Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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08/08/2001 | CN1307682A Method and device for monitoring an electrode line of a bipolar high voltage direct current (HVDC) transmission system |
08/08/2001 | CN1307358A Needle test film card |
08/07/2001 | US6272666 Transistor group mismatch detection and reduction |
08/07/2001 | US6272657 Apparatus and method for progammable parametric toggle testing of digital CMOS pads |
08/07/2001 | US6272656 Semiconductor integrated circuit including test facilitation circuit and test method thereof |
08/07/2001 | US6272655 Method of reducing test time for NVM cell-based FPGA |
08/07/2001 | US6272654 Fast scannable output latch with domino logic input |
08/07/2001 | US6272653 Method and apparatus for built-in self-test of logic circuitry |
08/07/2001 | US6272588 Method and apparatus for verifying and characterizing data retention time in a DRAM using built-in test circuitry |
08/07/2001 | US6272439 Programmable delay path circuit and operating point frequency detection apparatus |
08/07/2001 | US6272173 Efficient fir filter for high-speed communication |
08/07/2001 | US6272018 Method for the verification of the polarity and presence of components on a printed circuit board |
08/07/2001 | US6271700 Semiconductor integrated circuit having scan path |
08/07/2001 | US6271677 Semiconductor integrated circuit and method for testing the semiconductor integrated circuit |
08/07/2001 | US6271674 Probe card |
08/07/2001 | US6271673 Probe for measuring signals |
08/07/2001 | US6271671 Multi-chip module testability using poled-polymer interlayer dielectrics |
08/07/2001 | US6271668 Testing electrical installations |
08/07/2001 | US6271658 Universal Docking System |
08/07/2001 | US6271647 Method and apparatus for estimating the service life of a battery |
08/07/2001 | US6271643 Battery pack having memory |
08/07/2001 | US6271462 Inspection method and production method of solar cell module |
08/07/2001 | US6271024 Compartmental fast thermal cycler |
08/07/2001 | US6270357 Mounting for high frequency device packages |
08/07/2001 | US6270356 IC socket |
08/07/2001 | CA2333805A1 Power storage device and method of measuring voltage of storage battery |
08/07/2001 | CA2249949C Battery charge level detecting device |
08/07/2001 | CA2219874C Portable information terminal apparatus capable of correctly detecting power supply voltage |
08/02/2001 | WO2001056132A1 Portable jump-starting battery pack with charge monitoring system |
08/02/2001 | WO2001056033A2 Intermediate storage device |
08/02/2001 | WO2001055740A1 Partial discharge detection test link, partial discharge detection system and methods for detecting partial discharge on a power cable |
08/02/2001 | WO2001055739A1 Method and device for controlling a telecommunication cable |
08/02/2001 | WO2001055738A2 Capacitively coupled electrical ground detection circuit |
08/02/2001 | WO2001054951A1 Mains-connected vehicle apparatus |
08/02/2001 | WO2001004642A3 Kinematic coupling |
08/02/2001 | WO2000075746B1 System and method for measuring temporal coverage detection |
08/02/2001 | US20010011361 Semiconductor integrated circuit device with scan signal converting circuit |
08/02/2001 | US20010011360 System and method for evaluating the location of a failure in a logic circuit, and machine-readable recording medium having a recorded program |
08/02/2001 | US20010011197 In-line programming system and method |
08/02/2001 | US20010010652 Semiconductor memory device capable of reducing data test time in pipeline |
08/02/2001 | US20010010469 Semiconductor inspection apparatus and inspection method using the apparatus |
08/02/2001 | US20010010466 Connector continuity checking device |
08/02/2001 | US20010010462 Carrier identification system, carrier identification method and storage media |
08/02/2001 | US20010010460 Method for locating energized electric conductor |
08/02/2001 | US20010010321 Enhanced pad design for substrate |
08/02/2001 | US20010010274 Print board |
08/02/2001 | DE19945178A1 Meßspitze zur Hochfrequenzmessung und Verfahren zu deren Herstellung Probe head for high-frequency measurement and process for their preparation |
08/02/2001 | DE10102405A1 Halbleiterspeicherbauelement mit datenübertragender Pipeline A semiconductor memory device having data-transferring pipeline |
08/02/2001 | DE10102177A1 Mit Anschlußvorsprüngen versehene Anschlußstruktur Provided with terminal projections terminal structure |
08/02/2001 | DE10101538A1 Anschlußstruktur Terminal structure |
08/02/2001 | DE10064515A1 Measurement signal output device for testing integrated circuit, has electro-optical probe which is connected to input/output unit by cables, and signal measurement unit connected to input/output unit by connector |
08/02/2001 | DE10064407A1 Verfahren und Vorrichtung zur Verifizierung der Angemessenheit von Testmustern Method and apparatus for verifying the adequacy of test patterns |
08/02/2001 | DE10042622A1 Halbleitervorrichtung mit einem Testmodus und Halbleitertestverfahren, welches dieselbe benutzt A semiconductor device having a test mode and semiconductor test method using the same |
08/02/2001 | DE10033073A1 Verfahren zur Fehleraufdeckung an sicherheitsgerichteten Sensoren Method for fault detection in safety-related sensors |
08/02/2001 | DE10003605A1 Zwischenspeichereinrichtung Latch means |
08/02/2001 | CA2397572A1 Method and device for controlling a telecommunication cable |
08/02/2001 | CA2396860A1 Portable jump-starting battery pack with charge monitoring system |
08/01/2001 | EP1120828A1 Method and circuit to perform a trimming phase on electronic circuits |
08/01/2001 | EP1120663A2 Determining the capacity of an accumulator |
08/01/2001 | EP1120662A1 Method for testing an integrated circuit having confidential software or hardware elements |
08/01/2001 | EP1120661A2 Connector continuity checking device |
08/01/2001 | EP1120660A2 Apparatus and method for evaluating offset voltages of digital signals |
08/01/2001 | EP1120657A1 Test connector with high interconnection density for integrated circuits |
08/01/2001 | EP1119882A1 Method and apparatus for measuring complex impedance of cells and batteries |
08/01/2001 | EP0927422B1 Method and apparatus for providing external access to internal integrated circuit test circuits |
08/01/2001 | CN2441255Y Back-up uninterrupted power supply with color liquid crystal display |
08/01/2001 | CN2441146Y Dynamic electric characteristics testing device for high voltage switch operation mechanism |
08/01/2001 | CN2441145Y Antenna for GIS fault detector |
08/01/2001 | CN1306322A Socket for electrical components |
08/01/2001 | CN1306303A Steady-state service life test method by controlling junction temp of transistor |
07/31/2001 | US6269463 Method and system for automatically determining transparency behavior of non-scan cells for combinational automatic test pattern generation |
07/31/2001 | US6269461 Testing method for dynamic logic keeper device |
07/31/2001 | US6269455 System and a method for processing information about locations of defective memory cells and a memory test with defect compression means |
07/31/2001 | US6269436 Superscalar microprocessor configured to predict return addresses from a return stack storage |
07/31/2001 | US6269328 Testing integrated circuit device |
07/31/2001 | US6269326 Method for testing electronic components |
07/31/2001 | US6269319 Reconfigurable integration test station |
07/31/2001 | US6269315 Reliability testing method of dielectric thin film |
07/31/2001 | US6269038 Semiconductor memory device with test mode decision circuit |
07/31/2001 | US6268740 System for testing semiconductor device formed on semiconductor wafer |
07/31/2001 | US6268739 Method and device for semiconductor testing using electrically conductive adhesives |
07/31/2001 | US6268738 Method and apparatus for high-speed scanning of electromagnetic emission levels |
07/31/2001 | US6268735 Noise source module for microwave test systems |
07/31/2001 | US6268734 Operational amplifier input offset voltage and input bias current test circuit |
07/31/2001 | US6268733 Field service system for analog current analysis of digitally controlled power devices |
07/31/2001 | US6268732 Method and apparatus for automotive and other battery testing |
07/31/2001 | US6268719 Printed circuit board test apparatus |
07/31/2001 | US6268718 Burn-in test device |
07/31/2001 | US6268712 Method for determining the starting ability of a starter battery in a motor vehicle |
07/31/2001 | US6268710 Battery monitor apparatus |
07/31/2001 | US6268665 Testing battery power source of uninterruptible power supply |
07/31/2001 | CA2136232C Testing process for the quality control of electromagnetically actuated switching devices |
07/26/2001 | WO2001054248A2 System and method accommodating more than one battery within an electronic device |
07/26/2001 | WO2001054186A1 Failure analysis method using emission microscope and system thereof and production method for semiconductor device |
07/26/2001 | WO2001054152A1 Low profile, current-driven relay for integrated circuit tester |
07/26/2001 | WO2001054135A1 Apparatus for testing memories with redundant storage elements |
07/26/2001 | WO2001054056A2 Chipcard circuit with monitored access to the test mode |
07/26/2001 | WO2001054001A1 Adaptable circuit blocks for use in multi-block chip design |
07/26/2001 | WO2001053846A1 Power supply analyser |
07/26/2001 | WO2001053845A1 A printed circuit assembly with configurable boundary scan paths |