Patents
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
09/2001
09/05/2001CN2446614Y Fiber-optical conductor of current transformer signal
09/05/2001CN2446525Y Sempling circuit of radio fault tester for high voltage transmission line
09/05/2001CN2446524Y 传输线测量装置 Transmission line measuring device
09/05/2001CN2446523Y Earphone type multifunctional test pencil
09/05/2001CN1311970A GSM transceiver unit equiped for time of arrival measurements
09/05/2001CN1311942A Mobile communication unit with bone conduction speaker
09/05/2001CN1311860A Means for estimating charged state of battery and method for estimating degraded state of battery
09/05/2001CN1311442A Monitoring signal output circuit, batteries and battery voltage monitoring circuit and method therefor
09/05/2001CN1311441A Method for testing earthing resistance
09/05/2001CN1311434A Device for detecting fault of gas insulation electric appliance
09/05/2001CN1070612C Method for locating a single-phase ground fault in a powder distribution network
09/04/2001US6286121 Semiconductor device
09/04/2001US6286120 Memory architecture for automatic test equipment using vector module table
09/04/2001US6286119 Delay fault testing with IEEE 1149.1
09/04/2001US6286118 Scan path circuitry including a programmable delay circuit
09/04/2001US6286117 Circuits and methods for testing logic devices by modulating a test voltage with a noise signal
09/04/2001US6286114 Enhanced embedded logic analyzer
09/04/2001US6285973 Apparatus for, and method of, calculating electromagnetic field strength and medium for recording program to achieve the method
09/04/2001US6285963 Measuring signals in a tester system
09/04/2001US6285962 Method and system for testing rambus memory modules
09/04/2001US6285957 Apparatus and method for calculating the strength of an electromagnetic field radiated from an electric device
09/04/2001US6285914 Verification method by means of comparing internal state traces
09/04/2001US6285653 Method and apparatus to measure far end crosstalk for the determination of equal level far end crosstalk
09/04/2001US6285610 Burn-in test circuit
09/04/2001US6285538 Partial discharge coupler
09/04/2001US6285207 Method and apparatus for testing an electrically conductive substrate
09/04/2001US6285206 Comparator circuit
09/04/2001US6285204 Method for testing semiconductor packages using oxide penetrating test contacts
09/04/2001US6285203 Test system having alignment member for aligning semiconductor components
09/04/2001US6285201 Method and apparatus for capacitively testing a semiconductor die
09/04/2001US6285200 Apparatus and method for testing integrated circuit devices
09/04/2001US6285199 Device and method for optimally detecting a surface condition of wafers
09/04/2001US6285196 Process for the electrical testing of the base material for the manufacture of printed circuit boards
09/04/2001US6285195 Time domain reflectometry apparatus and method
09/04/2001US6285193 Method of measuring insulation resistance of capacitor and apparatus for screening characteristics
09/04/2001US6285191 Measurement of current in a vehicle using battery cable as a shunt
09/04/2001US6285181 Method and system for determining the location of an open circuit in a semiconductor device using power modulation
09/04/2001US6285164 Means for detecting the integrated value of current flow, a means for detecting the value of current flow and a battery pack employing those means
09/04/2001US6285163 Means for estimating charged state of battery and method for estimating degraded state of battery
09/04/2001US6285139 Non-linear light-emitting load current control
09/04/2001US6285040 Internal-logic inspection circuit
09/04/2001US6285036 Endpoint detection for thinning of silicon of a flip chip bonded integrated circuit
09/04/2001US6283695 Tray conveying apparatus and method
09/04/2001US6283631 Electronic device for modeling the temperature of a motor
09/04/2001US6283464 Adjustable tooling pin for a card test fixture
09/04/2001CA2239664C Tone location device for locating faults in a paired line
09/01/2001CA2321807A1 Low-loss microwave device test fixture
09/01/2001CA2311620A1 Adaptable pre-matched tuner system and method
08/2001
08/30/2001WO2001063660A1 Apparatus for detecting defect in device and method of detecting defect
08/30/2001WO2001063580A1 Method and system for monitoring
08/30/2001WO2001063311A2 Method and system for wafer and device-level testing of an integrated circuit
08/30/2001WO2001063310A1 Integrated circuit with test interface
08/30/2001WO2001063309A1 Device for monitoring and forecasting the probability of inductive proximity sensor failure
08/30/2001WO2001063308A1 Membrane probing system
08/30/2001WO2001063307A1 Inspection apparatus and sensor
08/30/2001WO2001063306A1 Circuit for detecting leakage in power supply
08/30/2001WO2001063305A1 Method for measuring electrical characteristics of a telecommunication cable
08/30/2001WO2001063304A2 Method and apparatus for isolated thermal fault finding in electronic components
08/30/2001WO2001063301A2 Electromechanical apparatus for testing ic chips using first and second sets of substrates which are pressed together
08/30/2001WO2001028064A3 Battery management system
08/30/2001WO2001009980A3 Controlled compliance fine pitch interconnect
08/30/2001WO2000049421A9 Testing integrated circuit dice
08/30/2001WO2000039598A9 Internal unbalance detection in capacitors
08/30/2001US20010018754 Configuration for generating signal impulses of defined lengths in a module with a bist-function
08/30/2001US20010018647 Method and system for creating a netlist allowing current measurement through a sub-circuit
08/30/2001US20010017878 Method of inspecting pattern and inspecting instrument
08/30/2001US20010017814 Semiconductor integrated circuit device with test interface circuit for performing test on embedded memory from outside
08/30/2001US20010017804 Semiconductor device, semiconductor memory device and test-mode entry method
08/30/2001US20010017802 Semiconductor device and semiconductor device testing method
08/30/2001US20010017552 Semiconductor device and semiconductor device testing method
08/30/2001US20010017550 Method and apparatus for capacitively testing a semiconductor die
08/30/2001US20010017549 Probe and method for examining electrical characteristics of devices
08/30/2001US20010017547 Tape-like member transfer system
08/30/2001US20010017546 Antifuse repair circuit
08/30/2001US20010017533 Method of displaying full-charge-state
08/30/2001US20010017262 Failure determining apparatus of gas-insulated electrical appliance
08/30/2001DE10109506A1 Method for connecting integrated circuit test head to automatic handling device, with improved pipe connection, allowing low temperature testing of ICs by supply of carbon dioxide vapor to test head
08/30/2001DE10103316A1 Verfahren zum Anzeigen des Volladungszustands How to display Volladungszustands
08/30/2001DE10008354A1 Method for determining state of charge of lead battery based on fixed correlation between no-load voltage and state of charge
08/30/2001DE10005618A1 Integrierter Halbleiterspeicher mit redundanter Einheit von Speicherzellen Integrated semiconductor memory with a redundant unit of the memory cells
08/30/2001CA2400218A1 Method for measuring electrical characteristics of a telecommunication cable
08/30/2001CA2400062A1 Device for monitoring and forecasting the probability of inductive proximity sensor failure
08/29/2001EP1128479A2 Interconnect contact
08/29/2001EP1128424A2 Test structure close to integrated semiconductor
08/29/2001EP1128390A1 Scan structure for CMOS storage elements
08/29/2001EP1128293A2 Modelling non-linear devices
08/29/2001EP1128187A2 Method for determining the state of charge of lead accumulators
08/29/2001EP1128186A1 Test apparatus for wire harnesses
08/29/2001EP1127423A1 Measurement of nonlinear distortion in transmitters
08/29/2001EP1127323A1 Method and arrangement for comparing a first characteristic with given characteristics of a technical system
08/29/2001EP1127280A2 Electronic monitoring device for a multipart electrical energy storage unit
08/29/2001EP1055238B1 Circuit and method for testing a digital semi-conductor circuit
08/29/2001EP0575399B1 Interactive diagnostic system for an automotive vehicle, and method
08/29/2001CN2445335Y Portable pollution electric insulator current leakage detecting instrument
08/29/2001CN2445334Y On-line monitoring device for current leakage of lightning protector
08/29/2001CN1310800A Method and system for performance testing of rotating machines
08/28/2001US6282682 Automatic test equipment using sigma delta modulation to create reference levels
08/28/2001US6282681 Method and apparatus for testing finite state machine (FSM) conformance utilizing unique input/output sequence (UIO) sets
08/28/2001US6282680 Semiconductor device
08/28/2001US6282679 Pattern and method of metal line package level test for semiconductor device