Patents
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
08/2001
08/08/2001CN1307682A Method and device for monitoring an electrode line of a bipolar high voltage direct current (HVDC) transmission system
08/08/2001CN1307358A Needle test film card
08/07/2001US6272666 Transistor group mismatch detection and reduction
08/07/2001US6272657 Apparatus and method for progammable parametric toggle testing of digital CMOS pads
08/07/2001US6272656 Semiconductor integrated circuit including test facilitation circuit and test method thereof
08/07/2001US6272655 Method of reducing test time for NVM cell-based FPGA
08/07/2001US6272654 Fast scannable output latch with domino logic input
08/07/2001US6272653 Method and apparatus for built-in self-test of logic circuitry
08/07/2001US6272588 Method and apparatus for verifying and characterizing data retention time in a DRAM using built-in test circuitry
08/07/2001US6272439 Programmable delay path circuit and operating point frequency detection apparatus
08/07/2001US6272173 Efficient fir filter for high-speed communication
08/07/2001US6272018 Method for the verification of the polarity and presence of components on a printed circuit board
08/07/2001US6271700 Semiconductor integrated circuit having scan path
08/07/2001US6271677 Semiconductor integrated circuit and method for testing the semiconductor integrated circuit
08/07/2001US6271674 Probe card
08/07/2001US6271673 Probe for measuring signals
08/07/2001US6271671 Multi-chip module testability using poled-polymer interlayer dielectrics
08/07/2001US6271668 Testing electrical installations
08/07/2001US6271658 Universal Docking System
08/07/2001US6271647 Method and apparatus for estimating the service life of a battery
08/07/2001US6271643 Battery pack having memory
08/07/2001US6271462 Inspection method and production method of solar cell module
08/07/2001US6271024 Compartmental fast thermal cycler
08/07/2001US6270357 Mounting for high frequency device packages
08/07/2001US6270356 IC socket
08/07/2001CA2333805A1 Power storage device and method of measuring voltage of storage battery
08/07/2001CA2249949C Battery charge level detecting device
08/07/2001CA2219874C Portable information terminal apparatus capable of correctly detecting power supply voltage
08/02/2001WO2001056132A1 Portable jump-starting battery pack with charge monitoring system
08/02/2001WO2001056033A2 Intermediate storage device
08/02/2001WO2001055740A1 Partial discharge detection test link, partial discharge detection system and methods for detecting partial discharge on a power cable
08/02/2001WO2001055739A1 Method and device for controlling a telecommunication cable
08/02/2001WO2001055738A2 Capacitively coupled electrical ground detection circuit
08/02/2001WO2001054951A1 Mains-connected vehicle apparatus
08/02/2001WO2001004642A3 Kinematic coupling
08/02/2001WO2000075746B1 System and method for measuring temporal coverage detection
08/02/2001US20010011361 Semiconductor integrated circuit device with scan signal converting circuit
08/02/2001US20010011360 System and method for evaluating the location of a failure in a logic circuit, and machine-readable recording medium having a recorded program
08/02/2001US20010011197 In-line programming system and method
08/02/2001US20010010652 Semiconductor memory device capable of reducing data test time in pipeline
08/02/2001US20010010469 Semiconductor inspection apparatus and inspection method using the apparatus
08/02/2001US20010010466 Connector continuity checking device
08/02/2001US20010010462 Carrier identification system, carrier identification method and storage media
08/02/2001US20010010460 Method for locating energized electric conductor
08/02/2001US20010010321 Enhanced pad design for substrate
08/02/2001US20010010274 Print board
08/02/2001DE19945178A1 Meßspitze zur Hochfrequenzmessung und Verfahren zu deren Herstellung Probe head for high-frequency measurement and process for their preparation
08/02/2001DE10102405A1 Halbleiterspeicherbauelement mit datenübertragender Pipeline A semiconductor memory device having data-transferring pipeline
08/02/2001DE10102177A1 Mit Anschlußvorsprüngen versehene Anschlußstruktur Provided with terminal projections terminal structure
08/02/2001DE10101538A1 Anschlußstruktur Terminal structure
08/02/2001DE10064515A1 Measurement signal output device for testing integrated circuit, has electro-optical probe which is connected to input/output unit by cables, and signal measurement unit connected to input/output unit by connector
08/02/2001DE10064407A1 Verfahren und Vorrichtung zur Verifizierung der Angemessenheit von Testmustern Method and apparatus for verifying the adequacy of test patterns
08/02/2001DE10042622A1 Halbleitervorrichtung mit einem Testmodus und Halbleitertestverfahren, welches dieselbe benutzt A semiconductor device having a test mode and semiconductor test method using the same
08/02/2001DE10033073A1 Verfahren zur Fehleraufdeckung an sicherheitsgerichteten Sensoren Method for fault detection in safety-related sensors
08/02/2001DE10003605A1 Zwischenspeichereinrichtung Latch means
08/02/2001CA2397572A1 Method and device for controlling a telecommunication cable
08/02/2001CA2396860A1 Portable jump-starting battery pack with charge monitoring system
08/01/2001EP1120828A1 Method and circuit to perform a trimming phase on electronic circuits
08/01/2001EP1120663A2 Determining the capacity of an accumulator
08/01/2001EP1120662A1 Method for testing an integrated circuit having confidential software or hardware elements
08/01/2001EP1120661A2 Connector continuity checking device
08/01/2001EP1120660A2 Apparatus and method for evaluating offset voltages of digital signals
08/01/2001EP1120657A1 Test connector with high interconnection density for integrated circuits
08/01/2001EP1119882A1 Method and apparatus for measuring complex impedance of cells and batteries
08/01/2001EP0927422B1 Method and apparatus for providing external access to internal integrated circuit test circuits
08/01/2001CN2441255Y Back-up uninterrupted power supply with color liquid crystal display
08/01/2001CN2441146Y Dynamic electric characteristics testing device for high voltage switch operation mechanism
08/01/2001CN2441145Y Antenna for GIS fault detector
08/01/2001CN1306322A Socket for electrical components
08/01/2001CN1306303A Steady-state service life test method by controlling junction temp of transistor
07/2001
07/31/2001US6269463 Method and system for automatically determining transparency behavior of non-scan cells for combinational automatic test pattern generation
07/31/2001US6269461 Testing method for dynamic logic keeper device
07/31/2001US6269455 System and a method for processing information about locations of defective memory cells and a memory test with defect compression means
07/31/2001US6269436 Superscalar microprocessor configured to predict return addresses from a return stack storage
07/31/2001US6269328 Testing integrated circuit device
07/31/2001US6269326 Method for testing electronic components
07/31/2001US6269319 Reconfigurable integration test station
07/31/2001US6269315 Reliability testing method of dielectric thin film
07/31/2001US6269038 Semiconductor memory device with test mode decision circuit
07/31/2001US6268740 System for testing semiconductor device formed on semiconductor wafer
07/31/2001US6268739 Method and device for semiconductor testing using electrically conductive adhesives
07/31/2001US6268738 Method and apparatus for high-speed scanning of electromagnetic emission levels
07/31/2001US6268735 Noise source module for microwave test systems
07/31/2001US6268734 Operational amplifier input offset voltage and input bias current test circuit
07/31/2001US6268733 Field service system for analog current analysis of digitally controlled power devices
07/31/2001US6268732 Method and apparatus for automotive and other battery testing
07/31/2001US6268719 Printed circuit board test apparatus
07/31/2001US6268718 Burn-in test device
07/31/2001US6268712 Method for determining the starting ability of a starter battery in a motor vehicle
07/31/2001US6268710 Battery monitor apparatus
07/31/2001US6268665 Testing battery power source of uninterruptible power supply
07/31/2001CA2136232C Testing process for the quality control of electromagnetically actuated switching devices
07/26/2001WO2001054248A2 System and method accommodating more than one battery within an electronic device
07/26/2001WO2001054186A1 Failure analysis method using emission microscope and system thereof and production method for semiconductor device
07/26/2001WO2001054152A1 Low profile, current-driven relay for integrated circuit tester
07/26/2001WO2001054135A1 Apparatus for testing memories with redundant storage elements
07/26/2001WO2001054056A2 Chipcard circuit with monitored access to the test mode
07/26/2001WO2001054001A1 Adaptable circuit blocks for use in multi-block chip design
07/26/2001WO2001053846A1 Power supply analyser
07/26/2001WO2001053845A1 A printed circuit assembly with configurable boundary scan paths