Patents
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
09/2001
09/20/2001US20010023176 System for measuring a radio frequency signal in a wireless station and a wiring board switch
09/20/2001US20010022743 Semiconductor integrated circuit device
09/20/2001US20010022568 Driving module for a liquid crystal display panel and a liquid crystal display device having the same
09/20/2001US20010022518 Capacity estimation method, degradation estimation method and degradation estimation apparatus for lithium-ion cells, and lithium-ion batteries
09/20/2001US20010022510 Electrical storage capacitor system having initializing function
09/20/2001US20010022360 Test structure in an integrated semiconductor
09/20/2001US20010022345 Method of inspecting holes using charged-particle beam
09/20/2001US20010022340 Electro-optic probe
09/20/2001US20010022339 Probe signal outputting apparatus
09/20/2001US20010022338 Probe signal outputting apparatus
09/20/2001DE10109385A1 Kalibrierungsverfahren und -vorrichtung für Fassungen Calibration method and apparatus for sockets
09/20/2001DE10014434A1 Elektrische Schaltungsanordnung zur Überprüfung von Leitungen und elektrischen Komponenten Electrical circuit arrangement for testing lines and electrical components
09/20/2001DE10012023A1 Monitoring function of visual display involves detecting defect in visual display and outputting signal detectable by vehicle driver, e.g. steering wheel vibrations, if display defective
09/20/2001DE10011345A1 High voltage test system has two contact probes in which every electrode has associated high voltage cabling and high voltage switching arrangement
09/20/2001DE10011179A1 Determining temperature of semiconductor memory chip
09/20/2001CA2406510A1 Method and system for communication of data via an optimum data path in a network
09/20/2001CA2403437A1 Method and system for controlling data traffic in a network
09/19/2001EP1134801A2 Method of fabrication and testing of electronic circuit structures in a semiconducting substrate
09/19/2001EP1134676A1 A method, apparatus and computer program product for determination of noise in mixed signal systems
09/19/2001EP1134661A1 Method for analysing a program for testing electronic components
09/19/2001EP1134660A2 Test mode entering in an integrated circuit for use in floppy disk drive apparatus
09/19/2001EP1134591A1 A system for measuring a radio frequency signal in a wireless station and a wiring board switch
09/19/2001EP1134590A1 Electrical device for testing lines and electrical components
09/19/2001EP1134589A2 Method for detecting a faulty earth connection e.g. in a vehicle
09/19/2001EP1133702A1 A reconfigurable integrated circuit with integrated debugging facilities for use in an emulation system
09/19/2001EP1133701A1 Method for diagnosing insulation degradation in underground cable
09/19/2001EP1032846B1 Diagnostic device for recognizing short circuits or line interruptions of an inductive sensor
09/19/2001EP0965047B1 Method and device for identifying the system parameters stator resistance and rotor resistance of a transmitter-free induction machine operated in a field-oriented manner
09/19/2001EP0890110B1 Process for testing the ground contact of parts of a networked system
09/19/2001EP0765256B1 Anti-theft battery
09/19/2001CN2449241Y Accumulator monitor for communication equipment room
09/19/2001CN2449240Y Minibulb current tester
09/19/2001CN2449239Y 电子晶体测试头 Electron crystallography test head
09/19/2001CN2449238Y Plug-in die for testing
09/19/2001CN2449237Y Dispersed relay microcomputer protection tester
09/19/2001CN2448789Y Secondary cell sorting conveyer
09/19/2001CN1313722A Multi-layer printed circuit board and method for measuring impendance thereof
09/19/2001CN1313655A Socket for electric component
09/19/2001CN1313650A Using system and use of secondary battery
09/19/2001CN1071455C Intelligent high-voltage megohmmeter with automatic shifter
09/18/2001US6292916 Parallel backtracing for satisfiability on reconfigurable hardware
09/18/2001US6292915 Method of design for testability and method of test sequence generation
09/18/2001US6292911 Error detection scheme for a high-speed data channel
09/18/2001US6292765 Method for automatically searching for functional defects in a description of a circuit
09/18/2001US6292762 Method for determining a random permutation of variables by applying a test function
09/18/2001US6292541 Line shunt and ground fault apparatus method
09/18/2001US6292524 Counting apparatus and rotation stopped detection apparatus which uses a counting apparatus
09/18/2001US6292522 Frequency decoder databank for phase-locked loop
09/18/2001US6292415 Enhancements in testing devices on burn-in boards
09/18/2001US6292342 Voltage protection circuit for semiconductor test system
09/18/2001US6292337 Electrical system with arc protection
09/18/2001US6292182 Liquid crystal display module driving circuit
09/18/2001US6292026 Semiconductor device and electronic apparatus using the same
09/18/2001US6292011 Method for measuring collector and emitter breakdown voltage of bipolar transistor
09/18/2001US6292010 Dynamic pin driver combining high voltage mode and high speed mode
09/18/2001US6292009 Reduced terminal testing system
09/18/2001US6292008 Circuit configuration for burn-in systems for testing modules by using a board
09/18/2001US6292006 Method for preventing condensation on handler board during semiconductor device testing
09/18/2001US6292005 Probe card for IC testing apparatus
09/18/2001US6292002 Crystal resonant frequency sensor
09/18/2001US6291987 Method and system for detecting incipient failures in a power inverter
09/18/2001US6291981 Automatic test equipment with narrow output pulses
09/18/2001US6291980 High-resolution measurement of phase shifts in high frequency phase modulators
09/18/2001US6291979 Apparatus for and method of detecting a delay fault
09/18/2001US6291978 System and method for detecting shorts, opens and connected pins on a printed circuit board using automatic test equipment
09/18/2001US6291971 Method and apparatus for determining the charge balance of a storage battery for an operating system having a plurality of electrical consumers
09/18/2001US6291834 Semiconductor device and testing method therefor
09/18/2001US6291096 Pass/fail battery indicator and tester
09/14/2001CA2340981A1 Method for the analysis of a test software tool
09/13/2001WO2001067601A2 Test circuit configuration and method for testing a large number of transistors
09/13/2001WO2001067576A2 Connection tester for an electronic trip unit
09/13/2001WO2001067507A1 Test circuit arrangement and a method for testing a plurality of electric components
09/13/2001WO2001067471A1 Method for diagnosing abnormal condition of isolation transformer and device therefor
09/13/2001WO2001067116A2 Temperature compensated vertical pin probing device
09/13/2001WO2001067071A2 Evaluating a property of a multilayered structure
09/13/2001US20010021990 Method of edsigning semiconductor integrated circuit
09/13/2001US20010021988 Semiconductor testing apparatus for testing semiconductor device including built in self test circuit
09/13/2001US20010021899 Method and system for testing a test piece
09/13/2001US20010021601 Soket for electric part
09/13/2001US20010021558 Semiconductor integrated circuit device
09/13/2001US20010021143 Circuit, apparatus and method for generating address
09/13/2001US20010021134 Integrated semiconductor memory with redundant units for memory cells
09/13/2001US20010021015 Method and apparatus for analyzing the state of generation of foreign particles in semiconductor fabrication process
09/13/2001US20010020874 Method of evaluating quality of crystal unit
09/13/2001US20010020855 Fast signal selector
09/13/2001US20010020851 High-speed programmable interconnect
09/13/2001US20010020849 Process for monitoring the residual charge and capacity of a battery
09/13/2001US20010020546 Electrical contact structures formed by configuring a flexible wire to have a springable shape and overcoating the wire with at least one layer of a resilient conductive material, methods of mounting the contact structures to electronic components, and applications for employing the contact structures
09/13/2001US20010020545 Electrical contact structures formed by configuring a flexible wire to have a springable shape and overcoating the wire with at least one layer of a resilient conductive material, methods of mounting the contact structures to electronic components, and applications for employing the contact structures
09/13/2001US20010020538 Inspecting jig for wire harness
09/13/2001DE10107081A1 Verfahren zum Prüfen von Halbleiteranordnungen für die aktive Messung von elektrischen Eigenschaften A method of testing semiconductor devices for the measurement of electrical properties of active
09/13/2001DE10044837C1 Tampering detection circuit for IC has detection circuit coupled to signal line and at least one line pair extending between separate circuit blocks of IC
09/13/2001DE10010285A1 Teststruktur bei integriertem Halbleiter Test structure for integrated semiconductor
09/12/2001EP1132924A2 Self-testing of magneto-resistive memory arrays
09/12/2001EP1132816A2 Automatic detection of connectivity between an emulator and a target device
09/12/2001EP1132803A1 Electronic device, control circuit for electronic device, and method of controlling electronic device
09/12/2001EP1132751A1 Method for analyzing an electromagnetic field of a rotating machine and device for analyzing an electromagnetic field
09/12/2001EP1132750A2 Electrical circuit and method for testing a component of the electrical circuit
09/12/2001EP1132749A2 Method and apparatus for generating test sequence
09/12/2001EP1132748A2 High voltage testing device