Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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09/05/2001 | CN2446614Y Fiber-optical conductor of current transformer signal |
09/05/2001 | CN2446525Y Sempling circuit of radio fault tester for high voltage transmission line |
09/05/2001 | CN2446524Y 传输线测量装置 Transmission line measuring device |
09/05/2001 | CN2446523Y Earphone type multifunctional test pencil |
09/05/2001 | CN1311970A GSM transceiver unit equiped for time of arrival measurements |
09/05/2001 | CN1311942A Mobile communication unit with bone conduction speaker |
09/05/2001 | CN1311860A Means for estimating charged state of battery and method for estimating degraded state of battery |
09/05/2001 | CN1311442A Monitoring signal output circuit, batteries and battery voltage monitoring circuit and method therefor |
09/05/2001 | CN1311441A Method for testing earthing resistance |
09/05/2001 | CN1311434A Device for detecting fault of gas insulation electric appliance |
09/05/2001 | CN1070612C Method for locating a single-phase ground fault in a powder distribution network |
09/04/2001 | US6286121 Semiconductor device |
09/04/2001 | US6286120 Memory architecture for automatic test equipment using vector module table |
09/04/2001 | US6286119 Delay fault testing with IEEE 1149.1 |
09/04/2001 | US6286118 Scan path circuitry including a programmable delay circuit |
09/04/2001 | US6286117 Circuits and methods for testing logic devices by modulating a test voltage with a noise signal |
09/04/2001 | US6286114 Enhanced embedded logic analyzer |
09/04/2001 | US6285973 Apparatus for, and method of, calculating electromagnetic field strength and medium for recording program to achieve the method |
09/04/2001 | US6285963 Measuring signals in a tester system |
09/04/2001 | US6285962 Method and system for testing rambus memory modules |
09/04/2001 | US6285957 Apparatus and method for calculating the strength of an electromagnetic field radiated from an electric device |
09/04/2001 | US6285914 Verification method by means of comparing internal state traces |
09/04/2001 | US6285653 Method and apparatus to measure far end crosstalk for the determination of equal level far end crosstalk |
09/04/2001 | US6285610 Burn-in test circuit |
09/04/2001 | US6285538 Partial discharge coupler |
09/04/2001 | US6285207 Method and apparatus for testing an electrically conductive substrate |
09/04/2001 | US6285206 Comparator circuit |
09/04/2001 | US6285204 Method for testing semiconductor packages using oxide penetrating test contacts |
09/04/2001 | US6285203 Test system having alignment member for aligning semiconductor components |
09/04/2001 | US6285201 Method and apparatus for capacitively testing a semiconductor die |
09/04/2001 | US6285200 Apparatus and method for testing integrated circuit devices |
09/04/2001 | US6285199 Device and method for optimally detecting a surface condition of wafers |
09/04/2001 | US6285196 Process for the electrical testing of the base material for the manufacture of printed circuit boards |
09/04/2001 | US6285195 Time domain reflectometry apparatus and method |
09/04/2001 | US6285193 Method of measuring insulation resistance of capacitor and apparatus for screening characteristics |
09/04/2001 | US6285191 Measurement of current in a vehicle using battery cable as a shunt |
09/04/2001 | US6285181 Method and system for determining the location of an open circuit in a semiconductor device using power modulation |
09/04/2001 | US6285164 Means for detecting the integrated value of current flow, a means for detecting the value of current flow and a battery pack employing those means |
09/04/2001 | US6285163 Means for estimating charged state of battery and method for estimating degraded state of battery |
09/04/2001 | US6285139 Non-linear light-emitting load current control |
09/04/2001 | US6285040 Internal-logic inspection circuit |
09/04/2001 | US6285036 Endpoint detection for thinning of silicon of a flip chip bonded integrated circuit |
09/04/2001 | US6283695 Tray conveying apparatus and method |
09/04/2001 | US6283631 Electronic device for modeling the temperature of a motor |
09/04/2001 | US6283464 Adjustable tooling pin for a card test fixture |
09/04/2001 | CA2239664C Tone location device for locating faults in a paired line |
09/01/2001 | CA2321807A1 Low-loss microwave device test fixture |
09/01/2001 | CA2311620A1 Adaptable pre-matched tuner system and method |
08/30/2001 | WO2001063660A1 Apparatus for detecting defect in device and method of detecting defect |
08/30/2001 | WO2001063580A1 Method and system for monitoring |
08/30/2001 | WO2001063311A2 Method and system for wafer and device-level testing of an integrated circuit |
08/30/2001 | WO2001063310A1 Integrated circuit with test interface |
08/30/2001 | WO2001063309A1 Device for monitoring and forecasting the probability of inductive proximity sensor failure |
08/30/2001 | WO2001063308A1 Membrane probing system |
08/30/2001 | WO2001063307A1 Inspection apparatus and sensor |
08/30/2001 | WO2001063306A1 Circuit for detecting leakage in power supply |
08/30/2001 | WO2001063305A1 Method for measuring electrical characteristics of a telecommunication cable |
08/30/2001 | WO2001063304A2 Method and apparatus for isolated thermal fault finding in electronic components |
08/30/2001 | WO2001063301A2 Electromechanical apparatus for testing ic chips using first and second sets of substrates which are pressed together |
08/30/2001 | WO2001028064A3 Battery management system |
08/30/2001 | WO2001009980A3 Controlled compliance fine pitch interconnect |
08/30/2001 | WO2000049421A9 Testing integrated circuit dice |
08/30/2001 | WO2000039598A9 Internal unbalance detection in capacitors |
08/30/2001 | US20010018754 Configuration for generating signal impulses of defined lengths in a module with a bist-function |
08/30/2001 | US20010018647 Method and system for creating a netlist allowing current measurement through a sub-circuit |
08/30/2001 | US20010017878 Method of inspecting pattern and inspecting instrument |
08/30/2001 | US20010017814 Semiconductor integrated circuit device with test interface circuit for performing test on embedded memory from outside |
08/30/2001 | US20010017804 Semiconductor device, semiconductor memory device and test-mode entry method |
08/30/2001 | US20010017802 Semiconductor device and semiconductor device testing method |
08/30/2001 | US20010017552 Semiconductor device and semiconductor device testing method |
08/30/2001 | US20010017550 Method and apparatus for capacitively testing a semiconductor die |
08/30/2001 | US20010017549 Probe and method for examining electrical characteristics of devices |
08/30/2001 | US20010017547 Tape-like member transfer system |
08/30/2001 | US20010017546 Antifuse repair circuit |
08/30/2001 | US20010017533 Method of displaying full-charge-state |
08/30/2001 | US20010017262 Failure determining apparatus of gas-insulated electrical appliance |
08/30/2001 | DE10109506A1 Method for connecting integrated circuit test head to automatic handling device, with improved pipe connection, allowing low temperature testing of ICs by supply of carbon dioxide vapor to test head |
08/30/2001 | DE10103316A1 Verfahren zum Anzeigen des Volladungszustands How to display Volladungszustands |
08/30/2001 | DE10008354A1 Method for determining state of charge of lead battery based on fixed correlation between no-load voltage and state of charge |
08/30/2001 | DE10005618A1 Integrierter Halbleiterspeicher mit redundanter Einheit von Speicherzellen Integrated semiconductor memory with a redundant unit of the memory cells |
08/30/2001 | CA2400218A1 Method for measuring electrical characteristics of a telecommunication cable |
08/30/2001 | CA2400062A1 Device for monitoring and forecasting the probability of inductive proximity sensor failure |
08/29/2001 | EP1128479A2 Interconnect contact |
08/29/2001 | EP1128424A2 Test structure close to integrated semiconductor |
08/29/2001 | EP1128390A1 Scan structure for CMOS storage elements |
08/29/2001 | EP1128293A2 Modelling non-linear devices |
08/29/2001 | EP1128187A2 Method for determining the state of charge of lead accumulators |
08/29/2001 | EP1128186A1 Test apparatus for wire harnesses |
08/29/2001 | EP1127423A1 Measurement of nonlinear distortion in transmitters |
08/29/2001 | EP1127323A1 Method and arrangement for comparing a first characteristic with given characteristics of a technical system |
08/29/2001 | EP1127280A2 Electronic monitoring device for a multipart electrical energy storage unit |
08/29/2001 | EP1055238B1 Circuit and method for testing a digital semi-conductor circuit |
08/29/2001 | EP0575399B1 Interactive diagnostic system for an automotive vehicle, and method |
08/29/2001 | CN2445335Y Portable pollution electric insulator current leakage detecting instrument |
08/29/2001 | CN2445334Y On-line monitoring device for current leakage of lightning protector |
08/29/2001 | CN1310800A Method and system for performance testing of rotating machines |
08/28/2001 | US6282682 Automatic test equipment using sigma delta modulation to create reference levels |
08/28/2001 | US6282681 Method and apparatus for testing finite state machine (FSM) conformance utilizing unique input/output sequence (UIO) sets |
08/28/2001 | US6282680 Semiconductor device |
08/28/2001 | US6282679 Pattern and method of metal line package level test for semiconductor device |