| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 07/26/2001 | WO2001053844A1 Hierarchical test circuit structure for chips with multiple circuit blocks |
| 07/26/2001 | WO2001053843A1 Electric arc monitoring systems |
| 07/26/2001 | WO2001053842A1 Method of inspecting passive-matrix liquid crystal panel and apparatus for inspecting the same, and method of inspecting plasma display panel and apparatus for inspecting the same |
| 07/26/2001 | WO2000072444A9 Scannable flip flop circuit and method of operating an integrated circuit |
| 07/26/2001 | WO2000071986A3 Diagnostic device |
| 07/26/2001 | US20010010091 Method and apparatus for maximizing test coverage |
| 07/26/2001 | US20010010087 Method of analyzing fault occurring in semiconductor device |
| 07/26/2001 | US20010010080 Method for testing an integrated circuit including hardware and/or software parts having a confidential nature |
| 07/26/2001 | US20010010036 Logic analysis system for logic emulation systems |
| 07/26/2001 | US20010010030 Method for inspecting wireharness |
| 07/26/2001 | US20010009724 Depositing coating on elongate member to give a coated elongate member, coating comprising at least one metal and at least one additive, the additive capable of codepositing with the metal, heat treating; electronics packaging |
| 07/26/2001 | US20010009525 Word-line deficiency detection method for semiconductor memory device |
| 07/26/2001 | US20010009524 Semiconductor device having a test circuit |
| 07/26/2001 | US20010009523 Testing method and test apparatus in semiconductor apparatus |
| 07/26/2001 | US20010009378 Probe holder for low current measurements |
| 07/26/2001 | US20010009377 Wafer probe station for low-current measurements |
| 07/26/2001 | US20010009376 Probe arrangement assembly, method of manufacturing probe arrangement assembly, probe mounting method using probe arrangement assembly, and probe mounting apparatus |
| 07/26/2001 | US20010009371 Rapid determination of present and potential battery capacity |
| 07/26/2001 | US20010009370 Method for determining the state of charge of storage batteries |
| 07/26/2001 | US20010009365 Monitoring method and monitoring device for a filter |
| 07/26/2001 | US20010009361 Method for monitoring operating parameters of a rechargeable power supply |
| 07/26/2001 | US20010009303 Local interconnect structures for integrated circuits and methods for making the same |
| 07/26/2001 | DE19961311A1 Battery sensor device, has attachment device, sensor combined into integrated unit; attachment device is connected to single pole and has conventional terminal |
| 07/26/2001 | DE10002537A1 Incorrect ground connection detection method for electrical device mounted in vehicles, involves comparing voltage measured by detection circuit with reference value based on which ground fault is detected |
| 07/26/2001 | DE10002473A1 Verfahren zur Bestimmung des Ladezusatandes von Akkumulatoren Method for determining the Ladezusatandes of accumulators |
| 07/26/2001 | DE10001849A1 Vorrichtung und Verfahren zur Auswertung von offsetspannungsbehafteten digitalen Signalen Apparatus and method for evaluating digital signals offset voltage lossy |
| 07/26/2001 | DE10001154A1 Circuit for simulating input or output load of analogue circuit - has measuring element between input of driver stage and reference potential, and controllable coupling resistance between output of driver stage and reference potential |
| 07/26/2001 | DE10001129A1 Circuit for measuring capacitances of structures in an IC enables voltage-dependent, differential capacitance measurement - has test and reference structures connected to junctions of series transistors in parallel circuits connected between poles of controllable voltage supply |
| 07/26/2001 | DE10001117A1 Testvorrichtung für ein Halbleiterbauelement Test device for a semiconductor component |
| 07/26/2001 | CA2397372A1 Control system simulation, testing, and operator training |
| 07/25/2001 | EP1119103A1 Clock signal supply |
| 07/25/2001 | EP1118938A2 A field programmable gate array with integrated debugging facilities |
| 07/25/2001 | EP1118869A1 Battery voltage detection apparatus and detection method |
| 07/25/2001 | EP1118868A1 Chip card circuit with controlled test mode access |
| 07/25/2001 | EP1118867A1 Method for testing a CMOS integrated circuit |
| 07/25/2001 | EP1118007A1 Method and apparatus for automotive and other battery testing |
| 07/25/2001 | EP1118006A1 Method and device for testing capacitors integrated on a semiconductor chip |
| 07/25/2001 | EP1118005A1 Semiconductor wafer evaluating apparatus and method |
| 07/25/2001 | EP1118004A1 Method and device for locating an insulation fault in an electric cable |
| 07/25/2001 | EP1118002A1 Thermal isolation plate for probe card |
| 07/25/2001 | EP0935759B1 Device noise measurement system |
| 07/25/2001 | EP0568239B1 Built-in self-test network |
| 07/25/2001 | CN2440211Y Master-row type circuit-fault indicator |
| 07/25/2001 | CN1305590A Method and apparatus for measuring battery capacity |
| 07/25/2001 | CN1305226A Semiconductor circuit possessing scaning path circuit |
| 07/25/2001 | CN1305225A Device inspection apparatus and inspection method |
| 07/25/2001 | CN1305112A 2D scan tree structure for measurable scan design of low-power integrated circuits |
| 07/25/2001 | CN1305111A Apparatus and method for detecting electric trace by using photoelectric effect |
| 07/25/2001 | CN1305110A Multiple parameters memorizing indicator |
| 07/25/2001 | CN1068988C Charging device for commonly charging various kinds of buttery |
| 07/25/2001 | CN1068955C Method and device for monitoring consumption of contact elements in switching device |
| 07/24/2001 | US6266801 Boundary-scan cells with improved timing characteristics |
| 07/24/2001 | US6266800 System and method for eliminating effects of parasitic bipolar transistor action in dynamic logic using setup time determination |
| 07/24/2001 | US6266794 Circuit and method for testing an integrated circuit |
| 07/24/2001 | US6266793 JTAG boundary scan cell with enhanced testability feature |
| 07/24/2001 | US6266787 Method and apparatus for selecting stimulus locations during limited access circuit test |
| 07/24/2001 | US6266749 Access time measurement circuit and method |
| 07/24/2001 | US6266286 Wafer burn-in test circuit and method for testing a semiconductor memory device |
| 07/24/2001 | US6265922 Controllable latch/register circuit |
| 07/24/2001 | US6265894 Reconfigurable integrated circuit with integrated debugging facilities for use in an emulation system |
| 07/24/2001 | US6265888 Wafer probe card |
| 07/24/2001 | US6265886 Conductive bump array contactors having an ejector and methods of testing using same |
| 07/24/2001 | US6265885 Method, apparatus and computer program product for identifying electrostatic discharge damage to a thin film device |
| 07/24/2001 | US6265880 Apparatus and method for detecting conduit chafing |
| 07/24/2001 | US6265879 Electrical integrity test system for boats |
| 07/24/2001 | US6265878 Reliable trailer tester |
| 07/24/2001 | US6265877 Method for determining an end of discharge voltage for a secondary battery |
| 07/24/2001 | US6265849 Electrical apparatus comprising a battery and method of detecting the disconnection of a battery |
| 07/24/2001 | US6265848 Battery state monitoring circuit and battery device |
| 07/24/2001 | US6265844 Battery pack with photo means for enabling integral circuitry |
| 07/24/2001 | US6265375 Conformationally constrained backbone cyclized peptide analogs |
| 07/24/2001 | US6265245 Compliant interconnect for testing a semiconductor die |
| 07/24/2001 | US6263563 Method of manufacturing and checking electronic components |
| 07/19/2001 | WO2001052454A1 Electro-optic interface system and method of operation |
| 07/19/2001 | WO2001052381A1 Usage counter for portable jump-starting battery unit |
| 07/19/2001 | WO2001052357A1 An rf antenna detector circuit |
| 07/19/2001 | WO2001052342A1 Battery pack |
| 07/19/2001 | WO2001052147A1 Method for matching financial supply to demand |
| 07/19/2001 | WO2001051947A1 System and method for determining battery state-of-health |
| 07/19/2001 | WO2001051945A1 Method for compensating for measurement errors that occur while measuring current in an energy store |
| 07/19/2001 | WO2001051944A1 Alternator tester |
| 07/19/2001 | WO2001051943A1 Load angle determination for electrical motors |
| 07/19/2001 | WO2001051942A1 Method for testing circuits with tri-state drivers and circuit for use therewith |
| 07/19/2001 | WO2001051941A1 Automated testing equipment having a modular offset test head with split backplane |
| 07/19/2001 | WO2001051940A1 An algorithmic test pattern generator, with built-in-self-test (bist) capabilities, for functional testing of a circuit |
| 07/19/2001 | WO2001051939A1 Robotic probe for testing printed circuit boards in-situ using a single printed circuit card slot |
| 07/19/2001 | WO2001051938A1 Circuit arrangement for simulation of the input or output load of an analogue circuit |
| 07/19/2001 | WO2001051935A1 Test device for a semiconductor component |
| 07/19/2001 | US20010009032 Structure having multiple levels of programmable integrated circuits for interconnecting electronic components |
| 07/19/2001 | US20010009029 Device and method for testing integrated circuit dice in an integrated circuit module |
| 07/19/2001 | US20010008424 Electronic apparatus having the function of displaying the battery residual quantity and method for displaying the battery residual quantity |
| 07/19/2001 | US20010008377 Non-contact board inspection probe |
| 07/19/2001 | US20010008283 Semiconductor chip package |
| 07/19/2001 | US20010008061 Component handling apparatus and method of handling the same |
| 07/19/2001 | DE10100816A1 Abtastung integrierter Schaltungen mit differentiell gepulstem Laserstrahl Scanning of integrated circuits with differential pulsed laser beam |
| 07/19/2001 | DE10100183A1 Spring loaded test connector for electrical junction block or disconnectors, test rod can be slid from an inactive stable position to an stable active position by applying pressure to its insulated enclosure |
| 07/19/2001 | DE10062543A1 Electro-optical measurement sensor for electro-optic sampling oscilloscope has insulator that is connected by optical path to quarter wavelength plate, polarizing beam splitters, and Faraday cell |
| 07/19/2001 | DE10018638A1 Compact semiconductor element comprises a wafer having a chip region, a substrate arranged on the chip region, conducting bodies, a distancing device between the wafer and the substrate and component contacts |
| 07/19/2001 | CA2397420A1 System and method for determining battery state-of-health |
| 07/19/2001 | CA2397247A1 Usage counter for portable jump-starting battery unit |