Patents
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
10/2001
10/02/2001US6297647 Crosstalk test unit and method of calibration
10/02/2001US6297646 Electrical tester for small motor vehicles
10/02/2001US6297645 Device for sensing partial discharges in test objects, preferably a cable joint
10/02/2001US6297644 Multipurpose defect test structure with switchable voltage contrast capability and method of use
10/02/2001US6297643 Connection test method
10/02/2001US6297642 Partial discharge detection method
10/02/2001US6297618 Power storage device and method of measuring voltage of storage battery
10/02/2001US6297503 Method of detecting semiconductor defects
09/2001
09/27/2001WO2001071876A1 Method and apparatus for providing optimized access to circuits for debug, programming, and test
09/27/2001WO2001071779A2 Method and apparatus for planarizing a semiconductor contactor
09/27/2001WO2001071726A2 Method and apparatus for improving the testing, yield and performance of very large scale integrated circuits
09/27/2001WO2001071371A1 Testing device for printed boards
09/27/2001WO2001071369A1 Method and apparatus for inspection
09/27/2001WO2001009635A9 Apparatus having a single sensor for locating a concealed conductor energized by an alternating electric field
09/27/2001WO2000074110A3 Integrated circuit wafer probe card assembly
09/27/2001US20010025357 System and method for trellis decoding in a multi-pair transceiver system
09/27/2001US20010025356 Boundary scan path method and system with functional and non-functional scan cell memories
09/27/2001US20010025355 Circuit configuration with deactivatable scan path
09/27/2001US20010025301 Packet prioritization protocol for a large-scale, high speed computer network
09/27/2001US20010025227 Monitored burn-in test system and monitored burn-in test method of microcomputers
09/27/2001US20010025206 Wiring harness checking method
09/27/2001US20010024896 Socket for electric part
09/27/2001US20010024892 Contact sheet
09/27/2001US20010024890 Contactor having LSI-circuit-side contact piece and test-board-side contact piece for testing semiconductor device and manufacturing method thereof
09/27/2001US20010024338 Method and device for entering test mode in an integrated circuit for use in floppy disk drive, and a floppy disk drive apparatus incorporating the method
09/27/2001US20010024128 Conductive bump array contactors having an ejector and methods of testing using same
09/27/2001US20010024127 Semiconductor testing using electrically conductive adhesives
09/27/2001US20010024125 Method for detecting faults on safety oriented sensors
09/27/2001US20010024119 Robotic probe for testing printed circuit boards in-situ using a single printed circuit card slot
09/27/2001US20010024118 Bondpad attachments having self-limiting properties for penetration of semiconductor die
09/27/2001US20010024117 Method and apparatus for measuring harmonic load-pull for frequency multiplication
09/27/2001US20010024064 Vehicle mounted electrical component
09/27/2001US20010023770 Packaging and interconnection of contact structure
09/27/2001DE10014386A1 Integrated circuit e.g. for synchronous DRAM - has comparator for comparing temporal signal transitions of clock signal with those of digital signal
09/27/2001DE10013947A1 Conduction and availability tester for TAE connecting cables, has optical switching arrangement through which availability and conduction of plugs is optically indicated
09/27/2001DE10013537A1 Verfahren zur Strommessung Method for current measurement
09/27/2001DE10012107A1 Test environment for examining electronic systems, such as integrated circuits
09/27/2001DE10009010A1 Hardware and software components interpreter for diverse mobile applications, has single functional unit, in which entire functionality needed for evaluation of hardware and/or software components is integrated
09/27/2001DE10001484C1 Electrical sensor/actuator component simulation device, has control module providing model of simulated component controlled by real-time signals provided at signal interfaces associated with terminal pins
09/26/2001EP1136912A2 Probalistic diagnosis, in particular for embedded and remote applications
09/26/2001EP1136834A2 Integrated circuit with a control circuit for controlling a driver circuit
09/26/2001EP1136833A1 Method of performing a burn-in process to electrically stress a semiconductor memory
09/26/2001EP1136832A2 Monitored burn-in test system and monitored burn-in test method of microcomputers
09/26/2001EP1136828A2 Method for measuring current
09/26/2001EP1136827A2 Contactor having LSI-circuit-side contact piece and test-board-side contact piece for testing semiconductor device and manufacturing method thereof
09/26/2001EP1135979A1 Device for grasping and aligning an electronic component on a spindle
09/26/2001EP1135916A1 Fault conditions affecting high speed data services
09/26/2001EP1135899A1 Method and circuit configuration for determining the reliability performance of connection cables in a switching device
09/26/2001EP1135859A1 Method and apparatus for logic synchronization
09/26/2001EP1135840A2 System and method for monitoring a vehicle battery
09/26/2001EP1135794A1 A method and apparatus for the transport and tracking of an electronic component
09/26/2001EP1135693A1 Probe card for probing wafers with raised contact elements
09/26/2001EP1135692A1 Method and arrangement for dielectric integrity testing
09/26/2001EP1135665A1 Measurements using tunnelling current between elongate conductors
09/26/2001EP1032843B1 Method and device for measuring electromagnetic compatibility
09/26/2001EP0943127B1 Method for testing and for generating a mapping for an electronic device
09/26/2001EP0692126A4 Method and system for predicting steady state conditions from transient monotonic or cyclic data
09/26/2001CN2450673Y Intelligent insulation resistance testing recording instrument
09/26/2001CN1315072A Battery charge measurement and discharge reserve time prediction technique and apparatus
09/26/2001CN1315026A Method and apparatus for identifying and tracking connections of communcation lines
09/26/2001CN1315003A Internal signal/monitor of integrated circuit
09/26/2001CN1315002A High resolution analytical probe station
09/26/2001CN1314703A Contact switch for semiconductor device detection and its producing method
09/26/2001CN1314671A Driving module of liquid crystal display panel and liquid crystal display device with said driving module
09/26/2001CN1071923C Method for screening ceramic capacitors
09/25/2001US6295635 Adaptive Multidimensional model for general electrical interconnection structures by optimizing orthogonal expansion parameters
09/25/2001US6295623 System for testing real and simulated versions of an integrated circuit
09/25/2001US6295622 Method and apparatus for transforming pseudorandom binary test patterns into test stimulus patterns appropriate for circuits having 1 of N encoded inputs
09/25/2001US6295621 Apparatus for detecting output bond integrity in a display driver circuit
09/25/2001US6295620 Memory test facilitation circuit using stored test data repeatedly
09/25/2001US6295488 Method and device for locating faults and malfunctions in a complex system
09/25/2001US6295238 Semiconductor memory device having a circuit for fast operation
09/25/2001US6295190 Circuit breaker arrangement with integrated protection, control and monitoring
09/25/2001US6295146 System and method for sharing a spare channel among two or more optical ring networks
09/25/2001US6295003 Socket having an overload indicating and warning device
09/25/2001US6294949 Voltage drive circuit, voltage drive apparatus and semiconductor-device testing apparatus
09/25/2001US6294935 Built-in-self-test circuitry for testing a phase locked loop circuit
09/25/2001US6294923 Method and system for detecting faults utilizing an AC power supply
09/25/2001US6294921 Apparatus for testing an integrated circuit device
09/25/2001US6294918 Method for locating weak circuit having insufficient driving current in IC chips
09/25/2001US6294908 Top and bottom access functional test fixture
09/25/2001US6294897 Method and apparatus for electronically evaluating the internal temperature of an electrochemical cell or battery
09/25/2001US6294896 Method and apparatus for measuring complex self-immitance of a general electrical element
09/25/2001US6294894 Rechargeable battery arrangement
09/25/2001US6294396 Monitoring barrier metal deposition for metal interconnect
09/25/2001US6294395 Back side reactive ion etch
09/25/2001US6294284 Gauge effect battery tester
09/25/2001US6293808 Contact sheet
09/25/2001CA2325378C Battery parameter measurement
09/20/2001WO2001069866A1 Method and system for controlling data traffic in a network
09/20/2001WO2001069865A1 Method and system for communication of data via an optimum data path in a network
09/20/2001WO2001069604A2 Automated reference cell trimming verify
09/20/2001WO2001069275A2 Test environment and a method for testing systems
09/20/2001WO2001069274A1 Prober interface plate
09/20/2001WO2001069273A2 Apparatus and method for determining the operational state of a battery
09/20/2001WO2001069272A2 Device and method for monitoring a capacitor bushing
09/20/2001WO2001069268A2 Integrated circuit test socket lid assembly
09/20/2001WO2001069205A1 Beam delivery and imaging for optical probing of a device operating under electrical test
09/20/2001US20010023491 Device for testing digital signal processor in digital video disc reproducing apparatus
09/20/2001US20010023490 Method for activating a JTAG interface of a microprocessor of a microcontroller upon which a JTAG interface is implemented, and microcontroller