1 Verfahren und Vorrichtung zum Testen von Leiterplatten A method and apparatus for testing printed circuit boards |
| 07/05/2001 | DE19948904C1 Schaltungszelle mit eingebauter Selbsttestfunktion und Verfahren zum Testen hierfür Circuit cell with built-in self-test function and method of testing for this purpose |
| 07/05/2001 | DE10064514A1 Probe signal output device for electro-optical probe, has driver current control circuit with current drive circuit that supplies driver current to light source according to change in adder output |
| 07/05/2001 | DE10058464A1 Pattern generation method for use in testing semiconductor integrated circuit, involves generating desired pattern data based on logical value of each byte of juxtaposition pattern data |
| 07/05/2001 | DE10056825A1 Random code generation for functional operation testing in integrated circuit design, involves generating random weightings for predefined control values assigned to instruction type to be included in random code |
| 07/04/2001 | EP1113453A2 Memory circuit |
| 07/04/2001 | EP1113362A2 Integrated semiconductor memory with a memory unit for storing addresses of faulty memory cells |
| 07/04/2001 | EP1113282A2 System for testing a plurality of semiconductor chips |
| 07/04/2001 | EP1113280A2 Semiconductor integrated circuit having self-diagnosis test function and test method thereof |
| 07/04/2001 | EP1113279A2 Lbist controller circuits, systems, and methods with automated maximum scan channel lentgh determination |
| 07/04/2001 | EP1113276A2 Process and apparatus for cleaning contact needles |
| 07/04/2001 | EP1113273A2 System for testing bare IC chips and a socket for such chips |
| 07/04/2001 | EP1112577A1 Built-in self test schemes and testing algorithms for random access memories |
| 07/04/2001 | EP1112557A2 Method and apparatus for identifying and tracking connections of communication lines |
| 07/04/2001 | EP1112505A1 Locating underground power cable faults |
| 07/04/2001 | EP1112504A1 Diagnostic circuitry for measuring the resistance and leakage current of at least one electric consumer, especially a primer in a motor vehicle passenger protection system, and a passenger protection system fitted therewith |
| 07/04/2001 | EP1112484A2 Device for measuring work pieces using an image processing system |
| 07/04/2001 | EP1112195A1 Monitoring method and monitoring device for a filter |
| 07/04/2001 | EP0876619B1 Machine for the electric test of printed circuits with adjustable position of the testing needles |
| 07/04/2001 | EP0820391B1 Arrangement for triggering a personal protection system |
| 07/04/2001 | EP0713589B1 Voice trouble-shooting system for computer-controlled machines |
| 07/04/2001 | CN2438134Y Indicator type voltmeter for moped |
| 07/04/2001 | CN2438133Y Static DC electric machine feedback test device |
| 07/04/2001 | CN2438132Y Three-hole socket wiring testing device |
| 07/04/2001 | CN2438131Y Line fault indicator |
| 07/04/2001 | CN1302467A Method and apparatus for charging rechargeable battery |
| 07/04/2001 | CN1302379A Device for testing printed boards |
| 07/04/2001 | CN1067949C 电动车辆 Electric vehicles |
| 07/03/2001 | US6256770 Register transfer level (RTL) based scan insertion for integrated circuit design processes |
| 07/03/2001 | US6256761 Integrated electronic module with hardware error infeed for checking purposes |
| 07/03/2001 | US6256760 Automatic test equipment scan test enhancement |
| 07/03/2001 | US6256759 Hybrid algorithm for test point selection for scan-based BIST |
| 07/03/2001 | US6256758 Fault tolerant operation of field programmable gate arrays |
| 07/03/2001 | US6256757 Apparatus for testing memories with redundant storage elements |
| 07/03/2001 | US6256592 Multi-ended fault location system |
| 07/03/2001 | US6256505 GSM transceiver unit equipped for time of arrival measurements |
| 07/03/2001 | US6256257 Memory device including a burn-in controller for enabling multiple wordiness during wafer burn-in |
| 07/03/2001 | US6256243 Test circuit for testing a digital semiconductor circuit configuration |
| 07/03/2001 | US6256240 Semiconductor memory circuit |
| 07/03/2001 | US6255893 Method and apparatus for detection of electrical overstress |
| 07/03/2001 | US6255844 Semiconductor testing apparatus |
| 07/03/2001 | US6255843 Semiconductor integrated circuit testing apparatus and composite semiconductor integrated circuit testing apparatus |
| 07/03/2001 | US6255842 Applied-voltage-based current measuring method and device |
| 07/03/2001 | US6255841 Statistical system and method for testing integrated circuits |
| 07/03/2001 | US6255839 Voltage applied type current measuring circuit in an IC testing apparatus |
| 07/03/2001 | US6255838 Apparatus and method for disabling and re-enabling access to IC test functions |
| 07/03/2001 | US6255837 Apparatus and method disabling and re-enabling access to IC test functions |
| 07/03/2001 | US6255836 Built-in self-test unit having a reconfigurable data retention test |
| 07/03/2001 | US6255835 Circuit for testing option of a semiconductor memory device |
| 07/03/2001 | US6255834 Test fixture having a floating self-centering connector |
| 07/03/2001 | US6255829 Apparatus for function testing of sensors in high voltage devices |
| 07/03/2001 | US6255828 Interface for cable testing |
| 07/03/2001 | US6255826 Battery voltage measuring device |
| 07/03/2001 | US6255808 Device for measuring partial discharge in gas-insulated high voltage facilities, the device having a HF sensor and UHF sensor |
| 07/03/2001 | US6255803 Method for detecting minor short in cells and method for detecting cell short in cells |
| 07/03/2001 | US6255801 System and method for assessing a capacity of a battery and power plant incorporating the same |
| 07/03/2001 | US6255729 Multi chip package (MCP) applicable to failure analysis mode |
| 07/03/2001 | US6255727 Contact structure formed by microfabrication process |
| 07/03/2001 | US6255585 Packaging and interconnection of contact structure |
| 07/03/2001 | US6255124 Test arrangement and method for thinned flip chip IC |
| 07/03/2001 | CA2072980C Automated breakout box for automotive testing |
| 06/28/2001 | WO2001046706A2 Design-based reticle defect prioritization |
| 06/28/2001 | WO2001046674A1 Apparatus for evaluating electrical characteristics |
| 06/28/2001 | WO2001046643A1 Scanning force microscope probe cantilever with reflective structure |
| 06/28/2001 | WO2001045565A2 Modeling and testing of an integrated circuit |
| 06/28/2001 | WO2000077529A3 Method and apparatus for testing a video display chip |