Patents
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
08/2001
08/28/2001US6282676 Method and apparatus for testing and debugging integrated circuit devices
08/28/2001US6282592 Method and apparatus for high-speed data transmission bus entrainment
08/28/2001US6282506 Method of designing semiconductor integrated circuit
08/28/2001US6282121 Flash memory device with program status detection circuitry and the method thereof
08/28/2001US6281803 Control mat monitoring and warning apparatus and method
08/28/2001US6281699 Detector with common mode comparator for automatic test equipment
08/28/2001US6281698 LSI testing apparatus and timing calibration method for use therewith
08/28/2001US6281697 Semiconductor device evaluation apparatus
08/28/2001US6281695 Integrated circuit package pin indicator
08/28/2001US6281693 Semiconductor device test board and a method of testing a semiconductor device
08/28/2001US6281685 Cable shield fault locator
08/28/2001US6281684 Technique and apparatus to measure cell voltages of a fuel cell stack using different ground references
08/28/2001US6281683 Rapid determination of present and potential battery capacity
08/28/2001US6281029 Probe points for heat dissipation during testing of flip chip IC
08/28/2001US6280236 Testing system with bridge clip, and connector having a positive stop
08/28/2001US6280219 Socket apparatus for IC packages
08/28/2001US6279227 Method of forming a resilient contact structure
08/28/2001CA2321623A1 Interconnect contact
08/23/2001WO2001061754A1 Semiconductor device fabrication method and semiconductor device fabrication device
08/23/2001WO2001061745A2 Surface passivation method and arrangement for measuring the lifetime of minority carriers in semiconductors
08/23/2001WO2001061370A2 Method of measuring the battery level in a mobile telephone
08/23/2001WO2001061369A1 Lssd interface
08/23/2001WO2001061368A1 Tester and holder for tester
08/23/2001WO2001061364A2 Semiconductor component test socket
08/23/2001US20010016938 Inspection method and inspection system using charged particle beam
08/23/2001US20010016923 Program execution system for semiconductor testing apparatus
08/23/2001US20010016799 Oscillation measuring method and frequency measuring apparatus
08/23/2001US20010016435 IC socket for surface-monuting semiconductor device
08/23/2001US20010016420 Fix the glassivation layer's micro crack point precisely by using electroplating method
08/23/2001US20010015926 Semiconductor memory device and method for setting stress voltage
08/23/2001US20010015924 Test interface circuit and semiconductor integrated circuit device including the same
08/23/2001US20010015915 Programmable voltage divider and method for testing the impedance of a programmable element
08/23/2001US20010015725 System and method for adjusting image quality of liquid crystal display
08/23/2001US20010015655 Removable electrical interconnect apparatuses and removable engagement probes
08/23/2001US20010015654 Apparatus and method for disabling and re-enabling access to IC test functions
08/23/2001US20010015653 Integrated circuit with test interface
08/23/2001US20010015652 Probe card assembly and kit, and methods of making same
08/23/2001US20010015651 Test head assembly utilizing replaceable silicon contact
08/23/2001US20010015647 Method and apparatus for measuring insulation resistance
08/23/2001US20010015641 Circuit board testing apparatus
08/23/2001DE10063102A1 Anordnung und Messung interner Spannungen in einer integrierten Halbleitervorrichtung Arrangement and measurement of internal stresses in an integrated semiconductor device
08/23/2001DE10007843A1 Measuring device performs electromagnetic interference measurement within frequency range of 30 megahertz to 3 gigahertz via tube coupler
08/23/2001DE10006867A1 Diagnosevorrichtung Diagnostic device
08/22/2001EP1126609A1 Circuit for generating signal pulses with defined pulse length in a device with BIST-function
08/22/2001EP1126572A2 Arc fault detector responsive to average instantaneous current and step increases in current and circuit breaker incorporating same
08/22/2001EP1126283A1 A method for estimating the location of a cable break including means to measure resistive fault levels for cable sections
08/22/2001EP1126282A1 Battery voltage detector
08/22/2001EP1126280A1 A press assembly for electrically testing a printed circuit board
08/22/2001EP1125793A2 Vehicle mounted electrical component
08/22/2001EP1125330A1 Method of creating an electrical interconnect device bearing an array of electrical contact pads
08/22/2001EP1125142A1 Device for and method of preventing bus contention
08/22/2001EP1125141A1 Device for and method of preventing bus contention
08/22/2001EP1125140A1 Integrated circuit tester with disk-based data streaming
08/22/2001EP1125116A1 Apparatus and method for detecting memory effect in nickel-cadmium batteries
08/22/2001EP1125103A1 Vehicle diagnostics interface apparatus
08/22/2001EP1084418A4 Turning center with integrated non-contact inspection system
08/22/2001EP0834082B1 Performance driven bist technique
08/22/2001CN2444245Y Multfunctional electric checker
08/22/2001CN1309773A System for digital measurement of breakdown voltage of high-voltage samples
08/22/2001CN1309525A 印刷电路板 A printed circuit board
08/22/2001CN1309422A Method and device for testing integrated circuit
08/22/2001CN1309300A Method and probe for searching single-phase grounding failure
08/22/2001CN1309299A Method for testing electronic element
08/22/2001CN1069973C Method for detecting fault of uninterrupted power source in fire-fighting equipment and circuit for carrying out same
08/21/2001US6279144 Provably correct storage arrays
08/21/2001US6279115 Circuit arrangement for monitoring of an electric tripping device for low-voltage switches
08/21/2001US6278964 Hot carrier effect simulation for integrated circuits
08/21/2001US6278956 Method of locating a failed latch in a defective shift register
08/21/2001US6278919 Apparatus for diagnosing and indicating operational failure in automobiles
08/21/2001US6278797 Apparatus for inspecting land-attached circuit board
08/21/2001US6278730 Non-invasive digital cable test system
08/21/2001US6278628 Semiconductor integrated circuit
08/21/2001US6278331 System and method for compensating wafer parameters
08/21/2001US6278285 Configuration for testing integrated components
08/21/2001US6278284 Testing IC socket
08/21/2001US6278280 Battery inactivation detection device
08/21/2001US6278279 Path test for a DC battery back-up system
08/21/2001US6278257 Method for detecting abnormal cell
08/21/2001US6278097 Burn-in apparatus for burning-in microwave transistors
08/21/2001US6278052 Abnormality detection method, abnormality detection apparatus and solar cell power generating system using the same
08/21/2001US6277660 Method and apparatus for testing chips
08/21/2001US6276949 Socket for IC package
08/21/2001CA2212167C Measuring system for enclosed high-voltage switchgear
08/21/2001CA2211365C Condition tester for a battery
08/16/2001WO2001059790A1 Testable rom chip for a data memory redundant logic
08/16/2001WO2001059469A1 Tester and testing method, and testing unit
08/16/2001WO2001059466A1 Testing arrangement and testing method
08/16/2001WO2001059443A1 Storage battery with integral battery tester
08/16/2001WO2000077529B1 Method and apparatus for testing a video display chip
08/16/2001US20010014959 Probeless testing of pad buffers on wafer
08/16/2001US20010014952 Electronic apparatus, control circuit for electronic apparatus, and method of controlling electronic apparatus
08/16/2001US20010014556 Packaging and interconnection of contact structure
08/16/2001US20010013792 Induction machine asmmetry detection instrument and method
08/16/2001US20010013791 Method for inspecting an integrated circuit
08/16/2001US20010013790 Semiconductor device having a connection inspecting circuit for inspecting connections of power source terminals and grounding terminals, and inspection method for the same
08/16/2001US20010013789 Method and system for utilizing multiple thermocouples to obtain a temperature contour map
08/16/2001US20010013787 Needle load measuring method, needle load setting method and needle load detecting mechanism
08/16/2001US20010013786 Apparatus and method for evaluating printed circuit board assembly manufacturing processes
08/16/2001US20010013785 System and method for tuning a resonant structure
08/16/2001US20010013783 Circuit board testing apparatus and method