Patents
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
08/2001
08/16/2001US20010013782 Electrical connection testing device and an electrical connection testing method for terminal fittings accommodated in a connector
08/16/2001US20010013781 Connection test method
08/16/2001US20010013772 Chuck device and chuck method
08/16/2001US20010013770 Linear ramping digital-to-analog converter for integrated circuit tester
08/16/2001US20010013486 Electronic parts conveying apparatus and method
08/16/2001EP1124232A2 Integrated semiconductor memory with redundant cells
08/16/2001EP1124136A1 Electrical connection testing device and method for connector terminals
08/16/2001EP1123639A2 Wafer level burn-in and test thermal chuck and method
08/16/2001EP1123515A1 Battery pack having a state of charge indicator
08/16/2001EP1123514A1 Remote test module for automatic test equipment
08/16/2001EP1123513A1 Integrated multi-channel analog test instrument architecture
08/16/2001EP1123512A1 High density printed circuit board
08/16/2001EP0728399B1 Method and apparatus for inspecting printed circuit boards at different magnifications
08/16/2001DE10105876A1 Anschlußstruktur und zugehöriges Herstellungsverfahren Terminal structure and manufacturing method thereof
08/16/2001DE10101067A1 Program execution system of semiconductor test device, has programs in processor which are written in exclusive and general purpose programming languages based on hardware for semiconductor examination
08/16/2001DE10006490A1 Prüfgerät Tester
08/16/2001DE10003839A1 Temperaturkammer Temperature chamber
08/15/2001CN2443388Y Square cell tester
08/15/2001CN2443387Y Switch circuit resistance tester
08/15/2001CN2443386Y Various parameter memory indicator
08/15/2001CN2443385Y Fireproof alarm
08/15/2001CN1308754A Bus-operational sensor device and corresponding test method
08/15/2001CN1308389A Electronic connection testing device and method for terminal
08/15/2001CN1308387A Interconnected contacts
08/15/2001CN1308336A Memory device
08/15/2001CN1308239A Light, digital and phonetic warning system for transformer station
08/14/2001US6275972 Method for accurate channel-length extraction in MOSFETs
08/14/2001US6275963 Test circuit and a redundancy circuit for an internal memory circuit
08/14/2001US6275962 Remote test module for automatic test equipment
08/14/2001US6275958 Fault detection in a redundant power converter
08/14/2001US6275428 Memory-embedded semiconductor integrated circuit device and method for testing same
08/14/2001US6275162 Method of displaying capacity using LEDs of the notebook computer system and the device of the same
08/14/2001US6275161 Method and apparatus for automotive battery condition indication
08/14/2001US6275081 Gated clock flip-flops
08/14/2001US6275060 Apparatus and method for measuring minority carrier lifetimes in semiconductor materials
08/14/2001US6275059 Method for testing and diagnosing MOS transistors
08/14/2001US6275058 Method and apparatus for properly disabling high current parts in a parallel test environment
08/14/2001US6275057 Semiconductor test system having high frequency and low jitter clock generator
08/14/2001US6275056 Prober device having a specific linear expansion coefficient and probe pitch and method of probing thereof
08/14/2001US6275055 Semiconductor integrated circuit
08/14/2001US6275052 Probe card and testing method for semiconductor wafers
08/14/2001US6275051 Segmented architecture for wafer test and burn-in
08/14/2001US6275043 Test device for testing a module for a data carrier intended for contactless communication
08/14/2001US6275042 Equipment for testing battery of electric device
08/14/2001US6275023 Semiconductor device tester and method for testing semiconductor device
08/14/2001US6275008 Battery capacity detection system with temperature correction
08/14/2001US6274950 Battery communication system
08/14/2001US6274823 Interconnection substrates with resilient contact structures on both sides
08/14/2001US6274501 Formation of structure to accurately measure source/drain resistance
08/14/2001US6274397 Method to preserve the testing chip for package's quality
08/14/2001US6274395 Method and apparatus for maintaining test data during fabrication of a semiconductor wafer
08/14/2001US6273747 Connector for a flat flexible cable
08/14/2001US6273605 Semiconductor wirebond machine leadframe thermal map system
08/14/2001US6273400 Semiconductor wafer testing structure
08/14/2001CA2234521C Method and apparatus for improving stuck-at fault detection in large scale integrated circuit testing
08/09/2001WO2001057668A1 Packet display, packet data creating device and method, and recorded medium
08/09/2001WO2001057545A1 Inspection apparatus and method adapted to a scanning technique employing a rolling wire probe
08/09/2001WO2001057544A1 Capacitance monitoring systems
08/09/2001WO2001057541A1 Adapter for testing printed circuit boards and testing needle for such an adapter
08/09/2001WO2001004610A3 Method and apparatus for sensitive measurement of the lifetime of minority carriers in semiconductor materials
08/09/2001US20010013111 Programmable timing circuit for testing the cycle time of functional circuits on an integrated circuit chip
08/09/2001US20010013092 Memory latency compensation
08/09/2001US20010012739 Composite microelectronic spring structure and method for making same
08/09/2001US20010012725 System for testing bare IC chips and a socket for such chips
08/09/2001US20010012704 Interconnect assemblies and methods
08/09/2001US20010012320 Jitter measuring device and method
08/09/2001US20010012243 Sound apparatus for vehicle
08/09/2001US20010012220 Method and apparatus for supplying regulated power to memory device components
08/09/2001US20010011911 Input buffer circuit for semiconductor device
08/09/2001US20010011906 Method of testing semiconductor integrated circuits and testing board for use therein
08/09/2001US20010011905 Semiconductor integrated circuit device and testing method therefor
08/09/2001US20010011904 Integrated circuit having a self-test device for carrying out a self-test of the integrated circuit
08/09/2001US20010011903 System and method for detecting defects within an electrical circuit by analyzing quiescent current
08/09/2001US20010011902 Low-current probe card
08/09/2001US20010011901 Loading mechanism for automated verification and repair station
08/09/2001US20010011899 Method for testing semiconductor wafers
08/09/2001US20010011898 IC socket, a test method using the same and an IC socket mounting mechanism
08/09/2001US20010011896 Contact probe arrangement
08/09/2001US20010011891 Diagnostic trailer center device
08/09/2001US20010011881 Power storage device and method of measuring voltage of storage battery
08/09/2001US20010011775 Interconnect structure of semiconductor device
08/09/2001US20010011762 Integrated circuit package alignment feature
08/09/2001US20010011724 Semiconductor testing device
08/09/2001DE10101961A1 Trägeridentifizierungssystem, Trägeridentifizierungsverfahren und Speichermedium Carrier identification system, vehicle identification method and storage medium
08/09/2001DE10053758A1 Error simulating process for semiconductor integrated circuit involves producing list of errors by using logic signal value sequence computed by logic simulation on every signaling line
08/09/2001DE10016127A1 Electrical circuit for testing integrated circuit components especially macro type electronic components, where one or more components can be tested independently of the other components, where data on the bus can be turned off
08/09/2001DE10005540A1 Verfahren zur Ortung von Teilentladungen an Transformatoren und ähnlichen Hochspannungsgeräten A method for location of partial discharges in transformers and similar high-voltage devices
08/09/2001DE10004974A1 Adapter for testing circuit boards comprises testing needles and two guide plate units which are laterally movable relative to one another for alignment of the respective guide holes for testing needles
08/09/2001DE10004649A1 Tuning method for signal delays on bus systems or networks between quick memory modules, involves selectively separating strip conductor run from certain capacitive load structures of printed circuit board
08/09/2001DE10002831A1 Verfahren und Vorrichtung zum Testen elektronischer Bauelemente Method and device for testing electronic components
08/09/2001DE10001340A1 Verfahren zur Meßfehlerkompensation bei der Stromerfassung in einem Energiespeicher A method of measurement error in the current detection in an energy storage
08/08/2001EP1122854A2 Power storage device and method of measuring voltage of storage battery
08/08/2001EP1122852A2 Electrical storage capacitor system having initializing function
08/08/2001EP1122547A2 Method and system for generating charge sharing test vectors
08/08/2001EP1122546A2 Scan test machine for densely spaced test sites
08/08/2001EP1122545A1 Audio device in a motor vehicle
08/08/2001EP1121603A1 Method and system for manufacturing lamp tiles
08/08/2001EP1121602A1 Improving multi-chip module testability using poled-polymer interlayer dielectrics
08/08/2001EP0570067B1 Control device for interface control between a test machine and multi-channel electronic circuitry, in particular acording to Boundary Test Standard
08/08/2001CN1307793A Assembly of an electronic component with spring packaging