| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 07/19/2001 | CA2393940A1 Method for testing circuits with tri-state drivers and circuit for use therewith |
| 07/19/2001 | CA2366970A1 Electro-optic interface system and method of operation |
| 07/18/2001 | EP1117044A1 System model determination for failure detection and isolation in particular in computer systems |
| 07/18/2001 | EP1116958A2 Method of measuring the quality of a storage battery during electrical discharge of the storage battery |
| 07/18/2001 | EP1116957A2 Capacity measurement of structures in integrated circuits |
| 07/18/2001 | EP1116956A1 Electrical continuity inspection unit for connector |
| 07/18/2001 | EP1116955A2 Interactive diagnostic system |
| 07/18/2001 | EP1116423A1 Vertically actuated bga socket |
| 07/18/2001 | EP1116420A1 Printed circuit plate used for testing electric components |
| 07/18/2001 | EP1116315A1 Battery charge measurement and discharge reserve time prediction technique and apparatus |
| 07/18/2001 | EP1116241A2 A method and a device for testing a memory array in which fault response is compressed |
| 07/18/2001 | EP1116042A1 Circuit configuration with a scan path that can be deactivated |
| 07/18/2001 | CN1304598A Method and system for monitoring broadband quality of services |
| 07/18/2001 | CN1304488A Instpection of printed circuit board using color |
| 07/18/2001 | CN1304286A Conveying device and method for component |
| 07/18/2001 | CN1304200A Electric source system for electrically driven vehicle |
| 07/18/2001 | CN1304194A System for testing bare integrated circuit chip and socket for said chip |
| 07/18/2001 | CN1304045A Combined part-testing device |
| 07/17/2001 | USRE37281 Battery voltage alarm apparatus |
| 07/17/2001 | US6263476 Method and apparatus for selecting targeted components in limited access test |
| 07/17/2001 | US6263464 Device for controlling conformity of consumption of an electronic component in a testing machine |
| 07/17/2001 | US6263463 Timing adjustment circuit for semiconductor test system |
| 07/17/2001 | US6263461 Circuit for efficiently testing memory and shadow logic of a semiconductor integrated circuit |
| 07/17/2001 | US6263419 Integrated circuit with wait state registers |
| 07/17/2001 | US6263418 Process of operating a microprocessor to use wait state numbers |
| 07/17/2001 | US6263295 Programmable voltage divider and method for testing the impedance of a programmable element |
| 07/17/2001 | US6263098 Determination of functionality for integrated circuit modules |
| 07/17/2001 | US6262926 Nonvolatile semiconductor memory device |
| 07/17/2001 | US6262871 Fail safe fault interrupter |
| 07/17/2001 | US6262654 Audible alarm-wire identifier |
| 07/17/2001 | US6262625 Operational amplifier with digital offset calibration |
| 07/17/2001 | US6262602 Incident-edge detecting probe |
| 07/17/2001 | US6262595 High-speed programmable interconnect |
| 07/17/2001 | US6262590 Supply voltage abnormal condition indicating device |
| 07/17/2001 | US6262588 Bias monitor for semiconductor burn-in |
| 07/17/2001 | US6262587 Semiconductor wafer with connecting leads between the dies |
| 07/17/2001 | US6262585 Apparatus for I/O leakage self-test in an integrated circuit |
| 07/17/2001 | US6262584 IC device temperature control system and IC device inspection apparatus incorporating the same |
| 07/17/2001 | US6262582 Mechanical fixture for holding electronic devices under test showing adjustments in multiple degrees of freedom |
| 07/17/2001 | US6262581 Test carrier for unpackaged semiconducter chip |
| 07/17/2001 | US6262578 Detection and location of current leakage paths and detection of oscillations |
| 07/17/2001 | US6262577 Method of measuring quantities indicating state of electrochemical device and apparatus for the same |
| 07/17/2001 | US6262570 Probe apparatus |
| 07/17/2001 | US6262563 Method and apparatus for measuring complex admittance of cells and batteries |
| 07/17/2001 | US6262561 Battery system and electric vehicle using the battery system |
| 07/17/2001 | US6262494 Battery unit and information processing system having battery unit mounted therein |
| 07/17/2001 | US6261854 Interconnect with pressure sensing mechanism for testing semiconductor wafers |
| 07/17/2001 | US6261114 Socket for electrical parts |
| 07/17/2001 | US6260998 Method for specifying accelerated thermal cycling tests for electronic solder joint durability |
| 07/12/2001 | WO2001050566A1 An improved electronic earth leakage current device |
| 07/12/2001 | WO2001050474A1 Method and apparatus for exercising external memory with a memory built-in self-test |
| 07/12/2001 | WO2001050149A1 Method for dynamically measuring the state of health and charge of a car battery and device for implementing said method |
| 07/12/2001 | WO2001050148A1 Automated creation of specific test programs from complex test programs |
| 07/12/2001 | WO2001050140A2 Electric test connector, equipment and system using same |
| 07/12/2001 | WO2001050119A1 Method and apparatus for measurement of electrochemical cell and battery impedances |
| 07/12/2001 | WO2001042804A8 Device for controlling a storage battery condition |
| 07/12/2001 | US20010007972 Method and apparatus for verifying adequacy of test patterns |
| 07/12/2001 | US20010007970 Automatic test vector generation method, test method making use of the test vectors as automatically generated, chip manufacturing method and automatic test vector generation program |
| 07/12/2001 | US20010007427 Method and apparatus for capacitively testing a semiconductor die |
| 07/12/2001 | US20010007426 Method and apparatus for testing frequency-dependent electrical circuits |
| 07/12/2001 | US20010007425 Electrical continuity inspection unit for connector |
| 07/12/2001 | US20010007356 Integrated circuit and fabricating method and evaluating method of integrated circuit |
| 07/12/2001 | DE19964012A1 Refreshing memory contents of read only memory cell involves comparing current memory cell charge state with threshold value above reading charge, raising charge state if below threshold |
| 07/12/2001 | DE19963689A1 Schaltungsanordnung eines integrierten Halbleiterspeichers zum Speichern von Adressen fehlerhafter Speicherzellen Circuit arrangement of an integrated semiconductor memory for storing addresses of defective memory cells |
| 07/12/2001 | DE19961791A1 Anordnung zum Testen von Chips mittels einer gedruckten Schaltungsplatte Arrangement for testing chips by means of a printed circuit board |
| 07/12/2001 | DE19948902C1 Schaltungszelle zur Testmuster-Generierung und Testmuster-Kompression Circuit cell for test pattern generation and test pattern compression |
| 07/12/2001 | DE10065366A1 Elektrischer Prüfstecker Electrical Test Plugs |
| 07/12/2001 | DE10050737A1 Battery charging state indicating device for cellular phones used by visually impaired person, outputs command indicating charging state and remaining charge information to braille indicator control circuit |
| 07/12/2001 | DE10028835A1 Verfahren und Gerät zum Testen einer Halbleitervorrichtung Method and apparatus for testing a semiconductor device |
| 07/12/2001 | DE10000785A1 Selecting method for microprocessor of microcontroller during boundary scan testing involves controlling JTAG interface of microprocessor from test routine executable on microprocessor |
| 07/12/2001 | DE10000729A1 Method to measure usability of battery; involves electrically loading battery, forming current profile and assigning 'state of health' based on difference between lowest voltage and voltage limit |
| 07/11/2001 | EP1115171A1 Method for judging state of secondary cell and device for judging state thereof, and method for regenerating secondary cell |
| 07/11/2001 | EP1115043A2 Voltage detecting device, battery remaining voltage detecting method, electronic timepiece and electronic device |
| 07/11/2001 | EP1115003A1 Method of recognising a defective car battery |
| 07/11/2001 | EP1114538A1 Triggered clock signal generator |
| 07/11/2001 | EP1114329A1 Apparatus and method for determining the capacity of a nickel-cadmium battery |
| 07/11/2001 | EP1114328A1 A method of and an apparatus for monitoring the condition of batteries used by a mobile radio telecommunications fleet |
| 07/11/2001 | EP0788116B1 Overvoltage detection circuit for mode selection |
| 07/11/2001 | CN1303533A Process and apparatus for modulating terminal voltage of battery |
| 07/11/2001 | CN1303524A Battery having built-in controller |
| 07/11/2001 | CN1303480A System measuring partial discharge using digital peak detection |
| 07/11/2001 | CN1303126A Equivalent circuit for simulating ferroelectric capacitance |
| 07/11/2001 | CN1303101A Semi-conductor memory possessing test pattern decision circuit |
| 07/11/2001 | CN1303019A Method and equipment for measuring insulation resistance |
| 07/10/2001 | US6260166 Observability register architecture for efficient production test and debug |
| 07/10/2001 | US6260165 Accelerating scan test by re-using response data as stimulus data |
| 07/10/2001 | US6260163 Testing high I/O integrated circuits on a low I/O tester |
| 07/10/2001 | US6260033 Method for remediation based on knowledge and/or functionality |
| 07/10/2001 | US6259963 Equipment, method and computer program product for determining positions of inspection terminals on printed wiring board |
| 07/10/2001 | US6259640 Semiconductor storage device having a delayed sense amplifier activating signal during a test mode |
| 07/10/2001 | US6259638 Integrated circuit memory devices having an improved wafer burn-in test capability through independent operational control of a memory cell array and related methods of testing same |
| 07/10/2001 | US6259637 Method and apparatus for built-in self-repair of memory storage arrays |
| 07/10/2001 | US6259630 Nonvolatile semiconductor memory device equipped with verification circuit for identifying the address of a defective cell |
| 07/10/2001 | US6259268 Voltage stress testable embedded dual capacitor structure and process for its testing |
| 07/10/2001 | US6259267 Power-current measuring circuit in burn-in tester |
| 07/10/2001 | US6259265 Unified test system and method for testing printed circuit boards |
| 07/10/2001 | US6259264 Apparatus and method for testing semiconductor laser chips |
| 07/10/2001 | US6259263 Compliant contactor for testing semiconductors |
| 07/10/2001 | US6259262 Camera system for automated verification and repair station |
| 07/10/2001 | US6259261 Method and apparatus for electrically testing semiconductor devices fabricated on a wafer |