Patents
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
09/2001
09/12/2001EP1132746A2 Failure determining apparatus of gas insulated electrical appliance
09/12/2001EP1132745A2 Electromagnetic interference analysis method and apparatus
09/12/2001EP1131871A1 Instantaneous arc fault light detector with resistance to false tripping
09/12/2001EP1131646A1 Battery power source protecting device for an electromotive device
09/12/2001EP1131645A1 A skew calibration means and method of skew calibration
09/12/2001EP1131644A2 Dynamic register with low clock rate testing capability
09/12/2001EP1131643A1 Method for correcting frequency- and length-dependent line attenuation for fdr-measurements carried out on high-frequency cables
09/12/2001EP1131642A1 Method for determining an earth-faulted branch
09/12/2001EP1101287A4 Low charge injection mosfet switch
09/12/2001EP0890112B1 Testing electrical installations
09/12/2001EP0834124B1 Parallel testing of cpu cache and instruction units
09/12/2001EP0739512B1 Self-resetting bypass control for scan test
09/12/2001CN2447796Y Brushless DC machine position detecting device
09/12/2001CN1312911A Non-contact test method and apparatus
09/12/2001CN1312910A Holder of electroconductive contactor and method for producing same
09/12/2001CN1312596A Method for display cell fully-charged
09/12/2001CN1312472A Synchronous transient-process recording method and device
09/12/2001CN1071057C Battery charging apparatus
09/11/2001US6289480 Circuitry for handling high impedance busses in a scan implementation
09/11/2001US6289479 Circuit to prevent inadvertent test mode entry
09/11/2001US6289478 Data processing apparatus for IC tester
09/11/2001US6289477 Fast-scan-flop and integrated circuit device incorporating the same
09/11/2001US6289476 Method and apparatus for testing the timing of integrated circuits
09/11/2001US6289472 Method and test system for testing under a plurality of test modes
09/11/2001US6289469 Semiconductor integrated circuit having a plurality of processing circuits respectively executing necessary processes and a plurality of data holding circuits corresponding to the processing circuits
09/11/2001US6289295 Scannable circuits, systems, and methods implementing transistors having differing threshold voltages
09/11/2001US6289293 Device and method for testing input-output ports
09/11/2001US6289292 System for identifying a component with physical characterization
09/11/2001US6289290 Method for estimating radiated emission level from an EUT at an arbitrary position on the turn table at OATS
09/11/2001US6289058 Method and circuit arrangement for detecting short pulses of a digital input signal
09/11/2001US6289047 Dynamic regulation of power consumption of a high-speed communication system
09/11/2001US6288958 Semiconductor storage device and burn-in test method
09/11/2001US6288956 Semiconductor device having test function
09/11/2001US6288955 Methods and systems for testing integrated circuit memory devices by overlappiing test result loading and test result analysis
09/11/2001US6288782 Method for characterizing defects on semiconductor wafers
09/11/2001US6288562 Test pin for a printed circuit board
09/11/2001US6288561 Method and apparatus for probing, testing, burn-in, repairing and programming of integrated circuits in a closed environment using a single apparatus
09/11/2001US6288560 Self-soldering integrated circuit probe assembly
09/11/2001US6288559 Semiconductor testing using electrically conductive adhesives
09/11/2001US6288558 Method for probing semiconductor devices for active measuring of electrical characteristics
09/11/2001US6288557 Probe station having inner and outer shielding
09/11/2001US6288552 GMR sensor tester for heated window grids
09/11/2001US6288549 Uninterruptible power supply modular battery test panel
09/11/2001US6288530 Apparatus and method for measuring resonance frequency of electric circuit
09/11/2001US6288393 Automated method of circuit analysis
09/11/2001US6288371 Temperature controlled high power burn-in board heat sinks
09/11/2001US6288346 System and method for easily inspecting a bonded state of a BGA/CSP type electronic part to a board
09/11/2001US6287880 Method and apparatus for high resolution profiling in semiconductor structures
09/11/2001US6287878 Method of fabricating chip scale package
09/11/2001US6287877 Electrically quantifying transistor spacer width
09/11/2001US6287127 Electrical socket apparatus
09/07/2001WO2001065653A1 Gas insulated device and failure rating method
09/07/2001WO2001065627A1 Battery and maintenance service system for power supply device
09/07/2001WO2001064389A2 Vertical counter balanced test head manipulator
09/07/2001WO2001035111B1 METHOD AND APPARATUS FOR ANALYZING AN AgZn BATTERY
09/07/2001WO2001009635A3 Apparatus having a single sensor for locating a concealed conductor energized by an alternating electric field
09/07/2001WO2001001247A3 Semiconductor parallel tester
09/07/2001WO2000073905A3 Test interface for electronic circuits
09/07/2001EP1145033A3 Apparatus having a single sensor for locating a concealed conductor energized by an alternating electric field
09/06/2001US20010020283 Method and apparatus for sampling a power supply current of an integrated circuit, and storage medium onto which is recorded a control program therefor
09/06/2001US20010019584 System and method for high-speed decoding and ISI compensation in a multi-pair transceiver system
09/06/2001US20010019510 Method and device for refreshing the memory content of a memory cell of a read-only memory
09/06/2001US20010019313 Waveform generator and testing device
09/06/2001US20010019291 Semiconductor integrated circuit and semiconductor device
09/06/2001US20010019284 Integrated circuit
09/06/2001US20010019280 Method and circuit to perform a trimming phase
09/06/2001US20010019277 Method and device for testing electronic components
09/06/2001US20010019275 Method for testing integrated circuit devices
09/06/2001US20010019274 Current detecting circuit and current detecting method
09/06/2001US20010019270 Short circuit inspection method for battery and method of manufacturing batteries
09/06/2001US20010019269 Battery voltage detection apparatus and detection method
09/06/2001US20010019169 Electronic device with double-wire bonding, manufacturing method thereof, and method for checking intactness of bonding wires of this electronic device
09/06/2001US20010019124 Semiconductor device measuring socket capable of adjusting contact positions, and semiconductor device manufacturing method using the same
09/06/2001DE19961148C1 Integrated electronic module for influencing external functions
09/06/2001DE10006236A1 Anordnung zum Generieren von Signalimpulsen mit definierten Pulslängen in einem Baustein mit BIST-Funktion Arrangement for generating signal pulses with pulse lengths defined in a block with BIST function
09/05/2001EP1130669A1 Short circuit inspection method for battery and method of manufacturing batteries
09/05/2001EP1130519A2 System and method for automatically configuring an emulation system
09/05/2001EP1130501A1 Dynamically configurable debut port for concurrent support of debug functions from multiple data processing cores
09/05/2001EP1130410A2 Scan path constructing program and method, and arithmetic processing system in which said scan paths are integrated
09/05/2001EP1130409A2 Boundary scan path method and system
09/05/2001EP1130408A2 Method and apparatus for adaptation/adjustment of the delay time of signal between integrated circuits in networks or line systems
09/05/2001EP1130407A2 High frequency component, communication apparatus, and method for measuring characteristics of high frequency components
09/05/2001EP1130406A2 Method and equipment for testing a piece
09/05/2001EP1130405A1 Battery voltage monitor method
09/05/2001EP1129553A2 Multi-pair gigabit ethernet transceiver
09/05/2001EP1129551A1 Point-to-point link implemented over a broadcast network
09/05/2001EP1129521A2 Fir filter structure with low latency for gigabit ethernet applications
09/05/2001EP1129515A1 Method and device for detecting the disconnection of a fuse
09/05/2001EP1129454A1 Method of testing a memory
09/05/2001EP1129432A1 Method for comparing recorded pixel images representing equipotential lines of at least an integrated circuit chip
09/05/2001EP1129415A1 Automatic generation of user definable memory bist circuitry
09/05/2001EP1129408A1 Microcomputer with test instruction memory
09/05/2001EP1129407A1 Method and installation for fast fault localization in an integrated circuit
09/05/2001EP1129365A1 Method for locating faulty elements in an integrated circuit
09/05/2001EP1129364A1 An apparatus for performing electrical and environmental tests on electronic semiconductor devices
09/05/2001EP1129363A1 Instruction processing pattern generator controlling an integrated circuit tester
09/05/2001EP1129362A1 Method and apparatus for minimizing semiconductor wafer arcing during semiconductor wafer processing
09/05/2001EP1129343A1 Method and apparatus for determining battery properties from complex impedance/admittance
09/05/2001EP0811167B1 Manipulator for automatic test equipment test head
09/05/2001EP0629868B1 Flat panel display device and method of inspection of same